SIST EN 61300-2-14:2006
(Main)Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-14: Tests - Optical power handling and damage threshold characterization
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-14: Tests - Optical power handling and damage threshold characterization
The purpose of this part of IEC 61300 is to characterize the robustness of a fibre optic passive component or interconnecting device against damage from exposure to optical power. Specifically, the objectives are to: - characterize both the short term and the long term robustness of components from damage due to optical power induced degradation or failure mechanisms; - provide data necessary to ensure that components are exposed to appropriate optical power levels that will not degrade their performance; - identify components prone to irreversible degradation. The test procedure described in this standard is structured such that, if the 'full characterization' option is performed, the component will be characterized without the need for re-testing should future applications change. For example, one way to approach the issue of optical power characterization is to test a component at a specific power level and wavelength to which the component will be exposed in a specific application. While testing of the component at that power/wavelength may indicate the robustness of the component in that specific application, if the component is considered for another application, the tests will need to be performed again at other powers/wavelengths. However, if the component is fully characterized at all relevant wavelengths, and the maximum power handling level at those wavelengths is identified, then all the information required to assess the suitability of the component in any application is available. The results of the full characterization test method in this standard will be a rating of the component under test. This rating forms the basis of determining the power levels to which the component can be exposed in a reliable manner. It essentially defines the "operating region envelope" for the component. Since there will often be constraints (that is, time, cost, equipment availability) that limit the ability to perform the full characterization, alternative test methods are outlined in this standard that perform only a subset of the full test. The test methods contained in this standard are intended to assess the robustness of components in their normal use conditions for which they were designed.
Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prüf- und Messverfahren -- Teil 2-14: Prüfungen - Ermittlung von Kennwerten der optischen Leistung
Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes fondamentales d'essais et de mesures -- Partie 2-14: Essais - Traitement de la puissance optique et caractérisation du seuil de dommage
Cette partie de la EN 61300 est de proposer une méthode permettant de déterminer la robustesse d'un composant ou d'un dispositif d'interconnexion passif à fibres optiques contre les dommages dus à la puissance optique.
Povezovalne naprave in pasivne komponente optičnih vlaken – Osnovno preskušanje in merilni postopki – 2-14. del: Preskusi – Ravnanje z optično močjo in značilnosti praga poškodb (IEC 61300-2-14:2005)
General Information
Relations
Standards Content (Sample)
SLOVENSKI SIST EN 61300-2-14:2006
STANDARD
oct 2006
Povezovalne naprave in pasivne komponente optičnih vlaken – Osnovno
preskušanje in merilni postopki – 2-14. del: Preskusi – Ravnanje z optično
močjo in značilnosti praga poškodb (IEC 61300-2-14:2005)
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 2-14: Tests – Optical power handling and damage
threshold characterization (IEC 61300-2-14:2005)
ICS 33.180.20 Referenčna številka
SIST EN 61300-2-14:2006(en)
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
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EUROPEAN STANDARD
EN 61300-2-14
NORME EUROPÉENNE
May 2006
EUROPÄISCHE NORM
ICS 33.180.20 Supersedes EN 61300-2-14:1997
English version
Fibre optic interconnecting devices and passive components -
Basic test and measurement procedures
Part 2-14: Tests - Optical power handling and
damage threshold characterization
(IEC 61300-2-14:2005)
Dispositifs d'interconnexion et Lichtwellenleiter -
composants passifs à fibres optiques - Verbindungselemente und passive
Méthodes fondamentales d'essais Bauteile
et de mesures Teil 2-14: Prüfungen -
Partie 2-14: Essais - Ermittlung von Kennwerten
Traitement de la puissance optique et der optischen Leistung
caractérisation du seuil de dommage (IEC 61300-2-14:2005)
(CEI 61300-2-14:2005)
This European Standard was approved by CENELEC on 2006-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61300-2-14:2006 E
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EN 61300-2-14:2006 - 2 -
Foreword
The text of document 86B/2204/FDIS, future edition 2 of IEC 61300-2-14, prepared by SC 86B, Fibre
optic interconnecting devices and passive components, of IEC TC 86, Fibre optics, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 61300-2-14 on 2006-03-01.
This European Standard supersedes EN 61300-2-14:1997.
Specific technical changes from EN 61300-2-14:1997 include a fundamental change of the measurement
method to introduce various measurement environments such as limited testing resources.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2006-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-03-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61300-2-14:2005 was approved by CENELEC as a European
Standard without any modification.
__________
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- 3 - EN 61300-2-14:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60825-1 – Safety of laser products EN 60825-1 1994
+ corr. December Part 1: Equipment classification, requirements + corr. February 1995
- and user's guide + A11 1996
1) 2)
IEC 61300-1 – Fibre optic interconnecting devices and EN 61300-1 2003
passive components - Basic test and
measurement procedures
Part 1: General and guidance
1) 2)
IEC 61300-3-1 – Fibre optic interconnecting devices and EN 61300-3-1 2005
passive components - Basic test and
measurement procedures
Part 3-1: Examinations and measurements -
Visual examination
1)
Undated reference.
2)
Valid edition at date of issue.
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NORME CEI
INTERNATIONALE
IEC
61300-2-14
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
2005-10
Dispositifs d'interconnexion et
composants passifs à fibres optiques –
Méthodes fondamentales d'essais
et de mesures –
Partie 2-14:
Essais – Traitement de la puissance optique
et caractérisation du seuil de dommage
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 2-14:
Tests – Optical power handling
and damage threshold characterization
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microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Pour prix, voir catalogue en vigueur
For price, see current catalogue
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61300-2-14 IEC:2005 – 3 –
CONTENTS
FOREWORD.5
1 Scope.9
2 Normative references .11
3 Definitions .11
4 General description .11
4.1 Purpose of the component test .11
4.2 Procedures.13
4.3 Precautions .13
5 Apparatus.13
5.1 Source unit (S) .13
5.2 Detector unit (D).15
5.3 Environmental chamber.15
5.4 Data acquisition .15
5.5 Branching device.15
5.6 Temporary joints .15
5.7 Safety devices.15
6 Test procedures .17
6.1 Preparation of specimens .17
6.2 Preconditioning .17
6.3 Initial measurements .17
6.4 Method 1 .17
6.5 Method 2 .23
6.6 Method 3 .25
6.7 Recovery.25
6.8 Final measurements .25
7 Severity.25
8 Details to be specified .25
Annex A (informative) Background to the test method.29
Annex B (informative) Derating criteria .33
Bibliography.39
Figure 1 – High power handling and damage threshold characterization test set up .17
Figure 2 – Flowchart of short-term test .21
Figure 3 – Flowchart of long-term test.23
Figure B.1 – Derating chart.35
Table B.1 – Derating criteria .37
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61300-2-14 IEC:2005 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 2-14: Tests – Optical power handling
and damage threshold characterization
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-2-14 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
This second edition cancels and replaces the first edition published in 1997. It constitutes a
technical revision. Specific technical changes from the previous edition include fundamental
change of the measurement method to introduce various measurement environments such as
limited testing resources.
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61300-2-14 IEC:2005 – 7 –
The text of this standard is based on the following documents:
FDIS Report on voting
86B/2204/FDIS 86B/2234/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61300 consists of the following parts, under the general title Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
Part 1: General and guidance
Part 2: Tests
Part 3: Examinations and measurements
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
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61300-2-14 IEC:2005 – 9 –
FIBRE OPTIC INTERCONNECTING DEVICES
AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 2-14: Tests – Optical power handling
and damage threshold characterization
1 Scope
The purpose of this part of IEC 61300 is to characterize the robustness of a fibre optic
passive component or interconnecting device against damage from exposure to optical power.
Specifically, the objectives are to:
• characterize both the short term and the long term robustness of components from
damage due to optical power induced degradation or failure mechanisms;
• provide data necessary to ensure that components are exposed to appropriate optical
power levels that will not degrade their performance;
• identify components prone to irreversible degradation.
The test procedure described in this standard is structured such that, if the ‘full
characterization’ option is performed, the component will be characterized without the need
for re-testing should future applications change.
For example, one way to approach the issue of optical power characterization is to test a
component at a specific power level and wavelength to which the component will be exposed
in a specific application. While testing of the component at that power/wavelength may
indicate the robustness of the component in that specific application, if the component is
considered for another application, the tests will need to be performed again at other
powers/wavelengths. However, if the component is fully characterized at all relevant
wavelengths, and the maximum power handling level at those wavelengths is identified, then
all the information required to assess the suitability of the component in any application is
available.
The results of the full characterization test method in this standard will be a rating of the
component under test. This rating forms the basis of determining the power levels to which
the component can be exposed in a reliable manner. It essentially defines the “operating
region envelope” for the component.
Since there will often be constraints (that is, time, cost, equipment availability) that limit the
ability to perform the full characterization, alternative test methods are outlined in this
standard that perform only a subset of the full test.
The test methods contained in this standard are intended to assess the robustness of
components in their normal use conditions for which they were designed.
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61300-2-14 IEC:2005 – 11 –
2 Normative references
The following referenced documents are indispensable for the application of this standard. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60825-1: Safety of laser products – Part 1: Equipment classification, requirements and
user guide
IEC 61300-1: Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 1: General and guidance
IEC 61300-3-1: Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 3: Examinations and measurements – Visual examination
3 Definitions
3.1
drift
P
drift
the power at which the device experiences a specified change in insertion loss (IL) of 0,5 dB
during the short term test while under power. This drift is recoverable after power is removed
from the component
3.2
failure
P
fail
the power at which the device experiences a permanent specified change in insertion loss (IL)
after power is removed during the short term test
3.3
maximum power
P
max
the power to which a component may be exposed for up to 500 h and not experience
permanent damage P or performance drift P
fail drift
4 General description
4.1 Purpose of the component test
Testing of the component is designed to yield the following values:
a) drift (see 3.1);
b) failure (see 3.2);
failure for a component type and wavelength shall be defined as:
− for a component with an initial IL, <2 dB, the power change in the IL is ≥0,5 dB;
− for a component with initial IL, of 2-10 dB, where the change in the IL is ≥1 dB;
− for a component with the initial IL ≥10 dB, where the change in IL is ≥2 dB;
c) maximum power (see 3.3).
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61300-2-14 IEC:2005 – 13 –
4.2 Procedures
The preferred test procedure is the full characterization option. However, if conditions are
such that implementation of this procedure is impractical, there are several alternative
methods available in this standard. One of the following levels of qualification must be chosen
and successfully executed for a component to be used in a high power application.
• Method 1 – full characterization: this level of testing is preferred, as it gives the most
information on the overall optical power capabilities of the component.
• Method 2 – full characterization at a specific wavelength: this level of testing is
recommended if full characterization is not possible at all wavelengths.
• Method 3 – characterization based upon application: this level of testing can be performed
if time and resource constraints permit only limited testing. It should be noted that if this
option is chosen and the application conditions change, the device may be required to
undergo complete re-testing in order to maintain its qualification status.
Test samples may be put in series and tested simultaneously in both the short term and the
long term tests for all three test methods. (This is often referred to as ‘daisy-chaining’).
However, the last sample in the series must see the required test power level. In practice, this
will mean that samples at the beginning of the series will receive optical powers higher than
those further down the chain. Products using this technique may only claim verification to the
power level seen by the last sample in the chain.
4.3 Precautions
This test procedure involves the use of optical powers, which constitute a potential ocular and
skin hazard to test personnel. All necessary safety procedures shall be adopted in accordance
with IEC 60825-1. In particular, the device under test shall be unpowered (that is, with no
power propagating in the fibre) when conducting a visual examination.
5 Apparatus
5.1 Source unit (S)
The source unit consists of an optical emitter, the means to connect to it, and the associated
device electronics. It shall be stable in output power and wavelength over a time period
sufficient to record the performance of the device under test. The source shall have the
following characteristics:
− wavelength accuracy: ±5 nm;
− output power stability : ±0,05 dB.
NOTE 1 A tunable light source (TLS) in which a specific output wavelength can be tuned across a specified
wavelength range may be chosen as the light source. A TLS may consist of a tunable LD and an optical amplifier or
fiber ring laser in order to get an efficient power to test.
NOTE 2 For DWDM devices, wavelength accuracy and wavelength width should be chosen in accordance with its
operating passband.
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61300-2-14 IEC:2005 – 15 –
5.2 Detector unit (D)
The detector unit consists of an optical detector, the means to connect to it, and the
associated electronics. The detectors shall have sufficient dynamic range to make the
necessary measurements and shall be linear over this range. The detectors shall be stable
over the measurement period and shall have an operational wavelength range consistent with
the device under test. The connection to the detectors shall be an adapter that accepts a
connector plug of the appropriate design. The detectors shall be capable of capturing all light
emitted by the connector plug. The detectors shall have the following characteristics;
– linearity: ≤ ±0,1 dB;
– stability: ≤ 0,05 dB.
5.3 Environmental chamber
The test set up shall include an environmental chamber capable of producing and maintaining
the specified temperature and/or humidity.
5.4 Data acquisition
Recording of the power readings at the detector may be done either manually or automatically.
Appropriate data acquisition apparatus shall be used where measurements are performed
automatically.
5.5 Branching device
The splitting ratio of the branching device shall be stable over the optical powers and
wavelengths chosen for the test. It shall also be insensitive to polarization. The branching
devices shall be stable during the test. The splitting ratio of 1:99 for branching devices is
recommended in order to input high power to DUT and to monitor with low power.
5.6 Temporary joints
These are typically used in connecting the device under test to the test apparatus. Generally
the power and stability requirements of a test will necessitate that the temporary joints be
fusion splices.
5.7 Safety devices
All necessary safety devices, including laser safety glasses, signs and other safety materials
shall be provided, in order to protect individuals from possible hazards during testing.
A typical layout for the test apparatus is shown in Figure 1. This figure shows the case for
two-port optical components. For multi-port components, this test shall be carried out for all
input and output port combinations.
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61300-2-14 IEC:2005 – 17 –
Detector 1
Branching Branching
device device Source stability monitor
Source
Environmental
Fusion splice chamber
High power detector
Detector 2
Device
under test IEC 1822/05
Optical connector shall not be used. Fusion splice shall be used for all connecting points as described in 5.6.
Figure 1 – High power handling and damage threshold characterization test set up
6 Test procedures
6.1 Preparation of specimens
The chosen test samples shall be representative of a standard product. Prepare and clean the
specimen according to the manufacturer’s instructions. All connector mating surfaces shall be
visually examined, under at least 200× magnification, to ensure there are no visible signs of
debris.
NOTE Debris or the presence of contamination is one of the primary causes of failure in high optical power
connector applications.
6.2 Preconditioning
Pre-condition the specimen for 2 h at the standard test conditions as defined in IEC 61300-1,
unless otherwise specified in the relevant specification.
6.3 Initial measurements
Complete initial examinations and measurements on the specimen as required by the relevant
specification.
6.4 Method 1
The test is performed in two parts: short term testing and long term testing. The short term
test is intended to determine the minimum power exposure level that will cause failure in a
relatively short time (that is, 3 h). This is accomplished with a step stress test. The long term
test is intended to determine the power levels at which the component can be expected to
operate, without failure, for extended periods (that is, a minimum of 500 h or as specified in
the relevant specification).
The results of the short-term tests are used to determine the power levels to which the
samples should be exposed in the long-term tests.
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61300-2-14 IEC:2005 – 19 –
The tests shall be performed on the component in a normal operating mode that represents a
worst case condition (that is, a configuration which yields the most internal power dissipation).
a) All testing shall be performed with the samples maintained at a minimum temperature of
70 °C.
b) Three samples shall be tested at each wavelength. The following wavelengths are recom-
mended: 980 nm, 1 310 nm, 1 430 nm, 1 480 nm, 1 550 nm, 1 610 nm. All tested
wavelengths shall be recorded. Measure the low power (<1 mW) insertion loss (IL) of each
of the components at the specified wavelengths. It is acceptable to conduct the test at one
or two wavelengths (typically, the wavelength at which the component was designed to
perform). However, any deviation from this test procedure shall be recorded in the relevant
test report.
c) The power level increments (in mW) used for the short term tests are based on the
components low power insertion loss (IL) at the wavelengths being tested;
• IL <1 dB: 200, 400, 600, 800, (continuing in increments of 200 mW)
• IL =1 dB-10 dB: 20, 40, 60 80, (continuing in increments of 20 mW)
• IL >10 dB: 5, 10, 15, 20, (continuing in increments of 5 mW)
Samples shall be maintained continuously at each power level for 3 h.
NOTE 1 For any device that, by definition, has varying loss in the use wavelength band (for example, a GFF),
the component should be tested at a wavelength as close to the maximum loss in the band as possible. When
deciding a test wavelength, consideration should be given to the absorption characteristics of the component
material and/or the temperature rise of the material as a function of wavelength.
NOTE 2 If there is sufficient confidence that the component will pass the step stress test at higher powers,
the testing can be initiated at a higher step in order to save time. (The power level at which the test is started
should be one of the values as defined above.
...
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