EN 62132-8:2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 8: Messung der Störfestigkeit bei Einstrahlungen - IC-Streifenleiterverfahren

Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8: Mesure de l'immunité rayonnée - Méthode de la ligne TEM à plaques pour circuit intégré

La CEI 62132-8:2012 définit une méthode de mesure de l'immunité d'un circuit intégré (CI) aux perturbations électromagnétiques rayonnées aux fréquences radioélectriques sur la gamme de fréquences comprise entre 150 kHz et 3 GHz.

Integrirana vezja - Meritve elektromagnetne odpornosti - 8. del: Meritev odpornosti proti sevanju - Metoda z IC na tračnem valovodu

Ta del standarda IEC 62132 določa metodo za merjenje imunosti integriranega vezja (IC) na sevane elektromagnetne motnje radijske frekvence (RF) čez frekvenčni razpon od 150 kHz do 3 GHz.

General Information

• Status: Published
• Publication Date: 20-Sep-2012
• Withdrawal Date: 09-Aug-2015
• ICS: 31.200 - Integrated circuits. Microelectronics
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/SC 47A - IEC_SC_47A
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 21-Sep-2012
• Completion Date: 21-Sep-2012
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Ref Project: SIST EN 62132-8:2012 - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

Standards Content (Sample)

SLOVENSKI STANDARD
01-december-2012
,QWHJULUDQDYH]MD0HULWYHHOHNWURPDJQHWQHRGSRUQRVWLGHO0HULWHYRGSRUQRVWL
SURWLVHYDQMX0HWRGD],&QDWUDþQHPYDORYRGX
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of
radiated immunity - IC stripline method
Circuits intégrés - Mesure de l'immunité électromagnétique - Partie 8: Mesure de
l'immunité rayonnée - Méthode de la ligne à ruban pour circuit intégré
Ta slovenski standard je istoveten z: EN 62132-8:2012
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD
EN 62132-8
NORME EUROPÉENNE
September 2012
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic immunity -
Part 8: Measurement of radiated immunity -
IC stripline method
(IEC 62132-8:2012)
Circuits intégrés -  Integrierte Schaltungen -
Mesure de l'immunité électromagnétique - Messung der elektromagnetischen
Partie 8: Mesure de l'immunité rayonnée - Störfestigkeit -
Méthode de la ligne TEM à plaques pour Teil 8: Messung der Störfestigkeit bei
circuit intégré Einstrahlungen -
(CEI 62132-8:2012) IC-Streifenleiterverfahren
(IEC 62132-8:2012)
This European Standard was approved by CENELEC on 2012-08-10. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-8:2012 E
Foreword
The text of document 47A/882/FDIS, future edition 1 of IEC 62132-8, prepared by SC 47A, "Integrated
circuits", of IEC TC 47, "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 62132-8:2012.

The following dates are fixed:
(dop) 2013-05-10
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2015-08-10
• latest date by which the national
standards conflicting with the
document have to be withdrawn
This standard is to be used in conjunction with EN 62132-1.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent
rights.
Endorsement notice
The text of the International Standard IEC 62132-8:2012 was approved by CENELEC as a European
Standard without any modification.

- 3 - EN 62132-8:2012
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year

IEC 60050 Series International Electrotechnical Vocabulary - -

IEC 61000-4-20 2010 Electromagnetic compatibility (EMC) - EN 61000-4-20 2010
Part 4-20: Testing and measurement
techniques - Emission and immunity testing in
transverse electromagnetic (TEM)
waveguides
IEC 62132-1 2006 Integrated circuits - Measurement of EN 62132-1 2006
electromagnetic immunity, + corr. November 2006
150 kHz to 1 GHz -
Part 1: General conditions and definitions

IEC 62132-8 ®
Edition 1.0 2012-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Integrated circuits – Measurement of electromagnetic immunity –

Part 8: Measurement of radiated immunity – IC stripline method

Circuits intégrés – Mesure de l'immunité électromagnétique –

Partie 8: Mesure de l’immunité rayonnée – Méthode de la ligne TEM à plaques

pour circuit intégré
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX T
ICS 31.200 ISBN 978-2-83220-206-7

– 2 – 62132-8  IEC:2012
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 General . 7
5 Test conditions . 7
5.1 General . 7
5.2 Supply voltage. 8
5.3 Frequency range . 8
6 Test equipment . 8
6.1 General . 8
6.2 Cables . 8
6.3 Shielding . 8
6.4 RF disturbance generator . 8
6.5 IC stripline . 8
6.6 50 Ω termination . 8
6.7 DUT monitor . 8
7 Test setup . 9
7.1 General . 9
7.2 Test configuration . 9
7.3 EMC test board (PCB) . 9
8 Test procedure . 9
8.1 General . 9
8.2 Operational check . 10
8.3 Immunity measurement . 10
8.3.1 General . 10
8.3.2 RF disturbance signal . 10
8.3.3 Test frequency steps and ranges . 10
8.3.4 Test levels and dwell time . 10
8.3.5 DUT monitoring . 10
8.3.6 Detail procedure . 11
9 Test report. 11
10 RF immunity acceptance level . 11
Annex A (normative) Field strength determination . 12
Annex B (normative) IC stripline descriptions . 15
Annex C (informative) Closed stripline geometrical limitations . 18
Bibliography . 22

Figure 1 – IC stripline test setup . 9
Figure A.1 – Definition of height (h) and width (w) of IC stripline . 12
Figure A.2 – EM field distribution . 13
Figure B.1 – Cross section view of an example of an open IC stripline . 15
Figure B.2 – Cross section view of an example of a closed IC stripline . 16

62132-8  IEC:2012 – 3 –
Figure B.3 – Example of IC stripline with housing . 17
Figure C.1 – Calculated H-field reduction of closed version referenced to referring
open version as a function of portion of active conductor width of closed version to
open version . 20
Figure C.2 – Location of currents and mirrored currents at grounded planes used for
calculation of fields . 21

Table 1 – Frequency step size versus frequency range . 10
Table B.1 – Maximum DUT dimensions for 6,7 mm IC stripline (Open version) . 16
Table B.2 – Maximum DUT dimensions for 6,7 mm IC stripline (Closed version) . 16
Table C.1 – Height of shielding, simulated at h = 6,7mm to achieve practically
bottom
50 Ω system . 19

– 4 – 62132-8  IEC:2012
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY –

Part 8: Measurement of radiated immunity –
IC stripline method
FOREWORD
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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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