IEC 60749-11:2002/COR2:2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Modification of the validity date: now put at 2007.

Corrigendum 2 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains

Modification de la date de validité : fixée maintenant à 2007.

General Information

• Status: Published
• Publication Date: 12-Aug-2003
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Current Stage: PPUB - Publication issued
• Start Date: 31-Aug-2003
• Completion Date: 13-Aug-2003

Relations

• Corrects: IEC 60749-11:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
• Effective Date: 05-Sep-2023
• Corrects: IEC 60749-11:2002/COR1:2003 - Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
• Effective Date: 05-Sep-2023

Standards Content (Sample)

CEI 60749-11 IEC 60749-11
(Première édition – 2002) (First edition – 2002)
DISPOSITIFS À SEMICONDUCTEURS – SEMICONDUCTOR DEVICES –
MÉTHODES D'ESSAIS MÉCANIQUES MECHANICAL AND CLIMATIC TEST METHODS –
ET CLIMATIQUES –
Partie 11: Variations rapides de température – Part 11: Rapid change of temperature –
Méthode des deux bains Two-fluid-bath method
CORRIGENDUM 2
Page 2 Page 3
Au lieu de: Instead of:
Le comité a décidé que le cont
...