IEC 61671-5:2016
(Main)Standard for automatic test markup language (ATML) test adapter description
Standard for automatic test markup language (ATML) test adapter description
IEC 61672-5:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of a test adapter by defining the interface between the unit under test (UUT) and the test station, and the specific description of test adapter instance information.
General Information
Standards Content (Sample)
IEC 61671-5 ®
Edition 1.0 2016-04
™
IEEE Std 1671.5
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test adapter description
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IEC 61671-5 ®
Edition 1.0 2016-04
IEEE Std 1671.5™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test adapter description
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3267-5
IEEE Std 1671.5-2015 - i -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 2
2. Normative references . 3
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. TestAdapterDescription Schema . 5
4.1 General . 5
4.2 Elements . 6
4.3 Simple types . 7
5. Schema—TestAdapterInstance.xsd . 7
5.1 General . 7
5.2 Elements . 8
5.3 Simple types . 9
6. ATML TestAdapterDescription XML schema names and locations . 9
7. ATML XML schema extensibility .11
8. Conformance .11
8.1 Conformance of a TestAdapterDescription instance document .11
8.2 Conformance of a TestAdapterInstance instance document .12
Annex A (informative) IEEE download website material associated with this document .13
Annex B (informative) Users information and examples .14
B.1 Interface test adapter .14
Annex C (informative) Glossary .16
Annex D (informative) Bibliography .17
Annex E (informative) IEEE List of Participants.18
- ii -
IEEE Std 1671.5-2015
Standard for Automatic Test
Markup Language (ATML) Test Adapter
Description
FOREWORD
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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.
- iii -
IEEE Std 1671.5-2015
International Standard IEC 61671-5/IEEE Std 1671.5-2015 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
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The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1671.5-2015 91/1316/FDIS 91/1340/RVD
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Published by IEC under license from IEEE. © 2015 IEEE. All rights reserved.
- iv - IEEE Std 1671.5-2015
IEEE Standard fo
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