Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

IEC 61671:2012(E) defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.

General Information

Status
Published
Publication Date
20-Jun-2012
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
31-Mar-2012
Completion Date
21-Jun-2012
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IEC 61671:2012 - Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEC 61671
Edition 1.0 2012-06

IEEE Std 1671
INTERNATIONAL

STANDARD



Automatic Test Markup Language (ATML) for Exchanging Automatic Test
Equipment and Test Information via XML

IEC 61671:2012(E)  IEEE Std 1671-2010

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IEC 61671


Edition 1.0 2012-06



IEEE Std 1671™

INTERNATIONAL



STANDARD



















Automatic Test Markup Language (ATML) for Exchanging Automatic Test

Equipment and Test Information via XML




























INTERNATIONAL

ELECTROTECHNICAL

COMMISSION

PRICE CODE
XH


ICS 25.040; 35.060 ISBN 978-2-83220-104-6



  Warning! Make sure that you obtained this publication from an authorized distributor.

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IEC 61671:2012
– ii – IEEE Std 1671-2010
Contents
1. Overview . 1
1.1 General . 1
1.2 Scope . 2
1.3 Purpose . 2
1.4 Application . 3
1.5 Conventions used in this document . 4
2. Normative references . 6
3. Definitions, acronyms, and abbreviations. 7
3.1 Definitions . 7
3.2 Acronyms and abbreviations . 10
4. Automatic test system (ATS) architecture .
...

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