IEC TR 61967-4-1:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4

Serves as an application guidance and relates to IEC 61967-4. The division of IC types into -> IC function modules and the software modules for -> cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967. Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification. To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern IC related operating modes, pins and ports to be tested, test set-ups according IEC 61967-4, including description of load circuits and RF path, and IC related emission limits (or limit classes). Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.

General Information

• Status: Published
• Publication Date: 06-Feb-2005
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: SC 47A - Integrated circuits
• Drafting Committee: WG 9 - TC 47/SC 47A/WG 9
• Current Stage: PPUB - Publication issued
• Start Date: 15-Feb-2005
• Completion Date: 07-Feb-2005

Standards Content (Sample)

TECHNICAL IEC


REPORT TR 61967-4-1



First edition
2005-02

Integrated circuits –
Measurement of electromagnetic
emissions, 150 kHz to 1 GHz –
Part 4-1:
Measurement of conducted emissions –
1 Ω/150 Ω direct coupling method –
Application guidance to IEC 61967-4
Reference number
IEC/TR 61967-4-1:2005(E)

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TECHNICAL IEC


REPORT TR 61967-4-1





First edition
2005-02


Integrated circuits –
Measurement of electromagnetic
emissions, 150 kHz to 1 GHz –
Part 4-1:
Measurement of conducted emissions –
1 Ω/150 Ω direct coupling method –
Application guidance to IEC 61967-4

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– 2 – TR 61967-4-1  IEC:2005(E)
CONTENTS
FOREWORD.4

1 Scope .6
2 Normative references .6
3 Terms and definitions .7
4 Splitting ICs into IC function modules.9
4.1 Background .9
4.2 Benefits.9
4.3 IC function modules.9
4.4 Example matrix for splitting ICs into IC function modules .14
5 Workflow to perform IC EMC emission tests .15
5.1 Emission test philosophy .15
5.2 Flowchart of performing emission tests .15
6 Test configurations for IC function modules.16
6.1 EMC test recommendations for IC function modules .
...