EN 50513:2009

Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing

This document describes data sheet and product information for crystalline silicon (Si) – solar wafers and measurement methods for wafer properties. The document intends to provide the minimum information required for an optimal use of crystalline silicon wafers in solar cell manufacturing. Clauses 5 to 7 describe the data sheet information with technical specifications of the silicon solar wafer with all essential characteristics. The product information concerns packaging, labelling and storage, and implies the commitment to inform about major changes of the product and in the manufacturing process. This data is needed for the processing of silicon solar wafers to solar cells. Clauses 8 to 16 describe measurement methods for the characteristic properties specified in the data sheet.

Solarscheiben - Datenblattangaben und Produktinformation für kristalline Silizium-Scheiben zur Solarzellenherstellung

Diese Dokument beschreibt die Datenblattangaben und Angaben zum Produkt für kristalline Silicium (Si)-Solarscheiben und Messverfahren für Scheiben. Es stellt notwendige Informationen bereit, um eine optimale Weiterverarbeitung zu Si Solarzellen zu ermög-lichen. Die Abschnitte 5 bis 7 beschreiben die Datenblattinformationen mit technischen Beschreibungen der Si Solarscheibe mit allen wesentlichen Kenngrößen zu verstehen. Die Produktangaben betreffen die Verpackung, Kennzeichnung, Lagerung und beinhalten eine Verpflichtung zur Mitteilung von wesentlichen Änderungen am Produkt und am Prozess. Diese Angaben werden zur Weiterverarbeitung von Si Solarscheiben zu Solarzellen benötigt. Die Abschnitte 8 bis 16 beschreiben Messverfahren für Charakteristiken , die im Datenblatt angegeben werden.

Tranches de silicium solaires - Fiche technique et information produit sur les tranches au silicium cristallin pour la fabrication de cellules solaires

Ce document décrit la fiche technique et les informations Produit des tranches de silicium solaires au silicium cristallin (Si) ainsi que les méthodes de mesure des propriétés des tranches de silicium. Le document est destiné à fournir les informations minimales requises pour une utilisation optimale des tranches au silicium cristallin lors de la fabrication de cellules solaires. Les Articles 5 à 7 décrivent les informations de la fiche technique, y compris les spécifications techniques des tranches de silicium solaires avec toutes leurs caractéristiques essentielles. Les informations Produit concernent l’emballage, l’étiquetage et le stockage, et contiennent l’engagement à fournir des informations sur les principales modifications du produit et celles apportées au processus de fabrication. Ces données sont nécessaires pour la transformation des tranches de silicium solaires en cellules solaires. Les Articles 8 à 16 décrivent les méthodes de mesure des propriétés caractéristiques spécifiées dans la fiche technique.

Solarne rezine - Tehnični podatki in informacije o kristalnih silicijevih rezinah za izdelavo sončnih celic

General Information

• Status: Published
• Publication Date: 05-Mar-2009
• Withdrawal Date: 30-Nov-2011
• ICS: 27.160 - Solar energy engineering
• Technical Committee: CLC/TC 82 - Solar photovoltaic energy systems
• Drafting Committee: IEC/TC 82 - IEC_TC_82
• Parallel Committee: IEC/TC 82 - IEC_TC_82
• Current Stage: 9093 - Decision to confirm - Review Enquiry
• Completion Date: 08-Aug-2018
• Mandate: M/089 - Solar Photovoltaic energy systems and components
• Ref Project: SIST EN 50513:2009 - Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Solarscheiben - Datenblattangaben und Produktinformation für kristalline Silizium-Scheiben zur SolarzellenherstellungTranches de silicium solaires - Fiche technique et information produit sur les tranches au silicium cristallin pour la fabrication de cellules solairesSolar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing27.160Solar energy engineeringICS:Ta slovenski standard je istoveten z:EN 50513:2009SIST EN 50513:2009en,fr,de01-september-2009SIST EN 50513:2009SLOVENSKI
STANDARD
EUROPEAN STANDARD EN 50513 NORME EUROPÉENNE
EUROPÄISCHE NORM March 2009
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: avenue Marnix 17, B - 1000 Brussels
© 2009 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 50513:2009 E
ICS 27.160
English version
Solar wafers -
Data sheet and product information for crystalline silicon wafers
for solar cell manufacturing
Tranches de silicium solaires -
Fiche technique et information produit
sur les tranches au silicium cristallin
pour la fabrication de cellules solaires
Solarscheiben -
Datenblattangaben und Produktinformation für kristalline Silizium-Scheiben
zur Solarzellenherstellung
This European Standard was approved by CENELEC on 2008-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
at national level by publication of an identical
national standard or by endorsement
(dop)
2009-12-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2011-12-01 __________ SIST EN 50513:2009

– 3 – EN 50513:2009 Contents 1 Scope .6 2 Normative references .6 3 Terms, definitions and acronyms .7 4 Crystallisation process .7 5 Product characteristics .7 5.1 Size .7 5.2 Electrical characteristics .8 5.3 Surface and edge characteristics .8 5.4 Chemical characteristics .9 5.5 Crystal characteristics .9 6 Packaging, marking and storage .9 6.1 Packaging .9 6.2 Marking .9 6.3 Storage .9 7 Major changes of product and processes .9 8 Wafer thickness . 10 8.1 Scope . 10 8.2 Normative references . 10 8.3 Definitions . 10 8.4 Units . 10 8.5 Measuring equipment. 11 8.6 Measurement . 11 8.7 Evaluation
........................................................................................................................... 12 8.8 Test report
........................................................................................................................... 12 8.9 Precision of the procedure
.................................................................................................. 12 9 Variations in thickness ................................................................................................................ 13 9.1 Scope ................................................................................................................................... 13 9.2 Normative references ........................................................................................................... 13 9.3 Definition .............................................................................................................................. 13 9.4 Units ..................................................................................................................................... 13 9.5 Measuring equipment........................................................................................................... 13 9.6 Measurement
...................................................................................................................... 14 9.7 Evaluation
........................................................................................................................... 15 9.8 Test report
........................................................................................................................... 14 9.9 Precision of the procedure
.................................................................................................. 15 10 Waviness and warping ................................................................................................................. 15 10.1 Scope ................................................................................................................................... 15 10.2 Normative references ........................................................................................................... 15 10.3 Definitions ............................................................................................................................ 15 10.4 Arrangements ....................................................................................................................... 16 10.5 Test report ............................................................................................................................ 16 11 Grooves and step type saw mark ............................................................................................... 16 11.1 Scope ................................................................................................................................... 16 11.2 Definitions ............................................................................................................................ 16 11.3 Units ..................................................................................................................................... 17 11.4 Arrangements ....................................................................................................................... 17 11.5 Measuring devices ............................................................................................................... 17 SIST EN 50513:2009

.............................................................................................................................. 20 12.1 Scope ................................................................................................................................... 20 12.2 Definitions ............................................................................................................................ 20 12.3 Implementation ..................................................................................................................... 20 12.4 Analysis ................................................................................................................................ 21 12.5 Test report ............................................................................................................................ 21 13 Determining carrier lifetime measured on as cut wafer ........................................................... 21 13.1 Scope ................................................................................................................................... 21 13.2 Determination of carrier lifetime ........................................................................................... 22 13.3 General measuring conditions ............................................................................................. 23 13.4 Analysis ................................................................................................................................ 23 13.5 Test report ............................................................................................................................ 24 14 Determining minority carrier bulk lifetime measured on passivated wafers (laboratory measurement) ........................................................................................................... 24 14.1 Scope ................................................................................................................................... 24 14.2 Determination of carrier lifetime ........................................................................................... 24 14.3 Analysis ................................................................................................................................ 26 14.4 Test report ............................................................................................................................ 26 15 Electrical resistivity of multi and mono crystalline semiconductor wafers ........................... 26 15.1 Scope ................................................................................................................................... 26 15.2 Normative references ........................................................................................................... 26 15.3 Definition .............................................................................................................................. 26 15.4 Units ..................................................................................................................................... 26 15.5 Measuring devices ............................................................................................................... 27 15.6 Calibration ............................................................................................................................ 27 15.7 Sample size .......................................................................................................................... 27 15.8 Measurement of silicon wafers ............................................................................................ 27 15.9 Test report ............................................................................................................................ 28 16 Method for the measurement of substitutional atomic carbon and interstitial oxygen content in silicon used as solar material ................................................................................... 28 16.1 Scope ................................................................................................................................... 28 16.2 Referenced documents (Normative references) .................................................................. 28 16.3 Definitions ............................................................................................................................ 28 16.4 Units ..................................................................................................................................... 28 16.5 Arrangements ....................................................................................................................... 28 16.6 Measurement ...........
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