IEC 61788-3:2006
(Main)Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors
Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors
This part of IEC 61788 covers a test method for the determination of the dc critical current of short and straight Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without an applying external magnetic field. For all tests in a magnetic field, the magnetic field is perpendicular to the length of the specimen. In the test of a tape specimen in a magnetic field, the magnetic field is parallel or perpendicular to the wider tape surface (or one surface if square). The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard.
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INTERNATIONAL IEC
STANDARD 61788-3
Second edition
2006-04
Superconductivity –
Part 3:
Critical current measurement –
DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
Reference number
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INTERNATIONAL IEC
STANDARD 61788-3
Second edition
2006-04
Superconductivity –
Part 3:
Critical current measurement –
DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
IEC 2006 Copyright - all rights reserved
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– 2 – 61788-3 IEC:2006(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative reference .6
3 Terms and definitions .6
4 Principle .8
5 Requirements .8
6 Apparatus.8
7 Specimen preparation.9
8 Measurement procedure.10
9 Precision and accuracy of the test method.11
10 Calculation of results .12
11 Test report.13
Annex A (informative) Additional information relating to Clauses 1 to 10 .15
Annex B (informative) Magnetic hysteresis of the critical current of high-temperature
oxide superconductors.21
Bibliography.23
Figure 1 – Intrinsic U-I characteristic .14
Figure 2 – U-I characteristic with a current transfer component.14
Figure A.1 – Illustration of a measurement configuration for a short specimen of a few
hundred A class conductors .20
Figure A.2 – Illustration of superconductor simulator circuit .20
Table A.1 – Thermal expansion data of Bi-oxide superconductor and selected materials .19
61788-3 IEC:2006(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
__________
SUPERCONDUCTIVITY –
Part 3: Critical current measurement –
DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
FOREWORD
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rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61788-3 has been prepared by IEC technical committee 90:
Superconductivity.
This second edition cancels and replaces the first edition published in 2000. Modifications made
to the second version mostly involve wording and essentially include no technical changes.
Examples of technical changes introduced include the voltage lead diameter being smaller than
0,21 mm and the mode of expression for magnetic field accuracy being ±1 % and ±0,02 T
instead of 1 %. The expression for magnetic field precision has been changed in the same way.
The text of this standard is based on the following documents:
FDIS Report on voting
90/184/FDIS 90/190/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
– 4 – 61788-3 IEC:2006(E)
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61788 consists of the following parts, under the general title Superconductivity:
Part 1: Critical current measurement – DC critical current of Cu/Nb-Ti composite super-
conductors
Part 2: Critical current measurement – DC critical current of Nb Sn composite super-
conductors
Part 3: Critical current measurement – DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
Part 4: Residual resistance ratio measurement – Residual resistance ratio of Nb-Ti
composite superconductors
Part 5: Matrix to superconductor volume ratio measurement – Copper to superconductor
volume ratio of Cu/Nb-Ti composite superconductors
Part 6: Mechanical properties measurement – Room temperature tensile test of Cu/Nb-Ti
composite superconductors
Part 7: Electronic characteristic measurements – Surface resistance of superconductors at
microwave frequencies
Part 8: AC loss measurements – Total AC loss measurement of Cu/Nb-Ti composite
superconducting wires exposed to a transverse alternating magnetic field by a pickup
coil method
Part 9: Measurements for bulk high temperature superconductors – Trapped flux density of
large grain oxide superconductors
Part 10: Critical temperature measurement – Critical temperature of Nb-Ti, Nb Sn, and
Bi-system oxide composite superconductors by a resistance method
Part 11: Residual resistance ratio measurement – Residual resistance ratio of Nb Sn
composite superconductors
Part 12: Matrix to superconductor volume ratio measurement – Copper to non-copper volume
ratio of Nb Sn composite superconducting wires
Part 13: AC loss measurements – Magnetometer methods for hysteresis loss in Cu/Nb-Ti
multifilamentary composites
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
61788-3 IEC:2006(E) – 5 –
INTRODUCTION
In 1986 J.G. Bednorz and K.A. Mueller discovered that some Perovskite type Cu-containing
oxides show superconductivity at temperatures far above those which metallic superconductors
have shown. Since then, extensive R & D work on high-temperature oxide superconductors has
been and is being made worldwide, and its application to high-field magnet machines, low-loss
)
power transmission, electronics and many other technologies is in progress [1].
Fabrication technology is essential to the application of high-temperature oxide super-
conductors. Among high-temperature oxide superconductors developed so far, BiSrCaCu oxide
(Bi-2212 and Bi-2223) superconductors have been the most successful at being fabricated into
wires and tapes of practical length and superconducting properties. These conductors can be
wound into a magnet to generate a magnetic field of several tesla [2]. It has also been shown
that Bi-2212 and Bi-2223 conductors can substantially raise the limit of magnetic field
generation by a superconducting magnet [3].
In summer 1993, VAMAS-TWA16 started working on the test methods of critical currents in
Bi-oxide superconductors. In September 1997, the TWA16 worked out a guideline (VAMAS
guideline) on the critical current measurement method for Ag-sheathed Bi-2212 and Bi-2223
oxide superconductors. This pre-standardization work of VAMAS was taken as the base for the
IEC standard, described in the present document, on the dc critical current test method of
Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors.
The test method covered in this International Standard is intended to give an appropriate and
agreeable technical base to those engineers working in the field of superconductivity
technology.
The critical current of composite superconductors like Ag-sheathed Bi-oxide superconductors
depends on many variables. These variables need to be considered in both the testing and the
application of these materials. Test conditions such as magnetic field, temperature and relative
orientation of the specimen and magnetic field are determined by the particular application. The
test configuration may be determined by the particular conductor through certain tolerances.
The specific critical current criterio
...
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