iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
IEC

PT 62607-5-3 - TC 113/PT 62607-5-3

TC 113/PT 62607-5-3

General Information

Status
Active
Work Field
Information technology
Parent
TC 113 - Nanotechnology for electrotechnical products and systems
Standardization Organization
ICS
Directive
Mandate
50
IEC
IEC TS 62607-5-3:2020(Main)
Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

  • Technical specification
    20 pages
    English language
    sale 15% off
50