SIST EN 60747-5-2:2002
(Main)Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices - Essential ratings and characteristics
Gives the essential ratings and characteristics of the following categories or subcategories of optoelectronic devices which are not intended to be used in the field of fibre optic systems or subsystems: Semiconductor photoemitters, semiconductor photoelectric detectors, semiconductor photosensitive devices, and semiconductor devices utilizing the optical radiation for internal operation.
Einzel-Halbleiterbauelemente und integrierte Schaltungen -- Teil 5-2: Optoelektronische Bauelemente - Wesentliche Grenz- und Kennwerte
Dispositifs discrets à semiconducteurs et circuits intégrés -- Partie 5-2: Dispositifs optoélectroniques - Valeurs limites et caractéristiques essentielles
Donne les valeurs limites et caractéristiques essentielles des catégories et sous-catégories suivantes de dispositifs optoélectroniques qui ne sont pas destinés à être utilisés dans le domaine des systèmes et sous-systèmes à fibres optiques: Photoémetteurs à semiconducteurs, détecteurs photoélectriques à semiconducteurs, dispositifs photosensibles à semiconducteurs et dispositifs à semiconducteurs utilisant le rayonnement optique pour leur fonctionnement interne.
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics (IEC 60747-5-2:1997)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 60747-5-2:2002
01-september-2002
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic
devices - Essential ratings and characteristics (IEC 60747-5-2:1997)
Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic
devices - Essential ratings and characteristics
Einzel-Halbleiterbauelemente und integrierte Schaltungen -- Teil 5-2: Optoelektronische
Bauelemente - Wesentliche Grenz- und Kennwerte
Dispositifs discrets à semiconducteurs et circuits intégrés -- Partie 5-2: Dispositifs
optoélectroniques - Valeurs limites et caractéristiques essentielles
Ta slovenski standard je istoveten z: EN 60747-5-2:2001
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
SIST EN 60747-5-2:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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EUROPEAN STANDARD EN 60747-5-2
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2001
ICS 31.260
English version
Discrete semiconductor devices and integrated circuits
Part 5-2: Optoelectronic devices -
Essential ratings and characteristics
(IEC 60747-5-2:1997)
Dispositifs discrets à semiconducteurs et Einzel-Halbleiterbauelemente und
circuits intégrés integrierte Schaltungen
Partie 5-2: Dispositifs optoélectroniques - Teil 5-2: Optoelektronische Bauelemente -
Valeurs limites et caractéristiques Wesentliche Grenz- und Kennwerte
essentielles (IEC 60747-5-2:1997)
(CEI 60747-5-2:1997)
This European Standard was approved by CENELEC on 2000-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-5-2:2001 E
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EN 60747-5-2:2001 - 2 -
Foreword
The text of the International Standard IEC 60747-5-2:1997, prepared by SC 47C, Flat panel display
devices, of IEC TC 47, Semiconductor devices, was submitted to the Unique Acceptance Procedure
and was approved by CENELEC as EN 60747-5-2 on 2000-12-01 without any modification.
This standard should be read jointly with IEC 60747-1, EN 62007-1 and EN 62007-2.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-01-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes B and ZA are normative and annex A is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60747-5-2:1997 was approved by CENELEC as a
European Standard without any modification.
__________
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- 3 - EN 60747-5-2:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC 60065 (mod) 1985 Safety requirements for mains operated EN 60065 1993
electronic and related apparatus for
household and similar general use
IEC 60068-2-1 1990 Environmental testing EN 60068-2-1 1993
Part 2: Tests - Tests A: Cold
2)
IEC 60068-2-2 1974 Part 2: Tests - Test B: Dry heat HD 323.2.2 S1 1988
3)
IEC 60068-2-3 1969 Part 2: Tests - Test Ca: Damp heat, HD 323.2.3 S2 1987
steady state
IEC 60068-2-6 1995 Part 2: Tests - Test Fc: Vibration EN 60068-2-6 1995
+ corr. March 1995 (sinusoidal)
4)
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of EN 60068-2-14 1999
temperature
IEC 60068-2-17 1994 Part 2: Tests - Test Q: Sealing EN 60068-2-17 1994
IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: EN 60068-2-27 1993
Shock
5)
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: EN 60068-2-30 1999
Damp heat, cyclic (12 + 12 hour cycle)
IEC 60306-1 1969 Measurement of photosensitive devices--
Part 1: Basic recommendations
1)
EN 60065:1993 is superseded by EN 60065:1998 + corrigendum Jun. 1999, which is based on IEC 60065:1998
(mod.).
2)
EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2.
3)
HD 323.2.3 S2:1987 includes A1:1984 to IEC 60068-2-3.
4)
EN 60068-2-14:1999 includes A1:1986 to IEC 60068-2-14.
5)
EN 60068-2-30:1999 includes A1:1985 to IEC 60068-2-30.
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EN 60747-5-2:2001 - 4 -
Publication Year Title EN/HD Year
IEC 60664-1 1992 Insulation coordination for equipment HD 625.1 S1 1996
(mod) within low-voltage systems + corr. November 1996
Part 1: Principles, requirements and
tests
IEC 60695-2-2 1991 Fire hazard testing EN 60695-2-2 1994
Part 2: Test methods -- Section 2:
Needle-flame test
IEC 60747-5-1 1997 Discrete semiconductor devices and EN 60747-5-1 2001
integrated circuits
Part 5-1: Optoelectronic devices -
General
IEC 60747-5-3 1997 Part 5-3: Optoelectronic devices - EN 60747-5-3 2001
Measuring methods
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NORME
CEI
INTERNATIONALE
IEC
60747-5-2
INTERNATIONAL
Première édition
STANDARD
First edition
1997-09
Dispositifs discrets à semiconducteurs
et circuits intégrés –
Partie 5-2:
Dispositifs optoélectroniques –
Valeurs limites et caractéristiques essentielles
Discrete semiconductor devices
and integrated circuits –
Part 5-2:
Optoelectronic devices –
Essential ratings and characteristics
© IEC 1997 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
U
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
---------------------- Page: 6 ----------------------
60747-5-2 © IEC:1997 – 3 –
CONTENTS
Page
FOREWORD . 7
Clause
1 Scope. 9
2 Normative references. 9
3 Light-emitting diodes
(excluding devices for fibre optic systems or subsystems) . 11
3.1 Type. 11
3.2 Semiconductor material. 11
3.3 Colour. 11
3.4 Details of outline and encapsulation . 11
3.5 Limiting values (absolute maximum system) . 11
3.6 Electrical characteristics. 13
3.7 Supplementary information. 13
4 Infrared-emitting diodes
(excluding devices for fibre optic systems or subsystems) . 13
4.1 Type. 15
4.2 Semiconductor material. 15
4.3 Details of outline and encapsulation . 15
4.4 Limiting values (absolute maximum system). 15
4.5 Electrical characteristics. 15
4.6 Supplementary information. 17
5 Photodiodes
(excluding devices for fibre optic systems or subsystems) . 17
5.1 Type. 17
5.2 Semiconductor material. 17
5.3 Details of outline and encapsulation . 17
5.4 Limiting values (absolute maximum system). 19
5.5 Electrical characteristics. 19
5.6 Supplementary information. 19
6 Phototransistors
(excluding devices for fibre optic systems or subsystems) . 21
6.1 Type. 21
6.2 Semiconductor material. 21
6.3 Polarity. 21
6.4 Details of outline and encapsulation . 21
6.5 Limiting values (absolute maximum system). 21
6.6 Electrical characteristics. 23
6.7 Supplementary information. 25
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60747-5-2 © IEC:1997 – 5 –
Clause Page
7 Photocouplers, optocouplers
(with output transistor) . 25
7.1 Type. 25
7.2 Semiconductor material. 25
7.3 Polarity of the output resistor . 25
7.4 Details of outline and encapsulation . 25
7.5 Limiting values (absolute maximum system). 25
7.6 Electrical characteristics. 29
7.7 Supplementary information. 31
8 Photocouplers (optocouplers) providing protection against electrical shock . 31
8.1 Type. 31
8.2 Semiconductor material. 31
8.3 Details of outline and encapsulation . 31
8.4 Ratings. 31
8.5 Electrical characteristics. 31
8.6 Electrical, environmental and/or endurance test information (supplementary
information) . 33
9 Laser diodes. 41
9.1 Type. 41
9.2 Semiconductor. 41
9.3 Details of outline and encapsulation . 41
9.4 Limiting values (absolute maximum system). 41
9.5 Electrical and optical characteristics. 43
9.6 Supplementary information. 45
Annexes
A (informative) – Cross references index . 47
B (normative) – Input/output safety test. 51
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60747-5-2 © IEC:1997 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
__________
DISCRETE SEMICONDUCTOR DEVICES
AND INTEGRATED CIRCUITS –
Part 5-2: Optoelectronic devices –
Essential ratings and characteristics
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-5-2 has been prepared by subcommittee 47C:
Optoelectronic, display and imaging devices, of IEC technical committee 47: Semiconductor
devices.
This first edition replaces partially the second edition of IEC 60747-5 (1992) and constitutes a
technical revision (see also Annex A: Cross references index).
It should be read jointly with IEC 60747-1, IEC 62007-1 and IEC 62007-2.
The text of this standard is based partially on IEC 60747-5 (1992) and partially on the following
documents:
FDIS Report on voting
47C/173/FDIS 47C/186/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.
Annex B forms an integral part of this standard.
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60747-5-2 © IEC:1997 – 9 –
DISCRETE SEMICONDUCTOR DEVICES
AND INTEGRATED CIRCUITS –
Part 5-2: Optoelectronic devices –
Essential ratings and characteristics
1 Scope
This part of IEC 60747 gives the essential ratings and characteristics of the following
categories or subcategories of optoelectronic devices which are not intended to be used in the
field of fibre optic systems or subsystems:
– Semiconductor photoemitters, including:
. light-emitting diodes (LEDs);
. infrared-emitting diodes (IREDs);
. laser diodes.
– Semiconductor photoelectric detectors, including:
. photodiodes;
. phototransistors.
– Semiconductor photosensitive devices.
– Semiconductor devices utilizing the optical radiation for internal operation, including:
. photocouplers, optocouplers.
2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 60747. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 60747 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 60065:1985, Safety requirements for mains operated electronic and related apparatus for
household and similar general use
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Tests B: Dry heat
IEC 60068-2-3:1969, Environmental testing – Part 2: Tests – Test Ca: Damp heat, steady state
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperature
IEC 60068-2-17: 1994, Environmental testing – Part 2: Tests – Test Q: Sealing
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60747-5-2 © IEC:1997 – 11 –
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance: Damp
heat, cyclic (12 + 12-hour cycle)
IEC 60306-1:1969, Measurement of photosensitive devices – Part 1: Basic recommendations
IEC 60664-1:1992, Insulation coordination for equipment within low-voltage systems – Part 1:
Principles, requirements and tests
IEC 60695-2-2:1991, Fire hazard testing – Part 2: Test methods – Section 2: Needle-flame test
IEC 60747-5-1:1997, Discrete semiconductor devices and integrated circuits – Part 5-1:
Optoelectronic devices – General
IEC 60747-5-3:1997, Discrete semiconductor devices and integrated circuits – Part 5-3:
Optoelectronic devices – Measuring methods
3 Light-emitting diodes
(excluding devices for fibre optic systems or subsystems)
3.1 Type
Ambient-rated or case-rated light-emitting diode.
3.2 Semiconductor material
Gallium arsenide-phosphide, etc.
3.3 Colour
3.4 Details of outline and encapsulation
3.4.1 IEC and/or national reference number of the outline drawing.
3.4.2 Method of encapsulation: glass/metal/plastic/other.
3.4.3 Terminal identification and indication of any connection between a terminal and the
case.
3.5 Limiting values (absolute maximum system) over the operating temperature range,
unless otherwise stated
3.5.1 Minimum and maximum storage temperatures (T ).
stg
3.5.2 Minimum and maximum operating ambient or case temperature (T or T ).
amb case
3.5.3 Maximum reverse voltage (V ).
R
NOTE – Not applicable to dual-diode devices connected anode-to-cathode and cathode-to-anode.
3.5.4 Maximum continuous forward current (I ) at an ambient or case temperature of 25 °C
F
and derating curve or derating factor.
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60747-5-2 © IEC:1997 – 13 –
3.5.5 Where appropriate, maximum peak forward current (I ) at an ambient or case
FM
temperature of 25 °C, under specified pulse conditions.
3.6 Electrical characteristics
For multiple diodes, the characteristics should be given for each diode. For special
applications, additional characteristics may be required.
Conditions at
Ref. Characteristics T or T = 25 °C, Notes Symbols Requirements
amb case
unless otherwise stated
3.6.1 Forward voltage I specified (d.c. or pulse) V Max.
F F
3.6.2 Reverse current V specified 1 I Max.
R R
3.6.3 Luminous intensity along I specified (d.c. or pulse) 2, 3 I Min.
F v
the defined mechanical
axis
3.6.4 Peak emission I specified (d.c. or pulse) Min. Max.
λ
F
p
wavelength
3.6.5 Spectral radiation Half value of peak Max.
∆λ
bandwidth emission, with I as
F
(where appropriate) specified in 3.6.4
3.6.6 Switching times Max.
(where appropriate)
3.6.7 Half-intensity angle Max.
(where appropriate)
NOTE 1 – Not applicable to dual-diode devices connected anode-to-cathode and cathode-to-anode.
NOTE 2 – If the included solid angle over which the intensity is measured is not negligible, it should be
specified.
NOTE 3 – For diodes intended for use in multi-diode arrays, maximum luminous intensity is also required.
3.7 Supplementary information
3.7.1 Radiation diagram
A diagram graphically expressing typical luminous intensity versus viewing angle, and using
either polar or rectangular co-ordinates.
3.7.2 Spectral diagram (where appropriate)
A diagram graphically expressing typical luminous intensity versus wavelength.
3.7.3 Mechanical information
Mounting and soldering conditions, where appropriate.
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60747-5-2 © IEC:1997 – 15 –
4 Infrared-emitting diodes
(excluding devices for fibre optic systems or subsystems)
4.1 Type
Ambient-rated or case-rated infrared-emitting diode.
4.2 Semiconductor material
Gallium arsenide, etc.
4.3 Details of outline and encapsulation
4.3.1 IEC and/or national reference number of the outline drawing.
4.3.2 Method of encapsulation: glass/metal/plastic/other.
4.3.3 Terminal identification and indication of any connection between a terminal and the
case.
4.4 Limiting values (absolute maximum system) over the operating temperature range,
unless otherwise stated
4.4.1 Minimum and maximum storage temperature ( ).
T
stg
4.4.2 Minimum and maximum operating ambient or case temperature ( or ).
T T
amb case
4.4.3 Maximum reverse voltage ( ).
V
R
4.4.4 Maximum continuous forward current ( ) at an ambient or case temperature of 25 °C
I
F
and derating curve or derating factor.
4.4.5 Where appropriate, maximum peak forward current ( ) at an ambient or case
I
PM
temperature of 25 °C, under specified pulse conditions.
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60747-5-2 © IEC:1997 – 17 –
4.5 Electrical characteristics
For special applications, additional characteristics may be required.
Conditions at
Ref. Characteristics T or T = 25 °C, Notes Symbols Requirements
amb case
unless otherwise stated
4.5.1 Forward voltage I specified (d.c. or pulse) V Max.
F F
4.5.2 Reverse current Max.
V specified I
R R
4.5.3 Radiant power output or I specified (d.c. or pulse) 1 Min.
φ
F
e
radiant intensity along the
Min.
I
defined mechanical axis
e
4.5.4 Peak emission I specified (d.c. or pulse) Min. Max.
λ
F
p
wavelength
4.5.5 Spectral radiation Half-value of peak Max.
∆λ
bandwidth (where emission, with I as
F
appropriate) specified in 4.5.4
4.5.6 Switching times (where Max.
appropriate)
4.5.7 Half-intensity angle Max.
(where appropriate)
4.5.8 Capacitance (where Max.
appropriate)
NOTE 1 – If the included solid angle over which the intensity is measured is not negligible, it should be
specified.
4.6 Supplementary information
4.6.1 Radiation diagram
A diagram graphically expressing typical radiant power output or radiant intensity versus
angle with respect to the defined mechanical axis, and using either polar or rectangular
coordinates.
4.6.2 Spectral diagram (where appropriate)
A diagram graphically expressing typical radiant power output or radiant intensity versus
wavelength.
4.6.3 Mechanical information
Mounting and soldering conditions, where appropriate.
5 Photodiodes
(excluding devices for fibre optic systems or subsystems)
5.1 Type
Ambient-rated or case-rated photodiode intended for small-signal and switching applications.
5.2 Semiconductor material
Silicon, etc.
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60747-5-2 © IEC:1997 – 19 –
5.3 Details of outline and encapsulation
5.3.1 IEC and/or national reference number of the outline drawing.
5.3.2 Method of encapsulation: glass/metal/plastic/other.
5.3.3 Terminal identification and indication of any connection between a terminal and the
case.
5.4 Limiting values (absolute maximum system) over the operating temperature range,
unless otherwise stated
5.4.1 Minimum and maximum storage temperatures (T ).
stg
5.4.2 Minimum and maximum operating ambient or case temperature (T or T ).
amb case
5.4.3 Maximum reverse voltage (V ).
R
5.4.4 Where appropriate:
– maximum total power dissipation ( ) up to ambient or case temperature of 25 °C, and
P
tot
– derating factor above 25 °C (K ) or derating curve.
t
5.5 Electrical characteristics
Conditions at
Ref. Characteristics T or T = 25 °C, Notes Symbols Requirements
amb case
unless otherwise stated
5.5.1 Reverse current under V specified 1 I or I Min.
R R(H) R(e)
irradiation E or E specified
v e
5.5.2 Dark current V specified, E = 0 I Max.
R e R
5.5.3 Dark current V specified, E = 0 I Max.
R e R
at a specified high
temperature of T or
amb
T specified
case
5.5.4 Where appropriate, V specified, E S Min.
R e
spectral sensitivity specified, at a short
wavelength λ specified
1
S Min.
and at a longer
wavelength λ specified
2
5.5.5 Switching times (where Specified circuit
appropriate):
rise time and specified value of , Max.
V t
R r
fall time Max.
E or E specified t
v e r
or: Specified circuit
turn-on time and specified value of V , t Max.
R on
turn-off time E or E specified t Max.
v e off
NOTE 1 – Illumination by standard illuminant A (according to IEC 60306-1) emitted from a filament tungsten
lamp with a colour temperature T = 2 855,6 K or with radiation from a defined monochromatic source.
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60747-5-2 © IEC:1997 – 21 –
5.6 Supplementary information
5.6.1 Diagram of typical sensitivity
5.6.2 Typical spectral diagram
A diagram graphically expressing relative spectral sensitivity versus wavelength.
6 Phototransistors
(excluding devices for fibre optic systems or subsystems)
6.1 Type
Ambient-rated or case-rated phototransistor intended for small-signal and switching
applications.
6.2 Semiconductor material
Silicon, etc.
6.3 Polarity
NPN/PNP.
6.4 Details of outline and encapsulation
6.4.1 IEC and/or national reference number of the outline drawing.
6.4.2 Method of encapsulation: glass/metal/plastic/other.
6.4.3 Terminal identification and indication of any connection between a terminal and the
case.
6.5 Limiting values (absolute maximum system) over the operating temperature range,
unless otherwise stated
6.5.1 Minimum and maximum storage temperature (T ).
stg
6.5.2 Minimum and maximum operating ambient or case temperatures (T or T ).
amb case
6.5.3 Maximum collector-emitter voltage with zero base current (V ).
CEO
6.5.4 Where an external base connection is present:
6.5.4.1 Maximum collector-base voltage with zero emitter current (V
...
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