SIST EN 62562:2011
(Main)Cavity resonator method to measure the complex permittivity of low-loss dielectric plates (IEC 62562:2010)
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates (IEC 62562:2010)
The object of this International Standard is to describe a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency. This method is called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important.
Hohlraumresonanzverfahren zum Messen der komplexen Permittivität von verlustarmen dielektrischen Platten (IEC 62562:2010)
Méthode de la cavité résonante pour mesurer la permittivité complexe des plaques diélectriques à faibles pertes (CEI 62562:2010)
IEC 62562:2010 décrit une méthode de mesure des propriétés diélectriques en hyperfréquence dans la direction du plan d'une plaque diélectrique. Cette méthode est appelée méthode de la cavité résonante. Elle a été créée pour élaborer de nouveaux matériaux et pour concevoir des dispositifs micro-ondes actifs et passifs pour lesquels la normalisation des méthodes de mesure des propriétés des matériaux est de plus en plus importante. La présente version bilingue, publiée en 2010-05, correspond à la version anglaise.
Cette publication indique qu'elle contient des couleurs qui sont considérées comme utiles à une bonne compréhension de son contenu.
Metoda z votlinskim resonatorjem za merjenje kompleksne permitivnosti nizkoizgubnih dielektričnih plošč (IEC 62562:2010)
Namen tega mednarodnega standarda je opisati merilno metodo za dielektrične lastnosti v ravninski smeri dielektrične plošče pri mikrovalovni frekvenci. Ta metoda se imenuje metoda z votlinskim resonatorjem. Oblikovana je bila za razvoj novih materialov in zasnovo mikrovalovnih aktivnih in pasivnih naprav, pri katerih je standardizacija merilnih metod lastnosti materialov vse pomembnejša.
General Information
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.RVWLHohlraumresonanzverfahren zum Messen der komplexen Permittivität von verlustarmen dielektrischen Platten (IEC 62562:2010)Méthode de la cavité résonante pour mesurer la permittivité complexe des plaques diélectriques à faibles pertes (CEI 62562:2010)Cavity resonator method to measure the complex permittivity of low-loss dielectric plates (IEC 62562:2010)17.220.20Measurement of electrical and magnetic quantitiesICS:Ta slovenski standard je istoveten z:EN 62562:2011SIST EN 62562:2011en01-april-2011SIST EN 62562:2011SLOVENSKI
STANDARD
SIST EN 62562:2011
EUROPEAN STANDARD EN 62562 NORME EUROPÉENNE
EUROPÄISCHE NORM February 2011
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62562:2011 E
ICS 17.220
English version
Cavity resonator method to measure the complex permittivity
of low-loss dielectric plates (IEC 62562:2010)
Méthode de la cavité résonante pour mesurer la permittivité complexe des plaques diélectriques à faibles pertes (CEI 62562:2010)
Hohlraumresonanzverfahren zum Messen der komplexen Permittivität von verlustarmen dielektrischen Platten (IEC 62562:2010)
This European Standard was approved by CENELEC on 2011-01-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
SIST EN 62562:2011
EN 62562:2011 - 2 -
Foreword The text of document 46F/118/CDV, future edition 1 of IEC 62562, prepared by SC 46F, R.F. and microwave passive components, of IEC TC 46, Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62562 on 2011-01-02. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: – latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop)
2011-10-02 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2014-01-02 Endorsement notice The text of the International Standard IEC 62562:2010 was approved by CENELEC as a European Standard without any modification. __________
SIST EN 62562:2011
IEC 62562Edition 1.0 2010-02INTERNATIONAL STANDARD
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 17.220 PRICE CODEISBN 978-2-88910-763-6
® Registered trademark of the International Electrotechnical Commission ® SIST EN 62562:2011 colourinside
– 2 – 62562 © IEC:2010(E) CONTENTS FOREWORD.3 1 Scope.5 2 Measurement parameters.5 3 Theory and calculation equations.6 3.1 Relative permittivity and loss tangent.6 3.2 Temperature dependence of ε′ and δtan.9 3.3 Cavity parameters.10 4 Measurement equipment and apparatus.11 4.1 Measurement equipment.11 4.2 Measurement apparatus for complex permittivity.11 5 Measurement procedure.12 5.1 Preparation of measurement apparatus.12 5.2 Measurement of reference level.12 5.3 Measurement of cavity parameters: D, H, rσ, cα, ρTC.12 5.4 Measurement of complex permittivity of test specimen: 'ε, δtan.14 5.5 Temperature dependence of 'ε and δtan.15 Annex A (informative)
Example of measured result and accuracy.16 Bibliography.20
Figure 1 – Resonator structures of two types.6 Figure 2 – Correction term Δε’/ε’a.9 Figure 3 – Correction terms ΔA/A and ΔB/B.9 Figure 4 – Schematic diagram of measurement equipments.11 Figure 5 – Cavity resonator used for measurement.12 Figure 6 – Photograph of cavity resonator for measurement around 10 GHz.12 Figure 7 – Mode chart of cavity resonator.13 Figure 8 – Resonance peaks of cavity resonator.13 Figure 9 – Resonance frequency f0, insertion attenuation IA0 and half-power band width fBW.14 Figure 10 – Resonance frequency f0 of TE011 mode of cavity resonator with dielectric plate (D = 35 mm, H = 25 mm).15 Figure A.1 – Measured temperature dependence of f1 and Quc.17 Figure A.2 – Resonance peaks of cavity resonator clamping sapphire plate.18 Figure A.3 – Measured results of temperature dependence of f0, Qu, 'ε and tan/ for sapphire plate.19
Table A.1 – Measured results of cavity parameters.16 Table A.2 – Measured results of of 'ε and δtan for sapphire plate.18
SIST EN 62562:2011
62562 © IEC:2010(E) – 3 – INTERNATIONAL ELECTROTECHNICAL COMMISION ____________
CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62562 has been prepared by subcommittee 46F: R.F. and microwave passive components, of IEC technical committee 46: Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories. This first edition cancels and replaces the PAS published in 2008.
The text of this standard is based on the following documents: CDV Report on voting 46F/118/CDV 46F/143/RVC
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. SIST EN 62562:2011
– 4 – 62562 © IEC:2010(E) The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be
• reconfirmed, • withdrawn, • replaced by a revised edition, or • amended. A bilingual version of this publication may be issued at a later date.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer.
SIST EN 62562:2011
62562 © IEC:2010(E) – 5 – CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES
1 Scope The object of this International Standard is to describe a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency. This method is called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This method has the following characteristics:
• the relative permittivity 'ε and loss tangent δtan values of a dielectric plate sample can be measured accurately and non-destructively; • temperature dependence of complex permittivity can be measured; • the measurement accuracy is within 0,3 % for 'ε and within 5×10–6 for δtan; • fringing effect is corrected using correction charts calculated on the basis of rigorous analysis. This method is applicable for the measurements on the following condition: – frequency
: 2 GHz <
f
<
40 GHz; – relative permittivity: 2
<
'ε
<
100; – loss tangent
: 10–6
< δtan
<
10-2. 2 Measurement parameters The measurement parameters are defined as follows:
)/("'0EDjrεεεε=−= (1)
'/"tanεεδ= (2)
-
= 6refrefref101×−TTTCTεεεε
(1×10–6/K)
(3) where D
is the electric flux density; E
is the electric field strength; 0ε
is the permittivity in a vacuum; 'ε and ''ε
are the real and imaginary components of the complex relative permittivity rε; εTC
is the temperature coefficient of relative permittivity; Tε and refε
are the real parts of the complex relative permittivity at temperature T and reference temperature refT (= 20 °C to 25 °C), respectively. SIST EN 62562:2011
– 6 – 62562 © IEC:2010(E) 3 Theory and calculation equations 3.1 Relative permittivity and loss tangent A resonator structure used in the nondestructive measurement of the complex permittivity is shown in Figure 1a.
A cavity having diameter D and length MH2= is cut into two halves in the middle of its length.
A dielectric plate sample having 'ε, δtan and thickness t is placed between these two halves. The TE011 mode, having only the electric field component tangential to the plane of the sample, is used for the measurement, since air gaps at the plate-cavity interfaces do not affect the electromagnetic field. Taking account of the fringing field in the plate region outside diameter of the cavity on the basis of the rigorous mode matching analysis, we determine 'ε and δtan from the measured values of the resonant frequency 0f and the unloaded Q-factor uQ. This numerical calculation, however, is rather tedious.
Therefore,
a) approximated values a'ε and atanδ from the 0f and uQvalues by using simple formula for a resonator structure shown in Figure 1b, where a fringing effect for Figure 1a is neglected, will be determined; b) then, accurate values 'ε and δtan from a'ε and atanδ using charts calculated from the rigorous analysis will be obtained.
Figure 1a – Resonator used in measurement Figure 1b – Resonator to calculate ε’a and tanδa Figure 1 – Resonator structures of two types The value of a'ε is given by
12'22220a+⎪⎭⎪⎬⎫⎪⎩⎪⎨⎧⎟⎠⎞⎜⎝⎛−⎟⎟⎠⎞⎜⎜⎝⎛π=MtYXftcε (4) where c is the velocity of light in a vacuum (m/s109997,28×=c) and the first root X is
calculated from a given value Y, using the following simultaneous equations: >>:›:”:‰:©:›:À:¼:Ã:¼:º:Ë:É:À:º:w:§:Ã:¸:Ë:¼:Î:À:Ë:¿:wε=m:¤:¤:Ë:Ë:¤:¤:Ð:Ï:É::¹:€::¸:€:Ÿ:œ:œ>>:›:”:‰:©:›:À:¼:Ã:¼:º:Ë:É:À:º:w:§:Ã:¸:Ë:¼:Î:À:Ë:¿:wε=m:¤:¤:Ë:Ë:¤:¤:Ð:Ï:É::¹:€::¸:€:Ÿ:œ:œDielectric plate with ε’
y
r
x EEHMM MMtt D = 2R IEC
127/10 IEC
128/10 SIST EN 62562:2011
62562 © IEC:2010(E) – 7 –
YYMtXXcot2tan= (5)
'2r20jYkkMY=−= (6) with cfk002π=, Rjk01r'=, and 73831,3'01=j for the TE011 mode. When 0r0<−kk, Y is replaced by 'jY. The value of atanδ is given by
BRQAsuatan−=δ (7) where sR is the surface resistance of the conductor of cavity, given by
)S/m(),1/S(r00sσσσσμ=π=fR
(8) Here, μ and σ are the permeability and conductivity of the conductor. Furthermore, rσ is the relative conductivity and S/m108,570×=σ is the conductivity of standard copper. Constants A and B are given by
eeWWA121+= (9)
eWRPPPB1send2cy1cyω++= (10) In the above
...
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