IEC 61000-4-11:2004/ISH1:2010

Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Feuille d'interprétation 1 - Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension

General Information

• Status: Published
• Publication Date: 26-Aug-2010
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 28-Jan-2020

Relations

• Revises: IEC 61000-4-11:2004 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• Effective Date: 05-Sep-2023
• Revised: IEC 61000-4-11:2020 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
• Effective Date: 05-Sep-2023

Standards Content (Sample)

– 1 –
SC 77A/Publication 61000-4-11 (2004), Second edition/I-SH 01

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –

Voltage dips, short interruptions and voltage variations immunity tests

INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: Low frequency

phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77A/726/ISH 77A/731/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of the rise-time and fall-time requirements during EUT testing in IEC
61000-4-11:2004: Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations
immunity tests.
1) In IEC 61000-4-11:2004, Table 4 does not apply to EUT (equipment under test) testing.
Table 4 is for generator calibration and design only.
2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for
rise-time and fall-time when testing EUT; therefore, it is not necessary to measure these
parameters during tests.
3) With reference to Table 4, all of the requirements apply to design and calibration of the
generator. The requirements of Table 4 only apply when the load is a non-inductive 100 Ω
resistor. The requirements of Table 4 do not apply during EUT testing.

August 2010 ICS 33.100.20 French text overleaf

– 2 –
SC 77A/Publication 61000-4-11 (2004), Deuxième édition/I-SH 01

COMPATIBILITE ELECTROMAGNETIQUE (CEM) –
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