SIST EN 61019-1:2005

Surface acoustic wave (SAW) resonators -- Part 1: Generic specification

Specifies the methods of test and general requirements for SAW resonators.

Oberflächenwellenresonatoren (OFW-Resonatoren) -- Teil 1: Fachgrundspezifikation

Résonateurs à ondes acoustiques de surface (OAS) -- Partie 1: Spécification générique

Specifies the methods of test and general requirements for SAW resonators.

Resonatorji za površinske akustične valove – 1. del: Generična specifikacija (IEC 61019-1:2004)

General Information

• Status: Published
• Publication Date: 30-Nov-2005
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Dec-2005
• Due Date: 01-Dec-2005
• Completion Date: 01-Dec-2005
• Ref Project: EN 61019-1:2005 - Surface acoustic wave (SAW) resonators - Part 1: Generic specification

Standards Content (Sample)

SLOVENSKI SIST EN 61019-1:2005

STANDARD
december 2005
Resonatorji za površinske akustične valove – 1. del: Generična specifikacija
(IEC 61019-1:2004)
Surface acoustic wave (SAW) resonators – Part 1: Generic specification (IEC
61019-1:2004)
ICS 31.140 Referenčna številka
SIST EN 61019-1:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 61019-1
NORME EUROPÉENNE
EUROPÄISCHE NORM January 2005

ICS 31.140


English version


Surface acoustic wave (SAW) resonators
Part 1: Generic specification
(IEC 61019-1:2004)


Résonateurs à ondes acoustiques  Oberflächenwellenresonatoren
de surface (OAS) (OFW-Resonatoren)
Partie 1: Spécification générique Teil 1: Fachgrundspezifikation
(CEI 61019-1:2004) (IEC 61019-1:2004)






This European Standard was approved by CENELEC on 2004-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 61019-1:2005 E

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EN 61019-1:2005 - 2 -
Foreword
The text of document 49/689/FDIS, future edition 1 of IEC 61019-1, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 61019-1 on 2004-12-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-12-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61019-1:2004 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 61019-1:2005
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical HD 60027 Series
technology HD 245

IEC 60050-561 1991 International Electrotechnical - -
Vocabulary (IEV)
Chapter 561: Piezoelectric devices for
frequency control and selection

1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance

IEC 60068-2-1 1990 Part 2: Tests - Tests A: Cold EN 60068-2-1 1993

2)
IEC 60068-2-2 1974 Part 2: Tests - Tests B: Dry heat EN 60068-2-2 1993

IEC 60068-2-6 1995 Part 2: Tests - Test Fc: Vibration
+ corr. March 1995 (sinusoidal) EN 60068-2-6 1995

3)
IEC 60068-2-7 1983 Part 2: Tests - Test Ga: Acceleration, EN 60068-2-7 1993
steady state

IEC 60068-2-13 1983 Part 2: Tests - Test M: Low air pressure EN 60068-2-13 1999

4)
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of EN 60068-2-14 1999
temperature

IEC 60068-2-17 1994 Part 2: Tests - Test Q: Sealing EN 60068-2-17 1994

5)
IEC 60068-2-20 1979 Part 2: Tests - Test T: Soldering HD 323.2.20 S3 1988

IEC 60068-2-21 1999 Part 2-21: Tests - Test U: Robustness EN 60068-2-21 1999
of terminations and integral mounting
devices


1)
EN 60068-1 includes Corrigendum October 1988 + A1:1992 to IEC 60068-1.
2)
EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2.
3)
EN 60068-2-7 includes A1:1986 to IEC 60068-2-7.
4)
EN 60068-2-14 includes A1:1986 to IEC 60068-2-14.
5)
HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20.

---------------------- Page: 4 ----------------------

EN 61019-1:2005 - 4 -
Publication Year Title EN/HD Year
IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: EN 60068-2-27 1993
Shock

IEC 60068-2-29 1987 Part 2: Tests - Test Eb and guidance:
+ Corrigendum Bump EN 60068-2-29 1993

6)
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: EN 60068-2-30 1999
Damp heat, cyclic (12 + 12-hour cycle)

7)
IEC 60068-2-32 1975 Part 2: Tests - Test Ed: Free fall EN 60068-2-32 1993
(Procedure 1)

IEC 60068-2-45 1980 Part 2: Tests - Test Xa and guidance: EN 60068-2-45 1992
Immersion in cleaning solvents

IEC 60068-2-52 1996 Part 2: Tests - Test Kb: Salt mist, cyclic EN 60068-2-52 1996
(sodium chloride solution)

8)
IEC 60068-2-58 1999 Part 2-58: Tests - Test Td: Test EN 60068-2-58 1999
methods for solderability, resistance to
dissolution of metallization and to
soldering heat of surface mounting
devices (SMD)

IEC 60068-2-64 1993 Part 2: Test methods - Test Fh: EN 60068-2-64 1994
+ Corr. October 1993 Vibration, broad-band random (digital
control) and guidance

IEC 60068-2-78 2001 Part 2-78: Tests - Test Cab: Damp heat, EN 60068-2-78 2001
steady state

database
IEC 60617 Graphical symbols for diagrams - -

IEC 60122-1 2002 Quartz crystal units of assessed quality EN 60122-1 2002
Part 1: Generic specification

IEC 60444 Series Measurement of quartz crystal unit EN 60444 Series
parameters

IEC 61000-4-2 1995 Electromagnetic compatibility (EMC) EN 61000-4-2 1995
Part 4-2: Testing and measurement
techniques - Electrostatic discharge
immunity test

IEC 61019-2 1995 Surface acoustic wave (SAW) EN 61019-2 1997
resonators
Part 2: Guide to the use

IEC 61019-3 1991 Part 3: Standard outlines and lead - -
connections


6)
EN 60068-2-30 includes A1:1985 to IEC 60068-2-30.
7)
EN 60068-2-32 includes A2:1990 to IEC 60068-2-32.
8)
EN 60068-2-58 is superseded by EN 60068-2-58:2004, which is based on IEC 60068-2-58:2004.

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- 5 - EN 61019-1:2005
Publication Year Title EN/HD Year
IEC QC 001001 2002 IEC Quality assessment system for - -
electronic components (IECQ) - Basic
rules

IEC QC 001002-2
1998 IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules
of Procedure
Part 2: Documentation

IEC QC 001002-3
1998 Part 3: Approval procedures - -

IEC QC 001005 2003 IEC Quality assessment system for - -
electronic components (IECQ) -
Register of films, products and services
approved under the IECQ system,
including ISO 9000

ISO 1000 1992 SI units and recommendations for the - -
use of their multiples and of certain
other units

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INTERNATIONAL IEC


STANDARD 61019-1





First edition
2004-11


Surface acoustic wave (SAW) resonators –
Part 1:
Generic specification

 IEC 2004  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale W
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

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– 2 – 61019-1  IEC:2004(E)
CONTENTS

FOREWORD.4

1 Scope.6
2 Normative references .6
3 Order of precedence.8
4 Terms and definitions .8
4.1 General terms .8
4.2 Operational properties.11
5 Preferred values for ratings and characteristics .19
5.1 Standard nominal frequency values in megahertz (MHz) .19
5.2 Standard operating temperature ranges in degrees Celsius (°C) .19
5.3 Standard values of load capacitance in picofarads (pF).19
5.4 Standard levels of drive in milliwatts (mW) .19
5.5 Standard values of minimum insertion attenuation in decibels (dB).19
5.6 Standard climatic category .20
5.7 Bump severity .20
5.8 Vibration severity .20
5.9 Shock severity.20
5.10 Fine leak rate .21
6 Marking .21
6.1 Resonator marking .21
6.2 Package marking.21
7 Quality assessment procedures.21
7.1 Primary stage of manufacture.21
7.2 Structurally similar components.21
7.3 Subcontracting .22
7.4 Incorporated components .22
7.5 Manufacturer’s approval .22
7.6 Approval procedures .22
7.7 Procedures for capability approval .23
7.8 Procedures for qualification approval.23
7.9 Test procedures .24
7.10 Screening requirements .24
7.11 Rework and repair work.24
7.12 Certified records of released lots.24
7.13 Validity of release.24
7.14 Release for delivery .24
7.15 Unchecked parameters.24
8 Test and measurement procedures.24
8.1 General .24
8.2 Test and measurement conditions .25
8.3 Visual inspection .26

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61019-1  IEC:2004(E) – 3 –
8.4 Dimensions and gauging procedures .26
8.5 Measurement method of one-port resonator .26
8.6 Measurement method of two-port resonator.28
8.7 Mechanical and environmental test procedures .32
8.8 Endurance test procedure .37

Figure 1 – Basic configurations of SAW resonators.9
Figure 2 – One-port resonator equivalent circuit .12
Figure 3 – Vector admittance diagram of a one-port SAW resonator .14
Figure 4 – Typical frequency characteristics of a one-port SAW resonator inserted into
a transmission line in series (see 4.2.10.2.1 and 4.2.10.3.1).14
Figure 5 – Resonance and anti-resonance frequencies .15
Figure 6 – Two-port resonator equivalent circuits.17
Figure 7 – Typical frequency characteristics of a two-port resonator .18
Figure 8 – Reflection measurement .27
Figure 9 – Transmission measurement .29

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– 4 – 61019-1  IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

SURFACE ACOUSTIC WAVE (SAW) RESONATORS –

Part 1: Generic specification


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61019-1 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This first edition of IEC 61019-1 cancels and replaces the first edition of IEC 61019-1-1
published in 1990 and the first edition of IEC 61019-1-2 published in 1993. It constitutes a
technical revision.
The text of this standard is based on the following documents:
FDIS Report on voting
49/689FDIS 49/698/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO IEC Directives, Part 2.

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61019-1  IEC:2004(E) – 5 –
IEC 61019 consists of the following parts under the general title Surface acoustic wave (SAW)
resonators:
Part 1: Generic specification
Part 2: Guide to the use (at present under revision)
Part 3: Standard outlines and lead connections

The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

A bilingual version of this publication may be issued at a later date.

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– 6 – 61019-1  IEC:2004(E)
SURFACE ACOUSTIC WAVE (SAW) RESONATORS –

Part 1: Generic specification



1 Scope
This part of IEC 61019 specifies the methods of test and general requirements for SAW
resonators using either capability approval or qualification approval procedures of the IECQ
system.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050-561:1991, International Electrotechnical Vocabulary (IEC) – Chapter 561: Piezo-
electric devices for frequency control and selection
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Tests B: Dry heat
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Test Ga and guidance:
Acceleration, steady state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Test M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperature
IEC 60068-2-17:1994, Environmental testing – Part 2: Tests – Test Q: Sealing
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Test T: Soldering
IEC 60068-2-21:1999, Environmental testing – Part 2-21: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock
IEC 60068-2-29:1987, Environmental testing – Part 2: Tests – Test Eb and guidance: Bump
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance: Damp
heat, cyclic (12 + 12-hour cycle)

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61019-1  IEC:2004(E) – 7 –
IEC 60068-2-32:1975, Environmental testing – Part 2: Tests – Test Ed: Free fall
IEC 60068-2-45:1980, Environmental testing – Part 2: Tests – Test XA and guidance:
Immersion in cleaning solvents
IEC 60068-2-52:1996, Environmental testing – Part 2: Tests – Test Kb: Salt mist, cyclic
(sodium chloride solution)
IEC 60068-2-58:1999, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-64:1993, Environmental testing – Part 2: Tests – Test Fh: Vibration, broad-band
random (digital control) and guidance
IEC 60068-2-78:2001, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat,
steady state
1
IEC 60617 – DB:2001 Graphical symbols for diagrams
IEC 60122-1:2002, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60444 (all parts), Measurement of quartz crystal unit parameters
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 2: Electrostatic discharge immunity test. Basic EMC Publication
IEC 61019-2:1995, Surface acoustic wave (SAW) resonators – Part 2: Guide to the use
IEC 61019-3:1991, Surface acoustic wave (SAW) resonators – Part 3: Standard outlines and
lead connections
QC 001001:2002, IEC Quality Assessment System for Electronic Components (IECQ) – Basic
Rules
QC 001002-2:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 2: Documentation
QC 001002-3:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 3: Approval procedures
QC 001005:2003, IEC Quality Assessment System for Electronic Components (IECQ) –
Register of Firms, Products and Services approved under the IECQ System, including
ISO 9000
ISO 1000:1992, SI units and recommendations for the use of their multiples and of certain
other units
———————
1
 DB refers to the IEC on-line database.

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– 8 – 61019-1  IEC:2004(E)
3 Order of precedence
Where any discrepancies occur for any reason, documents shall rank in the following order of
precedence:
– the detail specification;
– the sectional specification;
– the generic specification;
– any other international document (for example, of the IEC) to which reference is made.
The same order of precedence shall apply to equivalent national documents.
4 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken
from the following standards: IEC 60027, IEC 60050-561, IEC 60122-1, IEC 60617, IEC 60642,
ISO 1000.
4.1 General terms
4.1.1
surface acoustic wave (SAW)
acoustic wave, propagating along the surface of an elastic substrate, whose amplitude decays
exponentially with substrate depth
4.1.2
surface acoustic wave resonator (SAW resonator or SAWR)
resonator using multiple reflections of surface acoustic waves
4.1.3
one-port resonator
SAW resonator having a pair of terminals (see 4.2.10 and Figure 1)
4.1.4
two-port resonator
SAW resonator having input and output ports (see 4.2.11 and Figure 1)

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61019-1  IEC:2004(E) – 9 –


IEC  1440/04

a) One-port resonator with opened arrays


IEC  1441/04

b) Two-port resonator with shorted arrays
Figure 1 – Basic configurations of SAW resonators
4.1.5
SAW resonator oscillator
oscillator that uses a SAW resonator as the main frequency controlling element
4.1.6
interdigital transducer (IDT)
SAW transducer made of a comb-like conductive structure deposited on a piezoelectric
substrate transforming electrical energy into acoustic energy or vice versa
4.1.7
finger
element of the IDT comb electrode
4.1.8
dummy finger
passive finger which may be included in order to suppress wave-front distortion
4.1.9
bus bar
common electrode which connects individual fingers together and also connects the resonator
to an external circuit
4.1.10
shorting bar
common electrode which interconnects individual metal strips (see Figure 1)

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– 10 – 61019-1  IEC:2004(E)
4.1.11
apodization (spurious suppression for SAW resonator)
weighting produced by the change in finger overlap over the length of the IDT to suppress the
transverse spurious modes
4.1.12
SAW coupling coefficient
2
k
S
SAW electromechanical coupling coefficient is defined as follows:
2
k = 2 Δv /v
S

where Δv/v is the relative velocity change produced by short-circuiting the surface potential
from the open-circuit condition
4.1.13
grating reflector
SAW reflecting array that normally makes use of the periodic discontinuity provided by metal
strips, grooves or ridges
4.1.14
metal strip array
periodic discontinuity realised by electrically short- or open-circuit metal strips providing
electrical and mass-loaded perturbations
4.1.15
grooved array
periodic discontinuity realized by topographic perturbation on a surface having shallow
grooves
4.1.16
ridge array
periodic discontinuity realized by the mass-loaded perturbation of the surface having thin
layer strips
4.1.17
shorted array
metal strip array interconnected with a shorting bar (see Figure 1b))
4.1.18
opened array
metal strip array without a metal strip array interconnection (see Figure 1a))
4.1.19
mass loading
perturbation in the SAW propagation caused by the mass of an overlay on the substrate
surface
4.1.20
IDT aperture
maximum IDT finger overlap length which approximately corresponds to the SAW beamwidth,
where the aperture may be expressed in length units or normalized term of wavelength

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61019-1  IEC:2004(E) – 11 –
4.2 Operational properties
4.2.1
nominal frequency
frequency given by the manufacturer or the specification to identify the resonator
4.2.2
working frequency
f
w
operational frequency of the resonator together with its associated circuits
4.2.3
frequency tolerance
4.2.3.1
overall tolerance
maximum permissible deviation of the working frequency from the nominal frequency due to a
specific cause or a combination of causes
4.2.3.2
adjustment tolerance
permissible deviation of the working frequency from the nominal frequency at the reference
temperature under specified conditions
4.2.3.3
ageing tolerance
permissible deviation due to time under specified conditions
4.2.3.4
tolerance over the temperature range
permissible deviation over the temperature range with respect to the frequency at the
specified reference temperature
4.2.3.5
tolerance due to level of drive variation
permissible deviation due to the level of drive variation
4.2.4
operating temperature range
range of temperatures as measured on the enclosure over which the resonator must function
within the specified tolerances
4.2.4.1
operable temperature range
range of temperatures as measured on the encl
...