EN 61338-1-5:2015

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.

Dielektrische Resonatoren vom Wellenleitertyp - Teil 1-5: Allgemeine Informationen und Prüfbedingungen - Messverfahren für die Leitfähigkeit an der Grenzfläche zwischen Leiterschicht und dielektrischem Träger im Mikrowellen-Frequenzbereich

Résonateurs diélectriques à modes guidés - Partie 1-5: Informations générales et conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences

L'IEC 61338-1-5:2015 décrit une méthode de mesure de la résistance et de la conductivité efficace au niveau de l'interface entre la couche conductrice et le substrat diélectrique, appelées résistance d'interface et conductivité d'interface. Cette première édition annule et remplace l'IEC PAS 61338-1-5 parue en 2010. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) description de contenu technique lié à des brevets (brevets japonais numéro JP3634966 et JP3735501) dans l'Introduction; b) modifications de références normatives; c) ajout bibliographique.

Dielektrični resonatorji valovodnega tipa - 1-5. del: Splošni podatki in pogoji preskušanja - Metoda za meritve prevodnosti na vmesniku med prevodno plastjo in dielektričnim substratom pri mikrovalovni frekvenci

Mikrovalovna vezja so običajno oblikovana na večplastnih organskih ali anorganskih substratih. Dušenje planarnih prenosnih vodov, kot so ploščati valovodi, mikro ploščati valovodi in koplanarni vodi, je v mikrovalovnih vezjih določeno z izgubo v kondenzatorju, izgubo v dielektriku in izgubo zaradi sevanja. Med temi je izguba v kondenzatorju glavni dejavnik, ki vpliva na dušenje planarnih prenosnih vodov. V tem dokumentu je standardizirana nova meritvena metoda za oceno prevodnosti prenosnih vodov na ali v substratih, kot so organski substrati, keramični substrati ali substrati iz nizkotemperaturne sočasno sintrane keramike (LTCC). Ta standard opisuje meritveno metodo za upornost in efektivno prevodnost na vmesniku med prevodno plastjo in dielektričnim substratom, imenovani upornost na vmesniku in prevodnost na vmesniku.
Ta meritvena metoda ima naslednje lastnosti:
– upornost na vmesniku Ri pridobimo tako, da izmerimo resonančno frekvenco f0 in neobremenjen kvalitativni faktor Qu resonatorja z drogom iz dielektrika načina TE01δ, ki ga prikazuje slika 2;
– prevodnost na vmesniku σi in relativna prevodnost na vmesniku σri = σi / σ0 sta izračunani iz izmerjene vrednosti Ri, pri čemer je σ0 = 5,8 × 107 S/m prevodnost navadnega bakra;
– meritvena negotovost σri (Δσri) je manjša od 5 %

General Information

• Status: Published
• Publication Date: 27-Aug-2015
• Withdrawal Date: 29-Jul-2018
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection
• Drafting Committee: IEC/TC 49 - IEC_TC_49
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 28-Aug-2015
• Completion Date: 28-Aug-2015
• Ref Project: SIST EN 61338-1-5:2015 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Overview

EN 61338-1-5:2015 (IEC 61338-1-5:2015) specifies a laboratory measurement method for the resistance and effective conductivity at the interface between a conductor layer and a dielectric substrate at microwave frequencies. Known as interface resistance and interface conductivity, these parameters quantify conductor‑substrate interaction that contributes to loss in planar microwave circuits. This first edition replaces IEC PAS 61338-1-5 (2010) and includes patent-related notes and updated normative references.

Key topics and technical requirements

• Measurement objective: Determine surface/interface resistance (R) and interface conductivity (σ) for conductor/dielectric assemblies used in microwave devices.
• Test method: Uses a TE‑mode dielectric rod (waveguide type dielectric resonator) arrangement and a substrate/conductor/substrate specimen geometry to excite and measure resonant behaviour, from which R and σ are calculated.
• Measured parameters: Resonant frequency, Q‑factor (quality factor), insertion attenuation and half‑power bandwidth are used to derive interface conductivity and associated uncertainties.
• Specimen preparation and apparatus: Standard defines preparation of test samples (including double‑substrate structures), reference rods (e.g., sapphire and low‑loss ceramic types), and the measurement setup (network analyzer, resonator mounting, calibration/reference level).
• Analysis and uncertainty: Calculation equations for R and σ are provided, plus guidance on measurement uncertainty and example results. Annexes supply derivations and parameter charts.
• Intellectual property: The document notes patent claims related to the TE‑mode rod resonator technique and the substrate/conductor/substrate structure (Japanese patents JP3634966, JP3735501); patent-holder contact details are included.

Applications and users

This standard is practical for:

• Microwave materials and components manufacturers (LTCC, multilayer ceramics, PCB and thin‑film processes)
• Test and calibration laboratories characterizing conductor/dielectric interfaces
• RF/microwave circuit and filter designers seeking to reduce conductor loss in microstrip, stripline and coplanar waveguides
• Quality assurance and process control teams aiming to monitor metallization adhesion or surface treatments that affect microwave loss
• Standards bodies and academic researchers studying microwave loss mechanisms

Practical benefits include improved prediction of transmission‑line attenuation, informed material selection, and process optimization for high‑Q microwave components.

Related standards

• IEC/EN 61338-1-3 - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
• Other parts of the IEC 61338 series covering resonator specifications, oscillator and filter guidelines, and millimeter‑wave measurements

Keywords: waveguide type dielectric resonators, interface conductivity, interface resistance, microwave frequency, TE mode resonator, EN 61338-1-5:2015, IEC 61338-1-5, conductor layer, dielectric substrate, LTCC, measurement method.

Standards Content (Sample)

SLOVENSKI STANDARD
01-december-2015
'LHOHNWULþQLUHVRQDWRUMLYDORYRGQHJDWLSDGHO6SORãQLSRGDWNLLQSRJRML
SUHVNXãDQMD0HWRGD]DPHULWYHSUHYRGQRVWLQDYPHVQLNXPHGSUHYRGQRSODVWMR
LQGLHOHNWULþQLPVXEVWUDWRPSULPLNURYDORYQLIUHNYHQFL
Waveguide type dielectric resonators - Part 1-5: General information and test conditions -
Measurement method of conductivity at interface between conductor layer and dielectric
substrate at microwave frequency
Résonateurs diélectriques à modes guidés -- Partie 1-5: Informations générales et
conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre
une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences
Ta slovenski standard je istoveten z: EN 61338-1-5:2015
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 61338-1-5

NORME EUROPÉENNE
EUROPÄISCHE NORM
August 2015
ICS 31.140
English Version
Waveguide type dielectric resonators - Part 1-5: General
information and test conditions - Measurement method of
conductivity at interface between conductor layer and dielectric
substrate at microwave frequency
(IEC 61338-1-5:2015)
Résonateurs diélectriques à modes guidés - Partie 1-5: Dielektrische Resonatoren vom Wellenleitertyp - Teil 1-5:
Informations générales et conditions d'essais - Méthode de Allgemeine Informationen und Prüfbedingungen -
mesure de la conductivité au niveau de l'interface entre une Messverfahren für die Leitfähigkeit an der Grenzfläche
couche conductrice et un substrat diélectrique fonctionnant zwischen Leiterschicht und dielektrischem Träger im
aux hyperfréquences Mikrowellen-Frequenzbereich
(IEC 61338-1-5:2015) (IEC 61338-1-5:2015)
This European Standard was approved by CENELEC on 2015-07-30. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 61338-1-5:2015 E
European foreword
The text of document 49/1089/CDV, future edition 1 of IEC 61338-1-5, prepared by
IEC/TC 49 "Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 61338-1-5:2015.
The following dates are fixed:
• latest date by which the document has to be (dop) 2016-04-30
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2018-07-30
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61338-1-5:2015 was approved by CENELEC as a
European Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year

IEC 61338-1-3 -  Waveguide type dielectric resonators -- EN 61338-1-3 -
Part 1-3: General information and test
conditions - Measurement method of
complex relative permittivity for dielectric
resonator materials at microwave
frequency
IEC 62252 -  Maritime navigation and EN 62252 -
radiocommunication equipment and
systems - Radar for craft not in compliance
with IMO SOLAS Chapter V - Performance
requirements, methods of test and required
test results
IEC 61338-1-5 ®
Edition 1.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –

Part 1-5: General information and test conditions – Measurement method of

conductivity at interface between conductor layer and dielectric substrate at

microwave frequency
Résonateurs diélectriques à modes guidés –

Partie 1-5: Informations générales et conditions d'essais – Méthode de mesure

de la conductivité au niveau de l'interface entre une couche conductrice et un

substrat diélectrique fonctionnant aux hyperfréquences

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-2721-3

– 2 – IEC 61338-1-5:2015 © IEC 2015
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references. 6
3 Measurement and related parameters . 6
4 Calculation equations for R and σ . 8
i i
5 Preparation of specimen . 12
6 Measurement equipment and apparatus . 12
6.1 Measurement equipment . 12
6.2 Measurement apparatus . 12
7 Measurement procedure . 13
7.1 Set-up of measurement equipment and apparatus . 13
7.2 Measurement of reference level . 13
7.3 Measurement procedure of Q . 13
u
7.4 Determination of σ and measurement uncertainty . 15
i
8 Example of measurement result . 15
Annex A (informative) Derivation of Equation (4) for R . 17
i
Annex B (informative) Calculation uncertainty of parameters in Figure 3 . 19
Bibliography . 20

Figure 1 – Surface resistance R , surface conductivity σ , interface resistance R , and
s s i
interface conductivity σ . . 7
i
Figure 2 – TE mode dielectric rod resonator to measure σ . . 8
01δ i
Figure 3 – Parameters chart of f , g, P and P for reference sapphire rod . 10
0 rod sub
Figure 4 – Parameters chart of f , g, P and P for reference (Zr,Sn)TiO rod . 11
0 rod sub 4
Figure 5 – Schematic diagram of measurement equipments . 12
Figure 6 – Schematic diagram of measurement apparatus for σ . . 13
i
Figure 7 – Frequency response for reference sapphire rod with two dielectric
substrates as shown in Figure 2. . 14
Figure 8 – Resonance frequency f , insertion attenuation IA and half-power band
0 0
width f . 15
BW
Table 1 – Specifications of reference rods . 9
Table 2 – ε’ and tanδ of reference rods measured by the method of IEC 61338-1-
rod rod
3 15
Table 3 – ε’ and tanδ of an LTCC test substrate measured by the method of
sub sub
IEC 62562 . 16
Table 4 – Measurement results of σ and σ of a copper layer in LTCC substrate . 16
i ri
Table B 1 – Parameters obtained by FEM and rigorous analysis of IEC 61338-1-3 for
the TE mode resonator . 19
Table B.2 – Calculated parameters f , g, P , P , R , σ and σ for the TE mode
0 rod sub i i ri 01δ
resonator . 19

IEC 61338-1-5:2015 © IEC 2015 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions –
Measurement method of conductivity at interface between
conductor layer and dielectric substrate at microwave frequency

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
International Standard IEC 61338-1-5 has been prepared by IEC technical committee
49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010.
This edition includes the following significant technical changes with respect to the previous
edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966,
JP3735501) in the Introduction;
b) changes to normative references;
c) addition to bibliography.
The text of this standard is based on the following documents:

– 4 – IEC 61338-1-5:2015 © IEC 2015
CDV Report on voting
49/1089/CDV 49/1103/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61338 series, published under the general title Waveguide type
dielectric resonators, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IEC 61338-1-5:2015 © IEC 2015 – 5 –
INTRODUCTION
IEC 61338 consists of the following parts, under the general title Waveguide type dielectric
resonators:
– Part 1: Generic specification
– Part 1-3: General information and test conditions − Measurement method of complex
relative permittivity for dielectric resonator materials at microwave frequency
– Part 1-4: General information and test conditions − Measurement method of complex
relative permittivity for dielectric resonator materials at millimeter-wave frequency
– Part 2: Guidelines for oscillator and filter applications
– Part 4: Sectional specification
– Part 4-1: Blank detail specification
The International Electrotechnical Commission (IEC) draws attention to the fact that it is
claimed that compliance with this document may involve the use of a patent concerning:
– The use of a TE mode dielectric rod resonator for the interface resistance and the
01δ
interface conductivity measurement, given in Clause 4;
– The use of a substrate/conductor/substrate layer structure, where a conductor is formed
between two dielectric substrates, for the interface resistance and interface conductivity
measurement, given in Clause 5.
IEC takes no position concerning the evidence, validity and scope of this patent right.
The holder of this patent right has assured the IEC that he/she is willing to negotiate licences
under reasonable and non-discriminatory terms and conditions with applicants throughout the
world. In this respect, the statement of the holder of this patent right is registered with IEC.
Information may be obtained from:
KYOCERA Corporation
6 Takeda Tobadono-cho, Fushimiku, Kyoto 612-8501, Japan
Attention is drawn to the possibility that some of the elements of this standard may be the
subject of patent rights other than those identified above. IEC shall not be held responsible for
identifying any or all such patent rights.
ISO (www.iso.org/patents) and IEC (http://patents.iec.ch) maintain on-line data bases of
patents relevant to their standards. Users are encouraged to consult the data bases for the
most up to date information concerning patents.

– 6 – IEC 61338-1-5:2015 © IEC 2015
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions –
Measurement method of conductivity at interface between
conductor layer and dielectric substrate at microwave frequency

1 Scope
Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In
the microwave circuits, the attenuation of planar transmission lines such as striplines,
microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and
radiation loss. Among them, the conductor loss is a major factor in the attenuation of the
planar transmission lines. A new measurement method is standardized in this document to
evaluate the conductivity of transmission line on or in the substrates such as the organic,
ceramic and LTCC (low temperature co-fired ceramics) substrates. This standard describes a
measurement method for resistance and effective conductivity at the interface between
conductor layer and dielectric substrate, which are called interface resistance and interface
conductivity.
This measurement method has the following characteristics:
– the interface resistance R is obtained by measuring the resonant frequency f and
i 0
unloaded quality factor Q of a TE mode dielectric rod resonator shown in Figure 2;
u 01δ
and the relative interface conductivity σ = σ / σ are calculated from
– the interface conductivity σ
i ri i 0
the measured R value, where σ = 5,8 × 10 S/m is the conductivity of standard copper;
i 0
– the measurement uncertainty of σ (Δσ ) is less than 5 %.
ri ri
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for
...