SIST EN 62341-1-1:2010

Organic Light Emitting Diode (OLED) displays - Part 1-1: Generic specifications (IEC 62341-1-1:2009)

This part of IEC 62341 is a generic specification for organic light emitting diode (OLED) displays. It defines general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.

Anzeigen mit organischen Leuchtdioden - Teil 1-1: Fachgrundspezifikation (IEC 62341-1-1:2009)

Afficheurs à diodes électroluminescentes organiques (OLED) - Partie 1-1: Spécifications génériques (CEI 62341-1-1:2009)

La CEI 62341-1-1:2009 est une spécification générique pour les afficheurs à diodes électroluminescentes organiques (OLED; en anglais Organic Light Emitting Diode). Elle définit les procédures générales pour l'assurance de la qualité à utiliser dans le système IECQ-CECC et établit des règles générales pour les méthodes de mesures électriques et optiques, les essais d'environnement et mécaniques et les essais d'endurance.

Prikazovalniki z organskimi svetlečimi diodami (OLED) - 1-1. del: Rodovna specifikacija (IEC 62341-1-1:2009)

Ta del IEC 62341 je rodovna specifikacija za prikazovalnike z organskimi svetlečimi diodami (OLED). Opredeljuje splošne postopke za ocenjevanje kakovosti, ki se uporabljajo v IECQ-CECC sistemu in vzpostavlja splošna pravila za metode električnih in optičnih merjenj, okoljskih in mehanskih preskušanj in preskuse vzdržljivosti.

General Information

• Status: Published
• Publication Date: 17-Jan-2010
• ICS: 31.120 - Electronic display devices
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 22-Dec-2009
• Due Date: 26-Feb-2010
• Completion Date: 18-Jan-2010
• Ref Project: EN 62341-1-1:2009 - Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62341-1-1:2010
01-februar-2010
3ULND]RYDOQLNL]RUJDQVNLPLVYHWOHþLPLGLRGDPL2/('GHO5RGRYQD
VSHFLILNDFLMD,(&
Organic Light Emitting Diode (OLED) displays - Part 1-1: Generic specifications (IEC
62341-1-1:2009)
Anzeigen mit organischen Leuchtdioden - Teil 1-1: Fachgrundspezifikation (IEC 62341-1-
1:2009)
Afficheurs à diodes électroluminescentes organiques (OLED) - Partie 1-1: Spécifications
génériques (CEI 62341-1-1:2009)
Ta slovenski standard je istoveten z: EN 62341-1-1:2009
ICS:
31.120 Elektronske prikazovalne Electronic display devices
naprave
SIST EN 62341-1-1:2010 en,fr
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62341-1-1:2010

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SIST EN 62341-1-1:2010

EUROPEAN STANDARD
EN 62341-1-1

NORME EUROPÉENNE
December 2009
EUROPÄISCHE NORM

ICS 31.260


English version


Organic light emitting diode (OLED) displays -
Part 1-1: Generic specifications
(IEC 62341-1-1:2009)


Afficheurs à diodes électroluminescentes Anzeigen mit organischen Leuchtdioden -
organiques (OLED) - Teil 1-1: Fachgrundspezifikation
Partie 1-1: Spécifications génériques (IEC 62341-1-1:2009)
(CEI 62341-1-1:2009)




This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: Avenue Marnix 17, B - 1000 Brussels


© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62341-1-1:2009 E

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SIST EN 62341-1-1:2010
EN 62341-1-1:2009 - 2 -
Foreword
The text of document 110/168/FDIS, future edition 1 of IEC 62341-1-1, prepared by IEC TC 110, Flat
panel display devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC
as EN 62341-1-1 on 2009-12-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2010-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2012-12-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62341-1-1:2009 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60027-1 NOTE  Harmonized as EN 60027-1:2006 (not modified).
IEC 60027-4 NOTE  Harmonized as EN 60027-4:2007 (not modified).
ISO 1101 NOTE  Harmonized as EN ISO 1101:2005 (not modified).
__________

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SIST EN 62341-1-1:2010
- 3 - EN 62341-1-1:2009
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60410 1973 Sampling plans and procedures - -
for inspection by attributes


IEC 60747-1 2006 Semiconductor devices - - -
Part 1: General


1) 2)
IEC 62341-1-2 - Organic light emitting diode displays - EN 62341-1-2 2009
Part 1-2: Terminology and letter symbols


IEC 62341-5 2009 Organic Light Emitting Diode (OLED) EN 62341-5 2009
displays -
Part 5: Environmental testing methods


1)
IEC 62341-6-1 - Organic light emitting diode (OLED) - -
displays -
Part 6-1: Measuring methods of optical and
electro-optical parameters


IEC QC 001002 Series IEC quality assessment system for electronic - -
components (IECQ) - Rules of procedure


ISO 2859 Series Sampling procedures for inspection - -
by attributes




1)
Undated reference.
2)
Valid edition at date of issue.

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SIST EN 62341-1-1:2010

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SIST EN 62341-1-1:2010
IEC 62341-1-1
®
Edition 1.0 2009-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE


Organic light emitting diode (OLED) displays –
Part 1-1: Generic specifications

Afficheurs à diodes électroluminescentes organiques (OLED) –
Partie 1-1: Spécifications génériques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
S
CODE PRIX
ICS 31.260 ISBN 2-8318-1036-1
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 62341-1-1:2010
– 2 – 62341-1-1 © IEC:2009
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Terms, definitions, units and symbols .6
4 Technical aspects.6
4.1 Order of precedence .6
4.2 Standard atmospheric conditions.7
4.3 Marking .7
4.3.1 Device identification .7
4.3.2 Device traceability .7
4.3.3 Packing .7
4.4 Categories of assessed quality.7
4.5 Screening.8
4.6 Handling.8
5 Quality assessment procedures.8
5.1 Eligibility for qualification approval .8
5.2 Primary stage of manufacture.8
5.3 Commercially confidential information .8
5.4 Formation of inspection lots.9
5.5 Structurally similar devices.9
5.6 Subcontracting .9
5.7 Validity of release.9
6 Quality approval procedure.9
6.1 Granting of qualification approval .9
6.2 Quality conformance inspection requirements.9
6.2.1 Division into groups and subgroups .9
6.2.2 Quality conformance Inspection requirements.11
6.2.3 Supplementary procedure for reduced inspection .12
6.2.4 Sampling requirements for small lots .12
6.2.5 Certified records of released lots (CRRL) .12
6.2.6 Delivery of devices subjected to destructive or non-destructive test.12
6.2.7 Delayed deliveries .12
6.2.8 Supplementary procedure for deliveries.12
6.3 Statistical sampling procedures .13
6.3.1 AQL sampling plans.13
6.3.2 LTPD sampling plans.13
6.4 Endurance tests .13
6.4.1 General .13
6.4.2 Endurance tests where the failure rate is specified .13
6.5 Accelerated test procedures .14
7 Capability approval procedure .14
8 Test and measurement procedures.15
8.1 Standard environmental conditions.15
8.1.1 Dark room condition .15
8.1.2 Standard setup condition .15
8.1.3 Standard atmospheric conditions for measurements .15

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62341-1-1 © IEC:2009 – 3 –
8.2 Physical examination.15
8.2.1 Visual examination .15
8.2.2 Dimensions .15
8.2.3 Weight.15
8.2.4 Permanence of marking.15
8.3 Electrical and optical measurement .15
8.3.1 General conditions and precautions.16
8.4 Environmental test .16
8.5 Endurance test .16
Annex A (informative) Lot tolerance percentage defective (LTPD) sampling plans .17
Bibliography.22

Table A.1 – LTPD sampling plans .19
Table A.2 – Hypergeometric sampling plans for small lot sizes of 200 or less .20
Table A.3 – AQL and LTPD sampling plans.21

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SIST EN 62341-1-1:2010
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS –

Part 1-1: Generic specifications


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62341-1-1 has been prepared by IEC technical committee 110:
Flat panel display devices.
The text of this standard is based on the following documents:
FDIS Report on voting
110/168/FDIS 110/176/RVD

Full information on the voting for the approval on this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of IEC 62341 series, under the general title Organic light emitting diode
(OLED) displays can be found on the IEC website.

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SIST EN 62341-1-1:2010
62341-1-1 © IEC:2009 – 5 –
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

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SIST EN 62341-1-1:2010
– 6 – 62341-1-1 © IEC:2009
ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS –

Part 1-1: Generic specifications


1 Scope
This part of IEC 62341 is a generic specification for organic light emitting diode (OLED)
displays. It defines general procedures for quality assessment to be used in the IECQ-CECC
system and establishes general rules for methods of electrical and optical measurements,
environmental and mechanical tests and endurance tests.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC 60747-1:2006, Semiconductor devices – Part 1: General
IEC 62341-1-2, Organic light emitting diode displays – Part 1-2: Terminology and letter
symbols
1
IEC 62341-5 , Organic light emitting diode (OLED) displays – Part 5: Environmental testing
methods
2
IEC 62341-6-1 , Organic light emitting diode (OLED) displays – Part 6-1: Measuring methods
of optical and electro-optical parameters
IEC QC 001002 (all parts), IEC Quality Assessment System for Electronic components (IECQ)
– Rules of Procedure
ISO 2859 (all parts), Sampling procedures for inspection by attributes
3 Terms, definitions, units and symbols
For the purposes of this document, the terms, definitions, units and symbols given in
IEC 62341-1-2 apply.
4 Technical aspects
4.1 Order of precedence
Where there are conflicting requirements, documents shall rank in the following order of
authority:
a) the detail specification;
b) the blank detail specification;
———————
1
 In preparation.
2
 In preparation.

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SIST EN 62341-1-1:2010
62341-1-1 © IEC:2009 – 7 –
c) the family specification, if any;
d) the sectional specification;
e) the generic specification;
f) the basic specification;
g) the IECQ rules of procedure;
h) any other international (e.g. IEC) documents to which reference is made;
i) a national document.
The same order of precedence shall apply to equivalent national documents.
4.2 Standard atmospheric conditions
Preferred values of temperature, humidity and pressure for the measurement characteristics
and tests, for operating condition, are specified in 8.1.3. Unless otherwise specified, all
measurement and tests shall be carried out under the condition described in 8.1.3.
4.3 Marking
4.3.1 Device identification
The marking on the device shall enable clear identification of the device. The order of priority
for marking on small products shall be specified in the detail specification.
4.3.2 Device traceability
The device shall be provided with a traceability code, which enables back-tracing of the
device to certain production or inspection lot.
4.3.3 Packing
Marking on the packing shall state:
a) the device identification code;
b) the traceability code(s) of the enclosed devices;
c) the number of enclosed devices;
d) the required precautions, if any.
This marking shall be in accordance with custom regulations.
4.4 Categories of assessed quality
This generic specification provides three categories of assessed quality. The devices are
grouped in an identified inspection lot in accordance with IEC QC 001002-3, 3.3, which is
tested to the specified quality categories. The AQL (acceptance quality levels) or LTPD (lot
tolerance percentage defective) associated with the same inspection group may vary for each
category and shall be as specified in the detail specification.
The minimum requirements of the categories are as follows:
Category I The type shall meet the requirements of qualification approval of categories II
or III. Each lot shall meet the inspection requirements of group A, which
includes functional tests. Every three months, one lot shall meet the
inspection requirements for interconnection ability. Annually, one lot shall
meet the group B and group C inspection requirements (see 6.2.1)

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SIST EN 62341-1-1:2010
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Category II The type shall meet the requirements of group A, group B, group C and group
D if needed, for qualification approval. The lot shall meet the inspection
requirements of group A and group B on a lot-by-lot basis, and of group C on
a periodic basis.
Category III The type shall meet the requirements of group A, group B, group C and group
D if needed, for qualification approval. The lot is 100 % screened and shall
meet the inspection requirements of group A and group B on a lot-by-lot basis,
and of group C on a periodic basis.
The sectional or blank detail specification shall define the minimum requirements for each
category. A detail specification may contain requirements, including screening requirements,
additional to those given in the generic, sectional or blank or any other relevant detail
specification.
4.5 Screening
A screening is an examination or test applied to all devices in a lot.
When required by the detail specification, all devices in the lot shall be screened by
submitting them to one of the sequences given in the relevant sectional or blank detail
specification, and all defectives shall be removed. Other sequences not specified in this
standard are applicable only where the above sequences are not correlated or are in
contradiction with failure mechanisms. When a part of the screening process as given in the
sectional or blank detail specification forms part of the manufacturing process in the
prescribed sequence, these procedures need not be repeated.
4.6 Handling
See IEC 60747-1, Clause 8.
Adequate warning shall be displayed in the case of harmful products.
5 Quality assessment procedures
Quality assessment comprises the procedure for obtaining qualification approval followed by
quality conformance inspection on a lot-by-lot basis (including screening if required) and on a
periodic basis as qualified in the detail specification. The quality assessment tests are
subdivided into group A, B and C tests; these are performed lot by lot or periodically, group D
(see 6.2.1.5) tests may also be specified, for example, for qualification approval.
5.1 Eligibility for qualification approval
A type of device becomes eligible for qualification approval when the rules of procedure of
IEC QC 001002-3, Clause 3, are satisfied.
5.2 Primary stage of manufacture
The primary stage of manufacture is defined in the sectional or blank detail specification.
5.3 Commercially confidential information
If any part of the manufacturing process is commercially confidential, this shall be suitably
identified, and the designated management representative (DMR) shall demonstrate to the
satisfaction of the National Supervising Inspectorate (NSI) that the requirements of the rules
of procedure given in 2.3.3.1 of IEC QC 001002-3, have been complied with.

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62341-1-1 © IEC:2009 – 9 –
5.4 Formation of inspection lots
See the rules of procedure given in IEC QC 001002-3, 3.3.1.
5.5 Structurally similar devices
See the rules of procedure given in IEC QC 001002-3, 3.3.2.
Details concerning grouping are given in the relevant sectional or blank detail specification.
5.6 Subcontracting
The use of subcontracting is permitted for quality assessments procedures. To use the
subcontracting, see the rules of procedure given in IEC QC 001002-3, Annex B to Clause 2
and 3.1.2.
5.7 Validity of release
See the rules of procedure given in IEC QC 001002-3, 3.2.2.
6 Quality approval procedure
6.1 Granting of qualification approval
See the rules of procedure given in IEC QC 001002-3, 3.1.4 and 3.1.5. Method a), b) or c) of
the rules of procedure may be used at the manufacture’s discretion in accordance with the
inspection requirements given in the sectional or blank detail specification. Samples may be
composed of appropriate structurally similar devices. In some cases, group D tests are
required for qualification approval. The qualification report shall include a summary of all the
test results for each group and subgroup, including number of devices tested and number of
devices failed. This summary shall be derived from variables and/or attributes data.
The manufacturer shall retain all data for submission to the NSI on demand.
6.2 Quality conformance inspection requirements
Quality conformance inspection shall consist of the examinations and tests of groups A, B, C
and D, as specified. For group B and C inspection, samples may be composed of structurally
similar devices. Samples for periodic tests shall be drawn from one or more lots which have
passed group A and B inspection. Individual devices shall have passed the group A
measurements called for in the detail specification.
6.2.1 Division into groups and subgroups
The following grouping shall be used in the preparation of detail specification.
6.2.1.1 Group A inspection (lot-by-lot)
This group prescribes the visual inspection and the electrical measurements to be made on a
lot-by-lot basis to assess the principal properties of a device. Unless otherwise specified,
structural similarity grouping is not permitted.
Group A inspection is divided into appropriate subgroups as follows:
Subgroup A1 This subgroup comprises a visual examination as specified in 8.2.1.
Subgroup A2 This subgroup comprises measurements of primary characteristics of the
device.

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Subgroup A3/A4 These subgroups may not be required. They comprise measurements of
secondary characteristics of the device. The correct requirements for each
device category are given in the sectional or blank detail specification. The
choice between subgroup A3 or A4 for given measurements is essentially
governed by the desirability of performing them at a given quality level.
6.2.1.2 Group B inspection (lot-by-lot, except for category I)
This group prescribes the procedure to be used to assess certain additional properties of the
device, and includes mechanical, environmental and endurance tests that can normally be
performed in one week or as specified in the relevant sectional or blank detail specification.
6.2.1.3 Group C inspection (periodic)
This group prescribes the procedures to be used on a periodic basis to assess certain
additional properties of the devices, and includes electrical and optical measurements,
mechanical, environmental and endurance tests appropriate for checking at intervals of either
three months (categories II and III) or one year (category I), or as specified in the relevant
sectional or blank detail specification.
6.2.1.4 Division of group B and group C into subgroups
To enable comparison and to facilitate change from group B to group C and vice versa when
necessary tests in these groups have been divided among subgroups bearing the same
number for corresponding tests.
The division is as given below.
Subgroup B1/C1 Comprise measurements that assess visual and dimensional properties
of the devices.
Subgroup B2a/C2a Comprise measurements that assess electrical and optical properties of
the devices of a design nature.
Subgroup B2b/C2b Comprise measurements that further assess some of the electrical and
optical characteristics of the device already measured in group A by
measurement under different voltage, current, temperature of optical
condition.
Subgroup B2c/C2c Comprise verification of ratings of the device, where appropriate.
Subgroup B3/C3 Comprise tests intended to assess mechanical robustness of the
devices.
Subgroup B4/C4 Comprise tests intended to assess
...