IEC 61000-4-34:2005+AMD1:2009 CSV

Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

IEC 61000-4-34:2005+A1:2009 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107. This consolidated version consists of the first edition (2005) and its amendment 1 (2009). Therefore, no need to order amendment in addition to this publication.

Compatibilité électromagnétique (CEM) - Partie 4-34: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour matériel ayant un courant d'alimentation de plus de 16 A par phase

La CEI 61000-4-34:2005+A1:2009 définit les méthodes d'essai d'immunité ainsi que la gamme des niveaux d'essais préférés pour les matériels électriques et électroniques connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures brèves et les variations de tension. La présente norme s'applique aux matériels électriques et électroniques dont le courant nominal d'entrée dépasse 16 A par phase. Elle s'applique aux matériels installés dans des environnements résidentiels de même qu'aux matériels industriels, pour l'aspect creux de tension et coupures brèves des équipements, monophasés et triphasés, reliés à des réseaux électriques alternatif de 50 Hz ou 60 Hz. Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. La méthode d'essai décrite dans la présente partie de la CEI 61000 détaille une méthode sans faille pour estimer l'immunité d'un matériel ou d'un système à un phénomène prédéfini. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI.  Cette version consolidée comprend la première édition (2005) et son amendement 1 (2009). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

• Status: Published
• Publication Date: 25-Nov-2009
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Current Stage: PPUB - Publication issued
• Start Date: 26-Nov-2009
• Completion Date: 26-Nov-2009

Overview

IEC 61000-4-34:2005+AMD1:2009 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on electromagnetic compatibility (EMC). This specific part, Part 4-34, establishes the testing and measurement techniques for evaluating the immunity of electrical and electronic equipment with rated mains current exceeding 16 A per phase to voltage dips, short interruptions, and voltage variations. It provides a consistent test methodology for equipment connected to low-voltage a.c. power supply networks-covering both 1-phase and 3-phase systems operating at either 50 Hz or 60 Hz. The standard is essential for manufacturers and users of high-current equipment found in both residential and industrial installations who need to ensure robust performance in the presence of unpredictable power supply disturbances.

Key Topics

• Scope: Applies to electrical and electronic equipment with a rated input current exceeding 16 A per phase, connected to low-voltage supply networks.
• Disturbances Addressed:
  • Voltage dips: Temporary reduction in supply voltage caused by faults or sudden changes in load.
  • Short interruptions: Complete loss of supply voltage for a brief period.
  • Voltage variations: Gradual or rapid changes in supply voltage due to fluctuating loads.
• Test Methods: Defines standardized immunity test procedures, preferred test levels, and parameters for simulating the defined electrical disturbances in a controlled laboratory environment.
• Test Levels:
  • Uses classes to define severity and duration of voltage dips and interruptions based on real-world supply conditions.
• Applicability: Includes most industrial machinery and large residential loads, but excludes equipment for 400 Hz systems.

Applications

IEC 61000-4-34 is widely used across sectors where equipment reliability under power supply anomalies is critical. Key applications include:

• Industrial Automation: Testing robustness of process control equipment, high-power drives, and industrial robots that operate on three-phase supplies.
• Power Distribution: Validation of large switchgear, circuit breakers, and electric panelboards for immunity to voltage instability.
• Medical and Laboratory Equipment: Ensuring critical systems with high mains current demands function correctly during grid disturbances.
• Data Centers and IT Infrastructure: Safeguarding essential IT hardware from outages caused by voltage sags or interruptions.
• Large Residential Installations: Assessing premium appliances and electrical systems that may exceed 16 A per phase.

By following the methods laid out in IEC 61000-4-34, manufacturers and compliance engineers can verify that their products meet global EMC immunity requirements, reduce downtime, and improve product reliability in markets where power quality can be unpredictable.

Related Standards

Several related IEC and EMC standards are important for a comprehensive EMC compliance program:

• IEC 61000-4-11: EMC immunity testing for equipment with mains current of 16 A or less per phase.
• IEC 61000-2-8: Details real-world environments for voltage dips and short interruptions.
• IEC 61000-4-30: Specifies methods for measuring power quality parameters.
• IEC 61000-4-14: Covers immunity testing for voltage fluctuations and flicker.
• IEC Guide 107: Provides guidance on the use of basic EMC publications by product committees.

In summary, IEC 61000-4-34 is an essential reference for anyone involved in the compliance, design, or operation of high-current electrical and electronic equipment, playing a crucial role in ensuring equipment immunity and maintaining dependable utility service in challenging EMC environments.

Standards Content (Sample)

IEC 61000-4-34 ®
Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase
IEC 61000-4-34:2005+A1:2009
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IEC 61000-4-34 ®
Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CG
CODE PRIX
ICS 33.100.20 ISBN 2-8318-1049-2
– 2 – 61000-4-34  IEC:2005+A1:2009
CONTENTS
FOREWORD. 4
INTRODUCTION . 6

1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 General . 9
5 Test levels . 9
5.1 Voltage dips and short interruptions . 10
5.2 Voltage variations (optional) . 11
6 Test instrumentation . 13
6.1 Test generator . 13
6.2 Power source . 14
7 Test set-up . 14
8 Test procedures . 14
8.1 Laboratory reference conditions . 15
8.2 Execution of the test . 15
9 Evaluation of test results . 18
10 Test report . 18

Annex A (normative) Test generator current drive capability . 19
Annex B (informative) Electromagnetic environment classes . 21
Annex C (informative) Vectors for three-phase testing . 22
Annex D (informative) Test instrumentation . 28
Annex E (informative) Dip immunity tests for equipment with large mains current . 31

Bibliography . 33

Figure 1 – Voltage dip – 70 % voltage dip sine wave graph . 12
Figure 2 – Voltage variation . 12
Figure 3a – Phase-to-neutral testing on three-phase systems . 17
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift . 17
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift . 17
Figure 3d – Not acceptable – phase-to-phase testing without phase shift . 17
Figure A.1 – Circuit for determining inrush current drive capability . 20
Figure C.1 – Phase-to-neutral dip vectors . 22
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors . 24
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors . 26
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches . 28

61000-4-34  IEC:2005+A1:2009 – 3 –
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create
the Acceptable Method 1 vectors of Figures C.1, C.2, 4a and 4b . 29
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier . 30

Table 1 – Preferred test level and durations for voltage dips . 10
Table 2 – Preferred test level and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 13
Table A.1 – Minimum peak inrush current capability . 19
Table C.1 – Vector values for phase-to-neutral dips . 23
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips . 25
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips . 27

– 4 – 61000-4-34  IEC:2005+A1:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-34 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-34 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
This consolidated version of IEC 61000-4-34 consists of the first edition (2005) [documents
77A/498/FDIS and 77A/515/RVD] and its amendment 1 (2009) [documents 77A/670/CDV and
77A/688/RVC].
The technical content is therefore identical to the base edition and its amendment and has
been prepared for user convenience.
It bears the edition number 1.1.

61000-4-34  IEC:2005+A1:2009 – 5 –
A vertical line in the margin shows where the base publication has been modified by
amendment 1.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date,
the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – 61000-4-34  IEC:2005+A1:2009
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).

61000-4-34  IEC:2005+A1:2009 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase

1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated mains current
exceeding 16 A per phase. (See Annex E for guidance on electrical and electronic equipment
rated at more than 200 A per phase.) It covers equipment installed in residential areas as well
as industrial machinery, specifically voltage dips and short interruptions for equipment
connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains.
NOTE 1 Equipment with a rated mains current of 16 A or less per phase is covered by publication IEC 61000-4-11.
NOTE 2 There is no upper limit on rated mains current in this publication. However, in some countries, the rated
mains current may be limited to some upper value, for example 75 A or 250 A, because of mandatory safety
standards.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for equipment connected to these networks will be covered by future IEC
standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE 1 Voltage fluctuations are covered by publication IEC 61000-4-14.
NOTE 2 For equipment under test with rated currents above 250 A, suitable test equipment may be difficult to
obtain. In these cases, the applicability of this standard should be carefully evaluated by committees responsible
for generic, product and product-family standards. Alternatively, this standard might be used as a framework for an
agreement on performance criteria between the manufacturer and the purchaser.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described
in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining
whether this immunity test standard should be applied or not, and if applied, they are
responsible for defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
– 8 – 61000-4-34  IEC:2005+A1:2009
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
IEC 61000-4-30, Electromagnetic compatibility (EMC) − Part 4-30: Testing and measurement
techniques – Power quality measurement methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following definitions apply:
3.1
1)
basic EMC standard (ACEC)
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems, and serve as reference
documents for product committees
3.2
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply system
below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operation related to the occurrence and
termination of short circuits on the system or installations connected to it.
3.5
residual voltage (of voltage dip)
minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
malfunction
termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
___________
1)
Advisory Committee on Electromagnetic Compatibility (ACEC).

61000-4-34  IEC:2005+A1:2009 – 9 –
3.7
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
NOTE 1 This term is based on the "uncertainty" approach.
NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle,
by a calibration diagram.
[IEV 311-01-09]
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to demonstrate that the test system is functioning within
the specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The procedure of 6.1.2 is meant as a guide to insure the correct operation of the test generator, and
other items making up the test set-up so that the intended waveform is delivered to the EUT.
NOTE 3 For the purpose of this basic EMC standard this definition is different from the definition given in
IEV 311-01-13.
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short
circuits (see also IEC 61000-2-8), in installations or by sudden large changes of load. In
certain cases, two or more consecutive dips or interruptions may occur. Voltage variations are
caused by continuously varying loads connected to the network.
Voltage dips at equipment terminals are influenced by the transformer connections between
the fault location on the supply system and the equipment connection point. The transformer
connections will influence both the magnitude and the phase relationship of the voltage dip
experienced by the equipment.
These phenomena are random in nature and can be minimally characterized for the purpose
of laboratory simulation in terms of the deviation from the rated voltage, and duration.
Consequently, different types of tests are specified in this standard to simulate the effects
of abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment as a basis for voltage
test level specification (U ).
T
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
– 10 – 61000-4-34  IEC:2005+A1:2009
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− the selection of test levels and durations shall take into account the information given in
IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. Unless otherwise specified by the
T
responsible product committee, the start and stop phase angle for the voltage dips and
interruptions shall be 0° (i.e. the positive-going voltage zero-crossing on the dipped phase),
) are used: 0 %, 40 %, 70 % and 80 %,
See 8.2.1. The following test voltage levels (in % U
T
corresponding to voltage dips or interruptions with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1.
For short interruptions, the preferred test levels and durations are given in Table 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many
real world dips, but are not intended to guarantee immunity to all voltage dips. More severe
test levels, for example 0 % test level for 1 s, and balanced three-phase dips, may be
considered by product committees.
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as an interruption.

Table 1 – Preferred test level and durations for voltage dips
a
Classes Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
70 % during
Class 2 0 % during 1 cycle
c
25/30 cycles
d
40 % during 70 % during 80 % during
Class 3 0 % during 1 cycle
c c c
10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the levels
must not be less severe than class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test", “10/12 cycles” means “10 cycles
for 50 Hz test” and “12 cycles for 60 Hz test” and “250/300 cycles” means “250 cycles for 50 Hz test” and “300
cycles for 60 Hz test”.
d
May be replaced by product committee with a test level of 50 % for equipment that is intended primarily for
200 V or 208 V nominal operation.

61000-4-34  IEC:2005+A1:2009 – 11 –
Table 2 – Preferred test level and durations for short interruptions
a
Classes Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test.

5.2 Voltage variations (optional)
This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.
The preferred duration of the voltages changes and the time for which the reduced voltages are to
be maintained are given in Table 3. The rate of change should be constant; however, the voltage
may be stepped. The steps should be positioned at zero crossings, and should be no larger than
10 % of U . Steps under 1 % of U are considered as constant rate of change of voltage.
T T
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced voltage Time for increasing
voltage (t ) (t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test.

For voltage variations in three-phase systems with or without neutral, all the three phases
shall be tested simultaneously. Simultaneous voltage variations in three-phase systems are
positioned at the zero-crossing of one of the voltages.
This shape is the typical shape of a motor starting with a rapid time for decreasing voltage, t ,
d
and slower time for increasing voltage, t
i.
Figure 2 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.

– 12 – 61000-4-34  IEC:2005+A1:2009

U
0 5 25
t (cycles)
IEC  1671/05
NOTE The voltage decreases to 70 % for 25 cycles (50 Hz). Step at zero crossing.
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph

U
T(r.m.s.)
100 %
70 %
0 %
t
t t
d s i
10Time
IEC  1672/05
Figure 2 – Voltage variation
61000-4-34  IEC:2005+A1:2009 – 13 –
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex D.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.
Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.
The output of the generator may be influenced by the generator characteristics, the load
characteristics, and/or the characteristics of the a.c. network that supplies the generator.
6.1.1 Characteristics and performance of the generator
Table 4 – Generator specifications
Output voltage at no load
As required in Table 1, ±5 % of residual voltage value
Voltage at the output of the generator during equipment As required in Table 1, ±10 % of residual voltage value,
test measured as r.m.s. value refreshed each ½ cycle per
IEC 61000-4-30
Output current capability See Annex A
Peak inrush current capability (no requirement for See Annex A
voltage variation tests)
Instantaneous peak overshoot/undershoot of the Less than 5 % of U
T
actual voltage, generator loaded with resistive load –
see NOTE 1
Voltage rise (and fall) time t (and t ), during abrupt Between 1 µs and 5 µs for current ≤75 A
r f
change, generator loaded with resistive load – see
Between 1 µs and 50 µs for current >75 A
NOTE A and NOTE 1
Phase angle at which the voltage dip begins and ends 0° to 360° with a maximum resolution of 5°, see
NOTE B
Phase relationship of voltage dips and interruptions
Less than ±5°
with the power frequency
Zero crossing control of the generators ±10°
NOTE A These values must be checked with a resistive load as per NOTE 1 after this table, but they need not
be checked when an EUT is connected.
NOTE B Phase angle adjustment may be required to comply with 5.1.

Output impedance shall be predominantly resistive.
The output impedance of the test voltage generator shall be low even during transitions when
generating dips. A brief interval (up to 100 μs) of high impedance is permitted during each
transition. For generating interruptions, a high impedance open circuit is permitted.
NOTE 1 The value of the non-inductive resistive load for testing overshoot, undershoot, rise time, and fall time
shall be 100 ohms for generators rated for 50 A or less, 50 ohms for generators rated for more than 50 A and less
or equal than 100 A, and 25 ohms for generators rated more than 100 A.
NOTE 2 To test equipment which regenerates energy, an external resistor connected in parallel to the load can
be added. The test result shall not be influenced by this load.
NOTE 3 A high-impedance interruption, when applied to an inductive load, may generate substantial over-
voltages.
– 14 – 61000-4-34  IEC:2005+A1:2009
6.1.2 Verification of the characteristics of the voltage dips, short interruptions
generators
In order to compare the test results obtained from different test generators, the generator
characteristics shall be verified according to the following:
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall conform to
those percentages of the selected operating voltage: 230 V, 120 V, etc.;
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall be
measured at no load, and shall be maintained within the specified percentage of the U ;
T
– the voltage at the output of the generator shall be monitored during tests as an r.m.s.
value refreshed each ½ cycle, and shall be maintained within the specified percentage
throughout the tests.
NOTE If it can be demonstrated that the equipment peak current requirements are sufficiently small as not to
influence the voltage at the output of the generator, it is not necessary to monitor the output voltage during tests.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching at both 90°
and 270°, from 0 % to 100 %, 100 % to 80 %, 100 % to 70 %, 100 % to 40 %, and 100 % to 0 %.
Phase angle accuracy shall be verified for switching from 0 % to 100 % and 100 % to 0 %,
at nine phase angles from 0 to 315° in 45° increments. It shall also be verified for switching
from 100 % to 80 % and 80 % to 100 %, 100 % to 70 % and 70 % to 100 %, as well as from
100 % to 40 % and 40 % to 100 %, at 90° and 180°.
6.2 Power source
The frequency of the test voltage shall be within ±2 % of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the shortest
power supply cable as specified by the EUT manufacturer. If no cable length is specified, it
shall be the shortest possible length suitable to the application of the EUT.
The test set-ups for the three types of phenomena described in this standard are:
– voltage dips;
– short interruptions;
– voltage variations with gradual transition between the rated voltage and the changed
voltage (optional).
Examples of test set-ups are given in Annex D.
8 Test procedures
Caution should be exercised during the set-up and execution of these tests. EUT and test
equipment shall not become dangerous or unsafe as a result of the application of the tests
defined in this part of IEC 61000. Precautions should be taken to avoid dangerous and unsafe
situations for personnel, the EUT, and the test equipment.
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is intended to be used.
Systems may require a precise pre-analysis to define which system configurations must be
tested to reproduce field situations.

61000-4-34  IEC:2005+A1:2009 – 15 –
Test cases must be explained and indicated in the Test report.
It is recommended that the test plan include the following items:
– the type designation of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables, and
peripherals;
– input power port of equipment to be tested;
– information about the inrush current requirements of the equipment;
– representative operational modes of the EUT for the test;
– performance criteria used and defined in the technical specifications;
– operational mode(s) of equipment;
– description of the test set-up.
If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and
after the tests. After each group of tests, a full functional check shall be performed.
8.1 Laboratory reference conditions
8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on
the EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the correct
operation of the EUT in order not to influence the test results.
8.2 Execution of the test
During the tests, the mains voltage for testing shall be monitored within an accuracy of 2 %.
8.2.1 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test
event). Each representative mode of operation shall be tested.
For voltage dips, changes in supply voltage shall occur at 0° (positive-going zero crossing of
the voltage). Additional angles considered critical may be selected by product committees or
individual product specifications preferably from 45°, 90°, 135°, 180°, 225°, 270° and 315° on
each phase.
– 16 – 61000-4-34  IEC:2005+A1:2009
For short interruptions, the starting angle shall be defined by the product committee as the
worst case. In the absence of definition, it is recommended to use 0° for one of the phases.
For short interruptions test of three-phase systems, all the three phases shall be
simultaneously tested as per 5.1.
For voltage dips test of single-phase systems, the voltage shall be tested as per 5.1. This
implies one series of tests.
For voltage dips test of three-phase systems with neutral, each individual voltage (phase-to-
neutral and phase-to-phase) shall be tested, one at a time, as per 5.1. This implies six
different series of tests. See Figure 3a, Figure 3b and Figure 3c.
For voltage dips test of three-phase systems without neutral, each phase-to-phase voltage
shall be tested, one at a time, as per 5.1. This implies three different series of tests. See
Annex C. See Figure 3b, and Figure 3c.
NOTE 1 For three-phase systems, during a dip on a phase-to-phase voltage, a change will occur on one or two of
the other voltages as well.
NOTE 2 For phase-to-phase testing on three-phase systems, the vectors of Figure 3b represents Acceptable
Method 1, and the vectors of Figure 3c represent Acceptable Method 2. The Acceptable Method 1 vectors shown
in Figure 3b may be easier for test labs to generate. See Annex D, Figure D.1. The Acceptable Method 2 vectors
shown in Figure 3c may be more representative of real-world dips. There may be significant differences between
results when comparing the vectors of Figure 3b to the vectors of Figure 3c.
For EUTs with more than one power cord, each power cord should be tested individually.

61000-4-34  IEC:2005+A1:2009 – 17 –

70 %
70 %
70 %
IEC  1673/05
NOTE Phase-to-neutral testing on three-phase systems is performed one phase at a time.
Figure 3a – Phase-to-neutral testing on three-phase systems

70 %
70 %
70 %
IEC  1674/05
NOTE Phase-to-phase testing on three-phase systems is also performed one phase at a time
Figure 3b – Phase-to-phase testing on three-phase systems –
Acceptable Method 1 phase shift

70 %
70 %
70 %
IEC  1675/05
Figure 3c – Phase-to-phase testing on three-phase systems –
Acceptable Method 2 phase shift

70 % 70 %
70 %
IEC  1676/05
Figure 3d – Not acceptable – phase-to-phase testing without phase shift
Figure 3 – Testing on three-phase systems

– 18 – 61000-4-34  IEC:2005+A1:2009
8.2.2 Voltage variations (optional)
The EUT is tested to each of the specified voltage variations, three times at 10 s intervals for
the most representative modes of operations.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows:
a) normal performance within limits specified by the manufacturer, requestor or purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c) temporary loss of function or degradation of performance, the correction of which requires
operator intervention;
d) loss of function or degradation of performance which is not recoverable, owing to damage
to hardware or software, or loss of data.
The manufacturer's specification may define effects on the EUT which may be considered
insignificant, and therefore acceptable.
This classific
...