prEN IEC 62132-8:2025
(Main)Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 8: Messung der Störfestigkeit bei Einstrahlungen - IC-Streifenleiterverfahren
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8: Mesure de l'immunité rayonnée - Méthode de la ligne TEM à plaques pour circuit intégré
Integrirana vezja - Meritve elektromagnetne odpornosti - 8. del: Meritev odpornosti proti sevanju - Metoda z IC na tračnem valovodu
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Standards Content (Sample)
SLOVENSKI STANDARD
01-maj-2025
Integrirana vezja - Meritve elektromagnetne odpornosti - 8. del: Meritev odpornosti
proti sevanju - Metoda z IC na tračnem valovodu
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of
radiated immunity - IC stripline method
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 8:
Messung der Störfestigkeit bei Einstrahlungen - IC-Streifenleiterverfahren
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8: Mesure de
l'immunité rayonnée - Méthode de la ligne TEM à plaques pour circuit intégré
Ta slovenski standard je istoveten z: prEN IEC 62132-8:2025
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
47A/1182/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62132-8 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2025-03-07 2025-05-30
SUPERSEDES DOCUMENTS:
47A/1167/CD, 47A/1176/CC
IEC SC 47A : INTEGRATED CIRCUITS
SECRETARIAT: SECRETARY:
Japan Mr Yoshinori FUKUBA
OF INTEREST TO THE FOLLOWING COMMITTEES: HORIZONTAL FUNCTION(S):
ASPECTS CONCERNED:
Electromagnetic Compatibility
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
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This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
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to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for submitting ISC
clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated
immunity - IC stripline method
PROPOSED STABILITY DATE: 2029
NOTE FROM TC/SC OFFICERS:
SC47A WG9 reviewed all CC of 47A/1167/CD and resolve all comments in 47A/1176/CC, SC47A decided next
step to be CDV (47A/1177A/RM, Decision 47A-2024-07).
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
IEC 62132-8 ED2 © IEC 2025 – 2 – 47A/1182/CDV
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 General . 7
5 Test conditions . 7
5.1 General . 7
5.2 Supply voltage . 7
5.3 Frequency range . 8
6 Test equipment . 8
6.1 General . 8
6.2 Cables . 8
6.3 Shielding . 8
6.4 RF disturbance generator . 8
6.5 IC stripline . 8
6.6 50 Ω termination . 8
6.7 DUT monitor . 8
7 Test setup . 8
7.1 General . 8
7.2 Test configuration . 9
7.3 EMC test board (PCB) . 9
8 Test procedure . 9
8.1 General . 9
8.2 Operational check. 9
8.3 Immunity measurement . 9
8.3.1 General . 9
8.3.2 RF disturbance signal . 10
8.3.3 Test frequency steps and ranges . 10
8.3.4 Test levels and dwell time . 10
8.3.5 DUT monitoring . 10
8.3.6 Detailed procedure . 10
9 Test report . 11
10 RF immunity acceptance level . 11
Annex A (normative) Field strength determination . 12
A.1 General . 12
A.2 Characteristic impedance of stripline arrangements . 12
A.3 Field strength calculation . 12
A.4 RF characteristic verification of the IC stripline . 13
Annex B (normative) IC stripline descriptions . 14
B.1 IC stripline . 14
B.2 Example for IC stripline arrangement . 15
Annex C (informative) Closed stripline geometrical limitations . 17
Bibliography . 21
IEC 62132-8 ED2 © IEC 2025 – 3 – 47A/1182/CDV
Figure 1 – IC stripline test setup . 9
Figure A.1 – Definition of height (h) and width (w) of an IC stripline . 12
Figure A.2 – EM field distribution . 13
Figure B.1 – Cross section view of an example of an open IC stripline . 14
Figure B.2 – Cross section view of an example of a closed IC stripline . 15
Figure B.3 – Example of a closed version of an IC stripline . 16
Figure C.1 – Calculated H-field reduction of closed version referenced to referring
open version as a function of portion of active conductor width of closed version to
open version . 19
Figure C.2 – Location of currents and mirrored currents at grounded planes used for
calculation of fields . 20
Table B.1 – Maximum DUT dimensions for 6,7 mm IC stripline (Open version) . 15
Table B.2 – Maximum DUT dimensions for 6,7 mm IC stripline (Closed version) . 15
Table C.1 – Height of shielding, simulated at hbottom = 6,7mm to achieve practically
50 Ω system . 18
IEC 62132-8 ED2 © IEC 2025 – 4 – 47A/1182/CDV
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY –
Part 8: Measurement of radiated immunity –
IC stripline method
FOREWORD
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IEC 62132-8 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical
committee 47: Semiconductor devices. It is an International Standard.
This second edition cancels and replaces the first edition published in 2012. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) [short description of the main changes].
IEC 62132-8 ED2 © IEC 2025 – 5 – 47A/1182/CDV
The text of this International Standard is based on the following documents:
Draft Report on voting
47A/XX/FDIS 47A/XX/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English [change
language if necessary].
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Par
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