ISO 12085:1996
(Main)Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters
Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters
Defines terms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator and measuring conditions.
Spécification géométrique des produits (GPS) — État de surface: Méthode du profil — Paramètres liés aux motifs
La présente Norme internationale définit les termes et paramètres pour la détermination de l'état de surface par la méthode des motifs. Elle décrit également l'opérateur théorique et les conditions de mesurage correspondantes.
Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda - Parametri motivov
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I NTE RNATI ONAL IS0
STANDARD 12085
First edition
1996-08-1 5
Geometrical Product Specification (GPS) -
Surface texture: Profile method - Motif
parameters
Spécification géométrique des produits (GPS) - État de surface: Méthode
du profil - Paramètres liés aux motifs
Reference number
IS0 12085:1996(E)
---------------------- Page: 1 ----------------------
IS0 12085:1996(E)
Contents Page
1 ScoDe . 1
2 Normative references . 1
3 Definitions . 1
3.1 General definitions . 1
3.2 Parameter definitions . 3
4 Theoretically exact operator of the motif method . 5
4.1 General . 5
4.2 Conventional limits of motifs . 5
4.3 Depth discrimination . 5
4.4 ldsntification of roughness and waviness motifs through
the combination of motifs . 8
4.5 Procedure for parameter calculation . 10
5 Measuring conditions of parameters . 12
5.1 Convention concerning traversing the primary profile . 12
5.2 Recommended measurement conditions . 12
5.3 Profile quantization step . 12
5.4 Rule for acceptance .
12
5.5 Use of motifs method for analysis of multiprocess
surfaces. . . 12
5.6 Indications on the drawings . . 12
O IS0 1996
All riahts reserved Unless otherwise SDecified. no Dart of this publication may be repro-
U
duced or utilized in any form or by any means, electronic or mechanical, including photo-
copying and microfilm, without permission in writing from the publisher
International Organization for Standardization
Case Postale 56 CH-1 21 1 Genève 20 Switzerland
Printed in Switzerland
II
---------------------- Page: 2 ----------------------
IS0 12085:1996(E)
0 IS0
Annexes
A Calculation method for combination of motifs . 13
Relation between motif parameters and function of surfaces . 16
B
C Relation to the GPS matrix model . 17
D Bibliography . 18
...
III
---------------------- Page: 3 ----------------------
IS0 12085:1996(E) 0 IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide fed-
eration of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be rep-
resented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. IS0 col-
laborates closely with the International Electrotechnical Commission (IEC)
on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are cir-
culated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 12085 was prepared jointly by Technical Com-
mittees iSO/TC 57, Metrology and properties of surfaces, Subcommit-
tee SC 1, Geometrical parameters - instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits and ISOflC 1 O, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
Annex A forms an integral part of this International Standard. Annexes B, C
and D are for information only.
iv
---------------------- Page: 4 ----------------------
@ IS0 IS0 12085:1996(E)
Introduction
This International Standard is a Geometrical Product Specification (GPS)
standard and is to be regarded as a General GPS standard (see
ISO/TR 14638). It influences links 2, 3 and 4 of the surface texture chain of
standards on roughness profile and waviness profile.
For more detailed information of the relation of this International Standard
to other GPS standards, see annex C.
The approach described in this International Standard facilitates the de-
termining roughness and waviness parameters from the primary profile by
finding those motifs which characterize the surface under consideration.
This method is independent of any profile filter and results in parameters
which are based on the depth and spacing of the motifs. These par-
ameters, which are complementary to those defined in IS0 4287, can be
used to describe the functional properties of workpieces as indicated in
Annex B.
V
---------------------- Page: 5 ----------------------
INTERNATIONAL STANDARD 0 IS0 IS0 12085:1996(E)
Geometrical Product Specification (GPS) - Surface
texture: Profile method - Motif parameters
1 Scope
This International Standard defines terms and parameters used for determining surface texture by the motif
L method, It also describes the corresponding ideal operator and measuring conditions.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this lnter-
national Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision,
and parties to agreements based on this International Standard are encouraged to investigate the possibility of ap-
plying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of
currently valid International Standards.
IS0 1302.1 992, Technical drawings - Method of Indicating surface texture
IS0 3274 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal character-
istics of contact (stylus) Instruments.
IS0 4287.1 996, Geometrical Product Specifications (GPS) - Surface texture. Profile method - Terms, definitions
and parameters of surface texture
L
IS0 4288 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and pro-
cedures for the assessment of surface texture
1- 3 Definitions
For the purposes of this International Standard the following definitions apply.
3.1 General definitions
3.1.1 surface profile: (See IS0 4287.)
3.1.2 primary profile: (See IS0 3274.)
1
---------------------- Page: 6 ----------------------
IS0 12085:1996(E) 0 IS0
3.1.3 local peak of profile: A part of a profile between two adjacent minima of the profile (see figure 1).
Local peak of the profile
Figure 1 - Local peak of profile
3.1.4 local valley of profile: A part of a profile between two adjacent maxima of the profile (see figure 2).
- Local valley of the profile
I
Figure 2 - Local valley of profile
3.1.5 motif: A portion of the primary profile between the highest points of two local peaks of the profile, which
are not necessarily adjacent.
A motif is characterized by (see figures 3 and 5):
- its length, ARi or AW,, measured parallel to the general direction of the profile;
- its two depths, H, and HI+ 1, or Hwj and Hw,+ 1, measured perpendicular to the general direction of the primary
profile;
- its T characteristic, that is the smallest depth between the two depths.
AR I i
T=MIN[H,:H,,,I
here: T = Hj+,
Figure 3 - Roughness motif
3.1.6 roughness motif: Motif derived by using the ideal operator with limit value A (see figure 3).
NOTE 1 By this definition, a roughness motif has a length ARi smaller than or equal to A.
---------------------- Page: 7 ----------------------
0 IS0 IS0 12085:1996(E)
3.1.7 upper envelope line of the primary profile (waviness profile): Straight lines joining the highest points of
peaks of the primary profile, after conventional discrimination of peaks (see figure 4).
/-Upper envelope line
Figure 4 - Upper envelope line
3.1.8 waviness motif: Motif derived on the upper envelope line by using the ideal operator with limit value B (see
figure 5).
Upper envelope line
r'l 1 I
l I
T = MIN [Hwj; Hwj
il
here: T = Hw *,
Figure 5 -Waviness motif
3.2 Parameter definitions
3.2.1 mean spacing of roughness motifs, AR: The arithmetical mean value of the lengths AR; of roughness mo-
tifs, within the evaluation length (see figure 61, i.e.
ln
AR=-T AR;
ne '
L 1=1
where n is the number of roughness motifs (equal to the number of ARi values).
3.2.2 mean depth of roughness motifs, R: The arithmetical mean value of the depths Hj of roughness motifs,
within the evaluation length (see figure 61, i.e.
1"
R=-x H. J
m.
J=1
where m is the number of Hj values.
NOTE 2 The number of H, values is twice the number of ARi values (m = 2n)
3.2.3 maximum depth of profile irregularity, Rx: The largest depth, H,, within the evaluation length.
EXAMPLE
On figure 6: Rx = Hg.
3
---------------------- Page: 8 ----------------------
IS0 12085: 1996(E)
Figure 6 - Roughness parameters
3.2.4 mean spacing of waviness motifs, AW The arithmetical mean value of the lengths AWi of waviness mo-
tifs, within the evaluation length (see figure 71, i.e.
AW=-C ln A&
n.
I=1
where n is the number of waviness motifs (equal to the number of AWj values).
3.2.5 mean depth of waviness motifs, W: The arithmetical mean value of the depths Hwj of waviness motifs,
within the evaluation length (see figure 71, i.e.
W=-c lrn Hwj
m
J =I
where m is the number of Hw, values.
NOTE 3 The number of Hwj values is twice the number of AWj values (rn = 24.
3.2.6 maximum depth of waviness, Wx: The largest depth Hwj, within the evaluation length (see figure 7).
3.2.7 total depth of waviness, Wte: The distance, measured in a direction perpendicu!ar to the general direction
of the primary profile, between the highest point and the lowest point of the upper envelope line of the primary
profile (see figure 7).
2.5 vm i
LX
500 pm
Figure 7 - Waviness parameters
4
---------------------- Page: 9 ----------------------
0 IS0
IS0 12085:1996( E)
4 Theoretically exact operator of the motif method
4.1 General
This clause describes the identification conditions of motifs (length and depth discrimination) and presents the
process for calculating roughness and waviness parameters.
4.2 Conventional limits of motifs
The recommended values for limits A and B as described in figure 8 are given under clause 5.
O spacing 2 A
7
A - spacing I B
I
L
ai Roughness moth b) Wavlners motlrs
Figure 8 - ConvenLmal limits of motifs
4.3 Depth discrimination
The depth discrimination applies to the primary profile for the assessment of surface roughness.
4.3.1 Discrimination based on minimum depth
Divide the primary profile into sections of width A/2, and take the height of each rectangle.
The local peaks taken into account are those whose depth is larger than 5 YO of the mean height of these rec-
tangles (see figure 9).
L
LLocal peak retained L Local peak rejected
LHeigh+ of this rectangle
(example) (example)
I,
Figure 9 - Depth discrimination
5
---------------------- Page: 10 ----------------------
0 IS0
IS0 12085:1996(E)
4.3.2 Discrimination based on maximum depth
For the roughness motifs the depths of which are Hj, the value Ej (mean value of Hj) and oh; (standard devi-
ation) are calculated. Any depth of local peak or valley the value of which is larger than H = Ej + l ,65 oh;, is lev-
elled equal to the H value (see figure 1 O).
NOTE 4 If the distribution of Hj is Gaussian, this condition concerns 5 ?!O of the peaks and valleys. This discrimination obviates
the risk of high isolated peaks interfering with the envelope line.
Figure 10 - Discrimination
...
SLOVENSKI STANDARD
SIST ISO 12085:2001
01-julij-2001
6SHFLILNDFLMDJHRPHWULMVNLKYHOLþLQL]GHOND7HNVWXUDSRYUãLQH SURILOQDPHWRGD
3DUDPHWULPRWLYRY
Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Motif
parameters
Spécification géométrique des produits (GPS) -- État de surface: Méthode du profil --
Paramètres liés aux motifs
Ta slovenski standard je istoveten z: ISO 12085:1996
ICS:
17.040.20 Lastnosti površin Properties of surfaces
SIST ISO 12085:2001 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
---------------------- Page: 1 ----------------------
SIST ISO 12085:2001
---------------------- Page: 2 ----------------------
SIST ISO 12085:2001
I NTE RNATI ONAL IS0
STANDARD 12085
First edition
1996-08-1 5
Geometrical Product Specification (GPS) -
Surface texture: Profile method - Motif
parameters
Spécification géométrique des produits (GPS) - État de surface: Méthode
du profil - Paramètres liés aux motifs
Reference number
IS0 12085:1996(E)
---------------------- Page: 3 ----------------------
SIST ISO 12085:2001
IS0 12085:1996(E)
Contents Page
1 ScoDe . 1
2 Normative references . 1
3 Definitions . 1
3.1 General definitions . 1
3.2 Parameter definitions . 3
4 Theoretically exact operator of the motif method . 5
4.1 General . 5
4.2 Conventional limits of motifs . 5
4.3 Depth discrimination . 5
4.4 ldsntification of roughness and waviness motifs through
the combination of motifs . 8
4.5 Procedure for parameter calculation . 10
5 Measuring conditions of parameters . 12
5.1 Convention concerning traversing the primary profile . 12
5.2 Recommended measurement conditions . 12
5.3 Profile quantization step . 12
5.4 Rule for acceptance .
12
5.5 Use of motifs method for analysis of multiprocess
surfaces. . . 12
5.6 Indications on the drawings . . 12
O IS0 1996
All riahts reserved Unless otherwise SDecified. no Dart of this publication may be repro-
U
duced or utilized in any form or by any means, electronic or mechanical, including photo-
copying and microfilm, without permission in writing from the publisher
International Organization for Standardization
Case Postale 56 CH-1 21 1 Genève 20 Switzerland
Printed in Switzerland
II
---------------------- Page: 4 ----------------------
SIST ISO 12085:2001
IS0 12085:1996(E)
0 IS0
Annexes
A Calculation method for combination of motifs . 13
Relation between motif parameters and function of surfaces . 16
B
C Relation to the GPS matrix model . 17
D Bibliography . 18
...
III
---------------------- Page: 5 ----------------------
SIST ISO 12085:2001
IS0 12085:1996(E) 0 IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide fed-
eration of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be rep-
resented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. IS0 col-
laborates closely with the International Electrotechnical Commission (IEC)
on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are cir-
culated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 12085 was prepared jointly by Technical Com-
mittees iSO/TC 57, Metrology and properties of surfaces, Subcommit-
tee SC 1, Geometrical parameters - instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits and ISOflC 1 O, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
Annex A forms an integral part of this International Standard. Annexes B, C
and D are for information only.
iv
---------------------- Page: 6 ----------------------
SIST ISO 12085:2001
@ IS0 IS0 12085:1996(E)
Introduction
This International Standard is a Geometrical Product Specification (GPS)
standard and is to be regarded as a General GPS standard (see
ISO/TR 14638). It influences links 2, 3 and 4 of the surface texture chain of
standards on roughness profile and waviness profile.
For more detailed information of the relation of this International Standard
to other GPS standards, see annex C.
The approach described in this International Standard facilitates the de-
termining roughness and waviness parameters from the primary profile by
finding those motifs which characterize the surface under consideration.
This method is independent of any profile filter and results in parameters
which are based on the depth and spacing of the motifs. These par-
ameters, which are complementary to those defined in IS0 4287, can be
used to describe the functional properties of workpieces as indicated in
Annex B.
V
---------------------- Page: 7 ----------------------
SIST ISO 12085:2001
---------------------- Page: 8 ----------------------
SIST ISO 12085:2001
INTERNATIONAL STANDARD 0 IS0 IS0 12085:1996(E)
Geometrical Product Specification (GPS) - Surface
texture: Profile method - Motif parameters
1 Scope
This International Standard defines terms and parameters used for determining surface texture by the motif
L method, It also describes the corresponding ideal operator and measuring conditions.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this lnter-
national Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision,
and parties to agreements based on this International Standard are encouraged to investigate the possibility of ap-
plying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of
currently valid International Standards.
IS0 1302.1 992, Technical drawings - Method of Indicating surface texture
IS0 3274 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal character-
istics of contact (stylus) Instruments.
IS0 4287.1 996, Geometrical Product Specifications (GPS) - Surface texture. Profile method - Terms, definitions
and parameters of surface texture
L
IS0 4288 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and pro-
cedures for the assessment of surface texture
1- 3 Definitions
For the purposes of this International Standard the following definitions apply.
3.1 General definitions
3.1.1 surface profile: (See IS0 4287.)
3.1.2 primary profile: (See IS0 3274.)
1
---------------------- Page: 9 ----------------------
SIST ISO 12085:2001
IS0 12085:1996(E) 0 IS0
3.1.3 local peak of profile: A part of a profile between two adjacent minima of the profile (see figure 1).
Local peak of the profile
Figure 1 - Local peak of profile
3.1.4 local valley of profile: A part of a profile between two adjacent maxima of the profile (see figure 2).
- Local valley of the profile
I
Figure 2 - Local valley of profile
3.1.5 motif: A portion of the primary profile between the highest points of two local peaks of the profile, which
are not necessarily adjacent.
A motif is characterized by (see figures 3 and 5):
- its length, ARi or AW,, measured parallel to the general direction of the profile;
- its two depths, H, and HI+ 1, or Hwj and Hw,+ 1, measured perpendicular to the general direction of the primary
profile;
- its T characteristic, that is the smallest depth between the two depths.
AR I i
T=MIN[H,:H,,,I
here: T = Hj+,
Figure 3 - Roughness motif
3.1.6 roughness motif: Motif derived by using the ideal operator with limit value A (see figure 3).
NOTE 1 By this definition, a roughness motif has a length ARi smaller than or equal to A.
---------------------- Page: 10 ----------------------
SIST ISO 12085:2001
0 IS0 IS0 12085:1996(E)
3.1.7 upper envelope line of the primary profile (waviness profile): Straight lines joining the highest points of
peaks of the primary profile, after conventional discrimination of peaks (see figure 4).
/-Upper envelope line
Figure 4 - Upper envelope line
3.1.8 waviness motif: Motif derived on the upper envelope line by using the ideal operator with limit value B (see
figure 5).
Upper envelope line
r'l 1 I
l I
T = MIN [Hwj; Hwj
il
here: T = Hw *,
Figure 5 -Waviness motif
3.2 Parameter definitions
3.2.1 mean spacing of roughness motifs, AR: The arithmetical mean value of the lengths AR; of roughness mo-
tifs, within the evaluation length (see figure 61, i.e.
ln
AR=-T AR;
ne '
L 1=1
where n is the number of roughness motifs (equal to the number of ARi values).
3.2.2 mean depth of roughness motifs, R: The arithmetical mean value of the depths Hj of roughness motifs,
within the evaluation length (see figure 61, i.e.
1"
R=-x H. J
m.
J=1
where m is the number of Hj values.
NOTE 2 The number of H, values is twice the number of ARi values (m = 2n)
3.2.3 maximum depth of profile irregularity, Rx: The largest depth, H,, within the evaluation length.
EXAMPLE
On figure 6: Rx = Hg.
3
---------------------- Page: 11 ----------------------
SIST ISO 12085:2001
IS0 12085: 1996(E)
Figure 6 - Roughness parameters
3.2.4 mean spacing of waviness motifs, AW The arithmetical mean value of the lengths AWi of waviness mo-
tifs, within the evaluation length (see figure 71, i.e.
AW=-C ln A&
n.
I=1
where n is the number of waviness motifs (equal to the number of AWj values).
3.2.5 mean depth of waviness motifs, W: The arithmetical mean value of the depths Hwj of waviness motifs,
within the evaluation length (see figure 71, i.e.
W=-c lrn Hwj
m
J =I
where m is the number of Hw, values.
NOTE 3 The number of Hwj values is twice the number of AWj values (rn = 24.
3.2.6 maximum depth of waviness, Wx: The largest depth Hwj, within the evaluation length (see figure 7).
3.2.7 total depth of waviness, Wte: The distance, measured in a direction perpendicu!ar to the general direction
of the primary profile, between the highest point and the lowest point of the upper envelope line of the primary
profile (see figure 7).
2.5 vm i
LX
500 pm
Figure 7 - Waviness parameters
4
---------------------- Page: 12 ----------------------
SIST ISO 12085:2001
0 IS0
IS0 12085:1996( E)
4 Theoretically exact operator of the motif method
4.1 General
This clause describes the identification conditions of motifs (length and depth discrimination) and presents the
process for calculating roughness and waviness parameters.
4.2 Conventional limits of motifs
The recommended values for limits A and B as described in figure 8 are given under clause 5.
O spacing 2 A
7
A - spacing I B
I
L
ai Roughness moth b) Wavlners motlrs
Figure 8 - ConvenLmal limits of motifs
4.3 Depth discrimination
The depth discrimination applies to the primary profile for the assessment of surface roughness.
4.3.1 Discrimination based on minimum depth
Divide the primary profile into sections of width A/2, and take the height of each rectangle.
The local peaks taken into account are those whose depth is larger than 5 YO of the mean height of these rec-
tangles (see figure 9).
L
LLocal peak retained L Local peak rejected
LHeigh+ of this rectangle
(example) (example)
I,
Figure 9 - Depth discrimination
5
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SIST ISO 12085:2001
0 IS0
IS0 12085:1996(E)
4.3.2 Discrimination based on
...
NORME
IS0
INTERNATIONALE
12085
Premiere kdition
1996-08-15
Spbcification gbombtrique des produits
(GPS) - &at de surface: M&thode du
profil
- ParamGtres lib aux motifs
Geometrical Product Specification (GPS) - Surface texture: Profile
method - Motif parameters
Numero de rkfkrence
IS0 12085:1996(F)
---------------------- Page: 1 ----------------------
IS0 12085:1996(F)
Sommaire Page
................................................................. 1
Domaine d ’application
............................................................... 1
References normatives
Definitions .
............................................................
3.1 Definitions g&Wales
3.2 Definitions de parametres .
Operateur theorique de la methode des motifs .
4.1 Generalites .
4.2 Limites conventionnelles des motifs .
4.3 Discrimination de profondeur .
4.4 Identification des motifs de rugosite et d ’ondulation par la
............................ ........................... 8
combinaison des motifs
.................................... 10
4.5 Procedure de calcul des parametres
................................... 12
Conditions de mesurage des parametres
12
5.1 Conventions de captage du profil primaire .
5.2 Conditions de mesurage recommandees . 12
.............................................. 12
5.3 Pas de quantification du profil
............................................................ 12
5.4 Regles d ’acceptation
5.5 Utilisation de la methode des motifs pour I ’analyse de
.......................... 12
surfaces obtenues par plusieurs procedes
12
5.6 Indications sur les dessins .
0 IS0 1996
Droits de reproduction reserves. Sauf prescription differente, aucune partie de cette publi-
cation ne peut etre reproduite ni utilisee sous quelque forme que ce soit et par aucun pro-
cede, electronique ou mecanique, y compris la photocopie et les microfilms, sans I ’accord
ecrit de I ’editeur.
Organisation internationale de normalisation
Case postale 56 l CH-1211 Geneve 20 l Suisse
Imprime en Suisse
ii
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IS0 12085:1996(F)
@ IS0
Annexes
.................. 13
A M&hode de calcul pour la combinaison des motifs.
B Relation entre la m&hode des motifs et la fonction des
16
surfaces .
17
C Relation avec la matrice GPS .
18
................................................................................
D Bibliographie
. . .
III
---------------------- Page: 3 ----------------------
IS0 12085:1996(F) @ IS0
Avant-propos
L ’ISO (Organisation internationale de normalisation) est une federation
mondiale d ’organismes nationaux de normalisation (comites membres de
I ’ISO). L ’elaboration des Normes internationales est en general confiee aux
comites techniques de I ’ISO. Chaque comite membre interesse par une
etude a le droit de faire partie du comite technique c&e 8 cet effet. Les
organisations internationales, gouvernementales et non gouvernemen-
tales, en liaison avec I ’ISO participent egalement aux travaux. L ’ISO colla-
bore etroitement avec la Commission electrotechnique internationale (CEI)
en ce qui concerne la normalisation electrotechnique.
Les projets de Normes internationales adopt& par les comites techniques
sont soumis aux comites membres pour vote. Leur publication comme
Normes internationales requiert I ’approbation de 75 % au moins des co-
mites membres votants.
La Norme internationale IS0 12085 a ete elaboree conjointement par les
comites techniques ISOnC 57, M&rologie et propriktb des surfaces,
sous-comite SC 1, Paramktres geomktriques - Instruments et probdu-
res pour la mesure de la rugosit6 et de I ’ondulation des surfaces,
lSO/TC 3, Ajustements et l’lSO/TC 10, Dessins techniques, dgfinition de
produits et documentation y relative, sous-comite SC 5, Cotation et to&-
rancement.
L ’annexe A fait partie integrante de la presente Norme internationale. Les
annexes B, C et D sont donnees a titre d ’information.
iv
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@ IS0 IS0 12085:1996(F)
Introduction
La presente Norme internationale qui traite de la specification geometrique
des produits (GPS) est consideree comme une norme GPS g&Wale (voir
l ’lSO/rR 14638). Elle influence les maillons 2, 3 et 4 des cha ’ines de nor-
mes relatives au profil de rugosite et au profil d ’ondulation.
Pour de plus amples informations sur la relation de la presente Norme in-
ternationale avec les autres normes GPS, voir I ’annexe C.
L ’approche d&rite dans la presente Norme internationale permet de de-
terminer des parametres de rugosite et d ’ondulation a partir du profil pri-
maire en recherchant les motifs caracteristiques de la surface en tours
d ’examen. Cette methode nest lice 8 aucun filtre de profil et donne des
parametres qui sont bases sur la profondeur et le pas des motifs. Ces pa-
rametres, complementaires a ceux definis dans I ’ISO 4287, peuvent etre
utilises pour decrire les proprietes fonctionnelles des pieces, comme
I ’illustre l ’annexe B.
V
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NORME INTERNATIONALE @ IS0
IS0 12085:1996(F)
Spbcification gbombtrique des produits (GPS) - &at de
- Paramktres Ii& aux motifs
surface: Mbthode du profil
1 Domaine d ’application
La presente Norme internationale definit les termes et parametres pour la determination de Mat de surface par la
methode des motifs. Elle decrit egalement I ’operateur theorique et les conditions de mesurage correspondantes.
2 Rbfbrences normatives
Les normes suivantes contiennent des dispositions qui, par suite de la reference qui en est faite, constituent des
dispositions valables pour la presente Norme internationale. Au moment de la publication, les editions indiquees
etaient en vigueur. Toute norme est sujette a revision et les parties prenantes des accords fond& sur la presente
Norme internationale sont invitees a rechercher la possibilite d ’appliquer les editions les plus recentes des normes
indiquees ci-apt-es. Les membres de la CEI et de I ’ISO possedent le registre des Normes internationales en vigueur
a un moment donne.
IS0 1302: 1992, Dessins techniques - Indication des eta ts de surface.
IS0 3274: 1996, Specification geometrique des produits (GPS) - &at de surface: Methode du pro fil - Caracteristi-
ques nominales des instruments a contact (palpeur).
IS0 4287: I 996, Specification geometrique des produits (GPS) - &at de surface: Methode du profil- Termes, de-
finitions et parametres d ’eta t de surface.
I SO 4288: 1996, Specification geome trique des produits (G PS) - &at de surface: Methode du profil - Regles et
procedures pour I ’evaluation de &tat de surface.
3 Dbfinitions
Pour les besoins de la presente Norme internationale, les definitions suivantes s ’appliquent.
3.1 Dbfinitions ghkales
3.1.1 profil de surface: (Voir I ’ISO 4287.)
3.1.2 profil primaire: (Voir I ’ISO 3274.)
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3.1.3 saillie locale du profil: Partie du profil comprise entre deux minima adjacents du profil (voir figure 1).
/- Saillie locale du profil
Figure 1 - Saillie locale du profil
3.1.4 creux local du profil: Partie du profil comprise entre deux maxima adjacents du profil (voir figure 2).
- Creux local du profit
I
Figure 2
- Creux local du profil
3.1.5 motif: Portion du profil primaire comprise entre les points les plus hauts de deux saillies locales du profil,
consecutives ou non.
Un motif est caracterise par (voir figures 3 et 5):
- sa longueur, A& ou AWi, mesuree parallelement a la direction g&Wale du profil;
- ses deux profondeurs, Hj et Hj + 1 ou Hwj et Hwj + 1, mesurees perpendiculairement a la direction g&&ale du
prof il;
- sa caracteristique, T, egale a la plus petite des deux profondeurs.
T = MIN [Hi; Hj+ AI
ici: T = Hi+ 1
Figure 3 - Motif de rugosith
3.1.6 motif de rugositb: Motif calcule en utilisant I ’operateur theorique avec la valeur A (voir figure 3).
NOTE 1 Par dkfinition, un motif de rugosite a une bngueurAl?i infkrieure ou 6gale h A.
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3.1.7 ligne enveloppe supkrieure du profil primaire (profil d ’ondulation): Segments de droite joignant les
points les plus hauts des saillies du profil primaire, apres discrimination conventionnelle de certaines saillies (voir
figure 4).
Ligne enveloppe superieure
Figure 4 - Ligne enveloppe suphrieure
3.1.8 motif d ’ondulation: Motif determine sur la ligne enveloppe superieure du profil primaire en utilisant I ’opera-
teur theorique avec la valeur B (voir figure 5).
Ligne enveloppe supkrieure
\J
AWi
-
-
T = MIN [Hw~; HWj + 11
ici: T = HWj + 1
Figure 5 - Motif d ’ondulation
3.2 Dbfinitions de parametres
3.2.1 pas moyen des motifs de rugositb, AR: Moyenne arithmetique des longueurs ARi des motifs de rugosite, a
I ’interieur de la longueur d ’evaluation (voir figure 61, c ’est-a-dire
1 n
AR=- ARi
c
n
i=l
ou IZ est le nombre de motifs de rugosite (egal au nombre de valeurs ARi).
3.2.2 profondeur moyenne des motifs de rugositk, R: Moyenne arithmetique des profondeurs Hj des motifs de
rugosite, a l ’interieur de la longueur d ’evaluation (voir figure 6), c ’est-a-dire
1 m
R=- I$
c
m
j=l
ou m est le nombre de valeurs Hj.
NOTE 2 II y a deux fois plus de valeur H’ que de valeurs ARi (m = 212).
3.2.3 profondeur maximale d ’une irrbgularitb de profil, RX: Plus grande des profondeurs Hj a l ’interieur de la
longueur d ’evaluation.
EXEMPLE
Sur la figure 6: RX = H3.
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Figure 6 - Paramhtres de rugositb
3.2.4 pas moyen des motifs d ’ondulation, AW: Moyenne arithmetique des longueurs AWi des motifs d ’ondula-
tion, a I ’interieur de la longueur d ’evaluation (voir figure 7), c ’est-a-dire
1 Iz
AW=- AWi
c
n
i=l
00 y1 est le nombre de motifs d ’ondulation @gal au nombre de valeurs AWi).
3.2.5 profondeur moyenne des motifs d ’ondulation, WI Moyenne arithmetique des profondeurs HWj des motifs
d ’ondulation, a I ’interieur de la longueur d ’evaluation (voir figure 7), c ’est-a-dire
1 m
W=- Hy
c
m
j=l
ou m est le nombre de valeurs Hwj.
NOTE 3 II y a deux fois plus de valeurs HWj que de valeurs AWi (m = 2n).
3.2.6 profondeur maximale d ’ondulation, Wx: Plus grande des profondeurs Hwj, a I ’interieur de la longueur
d ’evaluation (voir figure 7).
3.2.7 profondeur totale d ’ondulation, Wte: Distance, mesuree perpendiculairement a la direction generale du
profil primaire, entre le point le plus haut et le point le plus bas de la ligne enveloppe superieure du profil primaire
(voir figure 7).
Ligne enveloppe
superieure
-7
Figure 7 - Paramktres d ’ondulation
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4 Opbrateur thborique de la mkthode des motifs
4.1 Ghhalith
Le present article decrit les conditions d ’identification des motifs (longueurs et discrimination des profondeurs) et
presente la procedure permettant de calculer les parametres de rugosite et d ’ondulation.
4.2 Limites conventionnelles des motifs
Les valeurs recommandees des limites A et B d&rites a la figure 8 sont donnees a I ’article 5.
0 l pas 15 A
L-----W
a) Motifs de rugositC
b) Motifs d ’ondulation
Figure 8 - Limites conventionnelles des motifs
4.3 Discrimination de profondeur
La discrimination de profondeur est appliquee au profil primaire pour evaluer la rugosite de surface.
4.3.1 Discrimination basbe sur la profondeur minimale
Diviser le profil primaire en sections de largeur A/2 et calculer la hauteur de chaque rectangle.
Les pits locaux pris en compte sont ceux dont la hauteur est superieure a 5 % de la hauteur moyenne de ces rec-
tangles (voir figure 9).
L--Pit local retenu
-Pit local &Liminb
-Hauteur de ce rectangle
(exemple)
(exemple)
Figure 9 - Discrimination de profondeur
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4.3.2 Discrimination basee sur la profondeur maximale
A partir des motifs de rugositi! de profondeur H ’, calculer zj (moyenne des Hj) et oI!$ (&art-type). Toute profon-
deur de saillie ou creux local supbrieure A H =
zj + I,65 03 est ramenbe a cette valeur H (voir figure 10).
NOTE 4 Si la distribution des Hj suit une loi normale, cette condition concerne 5 % des pits et des creux. Cette condition
6vite que les pits isok faussent la ligne enveloppe.
Figure 10 - Discrimination ba&e sur la profondeur maximale
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4.4 Identification des motifs de rugositb et d ’ondulation par la combinaison des motifs
(Ces quatre conditions se referent a la figure 11. Sur cette figure, R signifie rugosite et W signifie ondulation.)
Condition enveloppe
I
La premiere condition selectionne les pits plus eleves que I ’un des pits avoisinants
II Condition de largeur
La deuxieme condition limite la longueur d
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