Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)

SIGNIFICANCE AND USE
4.1 A radiation-hardness assurance program requires a methodology for relating radiation induced changes in materials exposed to a variety of particle species over a wide range of energies, including those encountered in spacecraft and in terrestrial environments as well as those produced by particle accelerators and nuclear fission and fusion reactors.  
4.2 A major source of radiation damage in electronic and photonic devices and materials is the displacement of atoms from their normal lattice site. An appropriate exposure parameter for such damage is the damage energy calculated from NIEL by means of Eq 2. Other analogous measures, which may be used to characterize the irradiation history that is relevant to displacement damage, are damage energy per atom or per unit mass (displacement kerma, when the primary particles are neutral), and displacements per atom (dpa). See Terminology E170 for definitions of those quantities.  
4.3 Each of the quantities mentioned in the previous paragraph should convey similar information, but in a different format. In each case the value of the derived exposure parameter depends on approximate nuclear, atomic, and lattice models, an on measured or calculated cross sections. If consistent comparisons are to be made of irradiation effects caused by different particle species and energies, it is essential that these approximations be consistently applied.  
4.4 No correspondence should be assumed to exist between damage energy as calculated from NIEL and a particular change in a material property or device parameter. Instead, the damage energy should be used as a parameter which describes the exposure. It may be a useful correlation variate, even when different particle species and energies are included. NIEL should not be reported as a measure of damage, however, unless its correlation with a particular damage modality has been demonstrated in that material or device.  
4.5 NIEL is a construct that depends on a model of the part...
SCOPE
1.1 This practice describes a procedure for characterizing particle irradiations of materials in terms of non-ionizing energy loss (NIEL). NIEL is used in published literature to characterize both charged and neutral particle irradiations.  
1.2 Although the methods described in this practice apply to any particles and target materials for which displacement cross sections are known (see Practice E521), this practice is intended for use in irradiations in which observed damage effects may be correlated with atomic displacements. This is true of some, but not all, radiation effects in electronic and photonic materials.  
1.3 Procedures analogous to this one are used for calculation of displacements per atom (dpa) in charged particle irradiations (see Practice E521) or neutron irradiations (see Practice E693).  
1.4 Guidance on calculation of dpa from NIEL is provided.  
1.5 Procedures related to this one are used for calculation of 1-MeV equivalent neutron fluence in electronic materials (see Practice E722), but in that practice the concept of damage efficiency, based on correlation of observed damage effects, is included.  
1.6 Guidance on conversion of NIEL in silicon to monoenergetic neutron fluence in silicon (see Practice E722), and vice versa, is provided.  
1.7 The application of this standard requires knowledge of the particle fluence and energy distribution of particles whose interaction leads to displacement damage.  
1.8 The correlation of radiation effects data is beyond the scope of this standard. A comprehensive review (1)2 of displacement damage effects in silicon and their correlation with NIEL provides appropriate guidance that is applicable to semiconductor materials and electronic devices.

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Publication Date
31-Jan-2017
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: E3084 − 17
Standard Practice for
Characterizing Particle Irradiations of Materials in Terms of
1
Non-Ionizing Energy Loss (NIEL)
This standard is issued under the fixed designation E3084; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 1.9 This international standard was developed in accor-
dance with internationally recognized principles on standard-
1.1 This practice describes a procedure for characterizing
ization established in the Decision on Principles for the
particle irradiations of materials in terms of non-ionizing
Development of International Standards, Guides and Recom-
energy loss (NIEL). NIEL is used in published literature to
mendations issued by the World Trade Organization Technical
characterize both charged and neutral particle irradiations.
Barriers to Trade (TBT) Committee.
1.2 Althoughthemethodsdescribedinthispracticeapplyto
any particles and target materials for which displacement cross
2. Referenced Documents
sections are known (see Practice E521), this practice is
3
2.1 ASTM Standards
intended for use in irradiations in which observed damage
E170 Terminology Relating to Radiation Measurements and
effects may be correlated with atomic displacements. This is
Dosimetry
true of some, but not all, radiation effects in electronic and
E521 Practice for Investigating the Effects of Neutron Ra-
photonic materials.
diation Damage Using Charged-Particle Irradiation
1.3 Procedures analogous to this one are used for calcula-
E693 Practice for Characterizing Neutron Exposures in Iron
tion of displacements per atom (dpa) in charged particle
and Low Alloy Steels in Terms of Displacements Per
irradiations (see Practice E521) or neutron irradiations (see
Atom (DPA)
Practice E693).
E722 PracticeforCharacterizingNeutronFluenceSpectrain
Terms of an Equivalent Monoenergetic Neutron Fluence
1.4 Guidance on calculation of dpa from NIEL is provided.
for Radiation-Hardness Testing of Electronics
1.5 Procedures related to this one are used for calculation of
1-MeV equivalent neutron fluence in electronic materials (see
3. Terminology
Practice E722), but in that practice the concept of damage
3.1 Definitions of some terms used in this practice can be
efficiency, based on correlation of observed damage effects, is
found in Terminology E170.
included.
3.2 Definitions:
1.6 Guidance on conversion of NIEL in silicon to monoen-
3.2.1 tracked particles—those particles whose position-
ergetic neutron fluence in silicon (see Practice E722), and vice
dependent fluence spectra are calculated in a particle transport
versa, is provided.
calculation for a specific target geometry.
1.7 The application of this standard requires knowledge of
3.2.1.1 Discussion—In calculating displacement damage
the particle fluence and energy distribution of particles whose
energy and NIEL, the tracked particles should include
interaction leads to displacement damage.
neutrons, photons, protons and ions up to Z=2, unless their
contributions are known to be negligible. Heavier ions may
1.8 The correlation of radiation effects data is beyond the
2
also be tracked in some Monte Carlo codes. Except in the case
scope of this standard. A comprehensive review (1) of
of neutrons, particles below a specified minimum energy are
displacement damage effects in silicon and their correlation
not tracked, and are treated as non-tracked particles.
with NIEL provides appropriate guidance that is applicable to
semiconductor materials and electronic devices.
3.2.2 tracked-particle fluence spectrum, Φ (E)—the fluence
p
spectrumofparticles,ofspeciespandatparticleenergy E,that
are tracked in a particle transport calculation. For each species
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
Technology and Applications and is the direct responsibility of Subcommittee
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices.
3
Current edition approved Feb. 1, 2017. Published March 2017. DOI: 10.1520/ For referenced ASTM standards, visit the ASTM website, www.astm.org, or
D3084-17. contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
2
The boldface numbers in parentheses refer to a list of references at the end of Standards volume information, refer to the standard’s Document Summary page on
this standard. the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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E3084 − 17
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of tracked particle other than neutrons there is a specified (cm ) in sili
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