IEC 61445:2012

Digital Test Interchange Format (DTIF)

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

General Information

• Status: Published
• Publication Date: 20-Jun-2012
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 25.040.01 - Industrial automation systems in general
• ICS: 35.060 - Languages used in information technology
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 31-Mar-2012
• Completion Date: 21-Jun-2012

Standards Content (Sample)

IEC 61445
Edition 1.0 2012-06
™
IEEE Std 1445
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)

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IEC 61445
Edition 1.0 2012-06
IEEE Std 1445™
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XD
ICS 25.040; 35.060 ISBN 978-2-83220-105-3


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IEEE Std 1445-1998
Digital Test
Interchange Format (DTIF)
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