Amendment 1 - Winding wires - Test methods - Part 5: Electrical properties

Amendement 1 - Fils de bobinage - Méthodes d'essai - Partie 5: Propriétés électriques

General Information

Status
Published
Publication Date
20-Jun-2011
Technical Committee
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
15-Jul-2011
Completion Date
21-Jun-2011
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IEC 60851-5:2008/AMD1:2011 - Amendment 1 - Winding wires - Test methods - Part 5: Electrical properties
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IEC 60851-5 ®
Edition 4.0 2011-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Winding wires – Test methods –
Part 5: Electrical properties
Fils de bobinage – Méthodes d’essai –
Partie 5: Propriétés électriques

IEC 60851-5:2008/A1:2011
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IEC 60851-5 ®
Edition 4.0 2011-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Winding wires – Test methods –
Part 5: Electrical properties
Fils de bobinage – Méthodes d’essai –
Partie 5: Propriétés électriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE PRICE CODE
H
CODE PRIX
ICS 29.060.10 ISBN 978-2-88912-549-4

– 2 – 60851-5 Amend.1  IEC:2011
FOREWORD
This amendment has been prepared by IEC technical committee 55: Winding wires.
This amendment 1 includes
• in Clause 4 the addition of dielectric breakdown requirements for fully insulated (FIW)
zero-defect enamelled round copper wires;
• in Clause 5 the addition of continuity requirements for fully insulated (FIW) zero-defect
enamelled round copper wires.
The text of this amendment is based on the following documents:
FDIS Report on voting
55/1223/FDIS 55/1251/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
60851-5 Amend.1  IEC:2011 – 3 –
4 Test 13: Breakdown voltage
4.2 Equipment
Add the following new dashed text at the end of the list:
– metal mandrel, 80 mm ± 3 mm in diameter.

4.3 Enamelled round wire with a nominal conductor diameter
up to and including 0,100 mm
Replace the existing title of Subclause 4.3 with the following new title:
4.3 Enamelled round wire
Re-designate the text under 4.3 as the new Subclause 4.3.1 and modify the first paragraph as
follows:
4.3.1 Grade 1 to grade 3 with a nominal diameter up to and including 0,100 mm
The test is carried out on a cylinder with a diameter of 25 mm ± 1 mm. A straight piece of wire
with the insulation removed at one end shall be connected to the upper terminal as shown in
Figure 1 and wound once around the cylinder. A load as specified in Table 2.1 shall be
applied to the lower end of the wire to keep the specimen in close contact with the cylinder.
Renumber Table 2 as follows:
Table 2.1 – Loads applied to the wire

Add the following new Subclause 4.3.2 as follows:
4.3.2 Grade of FIW 3 to FIW 9 with a nominal conductor diameter up to and including
1,600 mm
The test is carried out on a cylinder with a diameter as set out in Table 2.2.
A straight piece of wire with the insulation removed at one end shall be connected to the
upper terminal as shown in Figure 1 and wound once around the cylinder. A load as specified
in Table 2.2 shall be applied to the lower end of the wire to keep the specimen in close
contact with the cylinder.
The test voltage shall be applied according to 4.1 between the conductor of the wire and the
cylinder. The test shall be carried out at room temperature. Five specimens shall be tested.
The five single values shall be reported.

– 4 – 60851-5 Amend.1  IEC:2011
Table 2.2 – Loads and diameters of test cylinders applied to wire
Nominal diameter Nominal diameter Load Diameter of test cylinder
mm mm N mm
Over Up to and including
- 0,040 0,080 25 ± 1
0,040 0,045 0,100 25 ± 1
0,045 0,050 0,130 25 ± 1
0,050 0,056 0,160 25 ± 1
0,056 0,063 0,200 25 ± 1
0,063 0,071 0,260
25 ± 1
0,071 0,080 0,330
25 ± 1
0,080 0,090 0,400
25 ± 1
0,090 0,100 0,500
25 ± 1
0,100 0,160 0,600
25 ± 1
0,160 0,250 0,850
25 ± 1
0,250 0,355 1,700
25 ± 1
0,355 0,500 3,400
25 ± 1
0,500 0,710 7,000
50 ± 2
0,710 1,060 13,500
50 ± 2
1,060 1,400 27,000
80 ± 3
1,400 1,600 54,000
80 ± 3
4.4 Enamelled round wire with a nominal conductor diameter over 0,100 mm up to
and including 2,500 mm
Replace the existing title of Subclause 4.4 with the following new title:
4.4 Enamelled round wire with a nominal conductor diameter over 0,100 mm up to
and including 2,500 mm, grade 1 to grade 3

5 Test 14: Continuity of insulation (applicable to enamelled round and tape
wrapped round wire)
5.2 Low-voltage continuity (nominal conductor diameter up to and including
0,050 mm)
Replace the title of Subclause 5.2 with the following new title:
5.2 Low-voltage continuity (nominal conductor diameter up to and including
0,050 mm, grade 1 to grade 3)
60851-5 Amend.1  IEC:2011 – 5 –
5.3 High-voltage continuity (nominal conductor diameter over 0,050 mm
up to and including 1,600 mm, grade 1 to grade 3, and over 0,035 mm, up to and
including 1,600 mm, grade 3 of FIW 3 to FIW 9)
Replace the title of Subclause 5.3 with the following new title:
5.3 Off-line high-voltage continuity (nominal conductor diameter over 0,050 mm up
to and including 1,600 mm)
5.3.2 Equipment
Replace the first dashed item in the list with the following new text:
– high voltage power supply providing a smooth filtered d.c. voltage with a ripple content
less than 5 %, with an open circuit test voltage adjustable from 350 V to 3000 V with a
short circuit current limited by internal series resistance to 25 µA ± 5 µA at any test
voltage with not more than 75 % drop in voltage in case of a 50 MΩ fault resistance;

Table 4 – Fault currents
Replace the existing Table 4 with the following new Table 4:
Table 4 – Off-line HVC fault currents
Test voltage (d.c.) Fault current
V µA
3 000 16
2 500 14
2 000 12
1 500 10
1 000 8
750 7
500 6
350 5
5.3.3 Procedure
Replace this existing text in Subclause 5.3.3 with the following new text:
A wire specimen of 30 m ± 1 m shall be pulled with a speed of (275 ± 25) mm/s over the high-
voltage electrode pulley or through the graphite brush electrode mounted between the earthed
guide pulleys with the conductor of the wire and the electrode connected to the electrical
circuit, with the open-circuit d.c. test voltage adjusted according to Table 5.1 or Table 5.2,
whichever applies, with a tolerance of ± 5 % and with a positive polarity with respect to the
earthed conductor of the wire.

– 6 – 60851-5 Amend.1  IEC:2011
Table 5 – Test voltages
Replace the existing Table 5 with the following new Tables 5.1 and 5.2:
Table 5.1 – Off-line HVC test voltages for grades 1 – 3
Nominal conductor diameter Voltage (d.c.)
Type of mm V
conductor
Over Up to and Grade 1 Grade 2 Grade 3
including
Copper 0,050 0,125 350 500 750
0,125 0,250 500 750 1000
0,250 0,500 750 1000 1500
0,500 1,600 1000 1500 2000
Aluminium 0,400 1,600 500 1500

Table 5.2 – Off-line HVC test voltages for grade of FIW 3 – FIW 9
Nominal
Type of conductor
Test voltage d.c.
conductor diameter
mm
Over Up to Grade of Grade of Grade of Grade of Grade of Grade of Grade of
and FIW 3 FIW 4 FIW 5 FIW 6 FIW 7 FIW 8 FIW 9
incl.
Copper 0,035 0,050 750 750 1000 2000 2000 2000 —
0,050 0,053 750 750 1000 2000 2000 2000 —
0,053 0,063 750 750 1000 2000 2000 3000 —
0,063 0,085 750 1000 2000 2000 2000 3000 3000
0,085 0,095 750 1000 2000 2000 3000 3000 3000

0,095 0,118 750 1000 2000 2000 3000 3000 3000
0,118 0,125 1000 2000 2000 3000 3000 3000 3000
0,125 0,170 1000 2000 2000 3000 3000 3000 3000
0,170 0,190 1000 2000 3000 3000 3000 3000 3000
0,190 0,250 2000 2000 3000 3000 3000 3000 3000

0,250 0,300 2000 2000 3000 3000 3000 3000 3000
0,300 0,375 2000 3000 3000 3000 3000 3000 3000
0,375 0,425 2000 3000 3000 3000 3000 3000 —
0,425 0,500 2000 3000 3000 3000 3000 — —
0,500 0,600 2000 3000 3000 3000 3000 — —

0,600 0,750 3000 3000 3000 3000 3000 — —
0,750 1,060 3000 3000 3000 3000 — — —
1,060 1,600 3000 3000 3000 — — — —
Aluminium
0,400 1,600 — — — — — — —
60851-5 Amend.1  IEC:2011 – 7 –
Add the following new Subclause 5.4 as follows:
5.4 Inline high-voltage continuity (wires in accordance with grade of FIW 3 to FIW 10
with nominal conductor diameter over 0,035 mm up to and including 1,600 mm)
5.4.1 Principle
During the enameling process and just prior to the wire being taken up on the delivery drum,
spool or reel, it is run over a “V”-grooved electrode (pulley) or through a graphite brush
electrode. DC test voltage is applied between the electrode and earth (ground). The wire
conductor is continuously connected to earth (ground). The wire run length and number of
faults in the insulation are recorded by a counting device.
5.4.2 Equipment
The following equipment shall be used:
– high-voltage power supply providing a smooth filtered d.c. voltage with a ripple content
less than 5 %, with an open circuit test voltage adjustable from 350 V to 3000 V with a
short-circuit current limited by internal series resistance to 25 µA ± 5 µA at any test
voltage and with not more than 75 % drop in voltage in case of a 50 MΩ fault resistance;
– fault detection circuit which operates at a fault current as shown in Table 6 with a speed of
response of ≤ 1,5 ms;
– electrode pulley, graphite brush, or other contact configuration made of a conductive
material and providing a wire contact length, giving a contact time of at least 2,25 ms (e.g.
≥ 25 mm at ≤ 667 m/min wire run speed);
– surge damping resistor of 4,7 MΩ ± 10 % installed in the high-voltage line.
NOTE The earth insulation for the high-voltage electrode should be a high-resistivity material, non-hygroscopic,
non-tracking and easily cleanable, having a clearance for maintaining a continuous voltage of 3000 V. No shield
...

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