EN 60749-5:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) correction of an error in an equation; b) inclusion of notes for guidance; c) clarification of the applicability of test conditions.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5: Essai continu de durée de vie sous température et humidité avec polarisation

L’IEC 60749-5:2017 décrit un essai continu de durée de vie utilisant la température et l’humidité avec polarisation pour évaluer la fiabilité des dispositifs à semiconducteurs sous boîtier non hermétique dans les environnements humides. Cette méthode d’essai est considérée comme destructive. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente: a) correction d’une erreur dans une équation; b) ajout de notes à des fins de recommandation; c) clarification de l’applicabilité des conditions d’essai.

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 5. del: Preskus življenjske dobe v dinamičnem ravnotežju vlažnosti in pri ustaljeni temperaturi (IEC 60749-5:2017)

Ta del standarda IEC 60749 določa preskus življenjske dobe v dinamičnem ravnotežju vlažnosti in pri ustaljeni temperaturi za namene vrednotenja zanesljivosti nehermetično pakiranih naprav v trdnem stanju v vlažnih okoljih.
Ta preskusna metoda se obravnava kot porušitvena.

General Information

• Status: Published
• Publication Date: 06-Jul-2017
• Withdrawal Date: 14-May-2020
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/TC 47X - Semiconductor devices and trusted chips
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 07-Jul-2017
• Completion Date: 07-Jul-2017
• Ref Project: SIST EN 60749-5:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017)

Relations

• Replaces: EN 60749-5:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
• Effective Date: 19-Jul-2016
• Replaced By: EN IEC 60749-5:2024 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
• Effective Date: 26-Jul-2022

Standards Content (Sample)

SLOVENSKI STANDARD
01-september-2017
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SIST EN 60749-5:2004
3ROSUHYRGQLãNLHOHPHQWL0HKDQVNHLQNOLPDWVNHSUHVNXVQHPHWRGHGHO
3UHVNXVåLYOMHQMVNHGREHYGLQDPLþQHPUDYQRWHåMXYODåQRVWLLQSULXVWDOMHQL
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state
temperature humidity bias life test (IEC 60749-5:2017)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5:
Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer
Beanspruchung (IEC 60749-5:2017)
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5:
Essai continu de durée de vie sous température et humidité avec polarisation (IEC
60749-5:2017)
Ta slovenski standard je istoveten z: EN 60749-5:2017
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60749-5
NORME EUROPÉENNE
EUROPÄISCHE NORM
July 2017
ICS 31.080.01 Supersedes EN 60749-5:2003
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 5: Steady-state temperature humidity bias life test
(IEC 60749-5:2017)
Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische
mécaniques et climatiques - Partie 5: Essai continu de Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter
durée de vie sous température et humidité avec polarisation Temperatur und Feuchte unter elektrischer Beanspruchung
(IEC 60749-5:2017) (IEC 60749-5:2017)
This European Standard was approved by CENELEC on 2017-05-15. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 60749-5:2017 E
European foreword
The text of document 47/2367/FDIS, future edition 2 of IEC 60749-5, prepared by
IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved
by CENELEC as EN 60749-5:2017.

The following dates are fixed:
(dop) 2018-02-15
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-05-15
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60749-5:2003.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 60749-5:2017 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu
Publication Year Title EN/HD Year

IEC 60749-4 -  Semiconductor devices - Mechanical and EN 60749-4 -
climatic test methods -
Part 4: Damp heat, steady state, highly
accelerated stress test (HAST)

IEC 60749-5 ®
Edition 2.0 2017-04
INTERNATIONAL
STANDARD
Semiconductor devices – Mechanical and climatic test methods –

Part 5: Steady-state temperature humidity bias life test

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.01 ISBN 978-2-8322-4171-4

– 2 – IEC 60749-5:2017 © IEC 2017
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General . 5
5 Equipment . 6
5.1 Equipment summary . 6
5.2 Temperature and relative humidity . 6
5.3 Devices under stress . 6
5.4 Minimizing release of contamination . 6
5.5 Ionic contamination . 6
5.6 Deionized water . 6
6 Test conditions . 6
6.1 Test conditions summary . 6
6.2 Temperature, relative humidity and duration . 6
6.3 Biasing guidelines . 7
6.4 Biasing choice and reporting . 7
7 Procedures . 8
7.1 Mounting . 8
7.2 Ramp-up . 8
7.3 Ramp-down . 8
7.4 Test clock . 8
7.5 Bias . 8
7.6 Read-out . 8
7.7 Handling . 9
8 Failure criteria . 9
9 Safety . 9
10 Summary . 9

Table 1 – Temperature, relative humidity and duration . 6
Table 2 – Criteria for choosing continuous or cyclical bias . 8

IEC 60749-5:2017 © IEC 2017 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 5: Steady-state temperature humidity bias life test

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60749-5 has been prepared by IEC technical committee 47:
Semiconductor devices.
This second edition cancels and replaces the first edition published in 2003. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

– 4 – IEC 60749-5:2017 © IEC 2017
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2367/FDIS 47/2383/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, published under the general title Semiconductor
devices – Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC we
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