IEC 61445:2012
(Main)Digital Test Interchange Format (DTIF)
Digital Test Interchange Format (DTIF)
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
General Information
Standards Content (Sample)
IEC 61445
Edition 1.0 2012-06
™
IEEE Std 1445
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)
IEC 61445:2012(E) IEEE Std 1445-1998
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IEC 61445
Edition 1.0 2012-06
IEEE Std 1445™
INTERNATIONAL
STANDARD
Digital Test Interchange Format (DTIF)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XD
ICS 25.040; 35.060 ISBN 978-2-83220-105-3
Warning! Make sure that you obtained this publication from an authorized distributor.
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IEC 61445:2012
IEEE Std 1445-1998
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