IEC 61000-4-34:2005+AMD1:2009 CSV

Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase

IEC 61000-4-34:2005+A1:2009 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107. This consolidated version consists of the first edition (2005) and its amendment 1 (2009). Therefore, no need to order amendment in addition to this publication.

Compatibilité électromagnétique (CEM) - Partie 4-34: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour matériel ayant un courant d'alimentation de plus de 16 A par phase

La CEI 61000-4-34:2005+A1:2009 définit les méthodes d'essai d'immunité ainsi que la gamme des niveaux d'essais préférés pour les matériels électriques et électroniques connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures brèves et les variations de tension. La présente norme s'applique aux matériels électriques et électroniques dont le courant nominal d'entrée dépasse 16 A par phase. Elle s'applique aux matériels installés dans des environnements résidentiels de même qu'aux matériels industriels, pour l'aspect creux de tension et coupures brèves des équipements, monophasés et triphasés, reliés à des réseaux électriques alternatif de 50 Hz ou 60 Hz. Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. La méthode d'essai décrite dans la présente partie de la CEI 61000 détaille une méthode sans faille pour estimer l'immunité d'un matériel ou d'un système à un phénomène prédéfini. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI.  Cette version consolidée comprend la première édition (2005) et son amendement 1 (2009). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

• Status: Published
• Publication Date: 25-Nov-2009
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Current Stage: PPUB - Publication issued
• Start Date: 26-Nov-2009
• Completion Date: 26-Nov-2009

Standards Content (Sample)

IEC 61000-4-34
®

Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase
IEC 61000-4-34:2005+A1:2009

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
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---------------------- Page: 2 ----------------------
IEC 61000-4-34
®

Edition 1.1 2009-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase

Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CG
CODE PRIX
ICS 33.100.20 ISBN 2-8318-1049-2
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 61000-4-34  IEC:2005+A1:2009
CONTENTS
FOREWORD. 4
INTRODUCTION . 6

1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 General . 9
5 Test levels . 9
5.1 Voltage dips and short interruptions . 10
5.2 Voltage variations (optional) . 11
6 Test instrumentation . 13
6.1 Test generator . 13
6.2 Power source . 14
7 Test set-up . 14
8 Test procedures . 14
8.1 Laboratory reference conditions . 15
8.2 Execution of the test . 15
9 Evaluation of test results . 18
10 Test report . 18

Annex A (normative) Test generator current drive capability . 19
Annex B (informative) Electromagnetic environment classes . 21
Annex C (informative) Vectors for three-phase testing . 22
Annex D (informative) Test instrumentation . 28
Annex E (informative) Dip immunity tests for equipment with large mains current . 31

Bibliography . 33

Figure 1 – Voltage dip – 70 % voltage dip sine wave graph . 12
Figure 2 – Voltage variation . 12
Figure 3a – Phase-to-neutral testing on three-phase systems . 17
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift . 17
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift . 17
Figure 3d – Not acceptable – phase-to-phase testing without phase shift . 17
Figure A.1 – Circuit for determining inrush current drive capability . 20
Figure C.1 – Phase-to-neutral dip vectors . 22
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors . 24
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors . 26
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches . 28

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61000-4-34  IEC:2005+A1:2009 – 3 –
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create
the Acceptable Method 1 vectors of Figures C.1, C.2, 4a and 4b . 29
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier . 30

Table 1 – Preferred test level and durations for voltage dips . 10
Table 2 – Preferred test level and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 13
Table A.1 – Minimum peak inrush current capability . 19
Table C.1 – Vector values for phase-to-neutral dips . 23
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips . 25
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips . 27

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– 4 – 61000-4-34  IEC:2005+A1:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase



FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-34 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-34 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
This consolidated version of IEC 61000-4-34 consists of the first edition (2005) [documents
77A/498/FDIS and 77A/515/RVD] and its amendment 1 (2009) [documents 77A/670/CDV and
77A/688/RVC].
The technical content is therefore identical to the base edition and its amendment and has
been prepared for user convenience.
It bears the edition number 1.1.

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61000-4-34  IEC:2005+A1:2009 – 5 –
A vertical line in the margin shows where the base publication has been modified by
amendment 1.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date,
the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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– 6 – 61000-4-34  IEC:2005+A1:2009
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).

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61000-4-34  IEC:2005+A1:2009 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase



1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated mains current
exceeding 16 A per phase. (See Annex E for guidance on electrical and electronic equipment
rated at more than 200 A per phase.) It covers equipment installed in residential areas as well
as industrial machinery, specifically voltage dips and short interruptions for equipment
connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains.
NOTE 1 Equipment with a rated mains current of 16 A or less per phase is covered by publication IEC 61000-4-11.
NOTE 2 There is no upper limit on rated mains current in this publication. However, in some countries, the rated
mains current may be limited to some upper value, for example 75 A or 250 A, because of mandatory safety
standards.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for equipment connected to these networks will be covered by future IEC
standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE 1 Voltage fluctuations are covered by publication IEC 61000-4-14.
NOTE 2 For equipment under test with rated currents above 250 A, suitable test equipment may be difficult to
obtain. In these cases, the applicability of this standard should be carefully evaluated by committees responsible
for generic, product and product-family standards. Alternatively, this standard might be used as a framework for an
agreement on performance criteria between the manufacturer and the purchaser.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described
in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining
whether this immunity test standard should be applied or not, and if applied, they are
responsible for defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility

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– 8 – 61000-4-34  IEC:2005+A1:2009
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
IEC 61000-4-30, Electromagnetic compatibility (EMC) − Part 4-30: Testing and measurement
techniques – Power quality measurement methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following definitions apply:
3.1
1)
basic EMC standard (ACEC)
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems, and serve as reference
documents for product committees
3.2
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply system
below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operation related to the occurrence and
termination of short circuits on the system or installations connected to it.
3.5
residual voltage (of voltage dip)
minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.

3.6
malfunction
termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
___________
1)
Advisory Committee on Electromagnetic Compatibility (ACEC).

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61000-4-34  IEC:2005+A1:2009 – 9 –
3.7
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
NOTE 1 This term is based on the "uncertainty" approach.
NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle,
by a calibration diagram.
[IEV 311-01-09]
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to demonstrate that the test system is functioning within
the specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The procedure of 6.1.2 is meant as a guide to insure the correct operation of the test generator, and
other items making up the test set-up so that the intended waveform is delivered to the EUT.
NOTE 3 For the purpose of this basic EMC standard this definition is different from the definition given in
IEV 311-01-13.
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short
circuits (see also IEC 61000-2-8), in installations or by sudden large changes of load. In
certain cases, two or more consecutive dips or interruptions may occur. Voltage variations are
caused by continuously varying loads connected to the network.
Voltage dips at equipment terminals are influenced by the transformer connections between
the fault location on the supply system and the equipment connection point. The transformer
connections will influence both the magnitude and the phase relationship of the voltage dip
experienced by the equipment.
These phenomena are random in nature and can be minimally characterized for the purpose
of laboratory simulation in terms of the deviation from the rated voltage, and duration.
Consequently, different types of tests are specified in this standard to simulate the effects
of abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment as a basis for voltage
test level specification (U ).
T
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T

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– 10 – 61000-4-34  IEC:2005+A1:2009
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− the selection of test levels and durations shall take into account the information given in
IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. Unless otherwise specified by the
T
responsible product committee, the start and stop phase angle for the voltage dips and
interruptions shall be 0° (i.e. the positive-going voltage zero-crossing on the dipped phase),
) are used: 0 %, 40 %, 70 % and 80 %,
See 8.2.1. The following test voltage levels (in % U
T
corresponding to voltage dips or interruptions with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1.
For short interruptions, the preferred test levels and durations are given in Table 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many
real world dips, but are not intended to guarantee immunity to all voltage dips. More severe
test levels, for example 0 % test level for 1 s, and balanced three-phase dips, may be
considered by product committees.
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as an interruption.

Table 1 – Preferred test level and durations for voltage dips
a
Classes Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
70 % during
Class 2 0 % during 1 cycle
c
25/30 cycles
d
40 % during 70 % during 80 % during
Class 3 0 % during 1 cycle
c c c
10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the levels
must not be less severe than class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test", “10/12 cycles” means “10 cycles
for 50 Hz test” and “12 cycles for 60 Hz test” and “250/300 cycles” means “250 cycles for 50 Hz test” and “300
cycles for 60 Hz test”.
d
May be replaced by product committee with a test level of 50 % for equipment that is intended primarily for
200 V or 208 V nominal operation.

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61000-4-34  IEC:2005+A1:2009 – 11 –
Table 2 – Preferred test level and durations for short interruptions
...