EN 62132-4:2006
(Main)Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit im Frequenzbereich von 150 kHz bis 1 GHz - Teil 4: Verfahren direkter Einspeisung der HF-Leistung
Circuits intégrés - Mesure de l'immunité électromagnétique 150 kHz à 1 GHz - Partie 4: Méthode d'injection directe de puissance RF
Cette partie de la CEI 62132 d Décrit une méthode de mesure de l'immunité des circuits intégrés (CI) en présence de perturbations RF conduites, comme par exemple celles résultant de perturbations RF rayonnées. Cette méthode garantit un degré élevé de répétabilité et une corrélation des mesures d'immunité. Cette norme établit une base commune pour l'évaluation des dispositifs à semiconducteurs utilisés dans les matériels fonctionnant dans un environnement soumis à des ondes électromagnétiques à radiofréquences intempestives.
Integrirana vezja – Merjenje elektromagnetne odpornosti pri frekvencah od 150 kHz do 1 GHz – 4. del: Metoda z neposredno priključitvijo RF energije (IEC 62132-4:2006)
General Information
Standards Content (Sample)
SLOVENSKI SIST EN 62132-4:2006
STANDARD
oct 2006
Integrirana vezja – Merjenje elektromagnetne odpornosti pri frekvencah od
150 kHz do 1 GHz – 4. del: Metoda z neposredno priključitvijo RF energije
(IEC 62132-4:2006)
Integrated circuits – Measurement of electromagnetic immunity 150 kHz to 1 GHz –
Part 4: Direct RF power injection method (IEC 62132-4:2006)
ICS 31.200; 33.100.20 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD
EN 62132-4
NORME EUROPÉENNE
May 2006
EUROPÄISCHE NORM
ICS 31.200
English version
Integrated circuits -
Measurement of electromagnetic immunity 150 kHz to 1 GHz
Part 4: Direct RF power injection method
(IEC 62132-4:2006)
Circuits intégrés - Integrierte Schaltungen -
Mesure de l'immunité électromagnétique Messung der elektromagnetischen
150 kHz à 1 GHz Störfestigkeit im Frequenzbereich
Partie 4: Méthode d'injection directe von 150 kHz bis 1 GHz
de puissance RF Teil 4: Verfahren direkter Einspeisung
(CEI 62132-4:2006) der HF-Leistung
(IEC 62132-4:2006)
This European Standard was approved by CENELEC on 2006-02-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62132-4:2006 E
Foreword
The text of document 47A/733/FDIS, future edition 1 of IEC 62132-4, prepared by SC 47A, Integrated
circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was
approved by CENELEC as EN 62132-4 on 2006-02-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2006-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-02-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62132-4:2006 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 62132-4:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1)
IEC 61000-4-6 Electromagnetic compatibility (EMC) - -
-
Part 4-6: Testing and measurement
techniques - Immunity to conducted
disturbances, induced by radio-frequency
fields
1) 2)
IEC 61967-4 - Integrated circuits - Measurement of EN 61967-4 2002
electromagnetic emissions, 150 kHz to 1 GHz
Part 4: Measurement of conducted emissions
- 1 ohm/150 ohm direct coupling method
IEC 62132-1 2006 Integrated circuits - Measurement of EN 62132-1 2006
electromagnetic immunity, 150 kHz to 1 GHz
Part 1: General conditions and definitions
CISPR 16-1-2 2003 Specification for radio disturbance and EN 55016-1-2 2004
immunity measuring apparatus and methods
Part 1-2: Radio disturbance and immunity
measuring apparatus - Ancillary equipment -
Conducted disturbances
1)
Undated reference.
2)
Valid edition at date of issue.
NORME CEI
INTERNATIONALE
IEC
62132-4
INTERNATIONAL
Première édition
STANDARD
First edition
2006-02
Circuits intégrés –
Mesure de l'immunité électromagnétique
150 kHz à 1 GHz –
Partie 4:
Méthode d'injection directe de puissance RF
Integrated circuits –
Measurement of electromagnetic
immunity 150 kHz to 1 GHz –
Part 4:
Direct RF power injection method
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62132-4 IEC:2006 – 3 –
CONTENTS
FOREWORD.7
1 Scope.11
2 Normative references.11
3 Terms and definitions .11
4 General .13
4.1 Measurement basics.13
4.2 Single pin direct power injection.17
4.3 Multiple pin direct power injection into pins of differential mode systems .19
5 Test conditions .19
6 Test equipment.19
6.1 General .19
6.2 RF power source .21
6.3 RF power meter and directional coupler .21
7 Test set-up .21
7.1 General .21
7.2 Power injection set-up .21
7.3 Test circuit board.23
7.4 Characteristics of the power injection set-up .25
7.5 Decoupling networks.25
8 Test procedure .27
8.1 General .27
8.2 Specific test procedure .27
9 Test report.29
Annex A (informative) Example of a specification of immunity levels e.g. for automotive
applications.31
Annex B (informative) Hints for the best installation of a test set-up with respect to RF .35
Annex C (informative) Constant peak test level explanation .47
Bibliography .49
Figure 1 – Arrangement of a direct injection test set-up .15
Figure 2 – Illustration of the principle of the single pin power injection.17
Figure 3 – Illustration of the principle of multiple pin power injection .19
Figure 4 – Example of the routing from the injection port to a pin of the DUT .23
Figure 5 – Example of a S magnitude measurement result (first resonance above 1 GHz).25
Figure 6 – Flowchart of a test procedure.29
62132-4 IEC:2006 – 5 –
Figure B.1 – Installation of a connector on the test board nearby the DUT.37
Figure B.2 – Using a shielding box placing the connector as close as possible to the
DUT (optional series resistor may be added) .37
Figure B.3 – Accessing a high pin count DUT by a large main board and an IC specific
board connected by spring contact pins .39
Figure B.4 – DC decoupling of a high current pin .39
Figure B.5 – Test set-up with mandatory blocking capacitor .41
Figure B.6 – Layout example for DUT with mandatory blocking capacitor .41
Figure B.7 – Test set-up example with the load on the test set-up.43
Figure B.8 – Example of a decoupling network for an input with high impedance.43
Figure B.9 – Termination of pins not to be tested with a typical impedance to reproduce
crosstalk currents.45
Figure B.10 – Example of power injection into two pins using the mandatory termination
of the high speed CAN bus.45
Table 1 – System and IC parameters affecting immunity.17
Table A.1 – Example of immunity level ranges.31
62132-4 IEC:2006 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
MEASUREMENT OF ELECTROMAGNETIC IMMUNITY
150 kHz TO 1 GHz –
Part 4: Direct RF power injection method
FOREWORD
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