IEC 61671-4:2016
(Main)Standard for automatic test markup language (ATML) test configuration
Standard for automatic test markup language (ATML) test configuration
IEC 61671-4:2016(E) defines an exchange format, utilizing extensible markup language (XML), for identifying all of the hardware, software, and documentation that is needed to test and diagnose a unit under test (UUT) on an ATS.
General Information
Standards Content (Sample)
IEC 61671-4 ®
Edition 1.0 2016-04
™
IEEE Std 1671.4
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test configuration
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IEC 61671-4 ®
Edition 1.0 2016-04
IEEE Std 1671.4™
INTERNATIONAL
STANDARD
Standard for automatic test markup language (ATML) test configuration
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040; 35.060 ISBN 978-2-8322-3266-8
IEEE Std 1671.4-2014 - LL -
Contents
1. Overview . 1
1.1 General . 1
1.2 Application of this document’s annexes . 2
1.3 Scope . 2
1.4 Application . 2
1.5 Conventions used within this document . 3
2. Normative references . 4
3. Definitions, acronyms, and abbreviations . 4
3.1 Definitions . 4
3.2 Acronyms and abbreviations . 5
4. TestConfiguration schema . 7
4.1 Background . 7
4.2 Test configuration.xsd . 7
5. TestConfiguration instance schema .32
6. ATML TestConfiguration XML schema names and locations .32
7. ATML XML schema extensibility .34
8. Conformance .34
Annex A (informative) IEEE download web-site material associated with this document .35
Annex B (informative) Test Configuration XML element mappings to MTPSI card fields .36
Annex C (informative) Examples .41
Annex D (informative) Bibliography .44
Annex E (informative) List of IEEE Participants .45
- LLL -
IEEE Std 1671.4-2014
STANDARD FOR AUTOMATIC TEST
MARKUP LANGUAGE (ATML) INSTRUMENT
DESCRIPTION
FOREWORD
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Published by IEC under license from IEEE. © 2014 IEEE. All rights reserved.
- LY -
IEEE Std 1671.4-2014
International Standard IEC 61671-4/IEEE Std 1671.4-2014 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
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IEEE Std FDIS Report on voting
IEEE Std 1671.4-2014 91/1315/FDIS 91/1339/RVD
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Published by IEC under license from IEEE. © 2014 IEEE. All rights reserved.
- Y - IEEE Std 1671.4-2014
IEEE Standard for Automatic Test
Markup Language (ATML) Test
Configuration
Sponsor
IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems
Approved 27 March 2014
IEEE-SA Standards Board
IEEE Std 1671.4-2014 - YL -
Abstract: An exchange format is specified in this standard, using extensible markup language
(XML), for identifying the test configuration used to test for and diagnose faults of a unit under test
(UUT) on an automatic test system (ATS).
Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup
Language (ATML), automatic test system (ATS), IEEE 1671.4™, Master Configuration Control
Document (MCCD), Master Test Program Set Index (MTPSI), station configuration file, test
configuration, XML schema
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