IEC PAS 62206:2000

Power and temperature cycling

Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.

General Information

• Status: Replaced
• Publication Date: 27-Nov-2000
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 10-Mar-2004

Relations

• Replaced By: IEC 60749-34:2004 - Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
• Effective Date: 05-Sep-2023

Standards Content (Sample)

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Edition 1.0
2000-11
Power and temperature cycling
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IN TER N A TION AL Reference number
E L E C T R OT E CHNI CA L
IEC/PAS 62206
C O MMI S S I O N
Copyright © 1996, JEDEC; 2000, IEC

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
POWER AND TEMPERATURE CYCLING
FOREWORD
A PAS is a technical specification not fulfilling the requirements for a standard, but made available to the
public and established in an organization operating under given procedures.
IEC-PAS 62206 was submitted by JEDEC and has been processed by IEC technical committee 47: Semiconductor
devices.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document:
Draft PAS Report on voting
47/1514/PAS 47/1544/RVD
Following publication of this PAS, the technical committee or subcommittee concerned will investigate the
possibility of transforming the PAS into an International Standard.
An IEC-PAS licence of copyright and assignment of copyright has been signed by the IEC and JEDEC and is
recorded at the Central Office.
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-
operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees;
any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International,
governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions
determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all interested
National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form of
standards, technical specifications, technical reports or guides and they are accepted by the National Committees in
that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards
transparently to the maximum extent possible in their national and regional standards. Any divergence between the
IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this PAS may be the subject of patent rights. The
IEC shall not be held responsible for identifying any or all such patent rights.
Page i
Copyright © 1996, JEDEC; 2000, IEC
EIA/JESD22-A105-B
Page 1
TEST METHOD A105-B
POWER AND TEMPERATURE CYCLING
(From Council Ballot JCB-95-85, formulated under the cognizance of JC-14.1 Committee on

Reliability Test Methods for Packaged Devices)
1 Purpose
The power and temperature cycling test is performed to determine the ability of a device to
withstand alternate exposures at high and low temperature extremes with operating biases
periodically applied and removed. It is intended to simulate worst case conditions
encountered in typical applications.
The power and temperature cycling test is considered destructive. It is intended for device
qualification.
2 Apparatus
The apparatus required for this test shall consist of a controlled temperature chamber capable
of produci
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