EN ISO 3497:2000
(Main)Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods (ISO 3497:2000)
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods (ISO 3497:2000)
Migrated from Progress Sheet (TC Comment) (2000-07-10): Under revision in ISO - PQ postponed. ++ this document must be processed in // with ISO 3497:1986 rev 5.1 . Resolution of ++ TC to be receivedwithin the month(glg-97-03-21) ++ N 201: New TD (980917)
Metallische Schichten - Schichtdickenmessung - Röntgenfluoreszenz-Verfahren (ISO 3497:2000)
1.1 Diese internationale Norm legt Verfahren zur Messung der Dicke metallischer Schichten nach dem Röntgenfluoreszenz-Verfahren fest. 1.2 Die Meßverfahren, für die diese internationale Norm gilt, sind grundlegende Verfahren, bei denen die flächenbezogene Masse bestimmt wird. Bei bekannter Dichte des Schichtwerkstoffs können die Meßergebnisse auch als längenbezogene Schichtdicke angegeben werden. 1.3 Die Meßverfahren erlauben die gleichzeitige Messung von Schichtsystemen mit bis zu drei Schichten, oder die gleichzeitige Messung der Dicke und Zusammensetzung von Schichten mit bis zu drei Bestandteilen.
Revêtements métalliques - Mesurage de l'épaisseur du revêtement - Méthodes par spectrométrie de rayons X (ISO 3497:2000)
AVERTISSEMENT : La présente Norme internationale ne traite pas des problèmes de protection du personnel contre les rayons X. Pour tout renseignement sur cet aspect essentiel, il convient de se référer aux Normes internationales et normes nationales, ainsi qu'aux codes locaux, s'il en existe. La présente Norme internationale spécifie des méthodes de mesurage, par spectrométrie de rayons X, de l'épaisseur des revêtements métalliques. Les méthodes de mesurage de la présente Norme internationale sont applicables, avant tout, à la détermination de la masse de revêtement par unité de surface. Connaissant la masse volumique du matériau de revêtement, il est possible, également, d'exprimer les résultats mesurés en épaisseur linéaire de revêtement. Les méthodes de mesurage permettent de mesurer simultanément les systèmes de revêtement ayant jusqu'à trois couches, ou de mesurer simultanément l'épaisseur et les compositions des couches ayant jusqu'à trois composants. Les plages pratiques de mesurage des matériaux de revêtement indiqués sont largement fonction de la puissance de la fluorescence X caractéristique à analyser et de l'incertitude de mesure tolérée, et peuvent différer selon l'appareillage et le mode opératoire utilisés.
Kovinske prevleke - Merjenje debeline prevleke - Rentgenska spektrometrijska metoda (ISO 3497:2000)
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-marec-2002
Kovinske prevleke - Merjenje debeline prevleke - Rentgenska spektrometrijska
metoda (ISO 3497:2000)
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods
(ISO 3497:2000)
Metallische Schichten - Schichtdickenmessung - Röntgenfluoreszenz-Verfahren (ISO
3497:2000)
Revetements métalliques - Mesurage de l'épaisseur du revetement - Méthodes par
spectrométrie de rayons X (ISO 3497:2000)
Ta slovenski standard je istoveten z: EN ISO 3497:2000
ICS:
17.040.20 Lastnosti površin Properties of surfaces
25.220.40 Kovinske prevleke Metallic coatings
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN ISO 3497
NORME EUROPÉENNE
EUROPÄISCHE NORM
December 2000
ICS 25.220.40
English version
Metallic coatings - Measurement of coating thickness - X-ray
spectrometric methods (ISO 3497:2000)
Revêtements métalliques - Mesurage de l'épaisseur du Metallische Schichten - Schichtdickenmessung -
revêtement - Méthodes par spectrométrie de rayons X (ISO Röntgenfluoreszenz-Verfahren (ISO 3497:2000)
3497:2000)
This European Standard was approved by CEN on 15 December 2000.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national
standards may be obtained on application to the Management Centre or to any CEN member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN member into its own language and notified to the Management Centre has the same status as the official
versions.
CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece,
Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
Management Centre: rue de Stassart, 36 B-1050 Brussels
© 2000 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 3497:2000 E
worldwide for CEN national Members.
Page 2
Corrected on 2001-05-16
Foreword
The text of the International Standard ISO 3497:2000 has been prepared by
Technical Committee ISO/TC 107 "Metallic and other inorganic coatings" in
collaboration with Technical Committee CEN/TC 262 "Metallic and other inorganic
coatings", the secretariat of which is held by BSI.
This European Standard shall be given the status of a national standard, either by
publication of an identical text or by endorsement, at the latest by June 2001, and
conflicting national standards shall be withdrawn at the latest by June 2001.
According to the CEN/CENELEC Internal Regulations, the national standards
organizations of the following countries are bound to implement this European
Standard: Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany,
Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain,
Sweden, Switzerland and the United Kingdom.
Endorsement notice
The text of the International Standard ISO 3497:2000 was approved by CEN as a
European Standard without any modification.
INTERNATIONAL ISO
STANDARD 3497
Third edition
2000-12-15
Metallic coatings — Measurement
of coating thickness — X-ray spectrometric
methods
Revêtements métalliques — Mesurage de l'épaisseur du revêtement —
Méthodes par spectrométrie de rayons X
Reference number
ISO 3497:2000(E)
©
ISO 2000
ISO 3497:2000(E)
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ii © ISO 2000 – All rights reserved
ISO 3497:2000(E)
Contents Page
Foreword.iv
1 Scope .1
2 Terms and definitions .1
3 Principle.3
4 Apparatus .7
5 Factors that influence the measurement results.10
6 Calibration of instrument .14
7 Procedure .16
8 Measurement uncertainty .17
9 Test report .17
Annex A (informative) Typical measuring ranges for some common coating materials .18
ISO 3497:2000(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO
member bodies). The work of preparing International Standards is normally carried out through ISO technical
committees. Each member body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, governmental and non-governmental, in
liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical
Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
Draft International Standards adopted by the technical committees are circulated to the member bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights.
International Standard ISO 3497 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganic
coatings, Subcommittee SC 2, Test methods.
This third edition cancels and replaces the second edition (ISO 3497:1990), which has been technically revised.
Annex A of this International Standard is for information only.
iv © ISO 2000 – All rights reserved
INTERNATIONAL STANDARD ISO 3497:2000(E)
Metallic coatings — Measurement of coating thickness —
X-ray spectrometric methods
1 Scope
WARNING Problems concerning protection of personnel against X-rays are not covered by this
International Standard. For information on this important aspect, reference should be made to current
international and national standards, and to local regulations, where these exist.
1.1 This International Standard specifies methods for measuring the thickness of metallic coatings by the use of
X-ray spectrometric methods.
1.2 The measuring methods to which this International Standard applies are fundamentally those that determine
the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can
also be expressed as linear thickness of the coating.
1.3 The measuring methods permit simultaneous measurement of coating systems with up to three layers, or
simultaneous measurement of thickness and compositions of layers with up to three components.
1.4 The practical measurement ranges of given coating materials are largely determined by the energy of the
characteristic X-ray fluorescence to be analysed and by the acceptable measurement uncertainty and can differ
depending upon the instrument system and operating procedure used.
2 Terms and definitions
For the purposes of this International Standard, the following terms and definitions apply.
2.1
X-ray fluorescence
XRF
secondary radiation occurring when a high intensity incident X-ray beam impinges upon a material placed in the
path of the incident beam
NOTE The secondary emission has wavelengths and energies characteristic of that material.
2.2
intensity of fluorescent radiation
radiation intensity, x, measured by the instrument, expressed in counts (radiation pulses) per second
2.3
saturation thickness
thickness that, if exceeded, does not produce any detectable change in fluorescent intensity
NOTE Saturation thickness depends upon the energy or wavelength of the fluorescent radiation, density and atomic
number of the material and on the angle of incident and fluorescent radiation with respect to the surface of the material.
ISO 3497:2000(E)
2.4
normalized intensity
x
n
ratio of the difference in intensity obtained from a coated specimen, x, and an uncoated substrate material, x ,and
the difference obtained from a material of thickness equal to or greater than the saturation thickness, x (see 2.3)
s
and an uncoated substrate material, x , all measured under the same conditions
NOTE 1 The mathematical relationship is given by:
xx�
x �
n
xx�
s0
where
x is the intensity obtained from the coated specimen;
x is the intensity obtained from uncoated substrate material;
x is the intensity obtained from a material of thickness equal to or greater than the saturation thickness.
s
NOTE 2 The normalized intensity is independent of measurement and integration time, and intensity of the excitation
(incident radiation). The geometric configuration and the energy of the excitation radiation can influence the normalized count
rate. The value of x is validbetween0and 1.
n
2.5
intermediate coatings
coatings that lie between the top coating and the basis material and are of thicknesses less than saturation for
each of the coatings
NOTE Any coating lying between the top coating and the basis material (substrate) and having a thickness above
saturation should itself be considered the true substrate since the material under such a coating will not affect the measurement
and can be eliminated for measurement purposes.
2.6
count rate
number of radiation pulses recorded by the instrument per unit time (see 2.2).
2.7
basis material
basis metal
material upon which coatings are deposited or formed
[ISO 2080:1981, definition 134]
2.8
substrate
material upon which a coating is directly deposited
NOTE For a single or first coating the substrate is identical with the basis material; for a subsequent coating the
intermediate coating is the substrate.
[ISO 2080:1981, definition 630]
2 © ISO 2000 – All rights reserved
ISO 3497:2000(E)
3Principle
3.1 Basis of operation
A relationship exists between mass per unit area of the coating (and thus the linear coating thickness if the density
is known) and the secondary radiation intensity. This relationship, for any practical instrument system, is first
established by calibrating using calibration standards having coatings of known mass per unit area. If the coating
material density is known, such standards can have coatings given in linear thickness units, provided that the
actual density value is also given.
NOTE The coating material density is the density as-coated, which may or may not be the theoretical density of the coating
material at the time the measurement is made. If this density differs from the density of the calibration standards, a factor that
reflects this difference is used and documented in the test report.
The fluorescent intensity is a function of the atomic number of the elements. Providing the top coating, intermediate
coating (if present) and the substrate are of different elements or a coating consists of more than one element,
these elements will generate radiation characteristics for each of them. A suitable detector system can be adjusted
to select either one or more energy bands, enabling the equipment to measure thickness and/or composition of
either the top coating or the top and some intermediate coatings simultaneously.
3.2 Excitation
3.2.1 General
The measurement of the thick
...
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