ASTM D2149-97

Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Ceramic Dielectrics At Frequencies To 10 MHz And Temperatures To 500&#176C

SCOPE
1.1 This test method covers the determination of the relative permittivity (dielectric constant) and dissipation factor of solid ceramic dielectrics from 50 Hz to 10 MHz over a range of temperatures from -80 to 500°C. Two procedures are included as follows:  
1.1.1 Procedure A -Using Micrometer Electrode.  
1.1.2 Procedure B -Using Precision Capacitor.  
Note 1-In common usage the word "relative" is frequently dropped.
1.2 This standard does not purport to address the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 09-Sep-1997
• ICS: 29.035.30 - Glass and ceramic insulating materials
• Technical Committee: D09 - Electrical and Electronic Insulating Materials
• Drafting Committee: D09.12 - Electrical Tests

Relations

• Replaced By: ASTM D2149-97(2004) - Standard Test Method for Permittivity (Dielectric Constant) And Dissipation Factor Of Solid Ceramic Dielectrics At Frequencies To 10 MHz And Temperatures To 500&#176C (Withdrawn 2013)
• Effective Date: 01-Mar-2004
• Referred By: ASTM D1039-16(2022) - Standard Test Methods for Glass-Bonded Mica Used as Electrical Insulation
• Effective Date: 10-Sep-1997
• Referred By: ASTM D2442-75(2020) - Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
• Effective Date: 10-Sep-1997
• Referred By: ASTM D116-86(2020) - Standard Test Methods for Vitrified Ceramic Materials for Electrical Applications
• Effective Date: 10-Sep-1997

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
An American National Standard
Designation: D 2149 – 97
Standard Test Method for
Permittivity (Dielectric Constant) And Dissipation Factor Of
Solid Dielectrics At Frequencies To 10 MHz And
Temperatures To 500°C
This standard is issued under the fixed designation D 2149; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope material is the ratio of the capacitance between two conductors
when embedded in the material to the capacitance between the
1.1 This test method covers the determination of the relative
same configuration of conductors in a vacuum (or air). The
permittivity (dielectric constant) and dissipation factor of solid
dissipation factor is the ratio of the resistive to capacitive
dielectrics from 50 Hz to 10 MHz over a range of temperatures
2,3
currents in the dielectric. The product of the permittivity and
from −80 to 500°C. Two procedures are included as follows:
dissipation factor is the loss index.
1.1.1 Procedure A—Using Micrometer Electrode.
1.1.2 Procedure B—Using Precision Capacitor.
4. Significance and Use
NOTE 1—In common usage the word “relative” is frequently dropped.
4.1 Permittivity and dissipation factor are sensitive to
1.2 This standard does not purport to address the safety changes in chemical composition, impurities, and homogene-
ity. Measurement of these properties is, therefore, useful for
concerns, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and quality control and for determining the effect of environments
such as moisture, heat, or radiation.
health practices and determine the applicability of regulatory
limitations prior to use.
5. Apparatus
2. Referenced Documents
5.1 Measuring Circuits—Suitable measuring circuits are
2.1 ASTM Standards: described in Test Methods D 150. For measurements from 50
Hz to 100 kHz a substitution method using a low-voltage
D 150 Test Methods for AC Loss Characteristics and Per-
capacitance bridge is recommended. For measurements at 1
mittivity (Dielectric Constant) of Solid Electrical Insulat-
ing Materials MHz and above, a resonant-circuit susceptance variation
method is recommended. The Q of the circuit should be at least
D 1711 Terminology Relating to Electrical Insulation
E 197 Specification for Enclosures and Servicing Units for 200 except for very low loss materials, for which a Q of 500 or
higher is desirable.
Tests Above and Below Room Temperature
5.2 Test Enclosure—Unless testing only at room tempera-
3. Terminology
ture, it is necessary to adapt a Hartshorn-Ward type specimen
3.1 Definitions: holder to a temperature-controlled test enclosure. Where ap-
3.1.1 Permittivity and dissipation factor are fully defined in plicable, use the requirements for a grade A enclosure as in
Terminology D 1711. Briefly, the permittivity of an insulating Specification E 197. A suggested arrangement is shown in Fig.
1. This arrangement provides terminal connections away from
the temperature zone.
This test method is under the jurisdiction of ASTM Committee D-9 on
5.3 Specimen Holder—The suggested arrangement shown
Electrical and Electronic Insulating Materials and is the direct responsibility of
in Fig. 1 incorporates the following requirements:
Subcommittee D09.12 on Electrical Tests.
5.3.1 The selection of the metals is of utmost importance.
Current edition approved Sept. 10, 1997. Published November 1997. Originally
published as D 2149 – 63 T. Last previous edition D 2149 – 96.
The metal should have good thermal and electrical conductiv-
R. Bartnikas, Chapter 2, “Alternating-Current Loss and Permittivity Measure-
ity and yet be oxidation resistant and have sufficient strength to
ments,” Engineering Dielectrics, Vol IIB, Electrical Properties of Solid Insulating
maintain its mechanical dimensions after repeated heating.
Materials, Measurement Techniques, R. Bartnikas, Editor, ASTM STP 926, ASTM,
Philadelphia, 1987. AISI Stainless No. 316 fulfills these requirements except for
R. Bartnikas, Chapter 1, “Dielectric Loss in Solids,” Engineering Dielectrics,
the thermal conductivity. The time required for a specimen to
Vol IIA, Electrical Properties of Solid Insulating Materials: Molecular Structure and
reach equilibrium in a holder made from this material is quite
Electrical Behavior, R. Bartnikas and R. M. Eichorn, Editors, ASTM STP 783,
ASTM Philadelphia, 1983.
Annual Book of ASTM Standards, Vol 10.01.
Discontinued, see 1980 Annual Book of ASTM Standards, Part 41.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
D 2149
FIG. 1 Suggested Specimen Holder
long. Precious metal alloys such as type B silver-magnesium- electrodes may be useful. Additional information on the
nickel have better overall properties but require special heat suitability of various electrode systems may be found in Test
treating. Methods D 150.
5.3.2 The insulators may be aluminum oxide, beryllium
7. Sampling
oxide, or polytetrafluoroethylene.
5.3.3 Use electrodes 50 mm in diameter and at least 5 mm 7.1 See ASTM standards for specific materials.
thick, with sharp corners. Maintain electrode parallellism to
8. Test Specimen
within 0.01 mm.
5.3.4 Select a length and cross-section for the lower tube so
8.1 Use a disk test specimen with a diameter of 40.006 0.01
that the temperature of each insulator does not exceed 100°C
mm and a thickness of 2 to 3 mm. Finish the surfaces to 1.8 μm
when the oven is at 500°C. Select a length and crosssection for
or better and maintain parallel surfaces to within 0.01 mm. The
the upper tube so that the drive nut can be touched with the
samples should be free of bubbles and other defects.
operator’s fingers (keep the drive nut less than 60°C) when the
oven is at 500°C. 9. Standard Test Frequencies
5.3.5 Use a micrometer or dial gage with a precision of
9.1 Unless otherwise specified, make measurements at one
0.005 mm to determine electrode separation and to monitor
or more of the following frequencies:
specimen expansion.
60 Hz 100 000 Hz
100 Hz 1 MHz
6. Electrodes
400 Hz 10 MHz
1000 Hz
6.1 Prior to measurement, apply conducting film or foil
Common test frequencies are 60 Hz, 1000 Hz, and 1 MHz.
electrodes to both flat surfaces of the specimen. (The specimen
thickness should be determined before applying electrodes.)
10. Temperature Control
Silver paint, tin or tin-lead foil, or evaporated metal electrodes
have ranges of usefulness. Evaporated metal electrodes are the 10.1 Take measurements at frequent temperature intervals
most suitable. When the specimen is porous sprayed-on metal (not to exceed 20°C), until the required temperature range has
D 2149
been traversed. Reduce the temperature to the lowest required D 5 C /C ~D 2 D ! (3)
s t s i v
test temperature and leave until equilibrium has been achieved.
where:
Determine equilibrium by clamping a specimen betwee
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