Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

Photovoltaik-Zellen - Teil 1: Messung der lichtinduzierten Degradation von kristallinen Silizium-Photovoltaikzellen

Cellules photovoltaïques - Partie 1: Mesure de la dégradation induite par la lumière des cellules photovoltaïques au silicium cristallin

l'IEC 63202-1:2019 décrit les procédures pour la mesure de la dégradation induite par la lumière (LID, light-induced degradation) des cellules photovoltaïques (PV) au silicium cristallin sous éclairement solaire simulé. L'amplitude de la dégradation induite par la lumière dans une cellule photovoltaïque au silicium cristallin est déterminée en comparant la puissance de sortie maximale aux conditions normales d’essai ((STC, standard test conditions) avant et après l'exposition à un éclairement solaire simulé, à une température et un éclairement spécifiés. L'objet du présent document est de fournir des informations sur la dégradation induite par la lumière des cellules photovoltaïques normalisées, afin d'aider les fabricants de modules photovoltaïques à réduire le plus possible la désadaptation entre les cellules à l'intérieur du même module, augmentant ainsi au maximum le rendement de puissance.

Fotonapetostne naprave - 11. del: Meritve degradacije kristalnih silicijevih sončnih celic, povzročene s svetlobo

Ta evropski standard opisuje postopke za meritve degradacije kristalnih silicijevih fotonapetostnih celic, povzročene s svetlobo (LID), pod simulirano sončno svetlobo. Obseg degradacije, povzročene s svetlobo, v kristalni silicijevi fotonapetostni celici se določi s primerjavo največje izhodne moči pri standardnih preskusnih pogojih (STC) pred izpostavljenostjo simulirani sončni svetlobi pri določeni temperaturi in sevanju ter po njej. Namen tega dokumenta je podati standardizirane informacije o degradaciji fotonapetostnih celic, povzročeni s svetlobo, ki proizvajalcem fotonapetostnih modulov pomagajo zmanjšati neujemanje celic v istem modulu, s čimer se poveča izkoristek energije. Ugotovljeno je bilo, da v primerjavi z meritvami degradacije fotonapetostnih modulov, povzročene s svetlobo, ki je opisana v skupini standardov IEC 61215, na preskus degradacije fotonapetostnih celic, povzročene s svetlobo, pomembno vpliva več dodatnih preskusnih dejavnikov, ki v standardu IEC 61215-2 niso bili upoštevani. Ta dokument določa postopek pogojevanja in merjenja ter nastavitve parametrov, ki so potrebne za dosledne meritve degradacije fotonapetostnih celic, povzročene s svetlobo. Obseg degradacije, povzročene s svetlobo, je eden od pomembnih dejavnikov kakovosti celice. Najpomembnejši dejavnik celic znotraj iste razvrstitve je porazdelitev izhodne moči po degradaciji, povzročeni s svetlobo.

General Information

Status
Published
Publication Date
19-Sep-2019
Current Stage
6060 - Document made available
Due Date
20-Sep-2019
Completion Date
20-Sep-2019

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SLOVENSKI STANDARD
SIST EN IEC 63202-1:2019
01-december-2019

Fotonapetostne naprave - 11. del: Meritve degradacije kristalnih silicijevih sončnih

celic, povzročene s svetlobo

Photovoltaic devices - Part 11: Measurement of light-induced degradation of crystalline

silicon solar cells
Ta slovenski standard je istoveten z: EN IEC 63202-1:2019
ICS:
27.160 Sončna energija Solar energy engineering
SIST EN IEC 63202-1:2019 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 63202-1:2019
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SIST EN IEC 63202-1:2019
EUROPEAN STANDARD EN IEC 63202-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2019
ICS 27.160
English Version
Photovoltaic cells - Part 1: Measurement of light-induced
degradation of crystalline silicon photovoltaic cells
(IEC 63202-1:2019)

Cellules photovoltaïques - Partie 1: Mesure de la Photovoltaik-Zellen - Teil 1: Messung der lichtinduzierten

dégradation induite par la lumière des cellules Degradation von kristallinen Silizium-Photovoltaikzellen

photovoltaïques au silicium cristallin (IEC 63202-1:2019)
(IEC 63202-1:2019)

This European Standard was approved by CENELEC on 2019-07-25. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 63202-1:2019 E
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SIST EN IEC 63202-1:2019
EN IEC 63202-1:2019 (E)
European foreword

The text of document 82/1565/FDIS, future edition 1 of IEC 63202-1, prepared by IEC/TC 82 "Solar

photovoltaic energy systems" was submitted to the IEC-CENELEC parallel vote and approved by

CENELEC as EN IEC 63202-1:2019.
The following dates are fixed:

• latest date by which the document has to be implemented at national (dop) 2020-04-25

level by publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2022-07-25

document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 63202-1:2019 was approved by CENELEC as a European

Standard without any modification.
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SIST EN IEC 63202-1:2019
EN IEC 63202-1:2019 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60904-1 - Photovoltaic devices - Part 1: EN 60904-1 -
Measurement of photovoltaic current-
voltage characteristics
IEC 60904-2 - Photovoltaic devices - Part 2: EN 60904-2 -
Requirements for photovoltaic reference
devices
IEC 60904-9 - Photovoltaic devices - Part 9: Solar EN 60904-9 -
simulator performance requirements
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SIST EN IEC 63202-1:2019
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SIST EN IEC 63202-1:2019
IEC 63202-1
Edition 1.0 2019-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Photovoltaic cells –
Part 1: Measurement of light-induced degradation of crystalline silicon
photovoltaic cells
Cellules photovoltaïques –
Partie 1: Mesure de la dégradation induite par la lumière des cellules
photovoltaïques au silicium cristallin
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-6896-4

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 63202-1:2019
– 2 – IEC 63202-1:2019 © IEC 2019
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

4 Apparatus ........................................................................................................................ 6

5 Sampling ......................................................................................................................... 6

6 Procedure for conditioning and evaluation ....................................................................... 6

7 Report ............................................................................................................................. 8

Annex A (informative) Bar charts presented in the test report, showing the absolute

value of I degradation for all specimens after conditions in 6.1, 6.7 and 6.10 are met ........ 9

Figure A.1 – I values of all test samples before and after LID tests .................................... 9

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SIST EN IEC 63202-1:2019
IEC 63202-1:2019 © IEC 2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC CELLS –
Part 1: Measurement of light-induced degradation
of crystalline silicon photovoltaic cells
FOREWORD

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8) Attention is drawn to the Normative referenc
...

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