IEC 63185:2020

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.

Méthode au résonateur à disque circulaire de type symétrique pour mesurer la permittivité complexe des substrats diélectriques à faible perte

l’IEC 63185:2020 traite d’une méthode de mesure de la permittivité complexe des substrats diélectriques aux hyperfréquences et aux fréquences à ondes millimétriques. Cette méthode a été élaborée pour évaluer les propriétés diélectriques des matériaux à faible perte utilisés dans les circuits et dispositifs hyperfréquences et à ondes millimétriques. Cette méthode utilise des modes d’ordre supérieur d’un résonateur à disque circulaire de type symétrique et permet d’effectuer, à l’aide d’un résonateur, des mesurages à large bande de substrats diélectriques, dont l’effet des trous d’excitation est pris en compte avec exactitude sur la base de l’analyse de couplage de mode.

General Information

• Status: Published
• Publication Date: 07-Dec-2020
• ICS: 33.120.30 - RF connectors
• Technical Committee: SC 46F - RF and microwave passive components
• Drafting Committee: WG 1 - TC 46/SC 46F/WG 1
• Current Stage: PPUB - Publication issued
• Start Date: 02-Jan-2021
• Completion Date: 08-Dec-2020

Standards Content (Sample)

IEC 63185 ®
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of the complex permittivity for low-loss dielectric substrates
balanced-type circular disk resonator method

Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte

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IEC 63185 ®
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of the complex permittivity for low-loss dielectric substrates

balanced-type circular disk resonator method

Méthode au résonateur à disque circulaire de type symétrique pour mesurer la

permittivité complexe des substrats diélectriques à faible perte

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.30 ISBN 978-2-8322-9133-7

– 2 – IEC 63185:2020 © IEC 2020
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Measurement parameters . 6
5 Theory and calculation equations . 6
6 Measurement system . 8
7 Measurement procedure . 9
7.1 Preparation of measurement apparatus. 9
7.2 Adjustment of measurement conditions . 9
7.3 Calibration of a vector network analyzer . 9
7.4 Measurement of complex permittivity of test sample . 10
7.5 Periodic checkup of metal in resonator. 10
Annex A (informative) Example of measurement results and associated uncertainties
for complex permittivity . 11
Bibliography . 13

Figure 1 – Structure of a circular disk resonator . 7
Figure 2 – Relations between resonant frequency and relative permittivity . 8
Figure 3 – Schematic diagram of a vector network analyzer measurement system . 9
Figure 4 – Frequency response of |S | of balanced-type circular disk resonator . 10
Table A.1 – Parameters of the cavity and the sheet sample . 11
Table A.2 – The resonant frequencies and unloaded Q-factors . 11
Table A.3 – Measurement results of complex permittivity . 12

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD

FOREWORD
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International Standard IEC 63185 has been prepared by subcommittee 46F: RF and microwave
passive components, of IEC technical committee 46: Cables, wires, waveguides, RF connectors,
RF and microwave passive components and accessories.
The text of this International Standard is based on the following documents:
FDIS Report on voting
46F/523/FDIS 46F/531/RVD
Full information on the voting for the approval of this International Standard can be found in the
report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – IEC 63185:2020 © IEC 2020
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MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD

1 Scope
This document relates to a measurement method for complex permittivity of a dielectric
substrates at microwave and millimeter-wave frequencies. This method has been developed to
evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave
circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and
provides broadband measurements of dielectric substrates by using one resonator, where the
effect of excitation holes is taken into account accurately on the basis of the mode-matching
analysis.
In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this
method has the following characteristics:
’ and loss tangent tanδ normal to dielectric plate
• the values of the relative permittivity ε
r
samples can be measured accurately and non-destructively;
• this method presents broadband measuremen
...