IEC 60747-16-4:2004/AMD1:2009

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

Amendement 1 - Dispositifs à semiconducteurs - Partie 16-4: Circuits intégrés hyperfréquences - Commutateurs

General Information

• Status: Published
• Publication Date: 09-Mar-2009
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: SC 47E - Discrete semiconductor devices
• Drafting Committee: WG 2 - TC 47/SC 47E/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 30-Jun-2009
• Completion Date: 10-Mar-2009

Relations

• Merged From: IEC 60747-16-4/AMD1/FRAGF - IEC 60839-10-1
• Effective Date: 05-Sep-2023
• Amends: IEC 60747-16-4:2004 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

IEC 60747-16-4:2004/A1:2009(E)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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International Standards for all electrical, electronic and related technologies.

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IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
F
ICS 31.080.99 ISBN 978-2-88910-283-9
– 2 – 60747-16-4 Amend. 1 © IEC:2009(E)
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/358/CDV 47E/373/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
CONTENTS
5.8 n-th order harmonic distortion ratio (P /P )
nth 1
Replace the title of this subclause by the following new title;
5.8 nth order harmonic distortion ratio (P /P )
1 nth
2 Normative references
Replace the existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
Add, to the existing list, the following new references:
IEC 60747-16-1:2001, Semiconductor devices – Part 16-1: Microwave integrated circuits –
Amplifiers
Amendment 1 (2007)
—————————
There exists a consolidated edition 1.1 published in 2007, including the base publication (2001) and its
Amendment 1 (2007).
60747-16-4 Amend. 1 © IEC:2009(E) – 3 –
IEC 61340-5-1:2007, Electrostatics – Part 5-1: Protection of electronic devices from
electrostatic phenomena – General requirements
IEC/TR 61340-5-2:2007, Electrostatics – Part 5-2: Protection of electronic devices from
electrostatic phenomena – User guide

3 Terms and definitions
Replace the terms, definitions and NOTES 3.1, 3.2 and 3.11 by the following new terms,
definitions and NOTES:
3.1
insertion loss
L
ins
ratio of the input power to the output power at the switched on port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ΔP (dBm) = ΔP (dBm).
o i
NOTE 2 Usually the insertion loss is expressed in decibels.
3.2
isolation
L
iso
ratio of the input power to the output power at the switched off port, in the linear region of the
p
...

IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

Dispositifs à semiconducteurs –
Partie 16-4: Circuits intégrés hyperfréquences – Commutateurs

IEC 60747-16-4:2004/A1:2009
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

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ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
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publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
 Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
 IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
 Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
 Customer Service Centre: www.iec.ch/webstore/custserv
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IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

Dispositifs à semiconducteurs –
Partie 16-4: Circuits intégrés hyperfréquences – Commutateurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE PRICE CODE
F
CODE PRIX
ICS 31.080.99 ISBN 978-2-88912-575-3

– 2 – 60747-16-4 Amend. 1  IEC:2009
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
This bilingual version, published in 2011-07, corresponds to the English version.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/358/CDV 47E/373/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
CONTENTS
5.8 n-th order harmonic distortion ratio (P /P )
nth 1
Replace the title of this subclause by the following new title;
5.8 nth order harmonic distortion ratio (P /P )
1 nth
2 Normative references
Replace the existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
Add, to the existing list, the following new references:

60747-16-4 Amend. 1  IEC:2009 – 3 –
IEC 60747-16-1:2001, Semiconductor devices – Part 16-1: Microwave integrated circuits –
Amplifiers
Amendment 1 (2007)
IEC 61340-5-1:2007, Electrostatics – Part 5-1: Protection of electronic devices from
electrostatic phenomena – General requirements
IEC/TR 61340-5-2:2007, Electrostatics – Part 5-2: Protection of electronic devices from
electrostatic phenomena – User guide

3 Terms and definitions
Replace the terms, definitions and NOTES 3.1, 3.2 and 3.11 by the following new terms,
definitions and NOTES:
3.1
insertion loss
L
ins
ratio of the input power to the output power at the switched on port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ∆P (dBm) = ∆P (dBm).
o i
NOTE 2 Usually the insertion loss is expressed in decibels.
3.2
isolation
L
iso
ratio of the input power to the output power at the switched off port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ∆P (dBm) = ∆P (dBm).
o i
NOTE 2 Usually the isolation is expressed in decibels.
3.11
nth order harmonic distortion ratio
P /P
1 nth
See 3.14 of Amendment 1 of IEC 60747-16-1:2007.

4.1.4 Package identification
Replace, in item b), "drawing, of drawing" by "drawing, or drawing".
4.3.1 Detailed block diagram – functional blocks
Replace, in the last paragraph, "IEC 60617-12 or IEC 60617-13" by "IEC 60617".
4.4.2 Temperatures
Replace the existing all items, a) to e), by the following new items:
—————————
There exists a consolidated edition 1.1 published in 2007, including the base publication (2001) and its
Amendment 1 (2007).
– 4 – 60747-16-4 Amend. 1  IEC:2009
a) Operating temperature (ambient or reference-point temperature)
b) Storage temperature
c) Channel temperature
d) Lead temperature (for soldering).
4.6 Electrical characteristics
Delete, in the first paragraph, “of 4.6.1 and 4.6.2”.
Replace, in the table, the parameters 4.6.12 and 4.6.13 by the following new parameters.
a
Subclause Parameters Min. Typical Max.
4.6.12 Adjacent channel power ratio (where appropriate) + +
4.6.13 nth order harmonic distortion ratio (where appropriate) + +

4.7 Mechanical and environmental ratings, characteristics and data
Replace "IEC 60747-1, Chapter VI, clause 7" by "5.10 and 5.11 of IEC 60747-1".
4.8.8 Handling precautions
Replace the existing text by the following amended text;
Where appropriate, handling precautions specific to the circuit should be stated (see also
IEC 61340-5-1 and IEC 61340-5-2, concerning electrostatic-sensitive devices.

5.1.1 General precautions
Replace "Clause 2 of IEC 60747-1, Chapter VII, Section One apply" by "6.3, 6.4 and 6.6 of
IEC 60747-1:2006 apply".
5.1.3 Handling precautions
Replace "Clause 1 of IEC 60747-1, Chapter IX" by "IEC 61340-5-1 and IEC 61340-5-2".

5.2.3 Principle of measurement
Replace Equation (1) by the following equation:
= P – P (1)
L
ins i o
5.2.6 Measurement procedure
Replace the second paragraph by the following new paragraph:
The bias under specified conditions is applied.
Replace, in the last paragraph, “Equations (3) and (1)” by “Equations (2), (3) and (1)”.

60747-16-4 Amend. 1  IEC:2009 – 5 –

5.3.6 Measurement procedure
Replace the second paragraph by the following new paragraph:
The bias under specified conditions is applied.
Replace, in the last paragraph, “Equations (6) and (4)” by “Equations (5), (6) and (4)”.

5.4.3 Principle of measurement
Replace Equation (7) by the following new equation:
L = P – P (7)
ret 1 2
5.4.6 Measurement procedure
Replace the seventh paragraph by the following new paragraph:
The bias under specified conditions is applied.

5.5.3 Principle of mea
...