Standard Practice for Single- and Multi-Level Continuous Sampling of a Stream of Product by Attributes Indexed by AQL

ABSTRACT
This practice establishes tables and procedures for applying five different types of continuous sampling plans for inspection by attributes using MIL-STD-1235B as a basis for sampling a steady stream of lots indexed by AQL. This practice represents a conversion of MIL-STD1235B to an ASTM-supported standard.
SIGNIFICANCE AND USE
4.1 The reason for preserving military sampling standards is that many organizations throughout the world still use these standards in their current form. MIL-STD-1235B is no longer supported by the U.S. Department of Defense as of the mid-1990s and is out of print, but does exist in the public domain. This practice represents a conversion of MIL-STD-1235B to an ASTM-supported standard.  
4.2 This practice provides the tables and procedures for applying five different types of continuous sampling plans for inspection by attributes. These continuous sampling plans are discussed in Sections 6 – 10 of this practice and each section includes information on:
(1) Initiation of 100 % inspection in use.
(2) Requirements on when to switch to sampling inspection.
(3) Conditions warranting a return to 100 % inspection.
(4) When a change in Code Letter, if desired, can be made.
(5) What to do when the checking inspector finds a defect that was originally found conforming by the screening inspector(s), that is, ineffective screening.
(6) Situations where a defect is found before the switch to 100 % inspection causing excessive periods of 100 % inspection so action must be taken, that is, long periods of screening.  
4.2.1 Section 6 (Section 2 in MIL-STD-1235B) describes specific procedures and applications of the CSP-1 sampling plans – a single-level continuous sampling procedure which provides for alternating between sequences of 100 % inspection and sampling inspection.  
4.2.2 Section 7 (Section 3 in MIL-STD-1235B) describes specific procedures and applications of the CSP-F sampling plans – a variation of the CSP-1 plans in that CSP-F plans are applied to a relatively short run of product, thereby permitting smaller clearance numbers to be used.  
4.2.3 Section 8 (Section 4 in MIL-STD-1235B) describes specific procedures and applications of the CSP-2 sampling plans – a modification of CSP-1 in that 100 % inspection resumes only after a prescribed number of def...
SCOPE
1.1 This practice establishes tables and procedures for applying five different types of continuous sampling plans for inspection by attributes using MIL-STD-1235B as a basis for sampling a steady stream of lots indexed by AQL.  
1.2 This practice provides the sampling plans of MIL-STD-1235B in ASTM format for use by ASTM committees and others. It recognizes the continuing usage of MIL-STD-1235B in industries supported by ASTM. Most of the original text in MIL-STD-1235B is preserved in Sections 6 – 10 of this practice.  
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.  
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E2819 − 11 (Reapproved 2021) AnAmerican National Standard
Standard Practice for
Single- and Multi-Level Continuous Sampling of a Stream of
Product by Attributes Indexed by AQL
This standard is issued under the fixed designation E2819; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 2.2 Military Standards:
MIL-STD-1235A1 Functional Curves of the Continuous
1.1 This practice establishes tables and procedures for
Sampling Plans
applying five different types of continuous sampling plans for
MIL-STD-1235B Single- and Multi-Level Continuous Sam-
inspection by attributes using MIL-STD-1235B as a basis for
pling for Attributes
sampling a steady stream of lots indexed by AQL.
3. Terminology
1.2 This practice provides the sampling plans of MIL-STD-
3.1 Definitions:
1235B in ASTM format for use by ASTM committees and
3.1.1 For a more extensive list of terms in Committee E11
others. It recognizes the continuing usage of MIL-STD-1235B
standards, see Terminology E456.
in industries supported by ASTM. Most of the original text in
3.1.2 acceptance quality limit (AQL), n—qualitylimitthatis
MIL-STD-1235B is preserved in Sections 6–10 of this
the worst tolerable process average when a continuing series of
practice.
lots is submitted for acceptance sampling. E2234
1.3 This standard does not purport to address all of the
3.1.3 average outgoing quality (AOQ), n—the average per-
safety concerns, if any, associated with its use. It is the
cent defective of outgoing product including all accepted lots
responsibility of the user of this standard to establish appro-
or batches after any defectives found in them are replaced by
priate safety, health, and environmental practices and deter-
acceptable units, plus all lots or batches which are not accepted
mine the applicability of regulatory limitations prior to use.
after such lots or batches have been effectively 100 % in-
1.4 This international standard was developed in accor-
spected and all defective units replaced by acceptable units.
dance with internationally recognized principles on standard-
E1994
ization established in the Decision on Principles for the
3.1.4 average outgoing quality limit (AOQL), n—the maxi-
Development of International Standards, Guides and Recom-
mum AOQ for a given acceptance sampling plan for all
mendations issued by the World Trade Organization Technical
possible incoming percentages defective for the process.
Barriers to Trade (TBT) Committee.
E1994
3.1.5 continuous sampling inspection, n—a method of sam-
2. Referenced Documents
pling a stream of product in order of production where the
2.1 ASTM Standards:
sampling frequency is adjusted based on ongoing inspection
E456 Terminology Relating to Quality and Statistics
results.
E1994 Practice for Use of Process Oriented AOQL and
3.1.5.1 Discussion—Only those units of product found by
LTPD Sampling Plans
the inspector or screening crew to be nonconforming are
E2234 Practice for Sampling a Stream of Product by Attri-
rejected. The rest of production, uninspected units as well as
butes Indexed by AQL
units found to be conforming, is allowed to continue down the
production line as conforming material.
3.1.6 critical defect, n—a defect that judgment and experi-
This practice is under the jurisdiction ofASTM Committee E11 on Quality and
ence indicate would result in hazardous or unsafe conditions
Statistics and is the direct responsibility of Subcommittee E11.30 on Statistical
for individuals using, maintaining, or depending upon the
Quality Control.
product, or a defect that judgment and experience indicate is
Current edition approved June 1, 2021. Published June 2021. Originally
likely to prevent performance of the function of a major end
approved in 2011. Last previous edition approved in 2015 as E2819 – 11 (2015).
DOI: 10.1520/E2819-11R21.
item. E2234
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on Available from DLA Document Services, Building 4/D, 700 Robbins Ave.,
the ASTM website. Philadelphia, PA 19111-5094, http://quicksearch.dla.mil.
Copyright ©ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA19428-2959. United States
E2819 − 11 (2021)
3.1.7 critical defective, n—a unit of product which contains collectively and each unit of product inspected is inspected for
one or more critical defects and may also contain major and each of the defects in the class.
minor, or both, defects. E2234
3.2.6 inspection by individual defect, n—inspection where
3.1.8 defect, n—any nonconformance of the unit of product one sampling plan is associated with inspection for a single
with specified requirements. E2234
defect, or where a sampling plan is applied to each of several
defects independently.
3.1.9 inspection, n—the process of measuring, examining,
testing, or otherwise comparing the unit of product with the
3.2.7 moving product, n—inspection where product is flow-
requirements. E2234
ing past the inspection station.
3.2.7.1 Discussion—In the typical case the product moves
3.1.10 inspection by attributes, n—inspection whereby ei-
on a conveyor belt or line; however, it may be moved in tote
ther the unit of product is classified simply as defective or
boxes, buggies or other conveyances which are operated
non-defective, or the number of defects in the unit of product
manually or by mobile materials-handling equipment.
is counted, with respect to a given requirement or set of
requirements. E2234
3.2.8 multi-level, n—plan consisting of periods of 100 %
3.1.11 major defect, n—a defect, other than critical, that is inspection and of sampling inspection at various rates which
reflect past inspection results.
likely to result in failure, or to reduce materially the usability
of the unit of product for its intended purpose. E2234
3.2.9 one hundred percent (100 %) inspection, n—the in-
3.1.12 major defective, n—a unit of product which contains spection of every unit of product for the defects concerned
one or more major defects, and may also contain minor defects listed for an inspection station.
but contains no critical defect. E2234 3.2.9.1 Discussion—The two terms, screening and 100 %
inspection, are used interchangeably in this practice.
3.1.13 minor defect, n—a defect that is not likely to reduce
materially the usability of the unit of product for its intended
3.2.10 production interval, n—a finite period of production,
purpose, or is a departure from established standards having
N items in length.
little bearing on the effective use or operation of the unit.
3.2.10.1 Discussion—The production interval is normally a
E2234
shift;itcanbeadayifitisreasonablycertainthatshiftchanges
do not affect quality of product, but shall not be longer than a
3.1.14 minor defective, n—a unit of product which contains
day.
one or more minor defects but contains no critical or major
defect. E2234
3.2.11 production interval length, n—N, specified number
of units to which CSP-F is to be applied.
3.1.15 process average (in inspection), n—the average per-
cent defective or average number of defects per hundred units
3.2.12 sampling frequency, n—f, desired ratio between the
(whichever is applicable) of product submitted by the supplier
number of units of product randomly selected and inspected at
for original inspection. E2234
an inspection station and the number of unit passing the
3.1.16 unit of product, n—thatwhichisinspectedinorderto inspection station during periods of sampling inspection.
determine its classification as defective or non-defective or to 3.2.12.1 Discussion—In this practice, each f is expressed as
count the number of defects. It may be a single article, a pair,
a fraction of the form, 1/7, 1/25, 1/50, etc. The procedure used
a set, a length, an area, an operation, a volume, a component of in selecting the sample units should give each unit of product
an end product, or the end product itself. E2234 presented during periods of sampling inspection an equal
3.1.16.1 Discussion—The unit of product may or may not chance of being selected and inspected. Also referred to as
be the same as the unit of purchase, supply, production, or “frequency of sampling”.
shipment.
3.2.13 sampling inspection, n—inspection for the defects
3.2 Definitions of Terms Specific to This Standard: concerned where the units selected for inspection are selected
by sampling.
3.2.1 checking inspection, n—sampling inspection per-
formed by the supplier on units of product which have already
3.2.14 screening, n—100 % inspection where all defective
been100 %inspectedinordertodeterminetheeffectivenessof
units are removed from the production flow.
the screening crew.
3.2.14.1 Discussion—The two terms, screening and 100 %
3.2.1.1 Discussion—This inspection is performed at the
inspection, are used interchangeably in this practice.
sampling rate f or more often.
3.2.15 single-level, n—planconsistingofalternatingperiods
3.2.2 clearance number, n—i, the number of consecutive
of 100 % inspection and sampling inspection wherein the
conforming, that is, defect-free, units in 100 % inspection
sampling rate is constant.
required prior to qualifying for inspection on a sampling basis.
3.2.3 conforming unit, n—a unit that meets the acceptance
4. Significance and Use
criteria established for the characteristic being considered.
4.1 Thereasonforpreservingmilitarysamplingstandardsis
3.2.4 defects concerned, n—defects being inspected for
that many organizations throughout the world still use these
while using the sampling plan.
standards in their current form. MIL-STD-1235B is no longer
3.2.5 inspection by defect class, n—whenonesamplingplan supported by the U.S. Department of Defense as of the
is associated with inspection for several kinds of defects mid-1990s and is out of print, but does exist in the public
E2819 − 11 (2021)
domain. This practice represents a conversion of MIL-STD- producing, or is capable of producing, material whose quality
1235B to an ASTM-supported standard. is stable, and (5) the inspection is non-destructive. The sam-
pling plans designated herein are applicable, but not limited, to
4.2 This practice provides the tables and procedures for
inspection of various entities, viz., end items, components, raw
applying five different types of continuous sampling plans for
materials, data or records, and any other entities, provided that
inspection by attributes. These continuous sampling plans are
the foregoing conditions are satisfied.
discussed in Sections6–10 of this practice and each section
includes information on:
5.3 Classification of Defects:
(1) Initiation of 100 % inspection in use.
5.3.1 Method of Classifying Defects—A classification of
(2) Requirements on when to switch to sampling inspec-
defects is the enumeration of possible defects of the unit of
tion.
product classified according to their seriousness. Defects will
(3) Conditions warranting a return to 100 % inspection.
normally be grouped into one or more of the following classes;
(4) When a change in Code Letter, if desired, can be made.
however, defects may be grouped into other classes, or into
(5) What to do when the checking inspector finds a defect
subclasses within these classes.
that was originally found conforming by the screening
5.3.1.1 Critical Defect—A critical defect is a defect that
inspector(s), that is, ineffective screening.
judgment and experience indicate is likely to result in hazard-
(6) Situations where a defect is found before the switch to
ous or unsafe conditions for individuals using, maintaining, or
100 % inspection causing excessive periods of 100 % inspec-
depending upon the product; or a defect that judgment and
tion so action must be taken, that is, long periods of screening.
experience indicate is likely to prevent performance of the
4.2.1 Section 6 (Section 2 in MIL-STD-1235B) describes
tactical function of a major end item such as a ship, aircraft,
specific procedures and applications of the CSP-1 sampling
tank,missile,orspacevehicle.Notethatforaspecialprovision
plans – a single-level continuous sampling procedure which
relating to critical defects, see 5.8.2.
provides for alternating between sequences of 100 % inspec-
5.3.1.2 Major Defect—Amajor defect is a defect other than
tion and sampling inspection.
critical that is likely to result in failure or materially reduce the
4.2.2 Section 7 (Section 3 in MIL-STD-1235B) describes
usability of the unit of product for its intended purpose.
specific procedures and applications of the CSP-F sampling
5.3.1.3 Minor Defect—Aminor defect is a defect that is not
plans – a variation of the CSP-1 plans in that CSP-F plans are
likely to reduce materially the usability of the unit of product
applied to a relatively short run of product, thereby permitting
for its intended purpose, or is a departure from established
smaller clearance numbers to be used.
standards having little bearing on the effective use or operation
4.2.3 Section 8 (Section 4 in MIL-STD-1235B) describes
of the unit.
specific procedures and applications of the CSP-2 sampling
5.3.2 Method of Classifying Defectives—A defective is a
plans – a modification of CSP-1 in that 100 % inspection
unit of product which contains one or more defects. Defectives
resumes only after a prescribed number of defect-free units
will usually be classified as follows:
separate any two defective sample units.
5.3.2.1 Critical Defective—Acritical defective contains one
4.2.4 Section 9 (Section 5 in MIL-STD-1235B) describes
or more critical defects and may also contain major and minor,
specific procedures and applications of the CSP-T sampling
or both, defects. Note that for a special provision relating to
plans – a multi-level continuous sampling procedure which
critical defectives, see 5.7.2.
provides for reducing the sampling frequency upon demonstra-
5.3.2.2 Major Defective—Amajor defective contains one or
tion of superior product quality.
more major defects, and may also contain minor defects, but
4.2.5 Section 10 (Section 6 in MIL-STD-1235B) describes
contains no critical defects.
specific procedures and applications of the CSP-V sampling
5.3.2.3 Minor Defective—Aminor defective contains one of
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