EN 62132-2:2011
(Main)Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 2: Messung der Störfestigkeit bei Einstrahlungen - TEM-Zellen- und Breitband-TEM-Zellenverfahren
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 2: Mesure de l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande
La CEI 62132-2:2010 spécifie une méthode de mesure de l'immunité d'un circuit intégré (CI) aux perturbations électromagnétiques rayonnées aux fréquences radioélectriques. La gamme de fréquences de cette méthode est comprise entre 150 kHz et 1 GHz, ou dans les limites fixées par les caractéristiques de la cellule TEM.
Integrirana vezja - Meritve elektromagnetne odpornosti - 2. del: Meritev odpornosti proti sevanju - Metoda s celico TEM in širokopasovno celico TEM (IEC 62132-2:2010)
Ta mednarodni standard določa metodo za merjenje odpornosti integriranega vezja (IC) proti radiofrekvenčnim izsevanim elektromagnetnim motnjam (RF). Frekvenčni razpon te metode sega od 150 kHz do 1 GHz ali kot ga omejujejo značilnosti celice TEM.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-maj-2011
Integrirana vezja - Meritve elektromagnetne odpornosti - 2. del: Meritev odpornosti
proti sevanju - Metoda s celico TEM in širokopasovno celico TEM (IEC 62132-
2:2010)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of
radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010)
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 2:
Messung der Störfestigkeit bei Einstrahlungen - TEM-Zellen- und Breitband-
TEMZellenverfahren (IEC 62132-2:2010)
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 2: Mesure de
l'immunité rayonnée - Méthode de cellule TEM et cellule TEM à large bande (CEI 62132-
2:2010)
Ta slovenski standard je istoveten z: EN 62132-2:2011
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.20 Imunost Immunity
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 62132-2
NORME EUROPÉENNE
March 2011
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic immunity -
Part 2: Measurement of radiated immunity -
TEM cell and wideband TEM cell method
(IEC 62132-2:2010)
Circuits intégrés - Integrierte Schaltungen -
Mesure de l'immunité électromagnétique - Messung der elektromagnetischen
Partie 2: Mesure de l'immunité rayonnée - Störfestigkeit -
Méthode de cellule TEM et cellule TEM à Teil 2: Messung der Störfestigkeit bei
large bande Einstrahlungen -
(CEI 62132-2:2010) TEM-Zellen- und Breitband-TEM-
Zellenverfahren
(IEC 62132-2:2010)
This European Standard was approved by CENELEC on 2011-01-02. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-2:2011 E
Foreword
The text of document 47A/838/FDIS, future edition 1 of IEC 62132-2, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was
approved by CENELEC as EN 62132-2 on 2011-01-02.
This part of EN 62132 is to be read in conjunction with EN 62132-1.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-10-02
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2014-01-02
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62132-2:2010 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
[7] IEC 61000-4-3:2006 NOTE Harmonized as EN 61000-4-3:2006 (not modified).
IEC 61000-4-3:2006/A1:2007 NOTE Harmonized as EN 61000-4-3:2006/A1:2008 (not modified).
[8] IEC 61000-4-6:2008 NOTE Harmonized as EN 61000-4-6:2009 (not modified).
[9] IEC 61000-4-20:2003 NOTE Harmonized as EN 61000-4-20:2003 (not modified).
[10] CISPR 16-1-1:2006 NOTE Harmonized as EN 55016-1-1:2007 (not modified).
[12] CISPR 16-1-5:2003 NOTE Harmonized as EN 55016-1-5:2004 (not modified).
[13] CISPR 16-2-1:2008 NOTE Harmonized as EN 55016-2-1:2009 (not modified).
[15] CISPR 16-2-3:2006 NOTE Harmonized as EN 55016-2-3:2006 (not modified).
[16] CISPR 16-2-4:2003 NOTE Harmonized as EN 55016-2-4:2004 (not modified).
__________
- 3 - EN 62132-2:2011
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050-131 2002 International Electrotechnical Vocabulary - -
(IEV) -
Part 131: Circuit theory
IEC 60050-161 1990 International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility
IEC 61967-2 - Integrated circuits - Measurement of EN 61967-2 -
electromagnetic emissions,
150 kHz to 1 GHz -
Part 2: Measurement of radiated emissions -
TEM cell and wideband TEM cell method
IEC 62132-1 2006 Integrated circuits - Measurement of EN 62132-1 2006
electromagnetic immunity, + corr. November 2006
150 kHz to 1 GHz -
Part 1: General conditions and definitions
IEC 62132-2 ®
Edition 1.0 2010-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Integrated circuits – Measurement of electromagnetic immunity –
Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell
method
Circuits intégrés – Mesure de l’immunité electromagnétique –
Partie 2: Mesure de l’immunité rayonnée – Méthode de cellule TEM et cellule
TEM à large bande
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.200 ISBN 978-2-88910-624-0
– 2 – 62132-2 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 Terms and definitions .5
4 General .6
5 Test conditions .7
6 Test equipment.7
6.1 General .7
6.2 Cables.7
6.3 RF disturbance source .7
6.4 TEM cell.8
6.5 Gigahertz TEM cell.8
6.6 50-Ω termination .8
6.7 DUT monitor.8
7 Test set-up .8
7.1 General .8
7.2 Test set-up details.8
7.3 EMC test board .10
8 Test procedure .10
8.1 General .10
8.2 Immunity measurement .10
8.2.1 General .10
8.2.2 RF disturbance signals .10
8.2.3 Test frequencies.11
8.2.4 Test levels and dwell time .11
8.2.5 DUT monitoring .11
8.2.6 Detail procedure .11
9 Test report.12
Annex A (normative) Field strength characterization procedure.13
Annex B (informative) TEM CELL and wideband TEM cell descriptions.21
Bibliography.22
Figure 1 – TEM and GTEM cell cross-section .9
Figure 2 – TEM cell test set-up .9
Figure 3 – GTEM cell test set-up.10
Figure 4 – Immunity measurement procedure flowchart .12
Figure A.1 – E-field characterization test fixture.14
Figure A.2 – The electric field to voltage transfer function.16
Figure A.3 – H-field characterization test fixture.19
Figure A.4 – The magnetic field to voltage transfer function .20
62132-2 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS – MEASUREMENT OF
ELECTROMAGNETIC IMMUNITY –
Part 2: Measurement of radiated immunity –
TEM cell and wideband TEM cell method
FOREWORD
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