EN 60270:2001/A1:2016
(Amendment)High-voltage test techniques - Partial discharge measurements
High-voltage test techniques - Partial discharge measurements
Applicable to the measurement of partial discharges which occur in electrical apparatus, components or systems when tested with alternating voltage up to 400 Hz or with direct voltage.
Hochspannungs-Prüftechnik - Teilentladungsmessungen
Techniques des essais à haute tension - Mesures des décharges partielles
Visokonapetostne preskusne tehnike - Meritve delnih razelektritev - Dopolnilo A1
Uporablja se za merjenje delnih razelektritev v električnih napravah, sestavnih delih ali sistemih med preskušanjem z izmenično napetostjo do največ 400 Hz ali z enosmerno napetostjo.
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-maj-2016
Visokonapetostne preskusne tehnike - Meritve delnih razelektritev - Dopolnilo A1
High-voltage test techniques - Partial discharge measurements
Hochspannungs-Prüftechnik - Teilentladungsmessungen
Techniques des essais à haute tension - Mesures des décharges partielles
Ta slovenski standard je istoveten z: EN 60270:2001/A1:2016
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
19.080 (OHNWULþQRLQHOHNWURQVNR Electrical and electronic
SUHVNXãDQMH testing
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN 60270:2001/A1
NORME EUROPÉENNE
EUROPÄISCHE NORM
March 2016
ICS 17.220.20; 19.080
English Version
High-voltage test techniques - Partial discharge measurements
(IEC 60270:2000/A1:2015)
Techniques des essais à haute tension - Mesures des Hochspannungs-Prüftechnik - Teilentladungsmessungen
décharges partielles (IEC 60270:2000/A1:2015)
(IEC 60270:2000/A1:2015)
This amendment A1 modifies the European Standard EN 60270:2001; it was approved by CENELEC on 2016-01-01. CENELEC members
are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the status of a
national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the
responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as
the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60270:2001/A1:2016 E
European foreword
The text of document 42/338/FDIS, future IEC 60270:2000/A1, prepared by IEC/TC 42 "High-voltage
testing techniques" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
The following dates are fixed:
(dop) 2016-10-01
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2019-01-01
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 60270:2000/A1:2015 was approved by CENELEC as a
European Standard without any modification.
IEC 60270 ®
Edition 3.0 2015-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AM ENDMENT 1
AM ENDEMENT 1
High-voltage test techniques – Partial discharge measurements
Techniques des essais à haute tension – Mesures des décharges partielles
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20; 19.080 ISBN 978-2-8322-3013-8
– 2 – IEC 60270:2000/AMD1:2015
© IEC2015
FOREWORD
This amendment has been prepared by IEC technical committee 42: High-voltage and high
current test techniques.
The text of this amendment is based on the following documents:
FDIS Report on voting
42/338/FDIS 42/340/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
3 Definitions
Replace the existing title and introductory phrase with the following new title and introductory
phrase:
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
Replace the existing definition 3.10 with the following new definition 3.10:
3.10
digital partial discharge instruments
instruments which perform a digital acquisition and evaluation of the PD data
Note 1 to entry: The A/D conversion of the PD pulses captured from the terminals of the test object can be done
either directly or after the apparent charge pulses have been established employing either an analogue band-pass
filter amplifier or an active integrator (see Annex E).
IEC 60270:2000/AMD1:2015 – 3 –
© IEC2015
Add the following new definitions:
3.12
accumulated apparent charge q
a
sum of the apparent charge q of all individual pulses exceeding a specified threshold level,
and occurring during a specified time interval ∆t
3.13
PD pulse count m
total number of PD pulses which exceed a specified threshold level within a specified time
interval ∆t
3.14
PD pattern
display of the apparent charge q versus the phase angle φ of the PD pulses recorded during
i
a specified time interval ∆t
4.3.4 Wide-band PD instruments
Replace the last sentence of 4.3.4 with the following new text:
Recommended values for the significant frequency parameters f , f and ∆f are:
1 2
30 kHz ≤ f ≤ 100 kHz
f ≤ 1 MHz
100 kHz ≤ ∆f ≤ 900 kHz
Renumber the existing "NOTE" in 4.3.4 to "NOTE 1" and add the following new "NOTE 2":
NOTE 2 For test objects with windings like transformers and electrical machines the acquired frequency band may
be reduced down to a few 100 kHz and even below. The upper limit frequency f to be accepted for such kinds of
test objects should be specified by the relevant Technical Committee.
5.2 Calibration procedure
Renumber the existing "NOTE" in 5.2 to "NOTE 1" and add the following new "NOTE 2" at the
end of the subclause:
NOTE 2 For tall test objects, the connection leads between calibrator and terminals of the test object might
exceed several meters. Thus the transfer of the charge from the calibrator to the test object may be reduced due to
inevitable stray capacitances. The measurement uncertainty acceptable under this condition should be specified by
the relevant Technical Committee.
6.1 General
Replace the existing third paragraph "The voltage pulses of the generator shall have a rise
time t of less than 60 ns." with the following new text:
r
The parameters characterizing unipolar step voltage of magnitude U shall satisfy the
following conditions (see Figure 6):
Rise time: t ≤ 60 ns
r
Time to steady state: t ≤ 200 ns
s
Step voltage duration: t ≥ 5 µs
d
Deviation of the step voltage magnitude U between t and t : ∆U ≤ 0.03 U
0 s d 0
, t and t are measured from the origin t of the step voltage which
The time parameters t
r s d 0
refers to the time instant when the rising voltage equals 10 % of U (see Figure 6).
– 4 – IEC 60270:2000/AMD1:2015
© IEC2015
The time to steady state t is the shortest instant at which the deviation ∆U from U remains
s 0
first time less than 3 %.
The step voltage duration t is the instant after t at which the magnitude of the step voltage
d s
decays below 97% of U . After t the voltage shall decrease continuously down to 10 % of U
,
0 d 0
within a time interval not shorter than 500 µs.
The magnitude U of the step voltage is the mean value occurring within the steady state
duration t − t .
d s
For test objects represented by a lumped capacitance C the calibrating capacitor C shall
a 0
satisfy the conditions C ≤ 200 pF and C ≤ 0,01 C .
0 0 a
For test objects represented by a characteristic impedance Z , such as power cables
c
exceeding a length of 200 m, the value of the calibrating capacitor shall satisfy the conditions
C ≤ 1nF and C × Z ≤ 30 ns.
0 0 c
For calibrators manufactured before this amendment was published, whose time and voltage
parameters do not comply with the above specified values, the deviation of the measured
values from the specified values shall be stated in the test protocol.
11.2 Quantities related to partial discharges
Replace the existing title and text of 11.2 with the following new title and text:
11.2 PD quantities
PD measurements with direct voltage should be based on the following quantities:
– apparent charge of each individual PD pulse occurring during a specified time interval ∆t
i
at constant test voltage, as defined in 3.3.1 (see Figure H.1a)).
– accumulated apparent charge of a PD pulse train occurring within a specified time interval
∆t at constant test voltage, as defined in 3.12 (see Figure H.1b)).
i
– PD pulse count m of PD pulse trains as defined in 3.13 exceeding specified limits of the
apparent charge magnitude q during a specified time interval ∆t at constant test voltage
m i
level (see Figure H.2a)).
– PD pulse count m occurring within specified ranges of the apparent charge magnitude q
m
for a specified time interval ∆t at constant test voltage level (see Figure H.2b)).
i
To determine the PD pulse count m care should be taken so that noisy pulses are not counted
to avoid misleading statistics. Thus before starting the actual PD measurement the
background noise level in terms of pC shall be determined. Based on this the apparent charge
threshold level shall be adjusted to at least twice the background noise.
Values for the PD quantities listed above shall be specified by the relevant Technical
Committee.
11.4 Test circuits and measuring systems
Replace the existing text with the following new text:
To measure the apparent charge according to 3.3.1, the basic circuits shown in Figure 1a to
Figure 1d shall be used in conjunction with either analogue or digital PD measuring systems,
as described in 4.3 and 4.4 and Annex E. The PD instruments applied shall have a pulse train
response that is independent of the repetition rate of PD pulses.
IEC 60270:2000/AMD1:2015 – 5 –
© IEC2015
To indicate the PD pulse count m, the application of either digital PD instruments with
integrated pulse counters or analogue PD instruments in combination with suitable pulse
counting devices is recommended.
The calibration procedures recommended in Clause 5 and the calibrators specified in
Clause 6 can also be applied for testing with direct voltage.
Add, after Figure 5, the following new Figure 6:
U + ΔU
1 U
U – ΔU
0,9 U
0,1 U
t
r
t
t
s
t
d
IEC
t
Key
U step voltage magnitude t step voltage duration
0 d
t origin of the step voltage (t − t ) steady state duration
0 d s
t rise time of the step voltage ∆U absolute voltage deviation from U
r
t time to steady state
s
Figure 6 – Step voltage parameters of a calibrator
A.3 Alternative method
Replace the existing title of Clause A.3 with the following new title:
A.3 Numerical integration method
Add, at the end of Clause A.3, the following new text:
The voltage and time parameters of the step voltage specified in 6.1 and in Figure 6 can be
determined if the current through the calibration capacitor C caused by the voltage step U is
0 0
measured by means of a resistive shunt R (see Figure A.2). For example, this shunt can be
m
a 50 Ω feed-through low-inductive termination. Under this condition the calibrating charge can
be determined based on a numerical integration of the time dependent voltage signal u (t)
r
appearing across R . Care shall be taken on the offset voltage which shall be adjusted
m
exactly to zero to avoid an integration error.
U
– 6 – IEC 60270:2000/AMD1:2015
© IEC2015
C
U R u (t)
0 m r
Calibrator Oscilloscope
IEC
Figure A.2 – Setup for performance tests of calibrators using the numerical integration
Add, at the end of Annex A, the following new Clause A.4:
A.4 Step voltage response method
The charge q generated by the calibrator can also be determined by measuring the transient
voltage appearing across a measuring capacitor C using the circuit shown in Figure A.3 and
m
[1] . As the series connection of C and C comprises a voltage divider, the magnitude U of
0 m c
the time dependent voltage u (t), which occurs across C at steady state condition, is direct
c m
proportional to the step voltage magnitude U generated by the calibrator:
U = U × C / (C + C )
c 0 0 0 m
The charge q transferred from the calibrator to the measuring capacitor C can thus be
c m
expressed by:
q = q / (1 + C /C )
c 0 0 m
Under the con
...
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