IEC/IEEE 62582-2:2011/AMD1:2016
(Amendment)Amendment 1 - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 2: Indenter modulus
Amendment 1 - Nuclear power plants - Instrumentation and control important to safety - Electrical equipment condition monitoring methods - Part 2: Indenter modulus
Amendement 1 - Centrales nucléaires de puissance - Instrumentation et contrôle-commande importants pour la sûreté - Méthodes de surveillance de l'état des matériels électriques - Partie 2: Module indenter
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IEC/IEEE 62582-2 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 1
AM ENDEMENT 1
Nuclear power plants – Instrumentation and control important to safety –
Electrical equipment condition monitoring methods –
Part 2: Indenter modulus
Centrales nucléaires de puissance – Instrumentation et contrôle-commande
importants pour la sûreté – Méthodes de surveillance de l’état des matériels
électriques –
Partie 2: Module indenter
IEC/IEEE 62582-2:2011-08/AMD1:2016-02(en-fr)
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IEC/IEEE 62582-2 ®
Edition 1.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AM ENDMENT 1
AM ENDEMENT 1
Nuclear power plants – Instrumentation and control important to safety –
Electrical equipment condition monitoring methods –
Part 2: Indenter modulus
Centrales nucléaires de puissance – Instrumentation et contrôle-commande
importants pour la sûreté – Méthodes de surveillance de l’état des matériels
électriques –
Partie 2: Module indenter
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.120.20 ISBN 978-2-8322-3157-9
– 2 – IEC/IEEE 62582-2:2011/AMD1:2016
IEC/IEEE 2016
FOREWORD
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This amendment has been prepared by subcommittee 45A: Instrumentation, control and
electrical systems of nuclear facilities, of IEC technical committee 45: Nuclear
instrumentation, in cooperation with the Nuclear Power Engineering Committee of the Power
& Energy Society of the IEEE , under the IEC/IEEE Dual Logo Agreement between IEC and
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This publication is published as an IEC/IEEE Dual Logo standard.
—————————
A list of IEEE participants can be found at the following URL: http://standards.ieee.org/downloads/62582-2/62582-2-amd1-
2016/62582-2-amd1-2016_wg-participants.pdf.
IEC/IEEE 2016
The text of this standard is based on the following IEC documents:
FDIS Report on voting
45A/1054/FDIS 45A/1067/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The IEC Technical Committee and IEEE Technical Committee have decided that the contents
of this publication will remain unchanged until the stability date indicated on the IEC web site
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publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
– 4 – IEC/IEEE 62582-2:2011/AMD1:2016
IEC/IEEE 2016
6 Measurement procedure
6.4 Instrumentation
Replace existing Figure 1 by the following new Figure 1:
Dimensions in millimetres
17,5°
≈ R0,1
IEC
Figure 1 – Geometry and dimensions of the profile
of the probe tip (truncated cone) used in the indenter
6.9 Determination of the value of the indenter modulus
Replace existing Figure 2 by the following new Figure 2 and add a note after Figure 2 as
follows:
d – d
2 1
0 0,1 0,2 0,3 0,4 0,5 0,6
Displacement (mm)
IEC
Figure 2 – Calculation of indenter modulus
–1
NOTE Some instruments used for indenter measurements show the result in load versus time (in N∙s ). The
–1 –1
value of the indenter modulus in N∙mm is then calculated as the value in N∙s divided by the probe velocity in
–1
mm∙s .
Load (N)
F – F
2 1
0,56
IEC/IEEE 2016
Annex A (informative)
A.1 Example of influence of variability in equipment dimensions and
construction
Replace existing Figure A.1 by the following new Figure A.1:
8 Thermally aged
8 o
1008 h at 120 C
Unaged
0 1 2 3 4 5 6 7 8
0 1 2 3 4 5 6 7 8
Time (s)
Time (s) IEC
IEC
–1
NOTE The probe velocity was 5,2 mm∙min and the indenter modulus values were calculated from the slope
–1
between 1 N and 4 N by division by 5,2∙60 .
Figure A.1 – Example of local variation of indenter modulus due to variation in
equipment dimensions and construction
Annex B (informative)
Replace existing Figure B.1 by the following new Figure B.1:
8 CSPE/EPDM
0 1 2 3 4 5 6 7 8 9
Time (s)
IEC
–1
NOTE The indenter modulus value was calculated from the slope between 1 N and 4 N by division by 5,162∙60 .
Figure B.1 – Example of measured force versus time
___________
Load (N)
Load (N)
Load (N)
– 6 – IEC/IEEE 62582-2:2011/AMD1:2016
IEC/IEEE 2016
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...
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