EN 61338-1-5:2015

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.

Dielektrische Resonatoren vom Wellenleitertyp - Teil 1-5: Allgemeine Informationen und Prüfbedingungen - Messverfahren für die Leitfähigkeit an der Grenzfläche zwischen Leiterschicht und dielektrischem Träger im Mikrowellen-Frequenzbereich

Résonateurs diélectriques à modes guidés - Partie 1-5: Informations générales et conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences

L'IEC 61338-1-5:2015 décrit une méthode de mesure de la résistance et de la conductivité efficace au niveau de l'interface entre la couche conductrice et le substrat diélectrique, appelées résistance d'interface et conductivité d'interface. Cette première édition annule et remplace l'IEC PAS 61338-1-5 parue en 2010. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) description de contenu technique lié à des brevets (brevets japonais numéro JP3634966 et JP3735501) dans l'Introduction; b) modifications de références normatives; c) ajout bibliographique.

Dielektrični resonatorji valovodnega tipa - 1-5. del: Splošni podatki in pogoji preskušanja - Metoda za meritve prevodnosti na vmesniku med prevodno plastjo in dielektričnim substratom pri mikrovalovni frekvenci

Mikrovalovna vezja so običajno oblikovana na večplastnih organskih ali anorganskih substratih. Dušenje planarnih prenosnih vodov, kot so ploščati valovodi, mikro ploščati valovodi in koplanarni vodi, je v mikrovalovnih vezjih določeno z izgubo v kondenzatorju, izgubo v dielektriku in izgubo zaradi sevanja. Med temi je izguba v kondenzatorju glavni dejavnik, ki vpliva na dušenje planarnih prenosnih vodov. V tem dokumentu je standardizirana nova meritvena metoda za oceno prevodnosti prenosnih vodov na ali v substratih, kot so organski substrati, keramični substrati ali substrati iz nizkotemperaturne sočasno sintrane keramike (LTCC). Ta standard opisuje meritveno metodo za upornost in efektivno prevodnost na vmesniku med prevodno plastjo in dielektričnim substratom, imenovani upornost na vmesniku in prevodnost na vmesniku.
Ta meritvena metoda ima naslednje lastnosti:
– upornost na vmesniku Ri pridobimo tako, da izmerimo resonančno frekvenco f0 in neobremenjen kvalitativni faktor Qu resonatorja z drogom iz dielektrika načina TE01δ, ki ga prikazuje slika 2;
– prevodnost na vmesniku σi in relativna prevodnost na vmesniku σri = σi / σ0 sta izračunani iz izmerjene vrednosti Ri, pri čemer je σ0 = 5,8 × 107 S/m prevodnost navadnega bakra;
– meritvena negotovost σri (Δσri) je manjša od 5 %

General Information

• Status: Published
• Publication Date: 27-Aug-2015
• Withdrawal Date: 29-Jul-2018
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection
• Drafting Committee: IEC/TC 49 - IEC_TC_49
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 28-Aug-2015
• Completion Date: 28-Aug-2015
• Ref Project: SIST EN 61338-1-5:2015 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Standards Content (Sample)

SLOVENSKI STANDARD
01-december-2015
'LHOHNWULþQLUHVRQDWRUMLYDORYRGQHJDWLSDGHO6SORãQLSRGDWNLLQSRJRML
SUHVNXãDQMD0HWRGD]DPHULWYHSUHYRGQRVWLQDYPHVQLNXPHGSUHYRGQRSODVWMR
LQGLHOHNWULþQLPVXEVWUDWRPSULPLNURYDORYQLIUHNYHQFL
Waveguide type dielectric resonators - Part 1-5: General information and test conditions -
Measurement method of conductivity at interface between conductor layer and dielectric
substrate at microwave frequency
Résonateurs diélectriques à modes guidés -- Partie 1-5: Informations générales et
conditions d'essais - Méthode de mesure de la conductivité au niveau de l'interface entre
une couche conductrice et un substrat diélectrique fonctionnant aux hyperfréquences
Ta slovenski standard je istoveten z: EN 61338-1-5:2015
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 61338-1-5

NORME EUROPÉENNE
EUROPÄISCHE NORM
August 2015
ICS 31.140
English Version
Waveguide type dielectric resonators - Part 1-5: General
information and test conditions - Measurement method of
conductivity at interface between conductor layer and dielectric
substrate at microwave frequency
(IEC 61338-1-5:2015)
Résonateurs diélectriques à modes guidés - Partie 1-5: Dielektrische Resonatoren vom Wellenleitertyp - Teil 1-5:
Informations générales et conditions d'essais - Méthode de Allgemeine Informationen und Prüfbedingungen -
mesure de la conductivité au niveau de l'interface entre une Messverfahren für die Leitfähigkeit an der Grenzfläche
couche conductrice et un substrat diélectrique fonctionnant zwischen Leiterschicht und dielektrischem Träger im
aux hyperfréquences Mikrowellen-Frequenzbereich
(IEC 61338-1-5:2015) (IEC 61338-1-5:2015)
This European Standard was approved by CENELEC on 2015-07-30. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 61338-1-5:2015 E
European foreword
The text of document 49/1089/CDV, future edition 1 of IEC 61338-1-5, prepared by
IEC/TC 49 "Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 61338-1-5:2015.
The following dates are fixed:
• latest date by which the document has to be (dop) 2016-04-30
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2018-07-30
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61338-1-5:2015 was approved by CENELEC as a
European Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year

IEC 61338-1-3 -  Waveguide type dielectric resonators -- EN 61338-1-3 -
Part 1-3: General information and test
conditions - Measurement method of
complex relative permittivity for dielectric
resonator materials at microwave
frequency
IEC 62252 -  Maritime navigation and EN 62252 -
radiocommunication equipment and
systems - Radar for craft not in compliance
with IMO SOLAS Chapter V - Performance
requirements, methods of test and required
test results
IEC 61338-1-5 ®
Edition 1.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –

Part 1-5: General information and test conditions – Measurement method of

conductivity at interface between conductor layer and dielectric substrate at

microwave frequency
Résonateurs diélectriques à modes guidés –

Partie 1-5: Informations générales et conditions d'essais – Méthode de mesure

de la conductivité au niveau de l'interface entre une couche conductrice et un

substrat diélectrique fonctionnant aux hyperfréquences

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-2721-3

– 2 – IEC 61338-1-5:2015 © IEC 2015
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references. 6
3 Measurement and related parameters . 6
4 Calculation equations for R and σ . 8
i i
5 Preparation of specimen . 12
6 Measurement equipment and apparatus . 12
6.1 Measurement equipment . 12
6.2 Measurement apparatus . 12
7 Measurement procedure . 13
7.1 Set-up of measurement equipment and apparatus . 13
7.2 Measurement of reference level . 13
7.3 Measurement procedure of Q . 13
u
7.4 Determination of σ and measurement uncertainty . 15
i
8 Example of measurement result . 15
Annex A (informative) Derivation of Equation (4) for R . 17
i
Annex B (informative) Calculation uncertainty of parameters in Figure 3 . 19
Bibliography . 20

Figure 1 – Surface resistance R , surface conductivity σ , interface resistance R , and
s s i
interface conductivity σ . . 7
i
Figure 2 – TE mode dielectric rod resonator to measure σ . . 8
01δ i
Figure 3 – Parameters chart of f , g, P and P for reference sapphire rod . 10
0 rod sub
Figure 4 – Parameters chart of f , g, P and P for reference (Zr,Sn)TiO rod . 11
0 rod sub 4
Figure 5 – Schematic diagram of measurement equipments . 12
Figure 6 – Schematic diagram of measurement apparatus for σ . . 13
i
Figure 7 – Frequency response for reference sapphire rod with two dielectric
substrates as shown in Figure 2. . 14
Figure 8 – Resonance frequency f , insertion attenuation IA and half-power band
0 0
width f . 15
BW
Table 1 – Specifications of reference rods . 9
Table 2 – ε’ and tanδ of reference rods measured by the method of IEC 61338-1-
rod rod
3 15
Table 3 – ε’ and tanδ of an LTCC test substrate measured by the method of
sub sub
IEC 62562 . 16
Table 4 – Measurement results of σ and σ of a copper layer in LTCC substrate . 16
i ri
Table B 1 – Parameters obtained by FEM and rigorous analysis of IEC 61338-1-3 for
the TE mode resonator . 19
Table B.2 – Calculated parameters f , g, P , P , R , σ and σ for the TE mode
0 rod sub i i ri 01δ
resonator . 19

IEC 61338-1-5:2015 © IEC 2015 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions –
Measurement method of conductivity at interface between
conductor layer and dielectric substrate at microwave frequency

FOREWORD
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