Printed electronics - Part 301-2: Equipment - Contact printing - Rigid master - Measurement method of plate master pattern dimension

IEC 62899-301-2:2017(E) defines measurement terms and methods related to the critical dimension of features and the registration accuracy of features on rigid plate masters.
General critical dimensions are defined to evaluate the shape accuracy of features on the plate master. To evaluate the registration accuracy of features on the plate master, the specification for the registration mark for the plate master is specified. Then, common metrology procedures to measure the critical dimensions and the registration accuracy of the plate master are established for device manufacturers, printing master manufacturers and printing master manufacturing equipment vendors. The measurement terms which are measured by agreement between the user and the supplier are measured using the measurement methods given in this document.

General Information

Status
Published
Publication Date
29-Aug-2017
Technical Committee
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
30-Sep-2017
Completion Date
30-Aug-2017
Ref Project

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IEC 62899-301-2:2017 - Printed electronics - Part 301-2: Equipment - Contact printing - Rigid master - Measurement method of plate master pattern dimension
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IEC 62899-301-2
®

Edition 1.0 2017-08
INTERNATIONAL
STANDARD

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inside


Printed electronics –
Part 301-2: Equipment – Contact printing – Rigid master – Measurement method
of plate master pattern dimension

IEC 62899-301-2:2017-08(en)

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IEC 62899-301-2

®


Edition 1.0 2017-08




INTERNATIONAL



STANDARD








colour

inside










Printed electronics –

Part 301-2: Equipment – Contact printing – Rigid master – Measurement method

of plate master pattern dimension


























INTERNATIONAL

ELECTROTECHNICAL


COMMISSION





ICS 19.080; 37.100.10 ISBN 978-2-8322-4768-6



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® Registered trademark of the International Electrotechnical Commission

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– 2 – IEC 62899-301-2:2017  IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Coordinate system [1] . 10
5 1-D qualification features [1] . 10
5.1 Measurement instrument . 10
5.2 Feature types . 10
5.3 Pattern ed
...

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