EN 60060-2:1994
(Main)High-voltage test techniques - Part 2: Measuring systems
High-voltage test techniques - Part 2: Measuring systems
Is applicable to complete Measuring Systems, and to their components, used for the measurement of high-voltages and currents during tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with impulse currents, or with combinations ot them as specified in HD 588.1
Hochspannungs-Prüftechnik - Teil 2: Meßsysteme
Techniques des essais à haute tension - Partie 2: Systèmes de mesure
Est applicable aux Systèmes de Mesure complets et à leurs constituants lorsqu'ils sont utilisés pour les mesures des hautes tensions et courants réalisées lors des essais en tension continue, tension alternative, tensions de chocs de foudre et de manoeuvre, lors des essais en fort courant impulsionnel, ou encore lors d'essais mettant en oeuvre plusieurs de ces contraintes et tels qu'ils sont définis dans la HD 588.1
High-voltage test techniques - Part 2: Measuring systems (IEC 60060-2:1994)
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SLOVENSKI STANDARD
01-januar-1998
High-voltage test techniques - Part 2: Measuring systems (IEC 60060-2:1994)
High-voltage test techniques - Part 2: Measuring systems (IEC 60060-2:1994)
Hochspannungs-Prüftechnik -- Teil 2: Meßsysteme
Techniques des essais à haute tension -- Partie 2: Systèmes de mesure
Ta slovenski standard je istoveten z: EN 60060-2:1994
ICS:
19.080 (OHNWULþQRLQHOHNWURQVNR Electrical and electronic
SUHVNXãDQMH testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
CEI
NORME
IEC
INTERNATIONALE
60-2
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
1994-11
Techniques des essais à haute tension
Partie 2:
Systèmes de Mesure
High-voltage test techniques
Part 2:
Measuring Systems
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60-2 ©IEC:1994 - 3 -
CONTENTS
Page
FOREWORD 9
Clause
1 Scope 11
2 Normative references 13
3 Definitions and symbols 15
3.1 Measuring Systems 15
3.2 Converting devices 17
3.3 Transmission system 17
3.4 Indicating or recording instrument 17
3.5 Scale factors 19
3.6 Definition related to the dynamic behaviour of a Measuring System 19
3.7 Response parameters 21
3.8 Overall uncertainty e 23
3.9 Rated values 25
3.10 Definitions related to tests 25
4 Procedures for qualification and use of measuring systems 27
4.1 General principles 27
4.2 Schedule of Performance Tests 27
4.3 Schedule of Performance Checks 29
4.4 Requirements for the Record of Performance 29
4.5 Operating conditions 31
5 Acceptance tests on components for an Approved Measuring System 33
5.1 Applicability 33
5.2 Determination of the scale factor 33
5.3 Linearity test 33
5.4 Short-term stability test 35
5.5 Long-term stability of single elements 35
5.6 Temperature effect 35
5.7 Proximity effect 35
5.8 Dynamic behaviour of a component 37
5.9 Withstand tests 37
6 Performance Tests on Measuring Systems 39
6.1 General requirements 39
6.2 Determination of the Assigned Scale Factor 41
6.3 Dynamic behaviour test (for Impulse Measuring Systems) 43
6.4 Interference test (for Impulse Measuring Systems) 43
– 5 –
60-2 © I EC:1994
Page
Clause
7 Measurement of direct voltage
7.1 Requirements for an Approved Measuring System
7.2 Acceptance tests on components for an Approved Measuring System
7.3 Performance Test on Measuring Systems
49 7.4 Performance Check
7.5 IEC Standard Measuring Device 49
7.6 Measurement of ripple amplitude
8 Measurement of alternating voltage
53 8.1 Requirements for an Approved Measuring System
8.2 Acceptance tests on components for an Approved Measuring System
57 8.3 Performance Test on Measuring Systems
8.4 Performance Check
57 8.5 IEC Standard Measuring Device
9 Measurement of lightning impulse voltage
59 9.1 Requirements for an Approved Measuring System
9.2 Acceptance tests on components for an Approved Measuring System
9.3 Performance Test on Measuring Systems
9.4 Performance Check
9.5 IEC Standard Measuring Device
10 Measurement of switching impulse voltage 73
73 10.1 Requirements for an Approved Measuring System
73 10.2 Acceptance tests on components for an Approved Measuring System
77 10.3 Performance Test on Measuring Systems
10.4 Performance Check
10.5 IEC Standard Measuring Device
83 11 Measurement of impulse current
11.1 Requirements for an Approved Measuring System
11.2 Acceptance tests on components for an Approved Measuring System
11.3 Performance Test on Measuring Systems
11.4 Performance Check
12 Reference Measuring Systems 91
12.1 Requirements for Reference Measuring Systems
12.2 Calibration of a Reference Measuring System
12.3 Interval between successive Certifications of Reference
Measuring Systems 93
60-2 ©I EC:1994 — 7 —
Clause Page
Figures
Annexes
A Accreditation Systems
A.1 National accreditation systems
A.2 Bibliography
B Structure of a Record of Performance
B.1 General structure
B.2 General description of the system (Chapter A)
B.3 Acceptance test results on components (Chapter B)
B.4 Routine test results on the complete Measuring System (Chapter C)
B.5 Performance Test results (Chapter D)
B.6 Performance Check (Chapter E)
B.7 Minimal form of the Record of Performance
C Step response measurements
C.1 Circuits for step response measurements
D Temperature rise of measuring resistors
E Reference Measuring Systems and Comparison Measurements for
Impulse Measurements — Bibliography
E.1 Comparison measurements
E.2 Some examples of dividers for Reference Measuring Systems
E.3 IEC Standard Measuring Devices
F Summary of tests
121 F.1 Tests on a direct voltage Measuring System
F.2 Tests on an alternating voltage Measuring System
F.3 Tests on a lightning impulse Measuring System
FA Tests on a switching impulse Measuring System
F.5 Tests on an impulse current Measuring System
G Areas where special care is needed
G.1 Measurement of the scale factor of a divider
G.2 Probes and external attenuators
G.3 Probe scale factor
G.4 Use of appropriate levels
G.5 Accuracy of time measurements
60-2 © IEC:1994 - 9 -
INTERNATIONAL ELECTROTECHNICAL COMMISSION
HIGH-VOLTAGE TEST TECHNIQUES -
Part 2: Measuring Systems
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international cooperation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in the
subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with
conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on
which all the National Committees having a special interest therein are represented, express, as nearly as
possible, an international consensus of opinion on the subjects dealt with.
3) They have the form of recommendations for international use published in the form of standards, technical
reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5)
The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
International Standard IEC 60-2 has been prepared by IEC technical committee 42: High-
voltage testing techniques.
This second edition cancels and replaces IEC 60-3, Measuring devices, published in 1976,
and IEC 60-4, Application guide for measuring devices, published in 1977. This second
edition constitutes a technical revision.
The text of this standard is based on the following documents:
Report on voting
DIS
42(CO)54 42(CO)57
Full information on the voting for the approval of this standard can be found in the report
on voting indicated in the above table.
IEC 60 consists of the following parts, under the general title: High-voltage test techniques:
-
Part 1: 1989, General definitions and test requirements
- Part 2: 1994: Measuring Systems
Annex A forms an integral part of this standard and provides normative requirements for
countries choosing to use accreditation systems.
Annexes B to G are for information only.
60-2 ©IEC:1994 - 11 -
HIGH-VOLTAGE TEST
TECHNIQUES -
Part 2: Measuring Systems
1 Scope
This part of IEC 60 is applicable to complete Measuring Systems, and to their components,
used for the measurement of high-voltages and currents during tests with direct voltage,
alternating voltage, lightning and switching impulse voltages and for tests with impulse
currents, or with combinations of them as specified in IEC 60-1.
The limits on measurement uncertainties stated in this International Standard apply to test
levels stated in IEC 71-1. The principles of this International Standard apply also to higher
levels but the uncertainty may be greater.
This standard:
- defines the terms used,
- states the requirements which the Measuring Systems shall meet,
-
describes the methods for approving a Measuring System and checking its components,
-
describes the procedure by which the user will show that a Measuring System
meets the requirements of this standard.
60-2 © IEC:1994 - 13 -
2 Normative references
The following normative documents contain provisions which, through reference in this
text, constitute provisions of
this part of IEC 60. At the time of publication, the editions
indicated were valid. All normative documents are subject to revision, and pa
rties to
agreements based on this pa rt
of IEC 60 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. Members
of
IEC and ISO maintain registers of currently valid International Standards.
IEC 50(301, 302, 303): 1983, International Electrotechnical Vocabulary (IEV) - Chapter 301:
General terms on measurements in electricity; Chapter 302: Electrical measuring
instruments; Chapter 303: Electronic measuring instruments
IEC 50(321): 1986,
International Electrotechnical Vocabulary (lEV) - Chapter 321:
Instrument transformers
IEC 51, Direct acting indicating analogue electrical-measuring instruments and their
accessories
IEC 52: 1960,
Recommendations for voltage measurement by means of sphere-gaps (one
sphere earthed)
IEC 60-1: 1989, High-voltage test techniques - Pa rt
1: General definitions and test
requirements
IEC 71-1: 1993, Insulation co-ordination - Part 1: Definitions, principles and rules
IEC 790: 1984, Oscilloscopes and peak voltmeters for impulse tests
IEC 833: 1987,
Measurement of power-frequency electric fields
IEC 1083-1: 1991, Digital recorders for measurements in high-voltage impulse tests -
Part 1: Requirements for digital recorders
60-2 © IEC:1994 - 15 -
3 Definitions and symbols
For the purposes of this pa rt of IEC 60, the following apply.
3.1 Measuring Systems
3.1.1
Measuring System: Complete set of devices suitable for performing a high-voltage
or impulse-current measurement.
NOTES
1 A Measuring System usually comprises the following components: a converting device with the leads
required for connecting this device to the test object or into the current circuit and the connections to earth, a
transmission system connecting the output terminals of the device to the indicating or recording instruments
with its attenuating, terminating and adapting impedances or networks, and indicating or recording instru-
ments together with any connections to the power supply. Measuring Systems which comprise only some of
the above components or which are based on non-conventional principles are acceptable if they meet the
accuracy requirements specified in this standard. Components may be made of many elements or a single
element, for example, a high-voltage capacitor of a capacitor divider may consist of many low-voltage
capacitors or it may consist of a single gas capacitor.
2 The environment in which a Measuring System functions, its clearances to live and earthed structures and
the presence of electric or magnetic fields may significantly affect its accuracy.
3.1.2 Record of Performance of a Measuring System: Detailed record, established by
the user, describing the system and containing evidence that the requirements given
in this standard have been met. This evidence shall include the results of the initial
rf rformance Test and
Pe ormance Test and the schedule and results of each subsequent Pe
Pe rformance Check.
3.1.3 Approved Measuring System: Measuring System which is shown to comply with
one or more of the sets of requirements set out in this standard by:
- an initial Performance Test,
- successive Pe rformance Checks and Pe rformance Tests,
- ormance.
inclusion of the results of these tests in the Record of Pe rf
The system is approved only for the arrangements and operating conditions included in its
Record of Pe
rformance.
3.1.4 Reference Measuring System: Measuring System having sufficient accuracy and
stability for use in the approval of other systems by making simultaneous comparative
measur
...
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