ASTM E1382-97(2015)

Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis

SIGNIFICANCE AND USE
5.1 These test methods cover procedures for determining the mean grain size, and the distribution of grain intercept lengths or grain areas, for polycrystalline metals and nonmetallic materials with equiaxed or deformed grain shapes, with uniform or duplex grain size distributions, and for single phase or multiphase grain structures.  
5.2 The measurements are performed using semiautomatic digitizing tablet image analyzers or automatic image analyzers. These devices relieve much of the tedium associated with manual measurements, thus permitting collection of a larger amount of data and more extensive sampling which will produce better statistical definition of the grain size than by manual methods.  
5.3 The precision and relative accuracy of the test results depend on the representativeness of the specimen or specimens, quality of specimen preparation, clarity of the grain boundaries (etch technique and etchant used), the number of grains measured or the measurement area, errors in detecting grain boundaries or grain interiors, errors due to detecting other features (carbides, inclusions, twin boundaries, and so forth), the representativeness of the fields measured, and programming errors.  
5.4 Results from these test methods may be used to qualify material for shipment in accordance with guidelines agreed upon between purchaser and manufacturer, to compare different manufacturing processes or process variations, or to provide data for structure-property-behavior studies.
SCOPE
1.1 These test methods are used to determine grain size from measurements of grain intercept lengths, intercept counts, intersection counts, grain boundary length, and grain areas.  
1.2 These measurements are made with a semiautomatic digitizing tablet or by automatic image analysis using an image of the grain structure produced by a microscope.  
1.3 These test methods are applicable to any type of grain structure or grain size distribution as long as the grain boundaries can be clearly delineated by etching and subsequent image processing, if necessary.  
1.4 These test methods are applicable to measurement of other grain-like microstructures, such as cell structures.  
1.5 This standard deals only with the recommended test methods and nothing in it should be construed as defining or establishing limits of acceptability or fitness for purpose of the materials tested.  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.  
1.7 The sections appear in the following order:    
Section  
Section  
Scope  
1  
Referenced Documents  
2  
Terminology  
3  
Definitions  
3.1  
Definitions of Terms Specific to This Standard  
3.2  
Symbols  
3.3  
Summary of Test Method  
4  
Significance and Use  
5  
Interferences  
6  
Apparatus  
7  
Sampling  
8  
Test Specimens  
9  
Specimen Preparation  
10  
Calibration  
11  
Procedure:  
Semiautomatic Digitizing Tablet  
12  
Intercept Lengths  
12.3  
Intercept and Intersection Counts  
12.4  
Grain Counts  
12.5  
Grain Areas  
12.6  
ALA Grain Size  
12.6.1  
Two-Phase Grain Structures  
12.7  
Procedure:  
Automatic Image Analysis  
13  
Grain Boundary Length  
13.5  
Intersection Counts  
13.6  
Mean Chord (Intercept) Length/Field  
13.7.2  
Individual Chord (Intercept) Lengths  
13.7.4  
Grain Counts  
13.8  
Mean Grain Area/Field  
13.9  
Individual Grain Areas  
13.9.4  
ALA Grain Size  
13.9.8  
Two-Phase Grain Structures  
13.10  
Calculation of Results  
14  
Test Report  
15  
Precision and Bias  
16  
Grain Size of Non-Equiaxed Grain Structure Specimens  
Annex A1  
Examples...

General Information

• Status: Historical
• Publication Date: 30-Sep-2015
• ICS: 13.300 - Protection against dangerous goods
• Technical Committee: E04 - Metallography
• Drafting Committee: E04.14 - Quantitative Metallography

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E1382 − 97 (Reapproved 2015)
Standard Test Methods for
Determining Average Grain Size Using Semiautomatic and
1
Automatic Image Analysis
This standard is issued under the fixed designation E1382; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
INTRODUCTION
These test methods may be used to determine the mean grain size, or the distribution of grain
intercept lengths or areas, in metallic and nonmetallic polycrystalline materials. The test methods may
be applied to specimens with equiaxed or elongated grain structures with either uniform or duplex
grain size distributions. Either semiautomatic or automatic image analysis devices may be utilized to
perform the measurements.
1. Scope
Section Section
Scope 1
1.1 These test methods are used to determine grain size
Referenced Documents 2
from measurements of grain intercept lengths, intercept counts, Terminology 3
Definitions 3.1
intersection counts, grain boundary length, and grain areas.
Definitions of Terms Specific to This Standard 3.2
Symbols 3.3
1.2 These measurements are made with a semiautomatic
Summary of Test Method 4
digitizing tablet or by automatic image analysis using an image
Significance and Use 5
of the grain structure produced by a microscope.
Interferences 6
Apparatus 7
1.3 These test methods are applicable to any type of grain
Sampling 8
structure or grain size distribution as long as the grain Test Specimens 9
Specimen Preparation 10
boundaries can be clearly delineated by etching and subsequent
Calibration 11
image processing, if necessary.
Procedure:
Semiautomatic Digitizing Tablet 12
1.4 These test methods are applicable to measurement of
Intercept Lengths 12.3
other grain-like microstructures, such as cell structures.
Intercept and Intersection Counts 12.4
Grain Counts 12.5
1.5 This standard deals only with the recommended test
Grain Areas 12.6
methods and nothing in it should be construed as defining or ALA Grain Size 12.6.1
Two-Phase Grain Structures 12.7
establishing limits of acceptability or fitness for purpose of the
Procedure:
materials tested.
Automatic Image Analysis 13
Grain Boundary Length 13.5
1.6 This standard does not purport to address all of the
Intersection Counts 13.6
safety concerns, if any, associated with its use. It is the
Mean Chord (Intercept) Length/Field 13.7.2
responsibility of the user of this standard to establish appro- Individual Chord (Intercept) Lengths 13.7.4
Grain Counts 13.8
priate safety and health practices and determine the applica-
Mean Grain Area/Field 13.9
bility of regulatory limitations prior to use.
Individual Grain Areas 13.9.4
ALA Grain Size 13.9.8
1.7 The sections appear in the following order:
Two-Phase Grain Structures 13.10
Calculation of Results 14
Test Report 15
1
These test methods are under the jurisdiction of ASTM Committee E04 on
Precision and Bias 16
Metallography and are the direct responsibility of Subcommittee E04.14 on
Grain Size of Non-Equiaxed Grain Structure Annex
Quantitative Metallography.
Specimens A1
Current edition approved Oct. 1, 2015. Published February 2016. Originally
Examples of Proper and Improper Grain Boundary Annex
approved in 1991. Last previous edition approved in 2010 as E1382 – 97(2010).
Delineation A2
DOI: 10.1520/E1382-97R15.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E1382 − 97 (2015)
¯
2. Referenced Documents A = average area of α grains in a two-phase (constituent)
α
2 microstructure.
2.1 ASTM Standards:
¯
A = area fraction of α grains in a two-phase microstruc-
Aα
E3 Guide for Preparation of Metallographic Specimens
ture.
E7 Terminology Relating to Metallography
th
A = total area of grains in the i field.
gi
E112 Test Methods for Determining Average Grain Size
th th
A = true area of the i grain; or, the test area of the i field.
E407 Practice for Microetching Metals and Alloys i
th
¯
A = mean grain area for the i field.
E562 Test Method for Determining Volume Fraction by i
A = area of the largest observed grain.
Systematic Manual Point Count
max
th
A = true test area for the i field.
E883 Guide for Reflected–Light Photomicrography
ti
E930 Test Methods for Estimating the Largest Grain Ob- d = diameter of test circle.
served in a Metallographic Section (ALA Grain Size) G = ASTM grain size number.
¯
E1181 Test Methods for Characterizing Duplex Grain Sizes
l = mean lineal intercept length.
¯
E1245 Practice for Determining the Inclusion or Second- l = mean lineal intercept length of the α phas
...

This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation: E1382 − 97 (Reapproved 2010) E1382 − 97 (Reapproved 2015)
Standard Test Methods for
Determining Average Grain Size Using Semiautomatic and
1
Automatic Image Analysis
This standard is issued under the fixed designation E1382; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
INTRODUCTION
These test methods may be used to determine the mean grain size, or the distribution of grain
intercept lengths or areas, in metallic and nonmetallic polycrystalline materials. The test methods may
be applied to specimens with equiaxed or elongated grain structures with either uniform or duplex
grain size distributions. Either semiautomatic or automatic image analysis devices may be utilized to
perform the measurements.
1. Scope
1.1 These test methods are used to determine grain size from measurements of grain intercept lengths, intercept counts,
intersection counts, grain boundary length, and grain areas.
1.2 These measurements are made with a semiautomatic digitizing tablet or by automatic image analysis using an image of the
grain structure produced by a microscope.
1.3 These test methods are applicable to any type of grain structure or grain size distribution as long as the grain boundaries
can be clearly delineated by etching and subsequent image processing, if necessary.
1.4 These test methods are applicable to measurement of other grain-like microstructures, such as cell structures.
1.5 This standard deals only with the recommended test methods and nothing in it should be construed as defining or
establishing limits of acceptability or fitness for purpose of the materials tested.
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
1.7 The sections appear in the following order:
Section Section
Scope 1
Referenced Documents 2
Terminology 3
Definitions 3.1
Definitions of Terms Specific to This Standard 3.2
Symbols 3.3
Summary of Test Method 4
Significance and Use 5
Interferences 6
Apparatus 7
Sampling 8
Test Specimens 9
Specimen Preparation 10
Calibration 11
Procedure:
Semiautomatic Digitizing Tablet 12
Intercept Lengths 12.3
Intercept and Intersection Counts 12.4
1
These test methods are under the jurisdiction of ASTM Committee E04 on Metallography and are the direct responsibility of Subcommittee E04.14 on Quantitative
Metallography.
Current edition approved Nov. 1, 2010Oct. 1, 2015. Published January 2011February 2016. Originally approved in 1991. Last previous edition approved in 20042010 as
E1382 – 97(2004).(2010). DOI: 10.1520/E1382-97R10.10.1520/E1382-97R15.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E1382 − 97 (2015)
Section Section
Grain Counts 12.5
Grain Areas 12.6
ALA Grain Size 12.6.1
Two-Phase Grain Structures 12.7
Procedure:
Automatic Image Analysis 13
Grain Boundary Length 13.5
Intersection Counts 13.6
Mean Chord (Intercept) Length/Field 13.7.2
Individual Chord (Intercept) Lengths 13.7.4
Grain Counts 13.8
Mean Grain Area/Field 13.9
Individual Grain Areas 13.9.4
ALA Grain Size 13.9.8
Two-Phase Grain Structures 13.10
Calculation of Results 14
Test Report 15
Precision and Bias 16
Grain Size of Non-Equiaxed Grain Structure Annex
Specimens A1
Examples of Proper and Improper Grain Boundary Annex
Delineation A2
2. Referenced Documents
2
2.1 ASTM Standards:
E3 Guide for Preparation of Metallographic Specimens
E7 Terminology Relating to Metallography
E112 Test Methods for Determining Average Grain Size
E407 Practice for Microetching Metals and Alloys
E562 Test Method for Determining Volume Fraction by Systematic Manual Point Count
E883 Guide for Reflected–Light Photomicrography
E930 Test Methods for Estimating the Largest Grain Observed in a Metallographic Section (ALA Grain Size)
E1181 Test Methods for Characterizing Duplex Grain Sizes
E1245 Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis
3. Terminology
3.1 Definitions—For definitions of terms used in these test methods, (feature-specific measurement, field
...