ASTM D4935-10
(Test Method)Standard Test Method for Measuring the Electromagnetic Shielding Effectiveness of Planar Materials
Standard Test Method for Measuring the Electromagnetic Shielding Effectiveness of Planar Materials
SIGNIFICANCE AND USE
This test method applies to the measurement of SE of planar materials under normal incidence, far-field, plane-wave conditions (E and H tangential to the surface of the material).
The uncertainty of the measured SE values is a function of material, mismatches throughout the transmission line path, dynamic range of the measurement system, and the accuracy of the ancillary equipment. An uncertainty analysis is given in Appendix X1 to illustrate the uncertainty that may be achieved by an experienced operator using good equipment. Deviations from the procedure in this test method will increase this uncertainty.
Approximate near-field values of SE may be calculated for both E or H sources by using measured values of far-field SE. A program may be generated from the source code in Appendix X2 that is suitable for use on a personal computer.
This test method measures the net SE caused by reflection and absorption. Separate measurement of reflected and absorbed power may be accomplished by the addition of a calibrated bidirectional coupler to the input of the holder.
SCOPE
1.1 This test method provides a procedure for measuring the electromagnetic (EM) shielding effectiveness (SE) of a planar material for a plane, far-field EM wave. From the measured data, near-field SE values may be calculated for magnetic (H) sources for electrically thin specimens. , Electric (E) field SE values may also be calculated from this same far-field data, but their validity and applicability have not been established.
1.2 The measurement method is valid over a frequency range of 30 MHz to 1.5 GHz. These limits are not exact, but are based on decreasing displacement current as a result of decreased capacitive coupling at lower frequencies and on overmoding (excitation of modes other than the transverse electromagnetic mode (TEM)) at higher frequencies for the size of specimen holder described in this test method. Any number of discrete frequencies may be selected within this range. For electrically thin, isotropic materials with frequency independent electrical properties of conductivity, permittivity, and permeability, measurements may be needed at only a few frequencies as the far-field SE values will be independent of frequency. If the material is not electrically thin or if any of the parameters vary with frequency, measurements should be made at many frequencies within the band of interest.
1.3 This test method is not applicable to cables or connectors.
1.4 Units—The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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Designation: D4935 − 10
Standard Test Method for
Measuring the Electromagnetic Shielding Effectiveness of
1
Planar Materials
This standard is issued under the fixed designation D4935; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
1.1 Thistestmethodprovidesaprocedureformeasuringthe
electromagnetic (EM) shielding effectiveness (SE) of a planar
2. Referenced Documents
material for a plane, far-field EM wave. From the measured
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2.1 ASTM Standards:
data, near-field SE values may be calculated for magnetic (H)
2,3
D1711Terminology Relating to Electrical Insulation
sources for electrically thin specimens. Electric (E) field SE
valuesmayalsobecalculatedfromthissamefar-fielddata,but
3. Terminology
their validity and applicability have not been established.
3.1 Definitions—For definitions of terms used in this test
1.2 The measurement method is valid over a frequency
method, refer to Terminology D1711.
rangeof30MHzto1.5GHz.Theselimitsarenotexact,butare
based on decreasing displacement current as a result of 3.2 Definitions of Terms Specific to This Standard:
decreased capacitive coupling at lower frequencies and on
3.2.1 dynamic range (DR), n—differencebetweenthemaxi-
overmoding (excitation of modes other than the transverse mum and minimum signals measurable by the system.
electromagnetic mode (TEM)) at higher frequencies for the
3.2.1.1 Discussion—Measurement of materials with good
size of specimen holder described in this test method. Any SE require extra care to avoid contamination of extremely low
number of discrete frequencies may be selected within this power or voltage values by unwanted signals from leakage
range. For electrically thin, isotropic materials with frequency paths.
independent electrical properties of conductivity, permittivity,
3.2.2 electrically thin, adj—thickness of the specimen is
and permeability, measurements may be needed at only a few 1
much smaller (< ⁄100) than the electrical wavelength within the
frequencies as the far-field SE values will be independent of
specimen.
frequency.Ifthematerialisnotelectricallythinorifanyofthe
3.2.3 far field, n—that region where vectors E and H are
parametersvarywithfrequency,measurementsshouldbemade
orthogonaltoeachotherandbotharenormaltothedirectionof
at many frequencies within the band of interest.
propagation of energy.
1.3 This test method is not applicable to cables or connec-
3.2.4 near field, n—that region where E and H are not
tors.
related by simple rules.
1.4 Units—The values stated in SI units are to be regarded
3.2.4.1 Discussion—The transition region between near
asstandard.Nootherunitsofmeasurementareincludedinthis
field and far field is not abrupt but is located at the distance
standard.
close to λ/2π from a dipole source, where λ is the free-space
wave length of the frequency of the source. This concept of
1.5 This standard does not purport to address all of the
regionsisfurtherblurredbyreradiatingasaresultofscattering
safety concerns, if any, associated with its use. It is the
by reflecting materials or objects that may be distant from the
responsibility of the user of this standard to establish appro-
source. The interior of metallic structures often contains a
mixture of near-field regions.
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This test method is under the jurisdiction of ASTM Committee D09 on
3.2.5 shielding effectiveness (SE), n—ratio of power re-
Electrical and Electronic Insulating Materials and is the direct responsibility of
Subcommittee D09.12 on Electrical Tests.
ceived with and without a material present for the same
Current edition approved May 1, 2010. Published June 2010. Originally
incident power.
approved in 1989. Last previous edition approved in 1999 as D4935–99. DOI:
10.1520/D4935–10.
2
Wilson, P. F., and Ma, M. T., “A Study of Techniques for Measuring the
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Electromagnetic Shielding Effectiveness of Materials,” NBS Technical Note 1095, For referenced ASTM standards, visit the ASTM website, www.astm.org, or
May 1986. contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
3
Adams, J. W., and Vanzura, E. J., “Shielding Effectiveness Measurements of Standards volume information, refer to the standard’s Document Summary page on
Plastics,” NBSIR 85-3035, January 1986. the ASTM website.
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D4935 − 10
3.2.5.1 Discussion—SE is usually expressed in decibels mid
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