kSIST FprEN IEC/IEEE 63195-2:2022
(Main)Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Part 2: Computational procedure
Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Part 2: Computational procedure
Identical adoption of future IEC/IEEE 63195-2 into EN IEC/IEEE 63195-2
Bewertung der Leistungsdichte der Exposition des Menschen gegenüber hochfrequenten Feldern von drahtlosen Geräten in unmittelbarer Nähe des Kopfes und des Körpers (Frequenzbereich von 6 GHz bis 300 GHz) - Teil 2: Berechnungsverfahren
Évaluation de la densité de puissance de l'exposition humaine aux champs radiofréquences provenant de dispositifs sans fil à proximité immédiate de la tête et du corps (plage de fréquences de 6 GHz à 300 GHz) - Partie 2: Procédure de calcul
Ocenjevanje gostote moči na človeku, izpostavljenem radiofrekvenčnim poljem iz brezžičnih naprav, ki so zelo blizu njegovi glavi in telesu (frekvenčno območje 6 GHz - 300 GHz) - 2. del: Izračunski postopek
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC/IEEE 63195-2:2022
01-september-2022
Ocenjevanje gostote moči na človeku, izpostavljenem radiofrekvenčnim poljem iz
brezžičnih naprav, ki so zelo blizu njegovi glavi in telesu (frekvenčno območje 6
GHz - 300 GHz) - 2. del: Izračunski postopek
Assessment of power density of human exposure to radio frequency fields from wireless
devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) -
Part 2: Computational procedure
Bewertung der Leistungsdichte der Exposition des Menschen gegenüber
hochfrequenten Feldern von drahtlosen Geräten in unmittelbarer Nähe des Kopfes und
des Körpers (Frequenzbereich von 6 GHz bis 300 GHz) - Teil 2: Berechnungsverfahren
Évaluation de la densité de puissance de l'exposition humaine aux champs
radiofréquences provenant de dispositifs sans fil à proximité immédiate de la tête et du
corps (plage de fréquences de 6 GHz à 300 GHz) - Partie 2: Procédure de calcul
Ta slovenski standard je istoveten z: prEN IEC/IEEE 63195-2
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
oSIST prEN IEC/IEEE 63195-2:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC/IEEE 63195-2:2022
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oSIST prEN IEC/IEEE 63195-2:2022
DRAFT
EUROPEAN STANDARD
prEN IEC/IEEE 63195-2
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2022
ICS 17.220.20 -
English Version
Assessment of power density of human exposure to radio
frequency fields from wireless devices in close proximity to the
head and body (frequency range of 6 GHz to 300 GHz) - Part 2:
Computational procedure
(IEC/IEEE 63195-2:2022)
Évaluation de la densité de puissance de l'exposition Bewertung der Leistungsdichte der Exposition des
humaine aux champs radiofréquences provenant de Menschen gegenüber hochfrequenten Feldern von
dispositifs sans fil à proximité immédiate de la tête et du drahtlosen Geräten in unmittelbarer Nähe des Kopfes und
corps (plage de fréquences de 6 GHz à 300 GHz) - des Körpers (Frequenzbereich von 6 GHz bis 300 GHz) -
Partie 2: Procédure de calcul Teil 2: Berechnungsverfahren
(IEC/IEEE 63195-2:2022) (IEC/IEEE 63195-2:2022)
This draft European Standard is submitted to CENELEC members for enquiry.
Deadline for CENELEC: 2022-09-16.
The text of this draft consists of the text of IEC/IEEE 63195-2:2022 (106/508/CDV).
If this draft becomes a European Standard, CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which
stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
This draft European Standard was established by CENELEC in three official versions (English, French, German).
A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to
the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
Recipients of this draft are invited to submit, with their comments, notification of any relevant patent rights of which they are aware and to
provide supporting documentation.
Warning : This document is not a European Standard. It is distributed for review and comments. It is subject to change without notice and
shall not be referred to as a European Standard.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Project: 70792 Ref. No. prEN IEC/IEEE 63195-2 E
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oSIST prEN IEC/IEEE 63195-2:2022
prEN IEC/IEEE 63195-2:2022 (E)
European foreword
This document (prEN IEC/IEEE 63195-2:2022) consists of the text of document
IEC/IEEE 63195-2:2022, prepared by IEC/TC 106 "Methods for the assessment of electric, magnetic
and electromagnetic fields associated with human exposure".
This document is currently submitted to the Enquiry.
The following dates are proposed:
• latest date by which the existence of this document (doa) dor + 6 months
has to be announced at national level
• latest date by which this document has to be (dop) dor + 12 months
implemented at national level by publication of an
identical national standard or by endorsement
• latest date by which the national standards (dow) dor + 36 months
conflicting with this document have to be withdrawn (to be confirmed or
modified when voting)
2
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oSIST prEN IEC/IEEE 63195-2:2022
prEN IEC/IEEE 63195-2:2022 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC/IEEE 2017 Determining the peak spatial-average specific - -
62704-1 absorption rate (SAR) in the human body from
wireless communications devices, 30 MHz to 6
GHz - Part 1: General requirements for using the
finite difference time-domain (FDTD) method for
SAR calculations
IEC/IEEE 2020 Determining the peak spatial-average specific - -
62704-4 absorption rate (SAR) in the human body from
wireless communication devices, 30 MHz to 6 GHz
- Part 4: General requirements for using the finite
element method for SAR calculations
1
IEC/IEEE 2022 Assessment of power density of human exposure EN IEC/IEEE —
63195-1 to radio frequency fields from wireless devices in 63195-1
close proximity to the head and body (frequency
range of 6 GHz to 300 GHz) - Part 1: Measurement
procedure
IEEE 145 - Definitions of terms for antennas - -
1
To be published. Stage at the time of publication: prEN IEC/IEEE 63195-1:2022.
3
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oSIST prEN IEC/IEEE 63195-2:2022
IEC/IEEE 63195-2
®
Edition 1.0 2022-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Assessment of power density of human exposure to radio frequency fields from
wireless devices in close proximity to the head and body (frequency range of
6 GHz to 300 GHz) –
Part 2: Computational procedure
Évaluation de la densité de puissance de l'exposition humaine aux champs
radiofréquences provenant de dispositifs sans fil à proximité immédiate de la
tête et du corps (plage de fréquences de 6 GHz à 300 GHz) –
Partie 2: Procédure de calcul
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-0184-8
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 10
3.1 Exposure metrics and parameters . 10
3.2 Spatial, physical, and geometrical parameters associated with exposure
metrics . 11
3.3 Test device technical operating and antenna parameters . 13
3.4 Computational parameters . 13
3.5 Uncertainty parameters . 14
4 Symbols and abbreviated terms . 14
4.1 Symbols . 14
4.1.1 Physical quantities . 14
4.1.2 Constants . 15
4.2 Abbreviated terms . 15
5 Overview and application of this document . 16
5.1 Overview of the numerical evaluation . 16
5.2 Application of this document . 17
5.3 Stipulations . 18
6 Requirements on the numerical software . 18
7 Model development and validation . 19
7.1 General . 19
7.2 Development of the numerical model of the DUT. 19
7.3 Power normalization . 20
7.4 Requirements on the experimental test equipment for model validation . 22
7.4.1 General . 22
7.4.2 Ambient conditions and device holder . 23
7.4.3 Power measurement . 23
7.5 Testing configurations for the validation of the DUT model . 24
7.5.1 General . 24
7.5.2 Tests to be performed . 24
7.5.3 Determining the validity of the DUT model . 25
7.5.4 Test reduction for additional DUTs . 25
8 Power density computation and averaging . 26
8.1 Evaluation surface . 26
8.2 Tests to be performed and DUT configurations . 26
8.2.1 General . 26
8.2.2 Devices with a single radiating element or with multiple elements that
do not operate simultaneously . 27
8.2.3 Devices with antenna arrays or sub-arrays . 27
8.2.4 Devices with multiple antennas or multiple transmitters . 28
8.3 Considerations on the evaluation surface and dimensions of the
computational domain . 29
8.4 Averaging of power density on an evaluation surface . 29
8.4.1 General . 29
8.4.2 Construction of the averaging area on an evaluation surface . 30
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8.5 Computation of sPD by integration of the Poynting vector. 31
8.5.1 General . 31
8.5.2 Surface-normal propagation-direction power density into the evaluation
surface, sPD . 31
n+
8.5.3 Total propagating power density into the evaluation surface, sPD . 32
tot+
8.5.4 Total power density directed into the phantom considering near-field
exposure, sPD . 32
mod+
8.6 Software . 33
9 Uncertainty evaluation . 33
9.1 General . 33
9.2 Uncertainty of the sPD and of the mpsPD due to the computational
parameters . 33
9.2.1 Uncertainty contributions due to the computational parameters . 33
9.2.2 Mesh resolution . 34
9.2.3 Absorbing boundary conditions . 35
9.2.4 Power budget . 35
9.2.5 Model truncation . 35
9.2.6 Convergence . 35
9.2.7 Dielectric properties . 36
9.2.8 Lossy conductors . 36
9.3 Uncertainty contribution of the computational representation of the DUT
model . 36
9.4 Uncertainty of the maximum exposure evaluation . 37
9.5 Uncertainty budget . 38
10 Reporting . 39
Annex A (normative) Code verification . 41
A.1 General . 41
A.2 Interpolation and superposition of vector field components . 41
A.3 Computation of the far-field pattern and the radiated power . 43
A.4 Implementation of lossy conductors . 43
A.5 Implementation of anisotropic dielectrics . 46
A.6 Computation of the sPD and psPD . 47
A.6.1 General . 47
A.6.2 Planar surfaces . 49
A.6.3 Non-planar surfaces . 50
A.7 Implementation of the field extrapolation according to the surface
equivalence principle . 52
Annex B (informative) Experimental evaluation of the radiated power . 53
B.1 General . 53
B.2 Direct conducted power measurements . 53
B.3 Radiated power measurement methods . 54
B.4 Information provided by the DUT . 54
Annex C (normative) Maximum-exposure evaluation techniques . 55
C.1 General . 55
C.2 Evaluation of EM fields radiated by each antenna element . 55
C.3 Evaluation of the mpsPD by superposition of individual EM fields . 56
C.3.1 General . 56
C.3.2 Maximization over the entire codebook by exhaustive search . 56
C.3.3 Optimization with fixed total conducted power. 56
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C.3.4 Optimization with fixed power at each port . 56
Annex D (informative) Examples of the implementation of power density averaging
algorithms . 58
D.1 Example for the evaluation of the psPD on a planar surface . 58
D.1.1 General . 58
D.1.2 Evaluation of the psPD by direct construction of the averaging area . 58
D.1.3 Example for the efficient evaluation of the psPD using an equidistant
mesh on the evaluation surface . 59
D.2 Example for the evaluation of the psPD on a non-planar surface . 60
Annex E (informative) File format for exchange of field data . 62
Annex F (informative) Rationales of the methods applied in IEC/IEEE 63195-1 and this
document . 64
F.1 Frequency range . 64
F.2 Computation of sPD . 64
F.2.1 Application of the Poynting vector for computation of incident power
density . 64
F.2.2 Averaging area . 65
Annex G (informative) Square averaging area on non-planar evaluation surfaces . 66
G.1 General . 66
G.2 Example implementation for the evaluation of the psPD on a non-planar
surface using square-shaped averaging area . 66
Annex H (informative) Validation of the maximum-exposure evaluation techniques . 67
H.1 General . 67
H.2 Validation of the exhaustive search . 67
H.2.1 Validation of the exhaustive search . 67
H.2.2 Validation using reconstruction method . 67
H.2.3 Validation of optimization with fixed total conducted power or with fixed
power at each port . 67
H.2.4 Validation of the maximum-exposure evaluation of measurement results . 67
H.3 Example validation source for maximum-exposure evaluation validation . 68
H.3.1 Description . 68
H.3.2 Positioning. 70
H.3.3 Nominal codebook, uncertainty and conducted power P . 71
R
H.3.4 Target values. 71
Annex I (normative) Supplemental files and their checksums . 73
Bibliography . 74
Figure 1 – Overview of the numerical power density evaluation procedure . 17
Figure 2 – Power reference planes . 22
Figure 3 – Example for configurations of radiating elements as different antenna sub-
arrays on the same DUT . 27
Figure 4 – Flow chart for the evaluation of power density for DUTs with antenna arrays
or sub-arrays as described in 8.2.3 . 28
Figure 5 – Example of the construction of the averaging area within a sphere with fixed
radius according to 8.4 . 31
Figure A.1 – Configuration of three λ/2 dipoles, D , D , and D , for the evaluation of
1 2 3
the interpolation and superposition of the electric field and magnetic field components . 42
Figure A.2 – R320 waveguide . 45
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Figure A.3 – Cross section of the R320 waveguide showing the locations of the E
y
components to be recorded . 46
Figure A.4 – S (x,y) computed with Formula (A.4) for the six parameter sets of
i
Table A.6 normalized to their maxima . 49
Figure A.5 – Cross sections of the symmetric quarters of the testing geometries (SAR
Stars) for the benchmarking of the power density averaging algorithm . 51
Figure A.6 – Areas for the computation of the sPD on a cone of the SAR Star . 51
Figure D.1 – Rotated averaging area on the discretized evaluation surface (base
mesh) . 60
Figure D.2 – Reduction of the area of triangles that are partially included in the
averaging sphere . 61
Figure H.1 – Main dimensions of patch array stencil . 69
Figure H.2 – Main dimensions of the validation device, including polypropylene casing . 70
Figure H.3 – Validation device with SAM head in the tilt position . 70
Figure H.4 – Validation device with SAM head in the touch position . 71
Table 1 – Budget of the uncertainty contributions of the computational algorithm for the
validation setup or testing setup . 34
Table 2 – Budget of the uncertainty of the developed model of the DUT . 37
Table 3 – Computational uncertainty budget . 38
Table A.1 – Interpolation and superposition of vector field components; maximum
permissible deviation from the reference results is 10 % . 42
Table A.2 – Computation of P ; maximum permissible deviation from the reference
R
results is 10 % for the radiated power and for the electric field amplitude of the far-
field pattern . 43
Table A.3 – Minimum fine and coarse mesh step for used method . 46
Table A.4 – Results of the evaluation of the computational dispersion characteristics . 46
Table A.5 – Results of the evaluation of the representation of anisotropic dielectrics . 47
Table A.6 – Parameters for the incident power density distribution of Formula (A.4) . 48
Table B.1 – Comparison of the experimental methods for the evaluation of the radiated
power . 53
Table H.1 – Main dimensions for the patch array stencil . 68
Table H.2 – Main dimensions of the validation device . 68
Table H.3 – Target values for validation device with the nominal codebook. 72
Table H.4 – Target values for validation device with infinite codebook . 72
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ASSESSMENT OF POWER DENSITY OF HUMAN EXPOSURE TO RADIO
FREQUENCY FIELDS FROM WIRELESS DEVICES IN CLOSE PROXIMITY
TO THE HEAD AND BODY (FREQUENCY RANGE OF 6 GHz TO 300 GHz) –
Part 2: Computational procedure
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC document(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
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with the IEC also participate in this preparation.
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