ISO 11452-3:2024
(Main)Road vehicles — Component test methods for electrical disturbances from narrowband radiated electromagnetic energy — Part 3: Transverse electromagnetic (TEM) cell
Road vehicles — Component test methods for electrical disturbances from narrowband radiated electromagnetic energy — Part 3: Transverse electromagnetic (TEM) cell
This document specifies transverse electromagnetic (TEM) cell tests for determining the immunity of electronic components of passenger cars and commercial vehicles to electrical disturbances from narrowband radiated electromagnetic energy, regardless of the vehicle propulsion system (e.g. spark-ignition engine, diesel engine, electric motor). The electromagnetic disturbances considered are limited to continuous narrowband electromagnetic fields.
Véhicules routiers — Méthodes d'essai d'un équipement soumis à des perturbations électriques par rayonnement d'énergie électromagnétique en bande étroite — Partie 3: Cellule électromagnétique transverse (TEM)
General Information
Standards Content (Sample)
International
Standard
ISO 11452-3
Fourth edition
Road vehicles — Component test
2024-05
methods for electrical disturbances
from narrowband radiated
electromagnetic energy —
Part 3:
Transverse electromagnetic
(TEM) cell
Véhicules routiers — Méthodes d'essai d'un équipement soumis
à des perturbations électriques par rayonnement d'énergie
électromagnétique en bande étroite —
Partie 3: Cellule électromagnétique transverse (TEM)
Reference number
© ISO 2024
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ii
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Test conditions . 1
5 Test apparatus . 2
5.1 TEM cell.2
5.2 Instrumentation .3
5.3 Test set-up .4
5.3.1 General .4
5.3.2 Exposure of device under test and wiring harness (for major field coupling to
the harness) .4
5.3.3 Exposure of device under test alone (for major field coupling to that device) .5
6 Test procedure . 6
6.1 Test plan .6
6.2 Test method .7
6.2.1 General .7
6.2.2 Test level setting .7
6.2.3 DUT test .8
6.3 Test report .8
Annex A (informative) TEM cell dimensions . 9
Annex B (informative) Calculations and measurements of TEM-cell frequency range .11
Annex C (informative) Installation of external components and low pass filter design .13
Annex D (informative) Test setup without low pass filters .16
Annex E (informative) Function performance status classification (FPSC) and test severity
levels .20
Bibliography .21
iii
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out through
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with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of ISO document should be noted. This document was drafted in accordance with the editorial rules of the
ISO/IEC Directives, Part 2 (see www.iso.org/directives).
ISO draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). ISO takes no position concerning the evidence, validity or applicability of any claimed patent
rights in respect thereof. As of the date of publication of this document, ISO had not received notice of (a)
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Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 32,
Electrical and electronic components and general system aspects.
This fourth edition cancels and replaces the third edition (ISO 11452-3:2016), of which it constitutes a minor
revision. The changes are as follows:
— Formula (1) in 6.2.2 was modified.
A list of all parts in the ISO 11452 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
iv
Introduction
Immunity measurements of complete road vehicles are generally able to be carried out only by the vehicle
manufacturer, owing to, for example, high costs of absorber-lined shielded enclosures, the desire to preserve
the secrecy of prototypes or a large number of different vehicle models.
For research, development and quality control, a laboratory measuring method can be used by both vehicle
manufacturers and equipment suppliers to test electronic components.
The TEM cell method has the major advantage of not radiating energy into the surrounding environment.
The method can be used for testing either the immunity of a component with the field coupling to the wiring
harness or the immunity of the component alone with minimum exposure to the wiring harness.
v
International Standard ISO 11452-3:2024(en)
Road vehicles — Component test methods for electrical
disturbances from narrowband radiated electromagnetic
energy —
Part 3:
Transverse electromagnetic (TEM) cell
1 Scope
This document specifies transverse electromagnetic (TEM) cell tests for determining the immunity
of electronic components of passenger cars and commercial vehicles to electrical disturbances from
narrowband radiated electromagnetic energy, regardless of the vehicle propulsion system (e.g. spark-
ignition engine, diesel engine, electric motor).
The electromagnetic disturbances considered are limited to continuous narrowband electromagnetic fields.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO 11452-1, Road vehicles — Component test methods for electrical disturbances from narrowband radiated
electromagnetic energy — Part 1: General principles and terminology
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 11452-1 apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
4 Test conditions
The upper frequency range limit of the TEM cell is a direct function of the TEM cell dimensions.
For testing automotive electronic systems, a 0,01 MHz to 200 MHz TEM cell should be used. See Annex A for
suggested cell dimensions. See Annex B for methods to determine TEM-cell frequency range.
The user shall specify the test severity level or levels over the frequency range. See Annex E for suggested
test severity levels.
Standard test conditions shall be those given in ISO 11452-1 for:
— test temperature;
— supply voltage;
— modulation;
— dwell time;
— frequency step sizes;
— definition of test severity levels;
— test-signal quality.
5 Test apparatus
5.1 TEM cell
The TEM cell used for this test is a rectangular coaxial line with a 50 Ω characteristic impedance (see
Figure 1). The device under test is exposed to a uniform TEM field.
The TEM cell is a laboratory measurement system which can be used to generate test fields within 2 dB of the
theoretical value if the device under test does not occupy an excessive portion of the test volume (see 5.3).
Key
1 outer conductor (shield)
2 septum (inner conductor)
3 access door
4 connector panel (optional)
5 coaxial connectors
6 dielectric support (relative permittivity ε ≤ 1,4)
r
7 device under test
8 input/output leads
Figure 1 — TEM cell
5.2 Instrumentation
Figure 2 shows an example of a TEM cell test set-up. The TEM cell has high resonances in the region greater
than the recommended upper frequency limit.
A low pass filter with an attenuation of at least 60 dB at frequencies above 1,5 times the cut-off frequency
of the TEM cell may be installed (e.g. 200 MHz TEM cell: 60 dB for frequencies above 300 MHz) to avoid
resonances.
Example of installation of low pass filter is given in Annex C.
Key
1 signal generator 9 low pass filters/connector panel
2 broadband amplifier 10 coupler
3 low pass filter (optional) 11 high power load (50 Ω)
4 dual-directional coupler (30 dB decoupling ratio 12 controller
minimum) 13 TEM cell
a
5 RF-power meter P (forward power).
forward
b
6 peripheral P (reflected power).
reflected
c
7 device under test P (output power).
output
8 dielectric support
Figure 2 — Example TEM cell configuration
5.3 Test set-up
5.3.1 General
In order to maint
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