Standard for automatic test markup language (ATML) test adapter description

IEC 61672-5:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of a test adapter by defining the interface between the unit under test (UUT) and the test station, and the specific description of test adapter instance information.

General Information

Status
Published
Publication Date
07-Apr-2016
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
15-Feb-2016
Completion Date
08-Apr-2016
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IEC 61671-5
®

Edition 1.0 2016-04

IEEE Std 1671.5
INTERNATIONAL

STANDARD



Standard for automatic test markup language (ATML) test adapter description
IEC 61671-5:2016-04(en)  IEEE Std 1671.5-2015

---------------------- Page: 1 ----------------------
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IEC 61671-5

®


Edition 1.0 2016-04




IEEE Std 1671.5™
INTERNATIONAL



STANDARD




















Standard for automatic test markup language (ATML) test adapter description



























INTERNATIONAL

ELECTROTECHNICAL

COMMISSION






ICS 25.040; 35.060 ISBN 978-2-8322-3267-5



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® Registered trademark of the International Electrotechnical Commission

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IEC 61671-5:2016
IEEE Std 1671.5-2015 - i -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 2
2. Normative references . 3
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. TestAdapterDescription Schema . 5
4.1 General . 5
4.2 Elements . 6
4.3 Simple types . 7
5. Schema—TestAdapterInstance.xsd . 7
5.1 General . 7
5.2 Elements . 8
5.3 Simple types . 9
6. ATML TestAdapterDescription XML schema names and locations . 9
7. ATML XML schema extensibility .11
8. Conformance .11
8.1 Conformance of a TestAdapterDescription instance document .11
8.2 Conformance of a TestAdapterInstance instance document .12
Annex A (informative) IEEE download website material associated with this document .13
Annex B (informative) Users information and examples .14
B.1 Interface test adapter .14
Annex C (informative) Glossary .16
Annex D (informative) Bibliography .17

Annex E (informative) IEEE List of Participants.18

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- ii -
 IEC 61671-5:2016
 IEEE Std 1671.5-2015

Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description




FOREWORD
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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.

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- iii -
IEC 61671-5:2016
IEEE Std 1671.5-2015
International Standard IEC 61671-5/IEEE Std 1671.5-2015 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.5-2015 91/1316/FDIS 91/1340/RVD
Full information on the voting for the approval of this standard can be found in the report on
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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.

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IEC 61671-5:2016
- iv - IEEE Std 1671.5-2015

IEEE Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description
Sponsor

IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems

Approved 26 March 2015

IEEE-SA Standards Board

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IEC 61671-5:2016
IEEE Std 1671.5-2015 - v -
Abstract: An exchange format using extensible markup language (XML) for identifying all of the
hardware, software, and documentation associated with a test adapter is specified in this
document. This test adapter may be used as a component of a test program set to test and
diagnose a unit under test.

Keywords: ATML instance document, automatic test equipment (ATE), automatic test markup
language (ATML), automatic test system (ATS), IEEE 1671.5™, interface device (ID), interface
test adapter (ITA), test adapter, test fixture, XML schema



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IEC 61671-5:2016
- vi - IEEE Std 1671.5-2015
IEEE Introduction
This introduction is not part of IEEE Std 1671.5™-2015, IEEE Standard for Automatic Test Markup Language
(ATML) Test Adapter Description.
This child, or dot, standard, also known as an ATML component standard, provides for the definition of the
Test Adapter XML schemas, and contains references to examples; both of which accompany this standard.
These XML schemas provide for the identification and definition of a test adapter.
ATML’s XML schemas define the basic information required within any test application and provide a
vehicle for formally defining the test environment by defining a class hierarchy corresponding to these
basic information entities and provide several methods within each to enable basic operations to be
performed on these entities. ATML component standards within the ATML framework define the
particular requirements within the test environment.

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IEC 61671-5:2016
IEEE Std 1671.5-2015 - vii -
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IEC 61671-5:2016
- viii - IEEE Std 1671.5-2015
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IEC 61671-5:2016
IEEE Std 1671.5-2015 - ix -
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IEC 61671-5:2016
- 1 - IEEE Std 1671.5-2015
Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description
IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health,
or environmental protection, or ensure against interference with or from other devices or networks.
Implementers of IEEE Standards documents are responsible for determining and complying with all
appropriate safety, security, environmental, health, and interference protection practices and all
applicable laws and regulations.
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be found under the heading “Important Notice” or “Important Notices and Disclaimers
Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at
http://standards.ieee.org/IPR/disclaimers.html.
1. Overview
1.1 General
Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible
markup language (XML) schemas that allow automatic test system (ATS) and test information to be
1
exchanged in a common format adhering to the XML standard.
The ATML framework and the ATML family of standards have been developed and are maintained under
the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standards Coordinating
Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test
strategies, test requirements, test procedures, test results management, and test system implementations,
while allowing test program (TP), test asset interoperability, and unit under test (UUT) data to be
interchanged between heterogeneous systems.
2
This standard (as well as the XML schemas and XML instance document examples that accompany this
standard) is intended to be used in identifying and documenting test adapters which may be utilized during
the testing of a unit under test (UUT). This information includes the mechanical, electrical, and software
interfaces of the test adapter.
1
This information is given for the convenience of users of this standard and does not constitute an endorsement by IEEE of this
consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same results.
2
The XML schemas and examples that accompany this standard are available at the
...

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