SIST EN 60679-5:2002
(Main)Quartz crystal controlled oscillators of assessed quality -- Part 5: Sectional specification - Qualification approval
Quartz crystal controlled oscillators of assessed quality -- Part 5: Sectional specification - Qualification approval
IEC 60679-5:1998 applies to quartz crystal controlled oscillators whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.
Quarzoszillatoren mit bewerteter Qualität -- Teil 5: Rahmenspezifikation - Bauartanerkennung
Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 5: Spécification intermédiaire - Homologation
IEC 60679-5:1998 s'applique aux oscillateurs pilotés par quartz, dont l'assurance de la qualité est basée sur l'homologation du composant. Elle prescrit les caractéristiques et valeurs préférentielles, accompagnées des essais appropriés et des méthodes de mesure contenus dans la spécification générique IEC 60679-1. Par ailleurs, y figurent les exigences de performance générales qui doivent être employées dans les spécifications particulières pour les oscillateurs pilotés par quartz.
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval (IEC 60679-5:1998)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 60679-5:2002
01-september-2002
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional
specification - Qualification approval (IEC 60679-5:1998)
Quartz crystal controlled oscillators of assessed quality -- Part 5: Sectional specification -
Qualification approval
Quarzoszillatoren mit bewerteter Qualität -- Teil 5: Rahmenspezifikation -
Bauartanerkennung
Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 5: Spécification
intermédiaire - Homologation
Ta slovenski standard je istoveten z: EN 60679-5:1998
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60679-5:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 60679-5:2002
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SIST EN 60679-5:2002
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SIST EN 60679-5:2002
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SIST EN 60679-5:2002
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SIST EN 60679-5:2002
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SIST EN 60679-5:2002
NORME
CEI
INTERNATIONALE
IEC
60679-5
INTERNATIONAL
QC 690200
STANDARD
Première édition
First edition
1998-04
Oscillateurs pilotés par quartz
sous assurance de la qualité –
Partie 5:
Spécification intermédiaire –
Homologation
Quartz crystal controlled oscillators
of assessed quality –
Part 5:
Sectional specification –
Qualification approval
IEC 1998 Droits de reproduction réservés Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE P
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 9
1.1 Scope. 9
1.2 Normative references . 9
2 Preferred ratings and guidance on detail specifications. 9
2.1 Preferred values for ratings and characteristics. 9
2.2 Information to be prescribed in detail specifications . 9
3 Quality assessment procedures. 13
3.1 Eligibility for qualification approval . 13
3.2 Structurally similar components . 13
3.3 Certified test records . 13
3.4 Qualification approval . 13
3.5 Quality conformance inspection . 15
Tables
1 Sampling plan together with numbers of permissible defectives
for qualification approval tests . 17
2 Lot-by-lot tests . 19
3 Periodic tests . 21
Annex A (normative) Test schedule for qualification approval. 23
Annex B (normative) Ageing test. 31
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 5: Sectional specification – Qualification approval
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60679-5 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
It forms part 5 of the standard series for quartz crystal controlled oscillators and also forms a
specification for quartz crystal controlled oscillators of assessed quality and constitutes the
sectional specification – Qualification approval.
The text of this standard is based on the following documents:
FDIS Report on voting
49/396/FDIS 49/406/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 7 –
IEC 60679 consists of the following parts under the general title Quartz crystal controlled
oscillators of assessed quality:
– Part 1: Generic specification (IEC 60679-1)
– Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2)
– Part 3: Standard outlines and lead connections (IEC 60679-3)
– Part 4: Sectional specification – Capability approval (IEC 60679-4)
– Part 4-1: Blank detail specification – Capability approval (IEC 60679-4-1)
– Part 5: Sectional specification – Qualification approval (IEC 60679-5)
– Part 5-1: Blank detail specification – Qualification approval (IEC 60679-5-1)
The QC number which appears on the front cover of this publication is the specification number
in the IEC Quality Assessment System for Electronic Components (IECQ).
Annexes A and B form an integral part of this standard.
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 9 –
QUARTZ CRYSTAL CONTROLLED OSCILLATORS
OF ASSESSED QUALITY –
Part 5: Sectional specification – Qualification approval
1 General
1.1 Scope
This sectional specification applies to quartz crystal controlled oscillators whose quality is
assessed on the basis of capability approval.
It prescribes the preferred ratings and characteristics, with appropriate tests and measuring
methods contained in the generic specification IEC 60679-1, and gives the general perform-
ance requirements to be used in detail specifications for quartz crystal controlled oscillators.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 60679. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 60679 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 60679-1:1997, Quartz crystal controlled oscillators of assessed quality – Part 1: Generic
specification
IEC 60679-5-1:1998, Quartz crystal controlled oscillators of assessed quality – Part 5-1: Blank
detail specification – Qualification approval
IEC QC 001002:1986, Rules of Procedure of the IEC Quality Assessment System for Electronic
Components (IECQ)
2 Preferred ratings and guidance on detail specifications
2.1 Preferred values for ratings and characteristics
The values given in detail specifications shall preferably be selected from those stated in 2.3 of
IEC 60679-1.
2.2 Information to be prescribed in detail specifications
Guidance on the preparation of detail specifications shall be derived from the future blank
detail specification, IEC 60679-5-1.
Each detail specification shall state all the tests and measurements required for inspection.
This shall, as a minimum, include the relevant tests given in the blank detail specification, with
methods and severities.
The following information shall be given in each detail specification.
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 11 –
2.2.1 Outline drawing and dimensions
The detail specification shall include a dimensional drawing of the crystal controlled oscillator
and/or the reference to an appropriate international standard to permit easy recognition and to
provide information for dimensioning and gauging procedures.
The dimensions shall include the overall dimensions of the body of the component and the size
and spacing of the terminations. All dimensions shall be stated in millimetres.
Terminal connections shall be identified for all enclosures.
This information may be given in more detail in an annex.
2.2.2 Mounting of the component
The detail specification shall define any assembly restrictions on the use of the crystal
controlled oscillator. Where these restrictions apply special mounting fixtures may be required
for the bump, shock, vibration and acceleration tests. Such fixtures shall be described in the
detail specification.
Where no special mounting fixtures are indicated, then the above tests shall be carried out as
specified in clause 4 of IEC 60679-1.
2.2.3 Severities for environmental tests
The detail specification shall state the method of testing and the appropriate severities selected
from clause 4 of IEC 60679-1.
2.2.4 Marking
The detail specification shall state the required marking on the crystal controlled oscillator and
on the primary package in accordance with 2.4 of IEC 60679-1.
2.2.5 Ordering information
The detail specification shall prescribe that the following information is required when ordering
a crystal controlled oscillator:
a) quantity;
b) detail specification number, issue number and date; and where applicable;
c) nominal frequency expressed in kilohertz (kHz) or megahertz (MHz);
d) enclosure type;
e) frequency tolerance(s) and operating temperature range;
f) full description of any additional requirement.
2.2.6 Additional information (not for inspection purposes)
The detail specification may include information which is not normally required to be verified by
the inspection procedure, such as circuit diagrams, curves, drawings and notes needed for
clarification.
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SIST EN 60679-5:2002
60679-5 © IEC:1998 – 13 –
3 Quality assessment procedures
3.1 Eligibility for qualification approval
Prior to making an application for qualification approval a manufacturer shall first obtain
manufacturer's inspection approval in accordance with 11.1 of IEC QC 001002.
The primary stage of manufacture shall be as defined in 3.1 of IEC 60679-1.
3.2 Structurally similar components
Structural similarity exists where a range of quartz crystal controlled oscillators covered by a
single detail specification and having similar electrical characteristics, incorporate the same
materials and method of sealing the enclosure.
3.3 Certified te
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