SIST EN 60444-7:2005

Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units

Describes the procedure for measuring and evaluating activity and frequency dips for quartz crystal units over a temperature range.

Messung von Schwingquarz-Parametern -- Teil 7: Messung von Aktivitäts- und Frequenz-Dips von Schwingquarzen

Mesure des paramètres des résonateurs à quartz -- Partie 7: Mesure des crevasses de l'activité et de la fréquence des résonateurs à quartz

Describes the procedure for measuring and evaluating activity and frequency dips for quartz crystal units over a temperature range.

Merjenje parametrov enot iz kremenovega kristala – 7. del: Merjenje aktivnosti in frekvenčnih gibov (frekvenčno odvisni mehanski nihaji) enot iz kremenovega kristala (IEC 60444-7:2004)

General Information

• Status: Published
• Publication Date: 28-Feb-2005
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Mar-2005
• Due Date: 01-Mar-2005
• Completion Date: 01-Mar-2005
• Ref Project: EN 60444-7:2004 - Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

Standards Content (Sample)

SLOVENSKI SIST EN 60444-7:2005

STANDARD
marec 2005
Merjenje parametrov enot iz kremenovega kristala – 7. del: Merjenje aktivnosti
in frekvenčnih gibov (frekvenčno odvisni mehanski nihaji) enot iz
kremenovega kristala (IEC 60444-7:2004)
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity
and frequency dips of quartz crystal units (IEC 60444-7:2004)
ICS 31.140 Referenčna številka
SIST EN 60444-7:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

---------------------- Page: 1 ----------------------

EUROPEAN STANDARD EN 60444-7
NORME EUROPÉENNE
EUROPÄISCHE NORM June 2004

ICS 31.140


English version


Measurement of quartz crystal unit parameters
Part 7: Measurement of activity and frequency dips of quartz crystal units
(IEC 60444-7:2004)


Mesure des paramètres des résonateurs Messung von Schwingquarz-Parametern
à quartz Teil 7: Messung von Aktivitäts- und
Partie 7: Mesure des crevasses Frequenz-Dips von Schwingquarzen
de l'activité et de la fréquence (IEC 60444-7:2004)
des résonateurs à quartz
(CEI 60444-7:2004)






This European Standard was approved by CENELEC on 2004-06-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60444-7:2004 E

---------------------- Page: 2 ----------------------

EN 60444-7:2004 - 2 -
Foreword
The text of document 49/637/FDIS, future edition 1 of IEC 60444-7, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 60444-7 on 2004-06-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-06-01
__________
Endorsement notice
The text of the International Standard IEC 60444-7:2004 was approved by CENELEC as a European
Standard without any modification.
__________

---------------------- Page: 3 ----------------------

INTERNATIONAL IEC


STANDARD 60444-7





First edition
2004-04


Measurement of quartz crystal unit parameters –
Part 7:
Measurement of activity and frequency dips
of quartz crystal units
 IEC 2004  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale H
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

---------------------- Page: 4 ----------------------

– 2 – 60444-7  IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 7: Measurement of activity and frequency dips
of quartz crystal units


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-7 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
The text of this standard is based on the following documents:
FDIS Report on voting
49/637/FDIS 49/664/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

---------------------- Page: 5 ----------------------

60444-7  IEC:2004(E) – 3 –
This standard forms Part 7 of a series of publications dealing with measurem
...