EN 60368-1:2000
(Main)Piezoelectric filters of assessed quality - Part 1: Generic specification
Piezoelectric filters of assessed quality - Part 1: Generic specification
Specifies the methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or qualification approval procedures.
Piezoelektrische Filter mit bewerteter Qualität - Teil 1: Fachgrundspezifikation
Filtres piézoélectriques sous assurance de la qualité - Partie 1: Spécification générique
Spécifie les méthodes d'essai et les exigences générales pour les filtres piézoélectriques dont la qualité est garantie par les procédures d'agrément de savoir-faire ou par les procédures d'homologation.
Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000)
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Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 60368-1:2002(en)ICS31.140; 31.160
EUROPEAN STANDARD
EN 60368-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
April 2000
ICS 31.140;31.160
English version
Piezoelectric filters of assessed quality Part 1: Generic specification (IEC 60368-1:2000)
Filtres piézoélectriques sous assurance de la qualité Partie 1: Spécification générique (CEI 60368-1:2000) Piezoelektrische Filter mit bewerteter Qualität Teil 1: Fachgrundspezifikation (IEC 60368-1:2000)
This European Standard was approved by CENELEC on 2000-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60368-1:2000 E
Page 2 EN 60368-1:2000
Foreword
The text of document 49/448/FDIS, future edition 1 of IEC 60368-1, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60368-1 on 2000-04-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2001-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2003-04-01
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. __________
Endorsement notice
The text of the International Standard IEC 60368-1:2000 was approved by CENELEC as a European Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60617 NOTE: Harmonized in the series EN 60617 (not modified).
__________
Page 3
Annex ZA (normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments).
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title
EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical technology
- -
IEC 60050-561 1991 International electrotechnical vocabulary - Chapter 561: Piezoelectric devices for frequency control and selection
- -
IEC 60068-1 1988 Environmental testing Part 1: General and guidance
EN 60068-11) 1994
IEC 60068-2-1 1990 Part 2: Tests - Tests A: Cold
EN 60068-2-1 1993
IEC 60068-2-2 1974 Part 2: Tests - Test B: Dry heat
EN 60068-2-22) 1993
IEC 60068-2-3 1969 Part 2: Tests - Test Ca: Damp heat, steady state
HD 323.2.3 S23) 1987
IEC 60068-2-6
+ corr. March 1995 1995 Part 2: Tests - Test Fc: Vibration (sinusoidal)
EN 60068-2-6 1995
IEC 60068-2-7 1983 Part 2: Tests - Test Ga and guidance: Acceleration, steady state
EN 60068-2-74) 1993
IEC 60068-2-10 1988 Part 2: Tests - Test J and guidance: Mould growth
HD 323.2.10 S3 1988
IEC 60068-2-13 1983 Part 2: Tests - Test M: Low air pressure
EN 60068-2-13 1999
1) EN 60068-1 includes the corrigendum October 1988 + A1:1992 to IEC 60068-1. 2) EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2. 3) HD 323.2.3 S2 includes A1:1984 to IEC 60068-2-3. 4) EN 60068-2-7 includes A1:1986 to IEC 60068-2-7.
Page 4 EN 60368-1:2000
Publication Year Title
EN/HD Year
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of temperature
EN 60068-2-145) 1999
IEC 60068-2-17 1994 Part 2: Tests - Test Q: Sealing
EN 60068-2-17 1994
IEC 60068-2-20 1979 Part 2: Tests - Test T: Soldering
HD 323.2.20 S36) 1988
IEC 60068-2-21 1999 Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 60068-2-21 1999
IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: Shock
EN 60068-2-27 1993
IEC 60068-2-29 +
corrigendum 1987 Part 2: Tests - Test Eb and guidance: Bump
EN 60068-2-29 1993
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: Damp heat, cyclic (12 + 12 hour cycle)
EN 60068-2-307) 1999
IEC 60068-2-32 1975 Part 2: Tests - Test Ed: Free fall
EN 60068-2-328) 1993
IEC 60068-2-45 1980 Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
EN 60068-2-45 1992
IEC 60068-2-52 1996 Part 2: Tests -Test Kb: Salt mist, cyclic (sodium chloride solution)
EN 60068-2-52 1996
IEC 60068-2-58 1999 Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
EN 60068-2-58 1999
IEC 60068-2-64 +
corr. October 1993 1993 Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance
EN 60068-2-64 1994
IEC 60368-4 9) Piezoelectric filters of assessed quality Part 4: Sectional specification - Capability approval
- -
IEC 60642 1979 Piezoelectric ceramic resonators and resonator units for frequency control and selection. Chapter I: Standard values and conditions. Chapter II: Measuring and test conditions
- -
5) EN 60068-2-14 includes A1:1986 to IEC 60068-2-14.
6) HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20. 7) EN 60068-2-30 includes A1:1985 to IEC 60068-2-30. 8) EN 60068-2-32 includes A2:1990 to IEC 60068-2-32. 9) To be published.
Page 5 EN 60368-1:2000
Publication Year Title
EN/HD Year
IEC 61000-4-2 1995 Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
EN 61000-4-2 1995 A1 1998
A1 1998
IEC 61178-1 1993 Quartz crystal units - A specification in the IEC Quality Assessment System for electronic Components (IECQ) Part 1: Generic specification
- -
IEC QC 001002-2 1998 IEC Quality Assessment System for Electronic Components (IECQ) - Basic rules Part 2: Documents
- -
IEC QC 001002-3 1998 Part 3: Approval procedures
- -
ISO 1000 1992 SI units and recommendations for the use of their multiples and of certain other units
- -
NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60368-1QC 640000Quatrième éditionFourth edition2000-03Filtres piézoélectriques sous assurancede la qualité –Partie 1:Spécification génériquePiezoelectric filters of assessed quality –Part 1:Generic specification Commission Electrotechnique Internationale International Electrotechnical CommissionPour prix, voir catalogue en vigueurFor price, see current catalogue© IEC 2000
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Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucun procédé,électronique ou mécanique, y compris la photo-copie et lesmicrofilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without permission inwriting from the publisher.International Electrotechnical Commission3, rue de Varembé
Geneva, SwitzerlandTelefax: +41 22 919 0300e-mail: inmail@iec.ch IEC web site
http://www.iec.chCODE PRIXPRICE CODEV
60368-1 © IEC:2000– 3 –CONTENTSPageFOREWORD.7Clause1General.111.1Scope.111.2Normative references.111.3Order of precedence.152Terminology and general requirements.152.1General.152.2Definitions.152.3Preferred values for ratings and characteristics.312.4Marking.333Quality assessment procedures.353.1Primary stage of manufacture.353.2Structurally similar components.353.3Subcontracting.353.4Incorporated components.353.5Manufacturer's approval.373.6Approval procedures.373.7Procedures for capability approval.373.8Procedures for qualification approval.393.9Test procedures.393.10Screening requirements.413.11Rework and repair work.413.12Certified records of released lots.413.13Validity of release.413.14Release for delivery.413.15Unchecked parameters.414Test and measurement procedures.434.1General.434.2Test and measurement conditions.434.3Visual inspection.454.4Dimensions and gauging procedures.454.5Electrical test procedures.454.6Mechanical and environmental test procedures.554.7Endurance test procedure.65Figure 1 – Symbol of monolithic filter.17Figure 2 – Symbol of tandem monolithic filter.17Figure 3 – Symbol of monolithic multiple pole resonator.17Figure 4 – Transducer attenuation characteristics of a filter.23
60368-1 © IEC:2000– 5 –Figure 5 – Shape factor of a band-pass filter.27Figure 6 – Pass-band ripple of a filter.27Figure 7 – Pass-band attenuation deviation of a filter.29Figure 8 – Test circuit for insertion attenuation, phase and group delay measurement.47Figure 9 – Test circuit for return attenuation measurement.51Figure 10 – Test circuit for the intermodulation distortion measurement.53Bibliography.67
60368-1 © IEC:2000– 7 –INTERNATIONAL ELECTROTECHNICAL COMMISSION____________PIEZOELECTRIC FILTERS OF ASSESSED QUALITY –Part 1: Generic specificationFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this prepar
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