ASTM D3380-90(1995)e1
(Test Method)Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
SCOPE
1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).
1.2 This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats, glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen thickness of 1.6 mm. The materials are applicable to service at nominal frequency of 9.6 GHz. Note 1-See Appendix X1. for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6 GHz.
1.3 The values stated in inch-pound units are to be regarded as the standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
General Information
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Standards Content (Sample)
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e1
Designation: D 3380 – 90 (Reapproved 1995)
Standard Test Method for
Relative Permittivity (Dielectric Constant) and Dissipation
Factor of Polymer-Based Microwave Circuit Substrates
This standard is issued under the fixed designation D 3380; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
e NOTE—Keywords were added in March 1995.
1. Scope 2.2 IPC Standards:
IPC-TM-650 Test Methods Manual Method 2.5.5.5.
1.1 This test method permits the rapid measurement of
IPC-CF-150E Copper Foil for Printed Wiring Applications.
apparent relative permittivity and loss tangent (dissipation
2.3 IEEE Standards:
factor) of metal-clad polymer-based circuit substrates in the
Standard No. 488.1 Standard Digital Interface for Program-
X-band (8 to 12.4 GHz).
mable Instrumentation.
1.2 This test method is suitable for testing PTFE (polytet-
Standard No. 488.2 Standards, Codes, Formats, Protocols
rafluorethylene) impregnated glass cloth or random-oriented
and Common Commands for use with ANSI and IEEE
fiber mats, glass fiber-reinforced polystyrene, polyphenyle-
Standard 488.1.
neoxide, irradiated polyethylene, and similar materials having
a nominal specimen thickness of 1.6 mm. The materials are
3. Terminology
applicable to service at nominal frequency of 9.6 GHz.
3.1 Definitions—See Terminology D 1711 for the defini-
NOTE 1—See Appendix X1 for additional information about range of
tions of terms used in this test method. See also Test Methods
permittivity, thickness other than 1.6 mm, and tests at frequencies other
D 2520, D 150, and IPC TM-650 for additional information
than 9.6 GHz.
regarding the terminology.
1.3 The values stated in inch-pound units are to be regarded
3.2 Definitions of Terms Specific to This Standard:
as the standard.
3.2.1 D—a symbol used in this test method for the dissipa-
1.4 This standard does not purport to address all of the
tion factor.
safety concerns, if any, associated with its use. It is the
3.2.2 DL—a correction factor associated with length which
responsibility of the user of this standard to establish appro-
corrects for the fringing capacitance at the ends of the resonator
priate safety and health practices and determine the applica-
element.
bility of regulatory limitations prior to use.
3.2.3 k8—symbol used in this test method to denote relative
permittivity.
2. Referenced Documents
NOTE 2—The preferred symbol for permittivity is Greek kappa prime
2.1 ASTM Standards:
but some persons use other symbols to denote this property such as DK,
D 150 Test Methods for A-C Loss Characteristics and
SIC,or e8 .
R
Permittivity (Dielectric Constant) of Solid Electrical Insu-
2 3.2.4 microstrip line—a microwave transmission line em-
lation
ploying a flat strip conductor bonded to one surface of a
D 618 Practice for Conditioning Plastics and Electrical
3 dielectric board or sheet, the other surface of which is clad
Insulating Materials for Testing
with, or bonded to, a continuous conductive foil or plate which
D 1711 Terminology Relating to Electrical Insulation
is substantially wider than the strip. Microstrip provides easier
D 2520 Test Methods for Complex Permittivity (Dielectric
accessibility than stripline for attaching components and de-
Constant) of Solid Electrical Insulating Materials at Mi-
4 vices to the strip circuitry.
crowave Frequencies and Temperatures to 1650°C
3.2.5 microwave substrate—a board or sheet of low-loss
dielectric material which may be clad with metal foil on one, or
both, surfaces. In this test method all metal is removed by
This test method is under the jurisdiction of ASTM Committee D-9 on
etching prior to testing.
Electrical and Electronic Insulating Materials and is the direct responsibility of
Subcommittee D09.12 on Electrical Tests.
Current edition approved Feb. 23, 1990. Published April 1990. Originally
published as D 3380 – 75. Last previous edition D 3380 – 89. Available from The Institute for Interconnecting and Packaging Electronics
Annual Book of ASTM Standards, Vol 10.01. Circuits, 7380 N. Lincoln Ave., Lincolnwood, IL 60646.
3 6
Annual Book of ASTM Standards, Vols 08.01 and 10.01. Available from the Institute of Electrical and Electronics Engineers, Inc., 345
Annual Book of ASTM Standards, Vol 10.02. E. 47th St., New York, NY 10017.
Copyright © ASTM, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, United States.
NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
D 3380
3.2.6 stripline—microwave transmission line using a flat
strip conductor clamped, or bonded, between two substantially
wider dielectric boards. The outer surfaces of both boards are
bonded to, or in intimate contact with, conducting foils or
plates (ground planes). Stripline may be conceived as a
flattened version of cylindrical coaxial cable.
3.2.7 stripline resonator—a disconnected section of strip-
line loosely coupled at each end by capacitative gaps to feed or
probe lines. The strip becomes resonant at those frequencies at
which the strip length, increased by an increment due to the
fringing fields at the ends, is equal to an integral multiple of
half-wavelengths in the dielectric. As frequency varies gradu-
ally, the power transmitted from the input to the output feed
lines becomes maximum at resonance, and falls off sharply to
essentially zero at frequencies which are a few parts per
thousand above and below resonance.
FIG. 1 Face View of Fixture Assembly
4. Summary of Test Method
4.1 Substrate specimens, with metal cladding removed,
become the supporting dielectric spacers of a microwave
stripline resonator when properly positioned and clamped in
the test fixture. The measured values of resonant frequency of
the stripline resonator and the half-power frequencies are used
to compute the relative permittivity (dielectric constant or k8)
and the dissipation factor (D) of the test specimen. The test
specimen consists of one or more pairs of test cards.
5. Significance and Use
5.1 Permittivity and dissipation factor are fundamental de-
sign parameters for design of microwave circuitry. Permittivity
plays a principal role in determining the wavelength and the
impedance of transmission lines. Dissipation factor (along with
copper losses) influence attenuation and power losses.
5.2 This test method is suitable for polymeric materials
FIG. 2 Exploded Side View of Assembly
having permittivity in the order of two to eleven. Such
materials are popular in applications of stripline and microstrip
configurations used in the 1 to 18 GHz range.
5.3 This test method is suitable for design, development,
acceptance specifications, and manufacturing quality control.
NOTE 3—See Appendix X1 for additional information regarding sig-
nificance of this test method and the application of the results.
6. Apparatus
6.1 The preferred assembly fixture shown in Fig. 1, Fig. 2,
and Fig. 3 is hereby designated Fixture A. This design of test
specimen fixture provides advantages over the design of
FIG. 3 Enlarged Exploded Side View Sectioned Through a Probe
Line Showing a Lap Conductor Joint for Fixture A
Fixture B shown in Fig. 4, Fig. 5, Fig. 6, and Fig. 7.
6.1.1 The Fixture B design has been included since this
fixture has been, and still is, in service in numerous laborato- 6.2 Fixture A—The elements of the fixture include the
ries.
following:
6.1.2 The Fixture B design relies upon close control of the 6.2.1 Resonator Pattern Card (see Fig. 8),
room temperature in the laboratory for control of the test 6.2.2 Base Stripline Board (see Fig. 9),
specimen temperature. 6.2.3 Base Cover Board (see Fig. 10),
6.1.3 Changing of test pattern cards in the Fixture B design 6.2.4 End-Launcher Bodies, adapted (see Fig. 11),
is less convenient than with the Fixture A design. 6.2.5 Aluminum Base Plates (see Fig. 12),
6.1.4 For Fixture A the preferred assembly for Resonator 6.2.6 Aluminum Clamping Plates (see Fig. 13),
Card and Specimen uses a Lap Conductor Joint. See Fig. 3 for 6.2.7 Aluminum Blocks, for temperature control (see Fig.
details. 14).
NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
D 3380
In. mm
0.001 0.03
0.002 0.05
0.086 2.18
0.100 2.54
0.143 3.63
0.200 5.08
0.214 5.44
0.250 6.35
0.500 12.70
1.000 25.40
1.500 38.10
2.000 50.80
2.700 68.58
NOTE 1—Dimensions are in inches.
NOTE 2—Metric equivalents are given for general information only.
FIG. 4 Generalized Resonator Pattern Card for Fixture B Showing
Dimensions of Table 1 and Made of Laminate Matching the
Nominal Permittivity of Material to be Tested
FIG. 5 Test Fixture Construction, Older Design (Fixture B)
6.2.8 Sliders and Blocks (see Fig. 15), and
6.8.3 Frequency Meter.
6.3 Microwave Signal Source, capable of providing an
6.8.4 Crystal Detector, two required.
accurate signal. An accurate signal provides a leveled power
6.8.5 Matched Load Resistor, for one of the crystal detec-
output that falls within a 0.1 dB range during the required time
tors.
period and over the range of frequency needed to make a
6.8.6 Standing Wave Rectified (SWR) Meter, two required.
permittivity and loss measurement, and maintains output
6.8.7 Directional Coupler.
within 5 MHz of the set value for the time required to make a
6.8.8 Attenuator, rated at 10 dB.
measurement when the signal source is set for a particular
6.8.9 Semi-Rigid Coaxial Cable and Connectors.
frequency.
6.8.10 Adapter, for waveguide to coaxial interconnection.
6.4 Frequency Measuring Device, having a resolution 5
6.8.11 The assembly of this equipment is shown schemati-
MHz or less.
cally in Fig. 16.
6.5 Power Level Detecting Device, having a resolution of
6.9 Apparatus for Computer Acquisition of Data—The
0.1 dB or less and capable of comparing power levels within a
following alternative equipment or its equivalent, when prop-
3-dB range with an accuracy of 0.1 dB.
7 erly interconnected, may be used effectively with a computer-
6.6 Compression Force Gage, capable of measuring to
control program for automated testing:
5000 N (1100 lb) with an accuracy of 61 % of full scale.
6.7 Vise, or a press, for exerting a controlled force of 4448
N (1000 lb) on the test fixture and having an opening of at least
The Hewlett Packard (HP) X532B meter has been found to be satisfactory for
5 in. (130 mm) to accept the force gage and test fixture.
this purpose.
6.8 Apparatus for Manual Test Setup: 11
The Hewlett Packard 423B Neg. detector has been found to be satisfactory for
6.8.1 Sweep Frequency Generator.
this purpose.
The Hewlett Packard 11523A option .001 resistor has been found to be
6.8.2 X-Band Frequency Plug-In Unit.
satisfactory for this purpose.
The Hewlett Packard 415E meter has been found to be satisfactory for this
purpose.
7 14
A Dillon force gage, Compression Model X, part #381612301, has been found The Hewlett Packard 779D coupler has been found to be satisfactory for this
satisfactory for this purpose. purpose.
8 15
The Hewlett Packard (HP) 8350B or 8620C generator has been found The Hewlett Packard attenuator 8491B has been found to be satisfactory for
satisfactory for this purpose. this purpose.
9 16
The Hewlett Packard (HP) 83545A or 86251A plug-in unit has been found The Hewlett Packard adapter X281A has been found to be satisfactory for this
satisfactory for this purpose. purpose.
NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
D 3380
FIG. 7 Test Fixture Construction, Older Design (Fixture B)
FIG. 6 Test Fixture Construction, Older Design (Fixture B)
6.9.1 Sweep Frequency Generator, see also 6.8.1.
6.9.2 Radio Frequency (RF) Plug-In Unit, having a range
from 0.01 to 20 GHz.
NOTE 4—A plug-in of a narrower frequency range (in the X-band from
5.9 to 12.4 GHz) may be selected at significant cost savings.
6.9.3 Power Splitter.
FIG. 8 Generalized Resonator Pattern Card for Fixture A Showing
6.9.4 Automatic Frequency Counter.
Dimensions of and Made of Laminate Matching the Nominal
6.9.5 Source Synchronizer.
Permittivity of Materials to be Tested
6.9.6 Attenuator, 10 dB, see also 6.8.8.
24 25
6.9.7 Programmable Power Meter. 6.9.8 Power Sensor, having a range from −70 to +10 dBm.
6.9.9 Controlling Computer, with a General Purpose Inter-
face Bus (GPIB) interface.
6.9.10 IEEE 488 (GPIB) Cables, Adapters, and Coaxial
The Hewlett Packard generator 8350B has been found to be satisfactory for
Cables, suitable for proper interconnecting of all of the
this purpose.
components as illustrated in Fig. 17 and described in 6.9.11.
The Hewlett Packard plug-in #83592A has been found to be satisfactory for
this purpose.
6.9.11 Interconnecting Instructions (applicable to 6.9
The Hewlett Packard plug-in #83545A has been found to be satisfactory for
only):
this purpose.
6.9.11.1 Connect the power splitter directly to the RF
The Hewlett Packard power splitter #11667A has been found to be satisfactory
for this purpose.
plug-in output. Connect one output of the splitter to the counter
The Hewlett Packard frequency counter #5343A has been found to be
input using an RF cable. With another RF cable, connect the
satisfactory for this purpose.
22 other output to the attenuator. Connect the attenuator to one of
The Hewlett Packard synchronizer #5344A has been found to be satisfactory
the test fixture probe lines.
for this purpose.
The Hewlett Packard attenuator #8491B has been found to be satisfactory for
this purpose.
24 25
The Hewlett Packard power meter #436A has been found to be satisfactory for The Hewlett Packard power sensor #8484A has been found to be satisfactory
this purpose. for this purpose.
NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
D 3380
FIG. 9 Base Stripline Board with Copper Foil and Dielectric
Matching the Nominal Permittivity of the Material to be Tested
FIG. 12 Aluminum Base Plate for Clamping the Base Cards and
Connecting Launcher Bodies to the Base Card
FIG. 10 Base Cover Board with Copper Foil Ground Plane
FIG. 13 Aluminum Clamping Plate Provided
...
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