ISO TS 80004-6:2013
(Main)Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
ISO/TS 80004-6:2013 lists terms and definitions relevant to the characterization of nano-objects.
Nanotechnologies - Vocabulaire - Partie 6: Caractérisation des nano-objets
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TECHNICAL ISO/TS
SPECIFICATION 80004-6
First edition
2013-11-01
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
Nanotechnologies — Vocabulaire —
Partie 6: Caractérisation d’un nano-objet
Reference number
ISO/TS 80004-6:2013(E)
©
ISO 2013
ISO/TS 80004-6:2013(E)
© ISO 2013
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Published in Switzerland
ii © ISO 2013 – All rights reserved
ISO/TS 80004-6:2013(E)
Contents Page
Foreword .iv
Introduction .vi
1 Scope . 1
2 General terms . 1
3 Terms related to size and shape measurement . 3
3.1 Terms related to measurands for size and shape . 3
3.2 Terms related to scattering techniques . 4
3.3 Terms related to aerosol characterization . 5
3.4 Terms related to separation techniques . 6
3.5 Terms related to microscopy . 7
3.6 Terms related to surface area measurement .10
4 Terms related to chemical analysis .11
5 Terms related to measurement of other properties .15
5.1 Terms related to mass measurement .15
5.2 Terms related to crystallinity measurement .16
5.3 Terms related to charge measurement in suspensions .16
Annex A (informative) Index .18
Bibliography .23
ISO/TS 80004-6:2013(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directives
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received. www.iso.org/patents
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical Barriers
to Trade (TBT) see the following URL: Foreword - Supplementary information
ISO/TS 80004-6 was prepared jointly by Technical Committee ISO/TC 229, Nanotechnologies and
Technical Committee IEC/TC 113, Nanotechnology standardization for electrical and electronic products
and systems. The draft was circulated for voting to the national bodies of both ISO and IEC.
Documents in the 80000 to 89999 range of reference numbers are developed by collaboration
between ISO and IEC.
ISO/TS 80004 consists of the following parts, under the general title Nanotechnologies — Vocabulary:
— Part 1: Core terms
— Part 3: Carbon nano-objects
— Part 4: Nanostructured materials
— Part 5: Nano/bio interface
— Part 6: Nano-object characterization
— Part 7: Diagnostics and therapeutics for healthcare
— Part 8: Nanomanufacturing processes
The following parts are under preparation:
1)
— Part 2: Nano-objects: Nanoparticle, nanofibre and nanoplate
— Part 9: Nano-enabled electrotechnical products and systems
— Part 10: Nano-enabled photonic components and systems
— Part 11: Nanolayer, nanocoating, nanofilm, and related terms
1) Revision of ISO/TS 27687:2008, Nanotechnologies — Terminology and definitions for nano-objects —
Nanoparticle, nanofibre and nanoplate.
iv © ISO 2013 – All rights reserved
ISO/TS 80004-6:2013(E)
— Part 12: Quantum phenomena in nanotechnology
Graphene and other two dimensional materials will form the subject of a future Part 13.
ISO/TS 80004-6:2013(E)
Introduction
Measurement and instrumentation techniques have effectively opened the door to modern
nanotechnology. Characterization is key to understanding the properties and function of all nano-objects.
Nano-object characterization involves interactions between people with different backgrounds and
from different fields. Those interested in nano-object characterization might, for example, be materials
scientists, biologists, chemists or physicists and might have a background that is primarily experimental
or theoretical. Those making use of the data extend beyond this group to include regulators and
toxicologists. To avoid any misunderstandings, and to facilitate both comparability and the reliable
exchange of information, it is essential to clarify the concepts, to establish the terms for use and to
establish their definitions.
The terms are classified under the following broad headings:
— Clause 2: General terms
— Clause 3: Terms related to size and shape measurement
— Clause 4: Terms related to chemical analysis
— Clause 5: Terms related to measurement of other properties
These headings are intended as guide only, as some techniques can determine more than one property.
Subclause 3.1 lists the overarching measurands that apply to the rest of Clause 3. Other measurands are
more technique specific and are placed in the text adjacent to the technique.
It should be noted that most techniques require analysis in a non-native state and involve sample
preparation, for example placing the nano-objects on a surface or placing it in a specific fluid or vacuum.
This could change the nature of the nano-objects.
The order of the techniques in this document should not be taken to indicate a preference and the
techniques listed in this document are not intended to be exhaustive. Equally, some of the techniques
listed in this document are more popular than others in their usage in analysing certain properties of
nano-objects. Table 1 lists alphabetically the main current techniques for nano-object characterization.
Table 1 — Alphabetical list of main current techniques for nano-object characterization
Property Current main techniques
Size atomic force microscopy (AFM), centrifugal liquid sedimentation (CLS), differential
mobility analysing system (DMAS), dynamic light scattering (DLS), scanning electron
microscopy (SEM), particle tracking analysis (PTA), transmission electron microscopy
(TEM)
Shape atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission
electron microscopy (TEM)
Surface area Brunauer-Emmett-Teller (BET) method
‘Surface’ chemistry secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS)
Chemistry of the inductively coupled plasma mass spectrometry (ICP-MS), nuclear magnetic resonance
‘bulk’ sample spectroscopy (NMR)
Charge in suspensions zeta potential
This document is intended to serve as a starting reference for the vocabulary that underpins measurement
and characterization efforts in the field of nanotechnologies.
vi © ISO 2013 – All rights reserved
TECHNICAL SPECIFICATION ISO/TS 80004-6:2013(E)
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
1 Scope
This Technical Specification lists terms and definitions relevant to the characterization of nano-objects.
2 General terms
2.1
nanoscale
size range from approximately 1 nm to 100 nm
Note 1 to entry: Properties that are not extrapolations from a larger size will typically, but not exclusively, be
exhibited in this size range. For such properties the size limits are considered approximate.
Note 2 to entry: The lower limit in this definition (approximately 1 nm) is introduced to avoid single and small
groups of atoms from being designated as nano-objects (2.2) or elements of nanostructures, which might be
implied by the absence of a lower limit.
[SOURCE: ISO/TS 80004-1:2010, definition 2.1]
2.2
nano-object
material with one, two or three external dimensions in the nanoscale (2.1)
Note 1 to entry: Generic term for all discrete nanoscale objects.
[SOURCE: ISO/TS 80004-1:2010, definition 2.5]
2.3
nanoparticle
nano-object (2.2) with all three external dimensions in the nanoscale (2.1)
Note 1 to entry: If the lengths of the longest to the shortest axes of the nano-object differ significantly (typically
by more than three times), the terms nanofibre (2.6) or nanoplate (2.4) are intended to be used instead of the term
nanoparticle.
[SOURCE: ISO/TS 27687:2008, definition 4.1]
2.4
nanoplate
nano-object (2.2) with one external dimension in the nanoscale (2.1) and the two other external
dimensions significantly larger
Note 1 to entry: The smallest external dimension is the thickness of the nanoplate.
Note 2 to entry: The two significantly larger dimensions are considered to differ from the nanoscale dimension
by more than three times.
Note 3 to entry: The larger external dimensions are not necessarily in the nanoscale.
[SOURCE: ISO/TS 27687:2008, definition 4.2]
ISO/TS 80004-6:2013(E)
2.5
nanorod
solid nanofibre (2.6)
[SOURCE: ISO/TS 27687:2008, definition 4.5]
2.6
nanofibre
nano-object (2.2) with two similar external dimensions in the nanoscale (2.1) and the third dimension
significantly larger
Note 1 to entry: A nanofibre can be flexible or rigid.
Note 2 to entry: The two similar external dimensions are considered to differ in size by less than three times and
the significantly larger external dimension is considered to differ from the other two by more than three times.
Note 3 to entry: The largest external dimension is not necessarily in the nanoscale.
[SOURCE: ISO/TS 27687:2008, definition 4.3]
2.7
nanotube
hollow nanofibre (2.6)
[SOURCE: ISO/TS 27687:2008, definition 4.4]
2.8
quantum dot
crystalline nanoparticle (2.3) that exhibits size-dependent properties due to quantum confinement
effects on the electronic states
[SOURCE: ISO/TS 27687:2008, definition 4.7]
2.9
particle
minute piece of matter with defined physical boundaries
Note 1 to entry: A physical boundary can also be described as an interface.
Note 2 to entry: A particle can move as a unit.
Note 3 to entry: This general particle definition applies to nano-objects (2.2).
[SOURCE: ISO 14644-6:2007, definition 2.102 and ISO/TS 27687:2008, definition 3.1]
2.10
agglomerate
collection of weakly bound particles (2.9) or aggregates (2.11) or mixtures of the two where the resulting
external surface area is similar to the sum of the surface areas of the individual components
Note 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces, or
simple physical entanglement.
Note 2 to entry: Agglomerates are also termed secondary particles and the original source particles are termed
primary particles.
[SOURCE: ISO/TS 27687:2008, definition 3.2]
2 © ISO 2013 – All rights reserved
...
TECHNICAL ISO/TS
SPECIFICATION 80004-6
First edition
2013-11-01
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
Nanotechnologies — Vocabulaire —
Partie 6: Caractérisation d’un nano-objet
Reference number
ISO/TS 80004-6:2013(E)
©
ISO 2013
ISO/TS 80004-6:2013(E)
© ISO 2013
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
the requester.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Published in Switzerland
ii © ISO 2013 – All rights reserved
ISO/TS 80004-6:2013(E)
Contents Page
Foreword .iv
Introduction .vi
1 Scope . 1
2 General terms . 1
3 Terms related to size and shape measurement . 3
3.1 Terms related to measurands for size and shape . 3
3.2 Terms related to scattering techniques . 4
3.3 Terms related to aerosol characterization . 5
3.4 Terms related to separation techniques . 6
3.5 Terms related to microscopy . 7
3.6 Terms related to surface area measurement .10
4 Terms related to chemical analysis .11
5 Terms related to measurement of other properties .15
5.1 Terms related to mass measurement .15
5.2 Terms related to crystallinity measurement .16
5.3 Terms related to charge measurement in suspensions .16
Annex A (informative) Index .18
Bibliography .23
ISO/TS 80004-6:2013(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
orga nizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directives
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received. www.iso.org/patents
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical Barriers
to Trade (TBT) see the following URL: Foreword - Supplementary information
ISO/TS 80004-6 was prepared jointly by Technical Committee ISO/TC 229, Nanotechnologies and
Technical Committee IEC/TC 113, Nanotechnology standardization for electrical and electronic products
and systems. The draft was circulated for voting to the national bodies of both ISO and IEC.
Documents in the 80000 to 89999 range of reference numbers are developed by collaboration
between ISO and IEC.
ISO/TS 80004 consists of the following parts, under the general title Nanotechnologies — Vocabulary:
— Part 1: Core terms
— Part 3: Carbon nano-objects
— Part 4: Nanostructured materials
— Part 5: Nano/bio interface
— Part 6: Nano-object characterization
— Part 7: Diagnostics and therapeutics for healthcare
— Part 8: Nanomanufacturing processes
The following parts are under preparation:
1)
— Part 2: Nano-objects: Nanoparticle, nanofibre and nanoplate
— Part 9: Nano-enabled electrotechnical products and systems
— Part 10: Nano-enabled photonic components and systems
— Part 11: Nanolayer, nanocoating, nanofilm, and related terms
1) Revision of ISO/TS 27687:2008, Nanotechnologies — Terminology and definitions for nano-objects —
Nanoparticle, nanofibre and nanoplate.
iv © ISO 2013 – All rights reserved
ISO/TS 80004-6:2013(E)
— Part 12: Quantum phenomena in nanotechnology
Graphene and other two dimensional materials will form the subject of a future Part 13.
ISO/TS 80004-6:2013(E)
Introduction
Measurement and instrumentation techniques have effectively opened the door to modern
nanotechnology. Characterization is key to understanding the properties and function of all nano-objects.
Nano-object characterization involves interactions between people with different backgrounds and
from different fields. Those interested in nano-object characterization might, for example, be materials
scientists, biologists, chemists or physicists and might have a background that is primarily experimental
or theoretical. Those making use of the data extend beyond this group to include regulators and
toxicologists. To avoid any misunderstandings, and to facilitate both comparability and the reliable
exchange of information, it is essential to clarify the concepts, to establish the terms for use and to
establish their definitions.
The terms are classified under the following broad headings:
— Clause 2: General terms
— Clause 3: Terms related to size and shape measurement
— Clause 4: Terms related to chemical analysis
— Clause 5: Terms related to measurement of other properties
These headings are intended as guide only, as some techniques can determine more than one property.
Subclause 3.1 lists the overarching measurands that apply to the rest of Clause 3. Other measurands are
more technique specific and are placed in the text adjacent to the technique.
It should be noted that most techniques require analysis in a non-native state and involve sample
preparation, for example placing the nano-objects on a surface or placing it in a specific fluid or vacuum.
This could change the nature of the nano-objects.
The order of the techniques in this document should not be taken to indicate a preference and the
techniques listed in this document are not intended to be exhaustive. Equally, some of the techniques
listed in this document are more popular than others in their usage in analysing certain properties of
nano-objects. Table 1 lists alphabetically the main current techniques for nano-object characterization.
Table 1 — Alphabetical list of main current techniques for nano-object characterization
Property Current main techniques
Size atomic force microscopy (AFM), centrifugal liquid sedimentation (CLS), differential
mobility analysing system (DMAS), dynamic light scattering (DLS), scanning electron
microscopy (SEM), particle tracking analysis (PTA), transmission electron microscopy
(TEM)
Shape atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission
electron microscopy (TEM)
Surface area Brunauer-Emmett-Teller (BET) method
‘Surface’ chemistry secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS)
Chemistry of the inductively coupled plasma mass spectrometry (ICP-MS), nuclear magnetic resonance
‘bulk’ sample spectroscopy (NMR)
Charge in suspensions zeta potential
This document is intended to serve as a starting reference for the vocabulary that underpins measurement
and characterization efforts in the field of nanotechnologies.
vi © ISO 2013 – All rights reserved
TECHNICAL SPECIFICATION ISO/TS 80004-6:2013(E)
Nanotechnologies — Vocabulary —
Part 6:
Nano-object characterization
1 Scope
This Technical Specification lists terms and definitions relevant to the characterization of nano-objects.
2 General terms
2.1
nanoscale
size range from approximately 1 nm to 100 nm
Note 1 to entry: Properties that are not extrapolations from a larger size will typically, but not exclusively, be
exhibited in this size range. For such properties the size limits are considered approximate.
Note 2 to entry: The lower limit in this definition (approximately 1 nm) is introduced to avoid single and small
groups of atoms from being designated as nano-objects (2.2) or elements of nanostructures, which might be
implied by the absence of a lower limit.
[SOURCE: ISO/TS 80004-1:2010, definition 2.1]
2.2
nano-object
material with one, two or three external dimensions in the nanoscale (2.1)
Note 1 to entry: Generic term for all discrete nanoscale objects.
[SOURCE: ISO/TS 80004-1:2010, definition 2.5]
2.3
nanoparticle
nano-object (2.2) with all three external dimensions in the nanoscale (2.1)
Note 1 to entry: If the lengths of the longest to the shortest axes of the nano-object differ significantly (typically
by more than three times), the terms nanofibre (2.6) or nanoplate (2.4) are intended to be used instead of the term
nanoparticle.
[SOURCE: ISO/TS 27687:2008, definition 4.1]
2.4
nanoplate
nano-object (2.2) with one external dimension in the nanoscale (2.1) and the two other external
dimensions significantly larger
Note 1 to entry: The smallest external dimension is the thickness of the nanoplate.
Note 2 to entry: The two significantly larger dimensions are considered to differ from the nanoscale dimension
by more than three times.
Note 3 to entry: The larger external dimensions are not necessarily in the nanoscale.
[SOURCE: ISO/TS 27687:2008, definition 4.2]
ISO/TS 80004-6:2013(E)
2.5
nanorod
solid nanofibre (2.6)
[SOURCE: ISO/TS 27687:2008, definition 4.5]
2.6
nanofibre
nano-object (2.2) with two similar external dimensions in the nanoscale (2.1) and the third dimension
significantly larger
Note 1 to entry: A nanofibre can be flexible or rigid.
Note 2 to entry: The two similar external dimensions are considered to differ in size by less than three times and
the significantly larger external dimension is considered to differ from the other two by more than three times.
Note 3 to entry: The largest external dimension is not necessarily in the nanoscale.
[SOURCE: ISO/TS 27687:2008, definition 4.3]
2.7
nanotube
hollow nanofibre (2.6)
[SOURCE: ISO/TS 27687:2008, definition 4.4]
2.8
quantum dot
crystalline nanoparticle (2.3) that exhibits size-dependent properties due to quantum confinement
effects on the electronic states
[SOURCE: ISO/TS 27687:2008, definition 4.7]
2.9
particle
minute piece of matter with defined physical boundaries
Note 1 to entry: A physical boundary can also be described as an interface.
Note 2 to entry: A particle can move as a unit.
Note 3 to entry: This general particle definition applies to nano-objects (2.2).
[SOURCE: ISO 14644-6:2007, definition 2.102 and ISO/TS 27687:2008, definition 3.1]
2.10
agglomerate
collection of weakly bound particles (2.9) or aggregates (2.11) or mixtures of the two where the resulting
external surface area is similar to the sum of the surface areas of the individual components
Note 1 to entry: The forces holding an agglomerate together are weak forces, for example van der Waals forces, or
simple physical entanglement.
Note 2 to entry: Agglomerates ar
...
SPÉCIFICATION ISO/TS
TECHNIQUE 80004-6
Première édition
2013-11-01
Nanotechnologies — Vocabulaire —
Partie 6:
Caractérisation des nano-objets
Nanotechnologies — Vocabulary —
Part 6: Nano-object characterization
Numéro de référence
ISO/TS 80004-6:2013(F)
©
ISO 2013
ISO/TS 80004-6:2013(F)
DOCUMENT PROTÉGÉ PAR COPYRIGHT
© ISO 2013
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni utilisée
sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie, l’affichage sur
l’internet ou sur un Intranet, sans autorisation écrite préalable. Les demandes d’autorisation peuvent être adressées à l’ISO à
l’adresse ci-après ou au comité membre de l’ISO dans le pays du demandeur.
ISO copyright office
Case postale 56 • CH-1211 Geneva 20
Tel. + 41 22 749 01 11
Fax + 41 22 749 09 47
E-mail copyright@iso.org
Web www.iso.org
Publié en Suisse
ii © ISO 2013 – Tous droits réservés
ISO/TS 80004-6:2013(F)
Sommaire Page
Avant-propos .iv
Introduction .vi
1 Domaine d’application . 1
2 Termes généraux . 1
3 Termes associés à la mesure des tailles et des formes . 3
3.1 Termes relatifs aux mesurandes pour la taille et la forme . 3
3.2 Termes relatifs aux techniques de diffusion . 4
3.3 Termes relatifs à la caractérisation des aérosols . 6
3.4 Termes relatifs aux techniques de séparation . 7
3.5 Termes relatifs à la microscopie . 7
3.6 Termes relatifs à la mesure de l’aire de surfaces .11
4 Termes relatifs à l’analyse chimique .12
5 Termes relatifs à la mesure d’autres propriétés .17
5.1 Termes relatifs à la mesure de la masse .17
5.2 Termes relatifs à la mesure de la cristallinité .17
5.3 Termes relatifs à la mesure des charges dans les suspensions .18
Annexe A (informative) Index .19
Bibliographie .24
ISO/TS 80004-6:2013(F)
Avant-propos
L’ISO (Organisation internationale de normalisation) est une fédération mondiale d’organismes
nationaux de normalisation (comités membres de l’ISO). L’élaboration des Normes internationales est
en général confiée aux comités techniques de l’ISO. Chaque comité membre intéressé par une étude
a le droit de faire partie du comité technique créé à cet effet. Les organisations internationales,
gouv ernementales et non gouvernementales, en liaison avec l’ISO participent également aux travaux.
L’ISO c ollabore étroitement avec la Commission électrotechnique internationale (CEI) en ce qui concerne
la normalisation électrotechnique.
Les procédures utilisées pour élaborer le présent document et celles destinées à sa mise à jour sont
décrites dans les Directives ISO/CEI, Partie 1. Il convient, en particulier de prendre note des différents
critères d’approbation requis pour les différents types de documents ISO. Le présent document a été
rédigé conformément aux règles de rédaction données dans les Directives ISO/CEI, Partie 2 (voir www.
iso.org/directives).
L’attention est appelée sur le fait que certains des éléments du présent document peuvent faire l’objet de
droits de propriété intellectuelle ou de droits analogues. L’ISO ne saurait être tenue pour responsable
de ne pas avoir identifié de tels droits de propriété et averti de leur existence. Les détails concernant les
références aux droits de propriété intellectuelle ou autres droits analogues identifiés lors de l’élaboration
du document sont indiqués dans l’Introduction et/ou sur la liste ISO des déclarations de brevets reçues
(voir www.iso.org/patents).
Les éventuelles appellations commerciales utilisées dans le présent document sont données pour
information à l’intention des utilisateurs et ne constituent pas une approbation ou une recommandation.
Pour une explication de la signification des termes et expressions spécifiques de l’ISO liés à l’évaluation de
la conformité, aussi bien que pour des informations au-sujet de l’adhésion de l’ISO aux principes de l’OMC
concernant les obstacles techniques au commerce (OTC) voir le lien suivant: Foreword - Supplementary
information
L’ISO/TS 80004-6 a été préparée conjointement par le Comité technique ISO/TC 229, Nanotechnologies
et le Comité technique CEI/TC 113, Normalistion dans le domaine des nanotechnologies relatives aux
appareils et systèmes életriques et életroniques. Le projet a été distribué aux organismes nationaux
membres de l’ISO et de la CEI pour le vote.
Les documents dans la plage de numéros de référence allant de 80000 à 89999 sont développés en
collaboration entre l’ISO et la CEI.
L’ISO/TS 80004 comprend les parties suivantes, présentées sous le titre général Nanotechnologies —
Vocabulaire:
— Partie 1: Termes «cœur»
— Partie 3: Nano-objets en carbone
— Partie 4: Matériaux nanostructurés
— Partie 5: Interface nano/bio
— Partie 6: Caractérisation d’un nano-objet
— Partie 7: Diagnostics et thérapies pour les soins de santé
Les parties suivantes sont en préparation:
1)
— Partie 2: Nano-objets: Nanoparticule, nanofibre et nanofeuillet
1) Révision de l’ISO/TS 27687:2008, Nanotechnologies — Terminologie et définitions relatives aux nano-
objets — Nanoparticule, nanofibre et nanofeuillet.
iv © ISO 2013 – Tous droits réservés
ISO/TS 80004-6:2013(F)
— Partie 8: Processus de nanofabrication
— Partie 9: Produits et systèmes électrotechniques nano-activés
— Partie 10: Produits et systèmes photoniques nano-activés
— Partie 11: Nano-couche, nano-revêtement, nano-film et termes associés
— Partie 12: Effets quantiques dans les nanotechnologies
Le graphène et autres matériaux à deux dimensions feront l’objet d’une future Partie 13.
ISO/TS 80004-6:2013(F)
Introduction
Les techniques de mesure et d’instrumentation ont largement contribué à ouvrir efficacement la
porte aux nanotechnologies modernes. La caractérisation constitue l’élément clé pour comprendre les
propriétés et les fonctions des nano-objets.
La caractérisation des nano-objets implique des interactions entre des personnes ayant des formations
différentes et intervenant dans des domaines différents. Ceux qui s’intéressent à la caractérisation des
nano-objets peuvent être des spécialistes des sciences des matériaux, des biologistes, des chimistes ou
des physiciens et il est possible que leur formation soit essentiellement expérimentale ou théorique.
Ceux qui utilisent les données peuvent se situer au-delà de ce groupe et inclure des spécialistes de la
réglementation et des toxicologues. Pour éviter les malentendus et pour faciliter à la fois la comparabilité
et l’échange fiable d’informations, il est essentiel de clarifier les concepts et d’établir les termes à utiliser
ainsi que leurs définitions.
Les termes sont classés sous les titres généraux suivants:
— Article 2: Termes généraux
— Article 3: Termes associés à la mesure des dimensions et des formes
— Article 4: Termes associés à l’analyse chimique
— Article 5: Termes associés à la mesure d’autres propriétés
Ces catégories sont uniquement destinées à servir de guide car certaines techniques permettent de
déterminer plus d’une propriété. Le paragraphe 3.1 énumère les mesurandes génériques qui s’appliquent
au reste de l’Article 3. D’autres mesurandes sont plus spécifiques à une technique et sont placés dans le
texte à côté de la technique.
Il convient de noter que la plupart des techniques nécessitent une analyse dans un état non natif et
impliquent une préparation des échantillons, par exemple, en plaçant les nano-objets sur une surface
ou dans un fluide spécifique ou sous vide. Cela pourrait conduire à une modification de la nature des
nano-objets.
Il convient de ne pas considérer l’ordre dans lequel les techniques sont présentées dans le document
comme un ordre de préférence. La liste des techniques énumérées dans le présent document n’est pas
exhaustive. Par ailleurs, certaines des techniques énumérées dans le document sont plus connues que
d’autres pour leur utilisation dans l’analyse de certaines propriétés des nano-objets. Le Tableau 1 énumère,
par ordre alphabétique, les principales techniques actuellement utilisées pour la caractérisation des
nano-objets.
Tableau 1 — Liste alphabétique des principales techniques actuellement utilisées pour la
caractérisation des nano-objets
Propriété Principales techniques actuellement utilisées
Dimensions microscopie à force atomique (AFM), sédimentation centrifuge en phase liquide (CLS); sys-
tème d’analyse différentielle de la mobilité (DMAS); diffusion dynamique de la lumière (DLD),
microscopie électronique à balayage (MEB), analyse par traçage de particules (analyse par
suivi de particules) (PTA), microscopie électronique à transmission (MET)
Forme microscopie à force atomique (AFM), microscopie électronique à balayage (MEB), microscopie
électronique à transmission (MET)
Surface Méthode de Brunauer-Emmett-Teller (BET)
Composition spectrométrie de masse d’ions secondaires (SIMS), spectroscopie de photoélectrons X (XPS)
chimique de
surface
vi © ISO 2013 – Tous droits réservés
ISO/TS 80004-6:2013(F)
Propriété Principales techniques actuellement utilisées
Analyse spectrométrie de masse à plasma couplé par induction (ICP-MS), spectroscopie de résonance
chimique de magnétique nucléaire (RMN)
l’échantillon
« en vrac »
Charge dans les potentiel zêta
suspensions
Le présent document est destiné à servir de référence de départ pour le vocabulaire utilisé en soutien
aux efforts de mesure et de caractérisation dans le domaine des nanotechnologies.
SPÉCIFICATION TECHNIQUE ISO/TS 80004-6:2013(F)
Nanotechnologies — Vocabulaire —
Partie 6:
Caractérisation des nano-objets
1 Domaine d’application
La présente Spécification technique donne la liste des termes et définitions applicables à la caractérisation
des nano-objets.
2 Termes généraux
2.1
échelle nanométrique
gamme de dimensions s’étendant approximativement de 1 nm à 100 nm
Note 1 à l’article: Les propriétés qui ne constituent pas des extrapolations par rapport à des dimensions plus
grandes seront présentées de façon générale, mais pas exclusivement, dans cette gamme de dimensions. Pour ces
propriétés, on considère que les limites dimensionnelles sont approximatives.
Note 2 à l’article: Dans cette définition, on indique une limite inférieure (approximativement 1 nm) pour éviter
à des atomes isolés et à de petits groupes d’atomes d’être désignés en tant que nano-objets (2.2) ou éléments de
nanostructures, ce qui pourrait être le cas en l’absence de limite inférieure.
[SOURCE: ISO/TS 80004-1:2010, définition 2.1]
2.2
nano-objet
matériau dont une, deux ou les trois dimensions externes sont à l’échelle nanométrique (2.1)
Note 1 à l’article: Terme générique pour tous les objets discrets à l’échelle nanométrique.
[SOURCE: ISO/TS 80004-1:2010, définition 2.5]
2.3
nanoparticule
nano-objet (2.2) dont les trois dimensions externes sont à l’échelle nanométrique (2.1)
Note 1 à l’article: Si les valeurs de la plus longue dimension et de la plus courte dimension du nano-objet diffèrent
de façon significative (généralement d’un facteur plus grand que trois), on utilise les termes nanofibre (2.6) ou
nanofeuillet (2.4) à la place du terme nanoparticule.
[SOURCE: ISO/TS 27687:2008, définition 4.1]
2.4
nanofeuillet
nano-objet (2.2) dont une dimension externe est à l’échelle nanométrique (2.1) et dont les deux autres
sont significativement plus grandes
Note 1 à l’article: La dimension externe la plus petite est l’épaisseur du nanofeuillet.
Note 2 à l’article: On considère que les deux dimensions significativement les plus grandes diffèrent de la dimension
à l’échelle nanométrique d’un facteur supérieur à trois.
Note 3 à l’article: Les dimensions externes les plus grandes ne sont pas nécessairement à l’échelle nanométrique.
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