Nanotechnologies - Guidance on the measurement of nanoparticle number concentration (ISO/TS 24672:2023)

This document provides an overview of the methods used to determine the nanoparticle number concentration in liquid dispersions and aerosols. The methods described are the ensemble measurement techniques of differential centrifugal sedimentation (DCS), multi-angle dynamic light scattering (MDLS), small-angle X-ray scattering (SAXS) and ultraviolet-visible spectroscopy (UV-vis) and the particle counting methods of particle tracking analysis (PTA), resistive pulse sensing (RPS), single particle inductively coupled plasma mass spectrometry (spICP-MS), condensation particle counter (CPC), and differential mobility analysing system (DMAS). This document provides information on the use of each technique, along with considerations on sample preparation, advantages and limitations.

Nanotechnologien - Leitfaden für die Messung der Konzentration von Nanopartikeln (ISO/TS 24672:2023)

Nanotechnologies - Conseils pour la mesure de la concentration en nombre de nanoparticules (ISO/TS 24672:2023)

Nanotehnologije - Navodilo za merjenje številčnosti koncentracije nanodelcev (ISO/TS 24672:2023)

Ta dokument vsebuje pregled metod za določanje številčnosti koncentracije nanodelcev v tekočih disperzijah in aerosolih. Opisane so naslednje metode: tehnike skupinskega merjenja, tj. diferencialna centrifugalna sedimentacija (DCS), dinamično sipanje svetlobe pod več koti (MDLS), sipanje rentgenskih žarkov pod majhnim kotom (SAXS) in ultravijolično-vidna spektroskopija (UV-vis) ter metode štetja delcev, tj. analiza sledenja delcev (PTA), uporovno pulzno zaznavanje (RPS), masna spektrometrija posameznih delcev z induktivno sklopljeno plazmo (spICP-MS), kondenzacijski števec delcev (CPC) in sistem za analizo diferencialne mobilnosti (DMAS). Ta dokument vsebuje informacije o uporabi posamezne tehnike ter vidike glede priprave vzorcev, prednosti in omejitev.

General Information

Status
Published
Public Enquiry End Date
30-Jul-2024
Publication Date
07-Oct-2024
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
02-Oct-2024
Due Date
07-Dec-2024
Completion Date
08-Oct-2024

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SLOVENSKI STANDARD
01-november-2024
Nanotehnologije - Navodilo za merjenje številčnosti koncentracije nanodelcev
(ISO/TS 24672:2023)
Nanotechnologies - Guidance on the measurement of nanoparticle number
concentration (ISO/TS 24672:2023)
Nanotechnologien - Leitfaden für die Messung der Konzentration von Nanopartikeln
(ISO/TS 24672:2023)
Nanotechnologies - Conseils pour la mesure de la concentration en nombre de
nanoparticules (ISO/TS 24672:2023)
Ta slovenski standard je istoveten z: CEN ISO/TS 24672:2024
ICS:
07.120 Nanotehnologije Nanotechnologies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

CEN ISO/TS 24672
TECHNICAL SPECIFICATION
SPÉCIFICATION TECHNIQUE
September 2024
TECHNISCHE SPEZIFIKATION
ICS 07.120
English Version
Nanotechnologies - Guidance on the measurement of
nanoparticle number concentration (ISO/TS 24672:2023)
Nanotechnologies - Conseils pour la mesure de la Nanotechnologien - Leitfaden für die Messung der
concentration en nombre de nanoparticules (ISO/TS Konzentration von Nanopartikeln (ISO/TS
24672:2023) 24672:2023)
This Technical Specification (CEN/TS) was approved by CEN on 9 September 2024 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and
United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2024 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN ISO/TS 24672:2024 E
worldwide for CEN national Members.

Contents Page
European foreword . 3

European foreword
The text of ISO/TS 24672:2023 has been prepared by Technical Committee ISO/TC 229
"Nanotechnologies” of the International Organization for Standardization (ISO) and has been taken over
as CEN ISO/TS 24672:2024 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of
which is held by AFNOR.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national standards body.
A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Türkiye and the
United Kingdom.
Endorsement notice
The text of ISO/TS 24672:2023 has been approved by CEN as CEN ISO/TS 24672:2024 without any
modification.
TECHNICAL ISO/TS
SPECIFICATION 24672
First edition
2023-11
Nanotechnologies — Guidance on the
measurement of nanoparticle number
concentration
Nanotechnologies — Conseils pour la mesure de la concentration en
nombre de nanoparticules
Reference number
ISO/TS 24672:2023(E)
ISO/TS 24672:2023(E)
© ISO 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii
ISO/TS 24672:2023(E)
Contents Page
Foreword .v
Introduction . vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Abbreviated terms . 4
5 Overview . 5
5.1 General . 5
5.2 Comparison of different techniques . 5
5.3 Considerations when selecting a technique . 8
5.3.1 General . 8
5.3.2 Type of particles. 8
5.3.3 Number concentration range . 9
5.3.4 Accuracy and precision . 9
5.3.5 Other factors . 10
5.4 Unit for nanoparticle number concentration . 10
6 Ensemble techniques . .11
6.1 Differential centrifugal sedimentation . 11
6.1.1 General . 11
6.1.2 Sample specifications .12
6.1.3 Technical aspects .12
6.1.4 Sources of uncertainty and challenges . 14
6.1.5 Outlook .15
6.2 Multi-angle dynamic light scattering . 15
6.2.1 General .15
6.2.2 Sample specifications . .15
6.2.3 Technical aspects . 16
6.2.4 Sources of uncertainty and challenges . 17
6.2.5 Outlook . 17
6.3 Small-angle X-ray scattering . 17
6.3.1 General . 17
6.3.2 Sample specifications . 18
6.3.3 Technical aspects . 18
6.3.4 Sources of uncertainty and challenges . 20
6.3.5 Outlook . 20
6.4 Ultraviolet-visible spectroscopy . 20
6.4.1 General .20
6.4.2 Sample specifications . . 21
6.4.3 Technical aspects . 21
6.4.4 Sources of uncertainty and challenges . 22
6.4.5 Outlook .23
7 Particle counting techniques .23
7.1 Particle tracking analysis .23
7.1.1 General .23
7.1.2 Sample specifications . .23
7.1.3 Technical aspects . 24
7.1.4 Sources of uncertainty and challenges . 24
7.1.5 Outlook .
...

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