Digital Test Interchange Format (DTIF)

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

General Information

Status
Published
Publication Date
20-Jun-2012
Current Stage
PPUB - Publication issued
Start Date
21-Jun-2012
Completion Date
21-Jun-2012
Ref Project

Buy Standard

Standard
IEC 61445:2012 - Digital Test Interchange Format (DTIF)
English language
101 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 61445
Edition 1.0 2012-06
IEEE Std 1445
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)
IEC 61445:2012(E) IEEE Std 1445-1998
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 1999 IEEE

All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of

Electrical and Electronics Engineers, Inc.

Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,

electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central

Office.

Any questions about IEEE copyright should be addressed to the IEEE. Enquiries about obtaining additional rights to

this publication and other information requests should be addressed to the IEC or your local IEC member National

Committee.
IEC Central Office Institute of Electrical and Electronics Engineers, Inc.
3, rue de Varembé 3 Park Avenue
CH-1211 Geneva 20 New York, NY 10016-5997
Switzerland United States of America
Tel.: +41 22 919 02 11 stds.info@ieee.org
Fax: +41 22 919 03 00 www.ieee.org
info@iec.ch
www.iec.ch
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigenda or an amendment might have been published.
Useful links:

IEC publications search - www.iec.ch/searchpub Electropedia - www.electropedia.org

The advanced search enables you to find IEC publications The world's leading online dictionary of electronic and

by a variety of criteria (reference number, text, technical electrical terms containing more than 30 000 terms and

committee,…). definitions in English and French, with equivalent terms in

It also gives information on projects, replaced and additional languages. Also known as the International

withdrawn publications. Electrotechnical Vocabulary (IEV) on-line.

IEC Just Published - webstore.iec.ch/justpublished Customer Service Centre - webstore.iec.ch/csc

Stay up to date on all new IEC publications. Just Published If you wish to give us your feedback on this publication

details all new publications released. Available on-line and or need further assistance, please contact the

also once a month by email. Customer Service Centre: csc@iec.ch.
---------------------- Page: 2 ----------------------
IEC 61445
Edition 1.0 2012-06
IEEE Std 1445™
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
ICS 25.040; 35.060 ISBN 978-2-83220-105-3

Warning! Make sure that you obtained this publication from an authorized distributor.

---------------------- Page: 3 ----------------------

LL
IEC 61445:2012
IEEE Std 1445-1998
&RQWHQWV

 2YHUYLHZ

 6FRSH

 3XUSRVH

 $SSOLFDWLRQ

 5HIHUHQFHV

 'HÀQLWLRQVDQGDFURQ\PV

 'HÀQLWLRQV

 $FURQ\PV

 'DWDRUJDQL]DWLRQRYHUYLHZRIWKH'7,)VWDQGDUGHQYLURQPHQW

 8870RGHO*URXS

 6WLPXOXVDQG5HVSRQVH*URXS

 )DXOW'LFWLRQDU\*URXS

 3UREH*URXS

 )LOHVSHFLÀFDWLRQV

 +($'(5ÀOH

 67,08/86ÀOH

 32B5(63216(ÀOH

 3,B1$0(6ÀOH

 32B1$0(6ÀOH

 0$,1B02'(/ÀOH

 &20321(17B7<3(ÀOH

 86(5B12'(ÀOH

 ,1387B3,1B1$0(6ÀOH

287387B3,1B1$0(6ÀOH

1($5B)5206B32,17(56ÀOH

1($5B)5206ÀOH

(9(17ÀOH

6(77/('B67$7(B21/<ÀOH

6(77/('B67$7(B B38/6(6ÀOH

12'(B6285&(ÀOH

67(36ÀOH

)'B323$76ÀOH

)'B)$8/7B6,*1$785(6ÀOH

)'B35,17B675,1*6ÀOH

75,67$7(B)5206B32,17(56ÀOH

75,67$7(B)5206ÀOH

36(8'23,B1$0(6ÀOH

7,0,1*B6(76ÀOH

7,0,1*B3(5B3$77(51ÀOH

3+$6(B&211(&7,216ÀOH

$8;,/,$5

3,B)250$76ÀOH

)250$7B$775,%87(6ÀOH

---------------------- Page: 4 ----------------------

,(&
LLL
,(((6WG8

)'B&5266B5()(5(1&(ÀOH

352%(7$*B'(),1,7,216ÀOH

352%(7$*B$66,*10(176ÀOH

%85676ÀOH

67,08/86B7(;7ÀOH

12'(B1$0(6ÀOH

(9(176B,1,7ÀOH

(48,9B)$8/76ÀOH

352%(B'(7(&7,21ÀOH

)'B(48,9B6(76ÀOH

 &RQIRUPDQFH

 (QGWRHQGWHVW

 'LDJQRVWLFWHVWXVLQJIDXOWGLFWLRQDU\

 'LDJQRVWLFWHVWXVLQJSUREH

$QQH[$ LQIRUPDWLYH ,PSOHPHQWDWLRQRYHUYLHZ

$QQH[% LQIRUPDWLYH '7,)GHSHQGHQF\GLDJUDPV

$QQH[& LQIRUPDWLYH ([DPSOHFLUFXLW

$QQH[' L /888.  



---------------------- Page: 5 ----------------------
LY
IEC 61445:2012
IEEE Std 1445-1998
Digital Test
Interchange Format (DTIF)
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all

national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-

operation on all questions concerning standardization in the electrical and electronic fields. To this end and in

addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation

is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may

participate in this preparatory work. International, governmental and non-governmental organizations liaising with

the IEC also participate in this preparation.

IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the

IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus

development process, which brings together volunteers representing varied viewpoints and interests to achieve the

final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE

administers the process and establishes rules to promote fairness in the consensus development process, IEEE

does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards.

Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to

important notices and legal disclaimers (see http://standards.ieee.org/IPR/disclaimers.html for more information).

IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two

organizations.

2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of

opinion on the relevant subjects since each technical committee has representation from all interested IEC National

Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and

Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested

parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is

given by the IEEE Standards Association (IEEE-SA) Standards Board.

3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National

Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content

of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or

for any misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

(including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional

publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional

publication shall be clearly indicated in the latter.

5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for

any services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts

and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the

Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any

personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs

(including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE

Publication or any other IEC or IEEE Publications.

8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material

covered by patent rights. By publication of this standard, no position is taken with respect to the existence or

validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying

Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope

of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission

of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this

standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of

such rights, is entirely their own responsibility.
---------------------- Page: 6 ----------------------
,(& Y
,(((6WG8

International Standard IEC 61445/ IEEE Std 1445-1998 has been processed through IEC

technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement.

The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1445-1998 93/321/FDIS 93/328/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

The IEC Technical Committee and IEEE Technical Committee have decided that the contents of

this publication will remain unchanged until the stability date indicated on the IEC web site under

"http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication

will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
---------------------- Page: 7 ----------------------
YL
IEC 61445:2012
IEEE Std 1445-1998
IEEE Std 1445™-1998(R2009)
IEEE Standard for Digital Test
Interchange Format (DTIF)
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Reaffirmed 9 December 2009
Approved 8 December 1998
IEEE-SA Standards Board
Reaffirmed 8 July 2004
Approved 16 November 1999
American National Standards Institute

Abstract: The information content and the data formats for the interchange of digital test program

data between digital automated test program generators (DATPGs) and automatic test equipment

(ATE) for board-level printed circuit assemblies are defined. This information can be broadly

grouped into data that defines the following: UUT Model, Stimulus and Response, Fault Dictionary,

and Probe.

Keywords: automatic test equipment (ATE), digital automated test program generator (DATPG),

digital test interchange format (DTIF), Fault Dictionary data
The Institute of Electrical and Electronics Engineers, Inc.
345 East 47th Street, New York, NY 10017-2394, USA
Copyright © 1999 by the Institute of Electrical and Electronics Engineers, Inc.

All rights reserved. Published 10 March 1999. Printed in the United States of America.

---------------------- Page: 8 ----------------------
,(& YLL
,(((6WG8
IEEE Introduction

>7KLVLQWURGXFWLRQLVQRWSDUWRI,(((6WG,(((6WDQGDUGIRU'LJLWDO7HVW,QWHUFKDQJH)RUPDW '7,) @

$GLJLWDODXWRPDWHGWHVWSURJUDPJHQHUDWRU '$73* SURGXFHVWHVWSDWWHUQDQGGLDJQRVWLFGDWDWKDWFDQEH

XVHGIRUWHVWLQJSULQWHGFLUFXLWDVVHPEOLHVRQDXWRPDWLFWHVWHTXLSPHQW $7( 7KHXVHRIVHYHUDO'$73*V

DOOZLWKLQGLYLGXDORXWSXWIRUPDWVFUHDWHGDQHHGIRUPDQ\XQLTXHSRVWSURFHVVRUVWREHGHYHORSHGDQG

PDLQWDLQHGIRUWKHOLIHRIWKH$7(7KHVHSRVWSURFHVVRUVVXSSRUWHGWKHOLQNIURPVSHFLÀF'$73*VWR

VSHFLÀFWHVWHUV7KHSUROLIHUDWLRQRIXQLTXHIRUPDWVDQGSRVWSURFHVVRUVFUHDWHGORJLVWLFDOVXSSRUWSUREOHPV

DQGWKHUHIRUHLGHQWLÀHGDQHHGIRUVWDQGDUGL]DWLRQ$'$73*DQG$7(LQGHSHQGHQWRXWSXWGDWDIRUPDWLV

UHTXLUHGWROLPLWWKHQXPEHURISRVWSURFHVVRUV RQHIRUHDFK$7( UHTXLULQJOLIHF\FOHVXSSRUW7KHGLJLWDO

WHVWLQWHUFKDQJHIRUPDW '7,) ZDVFKRVHQEHFDXVHRILWVZLGHXVHDQGEHFDXVHLWZDVEHFRPLQJNQRZQLQ

LQGXVWU\DVWKHGHIDFWRVWDQGDUG

7KLVGRFXPHQWSURYLGHVWKHEDVLVWRVWDQGDUGL]HGLJLWDOWHVWLQIRUPDWLRQIRUXVHRQ$7(7KHGLJLWDOWHVW

LQIRUPDWLRQFRQVLVWVRIWKHXQLWXQGHUWHVW 887 0RGHOLQIRUPDWLRQ6WLPXOXVDQG5HVSRQVHGDWD)DXOW

'LFWLRQDU\GDWDDQG3UREHGDWD

'7,)LVXQLTXHIURPRWKHUVWDQGDUGVVXFKDV,(((3 'UDIWGDWHG-XO\  'UDIW6WDQGDUG7HVW

,QWHUIDFH/DQJXDJH 67,/ IRU'LJLWDO7HVW9HFWRU'DWDDQG,(((6WG,(((6WDQGDUGIRU

:DYHIRUPDQG9HFWRU([FKDQJH6SHFLÀFDWLRQ :$9(6 67,/LVEHLQJGHYHORSHGWRVWDQGDUGL]HWKHRXWSXW

LQWHUIDFHRIH[LVWLQJFRPSXWHUDLGHGHQJLQHHULQJ &$( WRROVZLWKWKHLQSXWLQWHUIDFHRI$7(IRULQWHJUDWHG

FLUFXLW ,& WHVWLQJRQO\:$9(6LVDKDUGZDUHGHVFULSWLYHODQJXDJHXVHGIRUGHÀQLQJVWLPXOXVDQGUHVSRQVH

DQGWKHLUDVVRFLDWHGWLPLQJIRU,&ERDUGOHYHOGHVLJQ1HLWKHU67,/QRU:$9(6SURYLGHVIRUERDUGOHYHO

IDXOWGLDJQRVWLFV

$IXWXUHUHYLVLRQRIWKLVVWDQGDUGZLOOFRQVLGHUWKHXVHRIWKHLQIRUPDWLRQPRGHO

,(((3LVDQ,(((DXWKRUL]HGVWDQGDUGVSURMHFWWKDWZDVQRWDSSURYHGE\WKH,(((6$6WDQGDUGV%RDUG

DWWKHWLPHWKLVSXEOLFDWLRQZHQWWRSUHVV)RULQIRUPDWLRQDERXWREWDLQLQJWKHGUDIWFRQWDFWWKH,(((

---------------------- Page: 9 ----------------------

IEC 61445:2012
- 1 -
IEEE Std 1445-1998
Digital Test Interchange Format (DTIF)
2YHUYLHZ

7KHGLJLWDOWHVWLQWHUFKDQJHIRUPDW '7,) LVGHVLJQHGWRSURYLGHDPHFKDQLVPIRUGLJLWDOWHVWGDWDLQWHU

FKDQJHLQGHSHQGHQWRIVSHFLÀFGLJLWDODXWRPDWHGWHVWSURJUDPJHQHUDWRUV '$73*V DQGWHVWV\VWHPV7KH

'7,)SURYLGHVDQHXWUDOGDWDEDVHIRUWKHGHYHORSPHQWDQGGHOLYHU\RIGLJLWDOVLPXODWLRQEDVHGWHVWSURJUDP

VHWV 736V '7,)IXQFWLRQDOO\VXSSRUWVWKHXQLWXQGHUWHVW 887 0RGHO6WLPXOXVDQG5HVSRQVH)DXOW

'LFWLRQDU\DQG3UREHGDWDEDVHV
6FRSH

7KLVVWDQGDUGGHÀQHVWKHLQIRUPDWLRQFRQWHQWDQGWKHGDWDIRUPDWVIRUWKHLQWHUFKDQJHRIGLJLWDOWHVWSURJUDP

GDWDEHWZHHQ'$73*VDQGDXWRPDWLFWHVWHTXLSPHQW $7( IRUERDUGOHYHOSULQWHGFLUFXLWDVVHPEOLHV7KLV

LQIRUPDWLRQFDQEHEURDGO\JURXSHGLQWRGDWDWKDWGHÀQHVWKHIROORZLQJ
D 8870RGHO
E 6WLPXOXVDQG5HVSRQVH
F )DXOW'LFWLRQDU\
G 3UREH
3XUSRVH

7KHSXUSRVHRIWKLVVWDQGDUGLVWRSURYLGHDVWDQGDUGRXWSXWIRUPDWIRUWHVWGDWDJHQHUDWHGE\D'$73*$

'$73*SURGXFHVWHVWSDWWHUQVDQGIDXOWGLDJQRVWLFGDWDIRU$7(7KLVGDWDLVXVHGLQDSSOLFDWLRQVVXFKDV

ERDUGOHYHODVVHPEOLHVZKHUHGLDJQRVWLFGDWDLQWHUFKDQJHLVLPSRUWDQW
$SSOLFDWLRQ

7KLVVWDQGDUGLVSULPDULO\LQWHQGHGIRUXVHE\GLJLWDOVLPXODWRUGHYHORSHUVPDLQWDLQHUVDQG736GHYHORSHUV

PDLQWDLQHUV
---------------------- Page: 10 ----------------------

,(&

,(((6WG8
5HIHUHQFHV

7KLVVWDQGDUGVKDOOEHXVHGLQFRQMXQFWLRQZLWKWKHIROORZLQJVWDQGDUGV:KHQWKHIROORZLQJVWDQGDUGVDUH

VXSHUVHGHGE\DQDSSURYHGUHYLVLRQWKHUHYLVLRQVKDOODSSO\

$16,; 5HDII ,QIRUPDWLRQ6\VWHPV³&RGHG&KDUDFWHU6HWV³%LW$PHULFDQ1DWLRQDO

6WDQGDUG&RGHIRU,QIRUPDWLRQ,QWHUFKDQJH %LW$6&,, 
,(((6WG,(((6WDQGDUG'LFWLRQDU\RI(OHFWULFDODQG(OHFWURQLFV7HUPV
'HÀQLWLRQVDQGDFURQ\PV
'HÀQLWLRQV

7KHIROORZLQJGHÀQLWLRQVDUHIRUXVHZLWKWKLVVWDQGDUG)RURWKHUXVHVDQGIRUGHÀQLWLRQVQRWFRQWDLQHG

KHUHLQVHH,(((6WG8QOHVVRWKHUZLVHLQGLFDWHGWKH$73*VXEFRPPLWWHHIRUPXODWHGDOOWHUPV

GHÀQHGLQWKLVVXEFODXVH

EXUVW$VHWRIVWLPXOXVSDWWHUQVDQGUHODWHGXQLWXQGHUWHVW 887 UHVSRQVHVWKDWDUHVHWXSDSSOLHG

DQGUHDGDVDJURXS$WHVWSURJUDPPD\HPSOR\PRUHWKDQRQHEXUVWWRSURYLGHWKHVWLPXOLDQGUHVSRQVHV

QHFHVVDU\WRWHVWWKH887

FKDQQHO7KHWHVWHUHOHFWURQLFVDVVRFLDWHGZLWKDGLJLWDOLQSXWRXWSXW ,2 SLQWKDWHLWKHUGULYHVRU

VHQVHVDSDUWLFXODUQRGHRQWKHXQLWXQGHUWHVW 887 

FLUFXLWVLPXODWRU$VRIWZDUHSURJUDPWKDWSUHGLFWVDFLUFXLW·VUHVSRQVHWRDJLYHQVWLPXOXV

GLJLWDODXWRPDWLFWHVWSURJUDPJHQHUDWRU '$73* $SURJUDPRIWHQEDVHGRQVLPXODWLRQWKDWDLGV

LQWKHGHYHORSPHQWRIWHVWSDWWHUQVDQGGLDJQRVWLFLQIRUPDWLRQIURPWKHPRGHORIDXQLWXQGHUWHVW 887 

G\QDPLFSDWWHUQV$VHWRIFRQWUROOHGWLPHYDULDQWSDWWHUQVZLWKLQDWLPHLQWHUYDO

HGJH$ORJLFVWDWHWUDQVLWLRQWKDWLVFRQVLGHUHGLQVWDQWDQHRXVIRUDJLYHQSDWWHUQLQWKHVLPXODWLRQSUR

FHVV

HQGWRHQGWHVW$WHVWVHTXHQFHWRHVWDEOLVKSDVV IXQFWLRQLQJSURSHUO\ RUIDLO QRWIXQFWLRQLQJSURS

HUO\ FRQGLWLRQV6\QJRQRJRWHVW
IDXOWVHW$JURXSRIRQHRUPRUHIDXOWVZLWKWKHVDPHIDXOWVLJQDWXUH

IDXOWVLJQDWXUH$VHWRIXQLTXHSULPDU\RXWSXWSDWWHUQVLQZKLFKWKHIDXOWZLOOSURGXFHDUHVSRQVHGLI

IHUHQWIURPWKHJRRGPDFKLQHUHVSRQVH

IDXOWWLWOH$WZRSDUWGHVFULSWLRQWKDWLQFOXGHVDQRGHQDPHDQGDIDXOWW\SH>LH8!6$ FRP

SRQHQW8SLQIDXOWW\SH6WXFNDW @
JRQRJRWHVW6HHHQGWRHQGWHVW

$16,SXEOLFDWLRQVDUHDYDLODEOHIURPWKH6DOHV'HSDUWPHQW$PHULFDQ1DWLRQDO6WDQGDUGV,QVWLWXWH:HVWQG6WUHHWWK)ORRU

1HZ

,(((SXEOLFDWLRQVDUHDYDLODEOHIURPWKH,QVWLWXWHRI(OHFWULFDODQG(OHFWURQLFV(QJLQHHUV+RHV/DQH32%R[3LVFDWDZD\

1-86$ KWWSZZZVWDQGDUGVLHHHRUJ 
---------------------- Page: 11 ----------------------

IEC 61445:2012
- 3 -
IEEE Std 1445-1998

ORJLFVWDWH7KHUHSUHVHQWDWLRQDVLPXODWRUXVHVWRGHVFULEHWKHVWDWHRIDFLUFXLWGXULQJGLJLWDOORJLF

VLPXODWLRQ7KHUHDUHIRXUW\SHVRIORJLFVWDWHVWKDWH[LVWLQDW\SLFDOVLPXODWRU=DQG;

PDLQPRGHO7KHWRSOHYHOXQLWXQGHUWHVW 887 PRGHOGHVFULSWLRQWKDWLQFOXGHVDOLVWRIFRPSRQHQW

SDFNDJHVDQGDQHWOLVW

QHWOLVW$SRLQWWRSRLQWGHVFULSWLRQRIWKHLQWHUFRQQHFWLRQVEHWZHHQLQGLYLGXDOFRPSRQHQWVLQD

FLUFXLW

SDWWHUQV$VHWRIXQLWXQGHUWHVW 887 VWLPXOXVDQGH[SHFWHGUHVSRQVHVWDWHV$SDWWHUQFRQWDLQV

RQHXQLWRIORJLFVWDWH ;= GDWDIRUHDFK887LQSXWDQGHDFK887RXWSXWSLQ

SKDVH7KHWLPHZLWKLQDWLPLQJF\FOHZKHQDSULPDU\LQSXWLVLQWUDQVLWLRQEHWZHHQORJLFVWDWHV

SULPDU\LQSXW 3, $QRGHLQDFLUFXLWLQZKLFKWKHWHVWHUFDQDSSO\VWLPXOXV

SULPDU\RXWSXW 32 $QRGHLQDFLUFXLWLQZKLFKWKHWHVWHUFDQREVHUYHDUHVSRQVH

SULPDU\RXWSXWSDWWHUQV 323$7 $VHWRIXQLTXHUHVSRQVHVDWWKHQRGHLQZKLFKDIDXOWRUDJURXS

RIIDXOWVDUHGHWHFWHG
SUREH$WHVWHULQVWUXPHQWXVHGWRREVHUYHWKHVWDWHRIDQRGH
SUREHDEOHQRGH$Q\QRGHWKDWLVSK\VLFDOO\DFFHVVLEOHWRDWHVWHUSUREH

SUREHZLQGRZ7KHSHULRGRIWLPHGXULQJDSDWWHUQZKHQDSUREHFDQFDSWXUHDFWLYLW\RQDQRGH

SURELQJ$IDXOWGLDJQRVWLFWHFKQLTXHWKDWLQFRUSRUDWHVWKHXVHRIDSRUWDEOHGHYLFH KDQGKHOGRU

URERWLF WRPRQLWRURUFDSWXUHXQLWXQGHUWHVW 887 UHVSRQVHGDWD7KHORFDWLRQRIWKHSUREHSODFHPHQWLV

GHWHUPLQHGE\WKHFLUFXLWUHVSRQVHDQGWKHFLUFXLWWRSRORJ\

VLPXODWLRQWLPHXQLW 678 $À[HGXQLWRIWLPHWKDWLVXWLOL]HGGXULQJVLPXODWLRQIRUHYDOXDWLRQRI

GDWD

VNHZ7KHWLPLQJDPELJXLW\DVVRFLDWHGZLWKWKHRFFXUUHQFHRIDQDXWRPDWLFWHVWHTXLSPHQW $7(

,QSXW2XWSXW ,2 HYHQWWKDWLVGXHWRWKHSK\VLFDOOLPLWDWLRQVRIWKH$7(GLJLWDOGULYHUDQGGHWHFWRUHOHF

WURQLFV
VWDWLFSDWWHUQV$VHWRIFRQWUROOHGWLPHLQYDULDQWSDWWHUQV

VWLPXOXV7KHORJLFVWDWHVZLWKLQDSDWWHUQWKDWGULYHVDFLUFXLWPRGHOLQVLPXODWLRQRUDXQLWXQGHU

WHVW 887 RQDQDXWRPDWLFWHVWHTXLSPHQW $7( 

VWUREH7RUHFRUGRUPHDVXUHWKHVWDWHRIDSDUWLFXODUQRGHDWDQLQVWDQWLQWLPH6WURELQJZLOOKDYHD

VNHZDVVRFLDWHGZLWKLW

WKUHVKROGYROWDJH7KHPLQLPXPYROWDJHFRQVLGHUHGWREHDKLJKVWDWHRUWKHPD[LPXPYROWDJH

FRQVLGHUHGWREHDORZVWDWH

WLPLQJDPELJXLW\7KHSHULRGRIWLPHLQDQRGDOWUDQVLWLRQGXULQJZKLFKWKHVWDWHRIWKHQRGHFDQQRW

EHJXDUDQWHHG

WLPLQJJHQHUDWRU7KHIXQFWLRQLQWKHDXWRPDWLFWHVWHTXLSPHQW $7( WKDWVWRUHVDQGSURGXFHV

WLPLQJVHWVRULWVDQDORJRXVFRQVWUXFWLQWKHVLPXODWLRQSURFHVV
---------------------- Page: 12 ----------------------

,(&

,(((6WG8

WLPLQJVHW 76(7 $QDXWRPDWLFWHVWHTXLSPHQW $7( WLPLQJF\FOHGXULQJZKLFKVWLPXOLDUH

DSSOLHGDQGXQLWXQGHUWHVW 887 UHVSRQVHVDUHPHDVXUHG$WLPLQJVHWLQFOXGHVWKHVSHFLÀFDWLRQRIWKH

SDWWHUQSHULRG887LQSXWSLQJURXSLQJVWKDWZLOOWUDQVLWLRQDWDVSHFLÀFWLPHZLWKLQDSDWWHUQDQG887RXW

SXWSLQJURXSLQJVWKDWVKDUHWKHVDPHZLQGRZ

WUDFH$GLDJQRVWLFIDXOWLVRODWLRQSURJUDPWKDWXVHVDSUREHRQDWHVWHU

ZLQGRZ7KHSHULRGRIWLPHGXULQJDSDWWHUQF\FOHZKHQDSULPDU\RXWSXWLVDFWLYHO\PRQLWRUHGE\DQ

DXWRPDWLFWHVWHTXLSPHQW $7( FKDQQHO
$FURQ\PV
$6&,, $PHULFDQ6WDQGDUGV&RGHIRU,QIRUPDWLRQ,QWHUFKDQJH
$7( DXWRPDWLFWHVWHTXLSPHQW
&$( FRPSXWHUDLGHGHQJLQHHULQJ
'$73* GLJLWDODXWRPDWHGWHVWSURJUDPJHQHUDWRU
'7,) GLJLWDOWHVWLQWHUFKDQJHIRUPDW
,& LQWHJUDWHGFLUFXLW
,2 LQSXWRXWSXW
)/$3 IDXOWVHWODVWDQDO\]HG323$7
3, SULPDU\LQSXW
32 SULPDU\RXWSXW
323$7 SULPDU\RXWSXWSDWWHUQV
678 VLPXODWLRQWLPHXQLW
73 WHVWSURJUDP
736 WHVWSURJUDPVHW
76(7 WLPLQJVHW
887 XQLWXQGHUWHVW
'DWDRUJDQL]DWLRQRYHUYLHZRIWKH'7,)VWDQGDUGHQYLURQPHQW

'LJLWDOFLUFXLWVLPXODWRUVIRUWHVWPHDVXUHPHQWDQGGLDJQRVWLFHTXLSPHQWSURYLGHDQHIIHFWLYHZD\WRSUH

GLFW887EHKDYLRU JRRGDQGEDG GXULQJWHVWRQDQ$7(
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.