ASTM F1680-02

Standard Test Method for Determining Circuit Resistance of a Membrane Switch

SCOPE
1.1 This test method covers the determination of the circuit resistance of a membrane switch utilizing a predetermined force.  
1.2  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 09-Jan-2002
• ICS: 19.080 - Electrical and electronic testing
• ICS: 29.120.40 - Switches
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.18 - Printed Electronics

Relations

• Replaces: ASTM F1680-96 - Standard Test Method for Determining Circuit Resistance of a Membrane Switch
• Effective Date: 10-Jan-2002
• Replaced By: ASTM F1680-07 - Standard Test Method for Determining Circuit Resistance of a Membrane Switch
• Effective Date: 01-Jul-2007
• Referred By: ASTM F1661-09(2015) - Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
• Effective Date: 10-Jan-2002
• Referred By: ASTM F1662-16 - Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device (Withdrawn 2023)
• Effective Date: 10-Jan-2002
• Referred By: ASTM F1596-15 - Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
• Effective Date: 10-Jan-2002
• Referred By: ASTM F2865-13(2021) - Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch (Withdrawn 2023)
• Effective Date: 10-Jan-2002

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:F 1680–02
Standard Test Method for
1
Determining Circuit Resistance of a Membrane Switch
This standard is issued under the fixed designation F 1680; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This test method covers the determination of the circuit
resistance of a membrane switch utilizing a predetermined
force.
1.2 This standard does not purport to address all of the
safety concerns, if any, associated with its use. It is the
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
2. Referenced Documents
2.1 ASTM Standards:
D 2240 Test Method for Rubber Property-Durometer Hard-
FIG. 1 Test Probe Option
2
ness
3. Terminology 5.2 Test Surface to be flat, smooth, unyielding and larger
than switch under test.
3.1 Definitions:
5.3 Device, to hold test probe securely and provide perpen-
3.1.1 circuit resistance—electrical resistance as measured
dicular movement into and away from switch under test.
between two test points whose internal contacts, when held
5.4 Resistance Measuring Device, that is ohm meter. The
closed, complete a circuit.
device should not apply a voltage outside the operating range
3.1.2 membrane switch—a momentary switching device in
of the switch contacts.
which at least one contact is on, or made of, a flexible
5.5 Suitable Device, to apply a predetermined force on test
substrate.
probe.
3.1.3 test points—two preselected conductive points in a
circuit loop, possibly including a switch.
6. Procedure
4. Significance and Use 6.1 Pre-Test Setup:
6.1.1 Secure switch on test surface.
4.1 Resistance is useful to manufacturers and users when
6.1.1.1 Precondition switch by depressing manually 25
designing membrane switch interface circuitry.
times.
5. Apparatus
5.1 Test Probe, built to either of the configurations shown in
Fig. 1 or Fig. 2, are acceptable but must be made of an inert
elastomeric material with a hardness number equivalent to
A/45 6 5 as measured in accordance with Test Method
D 2240.Test probes that do not meet the above criteria must be
specified and recorded fully.
1
This test method is under the jurisdiction of ASTM Committee F01 on
Electronics and is the direct responsibility of Subcommittee F01.18
...