ASTM D2149-97(2004)

Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Ceramic Dielectrics At Frequencies To 10 MHz And Temperatures To 500&#176C (Withdrawn 2013)

SIGNIFICANCE AND USE
Permittivity and dissipation factor are sensitive to changes in chemical composition, impurities, and homogeneity. Measurement of these properties is, therefore, useful for quality control and for determining the effect of environments such as moisture, heat, or radiation.
SCOPE
1.1 This test method covers the determination of the relative permittivity (dielectric constant) and dissipation factor of solid ceramic dielectrics from 50 Hz to 10 MHz over a range of temperatures from -80 to 500°C. Two procedures are included as follows:  
1.1.1 Procedure A—Using Micrometer Electrode.  
1.1.2 Procedure B—Using Precision Capacitor.  
Note 1—In common usage the word "relative" is frequently dropped.
1.2 This standard does not purport to address the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
WITHDRAWN RATIONALE
This test method covers the determination of the relative permittivity (dielectric constant) and dissipation factor of solid dielectrics from 50 Hz to 10 MHz over a range of temperatures from���−80 to 500°C.
Formerly under the jurisdiction of Committee D09 on Electrical and Electronic Insulating Materials, this practice was withdrawn in January 2013 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.

General Information

• Status: Historical
• Publication Date: 29-Feb-2004
• Withdrawal Date: 31-Dec-2012
• ICS: 29.035.30 - Glass and ceramic insulating materials
• Technical Committee: D09 - Electrical and Electronic Insulating Materials
• Drafting Committee: D09.12 - Electrical Tests

Relations

• Replaces: ASTM D2149-97 - Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Ceramic Dielectrics At Frequencies To 10 MHz And Temperatures To 500&#176C
• Effective Date: 01-Mar-2004
• Referred By: ASTM D116-86(2020) - Standard Test Methods for Vitrified Ceramic Materials for Electrical Applications
• Effective Date: 01-Mar-2004
• Referred By: ASTM D1039-16(2022) - Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
• Effective Date: 01-Mar-2004
• Referred By: ASTM D2442-75(2020) - Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
• Effective Date: 01-Mar-2004

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: D2149 − 97(Reapproved 2004) An American National Standard
Standard Test Method for
Permittivity (Dielectric Constant) And Dissipation Factor Of
Solid Dielectrics At Frequencies To 10 MHz And
Temperatures To 500°C
This standard is issued under the fixed designation D2149; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 3. Terminology
1.1 Thistestmethodcoversthedeterminationoftherelative 3.1 Definitions:
permittivity (dielectric constant) and dissipation factor of solid 3.1.1 Permittivity and dissipation factor are fully defined in
dielectricsfrom50Hzto10MHzoverarangeoftemperatures Terminology D1711. Briefly, the permittivity of an insulating
2,3
from−80to500°C. Twoproceduresareincludedasfollows: materialistheratioofthecapacitancebetweentwoconductors
1.1.1 Procedure A—Using Micrometer Electrode. when embedded in the material to the capacitance between the
1.1.2 Procedure B—Using Precision Capacitor. same configuration of conductors in a vacuum (or air). The
dissipation factor is the ratio of the resistive to capacitive
NOTE 1—In common usage the word “relative” is frequently dropped.
currents in the dielectric. The product of the permittivity and
1.2 This standard does not purport to address the safety
dissipation factor is the loss index.
concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and
4. Significance and Use
health practices and determine the applicability of regulatory
4.1 Permittivity and dissipation factor are sensitive to
limitations prior to use.
changes in chemical composition, impurities, and homogene-
ity. Measurement of these properties is, therefore, useful for
2. Referenced Documents
quality control and for determining the effect of environments
2.1 ASTM Standards:
such as moisture, heat, or radiation.
D150Test Methods forAC Loss Characteristics and Permit-
tivity (Dielectric Constant) of Solid Electrical Insulation
5. Apparatus
D1711Terminology Relating to Electrical Insulation
5.1 Measuring Circuits—Suitable measuring circuits are
E197Specification for Enclosures and Servicing Units for
described in Test Methods D150. For measurements from 50
Tests Above and Below Room Temperature (Withdrawn
5 Hz to 100 kHz a substitution method using a low-voltage
1981)
capacitance bridge is recommended. For measurements at 1
MHz and above, a resonant-circuit susceptance variation
methodisrecommended.The Qofthecircuitshouldbeatleast
This test method is under the jurisdiction of ASTM Committee D09 on
200exceptforverylowlossmaterials,forwhicha Qof500or
Electrical and Electronic Insulating Materials and is the direct responsibility of
higher is desirable.
Subcommittee D09.12 on Electrical Tests.
Current edition approved March 1, 2004. Published March 2004. Originally
5.2 Test Enclosure—Unless testing only at room
approved in 1963. Last previous edition approved in 1997 as D2149–97. DOI:
temperature, it is necessary to adapt a Hartshorn-Ward type
10.1520/D2149-97R04.
2 specimen holder to a temperature-controlled test enclosure.
R. Bartnikas, Chapter 2, “Alternating-Current Loss and Permittivity
Measurements,” Engineering Dielectrics, Vol IIB, Electrical Properties of Solid
Whereapplicable,usetherequirementsforagradeAenclosure
Insulating Materials, Measurement Techniques, R. Bartnikas, Editor, ASTM STP
as in Specification E197.Asuggested arrangement is shown in
926, ASTM, Philadelphia, 1987.
Fig. 1. This arrangement provides terminal connections away
R. Bartnikas, Chapter 1, “Dielectric Loss in Solids,” Engineering Dielectrics,
from the temperature zone.
Vol IIA, Electrical Properties of Solid Insulating Materials: Molecular Structure and
Electrical Behavior, R. Bartnikas and R. M. Eichorn, Editors, ASTM STP 783,
5.3 Specimen Holder—The suggested arrangement shown
ASTM Philadelphia, 1983.
in Fig. 1 incorporates the following requirements:
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
5.3.1 The selection of the metals is of utmost importance.
Standards volume information, refer to the standard’s Document Summary page on
The metal should have good thermal and electrical conductiv-
the ASTM website.
ityandyetbeoxidationresistantandhavesufficientstrengthto
The last approved version of this historical standard is referenced on
www.astm.org. maintain its mechanical dimensions after repeated heating.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
D2149 − 97 (2004)
FIG. 1 Suggested Specimen Holder
AISI Stainless No. 316 fulfills these requirements except for thickness should be determined before applying electrodes.)
the thermal conductivity. The time required for a specimen to Silver paint, tin or tin-lead foil, or evaporated metal electrodes
reach equilibrium in a holder made from this material is quite have ranges of usefulness. Evaporated metal electrodes are the
long. Precious metal alloys such as type B silver-magnesium- most suitable. When the specimen is porous sprayed-on metal
nickel have better overall properties but require special heat electrodes may be useful. Additional information on the
treating. suitability of various electrode systems may be found in Test
5.3.2 The insulators may be aluminum oxide, beryllium Methods D150.
oxide, or polytetrafluoroethylene.
7. Sampling
5.3.3 Use electrodes 50 mm in diameter and at least 5 mm
thick, with sharp corners. Maintain electrode parallellism to
7.1 See ASTM standards for specific materials.
within 0.01 mm.
5.3.4 Select a length and cross-section for the lower tube so 8. Test Specimen
that the temperature of each insulator does not exceed 100°C
8.1 Use a disk test specimen with a diameter of 40.00 6
whentheovenisat500°C.Selectalengthandcross-sectionfor
0.01 mm and a thickness of 2 to 3 mm. Finish the surfaces to
the upper tube so that the drive nut can be touched with the
1.8 µm or better and maintain parallel surfaces to within 0.01
operator’s fingers (keep the drive nut less than 60°C) when the
mm. The samples should be free of bubbles and other defects.
oven is at 500°C.
5.3.5 Use a micrometer or dial gage with a precision of
9. Standard Test Frequencies
0.005 mm to determine electrode separation and to monitor
9.1 Unless otherwise specified, make measurements at one
specimen expansion.
or more of the following frequencies:
60 Hz 100 000 Hz
6. Electrodes
100 Hz 1 MHz
6.1 Prior to measurement, apply conducting film or foil 400 Hz 10 MHz
1000 Hz
electrodestobothflatsurfacesofthespecimen.(Thespecimen
D2149 − 97 (2004)
Common test frequencies are 60 Hz, 1000 Hz, and 1 MHz. 14. Calculation
14.1 Procedure A—Calculate the capacitance, C , and dis-
s
10. Temperature Control
sipation factor, D , of the specimen as follows:
s
10.1 Take measurements at frequent temperature intervals
C 5 C 2 C 1C (1)
s o t v
(not to excee
...