ASTM F219-96

Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps

SCOPE
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps.  
1.2 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.  
1.3  This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 09-Dec-1996
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.03 - Metallic Materials, Wire Bonding, and Flip Chip

Relations

• Replaced By: ASTM F219-96(2002) - Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
• Effective Date: 10-Dec-1996

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or
withdrawn. Contact ASTM International (www.astm.org) for the latest information.
Designation: F 219 – 96
AMERICAN SOCIETY FOR TESTING AND MATERIALS
100 Barr Harbor Dr., West Conshohocken, PA 19428
Reprinted from the Annual Book of ASTM Standards. Copyright ASTM
Standard Test Methods of Testing
1
Fine Round and Flat Wire for Electron Devices and Lamps
This standard is issued under the fixed designation F 219; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope tension tests the specimens shall be taken from points in the
length of the wire separated by at least 3 ft (0.9 m).
1.1 These test methods cover the testing of fine wire, flat or
round, approximately 0.010 in. (0.25 mm) and smaller in
4. Chemical Analysis
diameter or thickness, used in electronic devices and lamps.
4.1 In case of disagreement between producer and consumer
1.2 The values stated in inch-pound units are to be regarded
chemical analysis of the material shall be made in accordance
as the standard. The values given in parentheses are for
with the methods of the American Society for Testing and
information only.
Materials for the respective materials when such methods of
1.3 This standard does not purport to address all of the
analysis are available. When ASTM test methods are not
safety concerns, if any, associated with its use. It is the
available, the analytical procedures shall be agreed upon by the
responsibility of whoever uses this standard to consult and
producer and the consumer.
establish appropriate safety and health practices and deter-
mine the applicability of regulatory limitations prior to use.
5. Dimensions
2. Referenced Documents
5.1 Procedure A for Round Wire—Determine the weight-
size of round wire in accordance with Method F 205.
2.1 ASTM Standards:
5.2 Procedure B for Round Wire—As an alternative method,
B 63 Test Method for Resistivity of Metallically Conduct-
2
the diameter of wire over 0.005 in. (0.13 mm) may be
ing Resistance and Contact Materials
determined in accordance with Test Methods D 374.
D 374 Test Methods for Thickness of Solid Electrical
3
5.3 Procedure for Flat Wire:
Insulation
5.3.1 Determine the dimensions of flat wire in accordance
F 16 Test Methods for Measuring Diameter or Thickness of
4
with 5.1 in conjunction with width as measured in accordance
Wire and Ribbon for Electronic Devices and Lamps
with 5.2, or if agreed upon by the manufacturer and the
F 205 Test Method for Measuring Diameter of Fine Wire by
4
purchaser, any dimension exceeding 0.005 in. may be deter-
Weighing
mined in accordance with 5.2 alone.
F 289 Specification for Molybdenum Wire and Rod for
4
5.3.2 In determining the width of flat wire, form a flatwise
Electronic Applications
loop loosely with the ends held between the fingers. The minor
3. Test Specimens
1 3
axis of the loop shall be ⁄2 to ⁄4 of the diameter of the
3.1 The number of spools per shipment to be checked shall
micrometer jaws. Measure the width of the ribbon with the
be agreed upon by the producer and consumer. Three test
curve loop perpendicular to the micrometer jaws. Take care not
specimens from each spool to be tested shall be taken for the
to distort the ribbon or bend it out of the correct plane during
purpose of each of the tests covered by these methods, except
measurement.
Section 4, where one specimen per shipment shall be submit-
5.4 In case of disagreement between producer and con-
ted. These specimens shall be selected sufficiently far from
sumer, Methods F 16 shall be used as the referee method.
either end of the spool of wire to be free from kinks, bends, and
5.5 Report—The report shall include the average weight of
distortion. With the exceptions mentioned in 3.2, the specimens
wire or ribbon in mg/200 mm to three significant figures. The
shall be taken from points in the length of the wire separated by
average measurements for diameter, width, or thickness shall
at least 1 ft (305 mm).
be reported to the nearest 0.0001 in. (0.002 mm).
3.2 For the edgewise curvature test, straightness test, and
6. Out-of-Roundness
6.1 Procedure—Measure out-of-roundness on round wire
1
These test methods are under the jurisdiction of ASTM Committee F-1 on
over 0.005 in. (0.13 mm) in diameter in accordance with
Electronics and are the direct responsibility of Subcommittee F01.03 on Metallic
Sections 3 and 4 of Methods D 374. For wire 0.005 in. or less
Materials.
Current edition approved Dec. 10, 1996. Published February 1997. Originally
in diameter the same method shall apply except a bench type
published as F 219 – 47. Last previous edition F 219 – 79 (1991).
micrometer reading to 0.0001 in. (0.002 mm) shall be used.
2
Annual Book of ASTM S
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