Standard for automatic test markup language (ATML) test station description

IEC 61671-6:2016(E) defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

General Information

Status
Published
Publication Date
07-Apr-2016
Current Stage
PPUB - Publication issued
Start Date
08-Apr-2016
Completion Date
08-Apr-2016
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IEC 61671-6
Edition 1.0 2016-04
IEEE Std 1671.6
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description
IEC 61671-6:2016-04(en) IEEE Std 1671.6-2015
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 61671-6
Edition 1.0 2016-04
IEEE Std 1671.6™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test station description
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3268-2

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
IEC 61671-6:2016
IEEE Std 1671.6-2015 - i -
Contents

1. Overview .................................................................................................................................................... 1

1.1 General ................................................................................................................................................ 1

1.2 Application of this document’s annexes .............................................................................................. 2

1.3 Scope ................................................................................................................................................... 2

1.4 Application .......................................................................................................................................... 2

1.5 Conventions used within this document .............................................................................................. 2

2. Normative references .................................................................................................................................. 3

3. Definitions, acronyms, and abbreviations .................................................................................................. 4

3.1 Definitions ........................................................................................................................................... 4

3.2 Acronyms and abbreviations ............................................................................................................... 5

4. Schema—TestStationDescription.xsd ........................................................................................................ 6

4.1 General ................................................................................................................................................ 6

4.2 Elements .............................................................................................................................................. 6

4.3 Child elements ..................................................................................................................................... 8

4.4 Complex types ..................................................................................................................................... 9

5. Schema—TestStationInstance.xsd ............................................................................................................10

5.1 General ...............................................................................................................................................10

5.2 Elements .............................................................................................................................................10

5.3 Child elements ....................................................................................................................................12

5.4 Complex types ....................................................................................................................................12

6. ATML TestStationDescription XML schema names and locations ..........................................................14

7. ATML XML schema extensibility ............................................................................................................15

8. Conformance .............................................................................................................................................16

8.1 Conformance of a TestStationDescription instance document ...........................................................16

8.2 Conformance of a TestStationInstance instance document ................................................................16

Annex A (informative) IEEE download website material associated with this document ............................17

Annex B (informative) User’s information and examples .............................................................................18

B.1 Partial automatic test station ..............................................................................................................18

Annex C (informative) Glossary ...................................................................................................................21

Annex D (informative) Bibliography ............................................................................................................22

Annex E (informative) IEEE List of Participants............................................................................................23

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- ii -
IEC 61671-6:2016
IEEE Std 1671.6-2015
Standard for Automatic Test
Markup Language (ATML) Test Station
Description
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.
---------------------- Page: 5 ----------------------
- iii -
IEC 61671-6:2016
IEEE Std 1671.6-2015

International Standard IEC 61671-6/IEEE Std 1671.6-2015 has been processed through IEC

technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo

Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.6-2015 91/1316/FDIS 91/1340/RVD

Full information on the voting for the approval of this standard can be found in the report on

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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.
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IEC 61671-6:2016
- iv - IEEE Std 1671.6-2015
IEEE Standard for Automatic Test
Markup Language (ATML) Test Station
Description
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Approved 26 March 2015
IEEE-SA Standards Board
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IEC 61671-6:2016
IEEE Std 1671.6-2015 - v -

Abstract: An exchange format, using extensible markup language (XML), for identifying all of the

hardware, software, and documentation associated with a test station is specified in this

document. This test station may be used with a test program set to test and diagnose a unit under

test.

Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup

Language (ATML), automatic test system (ATS), IEEE 1671.6™, test station, XML schema

W3C is a registered trademark of the W3C®, (registered in numerous countries) World Wide Web Consortium. Marks of W3C are

registered and held by its host institutions: Massachusetts Institute of Technology (MIT), European Research Consortium for Information

and Mathematics (ERCIM), and Keio University, Japan.
---------------------- Page: 8 ----------------------
IEC 61671-6:2016
- vi - IEEE Std 1671.6-2015
IEEE Introduction

This introduction is not part of IEEE Std 1671.6™-2015, IEEE Standard for Automatic Test Markup Language

(ATML) Test Station Description.

This child, or dot, standard, also known as an ATML component standard, provides for the definition of the

Test Station XML schemas, and contains references to examples; both of which accompany this standard.

These XML schemas provide for the identification and definition of a test station.

ATML’s XML schemas define the basic information required within any test application and provide a

vehicle for formally defining the test environment by defining a class hierarchy corresponding to these

basic information entities and provide several methods within each to enable basic operations to be

performed on these entities. ATML component standards within the ATML framework define the

particular requirements within the test environment.
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IEC 61671-6:2016
IEEE Std 1671.6-2015 - vii -
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IEC 61671-6:2016
- viii - IEEE Std 1671.6-2015
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IEC 61671-6:2016
IEEE Std 1671.6-2015 - ix -
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---------------------- Page: 12 ----------------------
IEC 61671-6:2016
- 1 - IEEE Std 1671.6-2015
Standard for Automatic Test
Markup Language (ATML) Test Station
Description

IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,

or environmental protection, or ensure against interference with or from other devices or networks.

Implementers of IEEE Standards documents are responsible for determining and complying with all

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1. Overview
1.1 General

Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible

markup language (XML) schemas that allows automatic test system (ATS) and test information to be

exchanged in a common format adhering to the XML standard.

The ATML framework and the ATML family of standards have been developed and are maintained under

the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating

Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test

strategies, test requirements, test procedures, test results management, and test system implementations,

while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be

interchanged between heterogeneous systems.

This standard (as well as the XML schemas and XML instance document examples that accompany this

standard) is intended to be used i
...

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